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14644-9

2013



I S O 14644-9:2012
Cleanrooms and associated controlled environments Part 9:
Classification of surface cleanliness by particle concentration
(IDT)



2014
14644-9 2013


27 2002 . No 184- ,
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(ISO 14644-9:2012 Cleanrooms and associated controlled
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14644-9 2013

Cleanrooms and associated controlled environments. Part 9.


Classificaiion of surface cleanliness by panicle concentration

2014-12-01


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0.05 500 .
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(ISO 14644-6:2007 Cleanrooms and associated controlled environments Part 6:
Vocabulary).

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14644-9 2013

, 14644-
6:2007. :
3.1 (descriptor for specific
partide size range): ,
(SCP)

- ,
, . .
( SCP).

3.2 (direct measurement method): -


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3.3 (indirect measurement method): ,
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3.4 (solid surface):
.
3.5 (surface particle): / ,
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3.6 , SCP (surface cleanliness by particle


concentration. SCP): no .

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3.7 ,
(surface cleanliness by particle concentration class. SCP dass): ,
(/*)
( 1 8).
. , SCP (surface cleanliness by
partide concentration classification. SCP classification): ,
(/*) .
SCP N.
3.9 (surface particle concentration):
.

:
AFM - - :
CNC - ;
EDX - ;
ESCA - ,
:
ESD - ;
IR () - ( );
- ;
- ;
SEM - ;
SPC - ;
UV () - ;
WDX - .

2
14644*9 2013

5.1 SCP

( SCP)

N.
. (/* ), .

D: ^.0=. (1)
Cscpo - ,
D (/* ).
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N - SCP. (SCP) 1 8
( SCP 1 - SCP 8). SCP N , :

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1. SCP. ,
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2. ,

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cSCPj0 (1) . 1
SCP
.
1 .
1 - SCP
- /'
,
SCP . 0.1 0.5 21 5 2 10 2 50 100 2 500
(2001 100 20 )
SCP 1
(2 000) 1 000 200 100 (20) ()
SCP2
(20 000) 10 000 2 000 1 000 (200) (100)
SCP 3
(200 000) 100 000 20 000 10 000 2 000 1 000 (200) (100)
SCP 4
1 000 000 200 000 100 000 20000 10000 2 000 1 000 (200)
SCP 5
(10000 2 000 000 1 000 000 200 000 100 000 20 000 10 000 2 000
SCP 6 000)
10 000 2000 000 1000 000 200 000 100 000 20 000
SCP 7 000
10 000 2 000 000 1 000 000 200 000
SCP8 000
, 1. .
SCP , 1 7
(Cscp,c)-
, , .
.

.
- (. . ) SCP
100>0>01^>0^^08^^^^^^^^^^^^^^^^^^^^^_

3
14644-9 2013

X - , D. ; Y - t D. ^^. / *:
1 - SCP 1: 2- SCP 2; 3- SCP 3: 4- SCP 4; 5- SCP 5:
- SCP 6:7- SCP 7:8- SCP 8
1 - SCP

SCP .
.

- , ,
, , ,
, , . . { ).

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SCP 5 (1 ) , 1 2 10s
2 1 (D = 1). SCP 5 (10 ) , 1 2
104 2 10 (0 = 10).
( ). , SCP 5 ( ).
SCP.
, ,
, -
, ( ).

5.2

( SCP)
: SCP N { D ).
SCP
:
a) ;
b) ;
c) .
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SCP.
:
1 SCP 2 (0,1 ): , 2:
.

4
14644-9 2013

2 SCP 5 (0.5 ); , 200 *;


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5.3

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6.2

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6.3


SCP.
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, . . 14644-9-2013:
c) , :
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(, , ),
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( . .) ;

5
14644-9 2013

d) :
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e) :
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6
14644-9 2013


()

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0 1 ( 0 % 100 %}.
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7
14644-9 2013

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SEMI 43-0301. SEMI 70-0706).
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1 - : 2 - ; 3 -
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8
14644*9 2013


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9
14644-9 2013

: = 4,5 - J>y = 5,5 :


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Ct:: ; t^A

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. 10 000 /* 500 *
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10
14644*9 2013


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11
14644-9 2013

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D.2.1
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12
14644-9 2013

D.1- ,


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>25
+ + + + + ++ + +> ++ -- ++

>1.0
++ + ++ ++ + + ++ ++ ++
(
)

,
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>0.5
++ ++ + ++ + +> ++ --

(
)

>0.07
++ ++ - - - - ++ -

>0.01
+ + ++ ++ - - - - + +

(SEM)
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+ + ++ + ++ + + +> - + +

(AFM)
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13
14644-9 2013

D.2.3.32
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14
14644-9 2013

0.2 - ,


1 &
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1
1

0 2 >1
(/ ) + ++ - - - ++ ++ ++ + + -

(> 1 )




02 >1
++ ++ ++ - + ++ - ++ -




(> 0.5 )

02 >0.2
( ++ ++ - - - ++ ++ ++ + ++ -



)
(> 0.05 )

( 0.3 >0.3
++ - - - ++ ++ ++ + ++ -


)
(> 0.05 )

15
14644-9 2013

D.2
S
D
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3 ( 47 ) ( 16232-2. 16232-3.
16232-4. 16232-5).
, .
. ._______________________
_________ ._________________________________

D.2.4

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.

(. 5725-2. /TS
21748. 10576-1).
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D.2.5.1
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16
14644-9 2013

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02.6.1
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(WDX)
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(, ) .
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17
14644-9 2013

, .
. ,
, , 0,05
2500 (2.5 ). .
(CMC).
.
0.005 .
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> 0,05 . ()
.
D.2.7.5
( )
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1 .
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[>.2.7.6

(, , ).
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D.2.7.7
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D.2.7.6 - (AFM)
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D.2.7.9
( ) ,
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(,
).

D.3

6.3,
, .

18
14644-9 2013


()

.1

14644-6-2010
14644-6:2007 .
6.

- 8
:
- .

Geometrical Product Specifications (GPS) Surface texture: Profile method


(1] ISO 4287:1997
Terms, definitions and surface texture parameters
Geometrical Product Specifications (GPS) Surface texture: Profile method
[2] ISO 4288:1996
Rules and procedures lor the assessment of surface texture
Accuracy (trueness and precision) of measurement methods and results Pari
(3] ISO 5725-2:1994 2: Basic method for the determination of repeatability and reproducibility of a
standard measurement method
[4] IS010015:1999 Quality management Guidelines for training
Statistical methods Guidelines for the evaluation of conformity with specified
(5] IS010576-1:2003
requirements Part t: General principles
Road vehicles Cleanliness ot components of fluid circuits Part 2: Method
[6] IS0 16232-2:2007
of extraction of contaminants by agitabon
Road vehicles Cleanliness ot components of fluid circuits Part 3: Method
[7] IS016232-3:2007
of extraction of contaminants by pressure rinsing
Road vehicles Cleanliness of components of fluid circuits Part 4: Method
(8] IS016232-4:2007
of extraction of contaminants by ultrasonic techniques
Road vehicles Cleanliness ot components of fluid circuits Part 5: Method
(9] IS0 16232-5:2007
of extraction of contaminants on functional test bench
Guidance for the use of repeatability, reproduoMity and trueness estimates in
(10] ISO/TS 21748:2004
measurement uncertainty estimation
Electrostatics Part 5-1: Protection of electronic devices Irom electrostatic
(11] IEC 61340-5-1:2007
phenomena General requirements
(12] ASTM E18-07 Standard Test Methods for Rockwell Hardness of Metallic Materials
[13] ASTM E1216-06 Standard Practice tor Sampling for Particulate Contamination by Tape Lift
Standard Test Methods for Mfcroscopical Sizing and Counting Particles from
(14] ASTM F312-08
Aerospace Fluids on Membrane Filters
Standard Method tor Measuring and Counting Particulate Contamination on
(15] ASTM F24-09
Surfaces
Standard Practice tor Sampling for Particles in Aerospace Fluids and
[16] ASTM F303-08
Components
Electrostatics Part 5-2: Protection of electronic devices trom electrostatic
(17] CLOTR 61340-5-2:2008
phenomena: User guide
[18] IEST-RP-CC022.2-2004 Electrostatic charge in cleanrooms and other controlled environments
[19] IEST-STD-CC12460 Product Cleanfiness Levels and Contamination Control Program
[20] SEMI 4-0301 Guide for Measuring Static Charge on Objects and Surfaces
Guide to Assess and Control Electrostatic Discharge (ESD) and Electrostatic
[21] SEMI E78-0706
Attraction (ESA) tor Equipment
Adamson. A.W. Physical Chemistry of Surfaces. John Wiley & Sons, New York.
[ 22]
1976

19
14644-9 2013

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