Professional Documents
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Mark Stephens, PE
Manager
Industrial Studies
Electric Power Research Institute
942 Corridor Park Blvd
Knoxville, Tennessee 37932
Phone 865.218.8022
mstephens@epri.com
Equipment Design that is not Certified to a PQ
Standard can have Components that are highly Robust
and others that are Susceptible to voltage sags
100%
90%
80%
70%
%Vnominal
60%
50%
40%
30%
20%
10%
0%
0 10 20 30 40 50 60
Cycles
SEMI F47 does not Address Product Quality, the intent of the
Standard is to keep the equipment Running (i.e. No Operator
Interventions) when Exposed to Voltage Sags Above the Defined
Curve
Simulation Output for Method B Simulation Output for Method C Simulation Output for Method D
(Figure 3B in IEC 61000-4-34) (Figure 3C in IEC 61000-4-34) (Figure 3D in IEC 61000-4-34)
(50% one L-L voltage, 12 cycles) (50% one L-L voltage, 12 cycles) (50% one L-L voltage, 12 cycles)
700 700 800
Vdc
Vdc
Vdc
Vab
Vab
Vab
0 0 0
Vbc
Vbc
Vbc
0 0 0
Vca
Vca
Vca
0 0 0
Ia
Ia
0
Ia
600
550
Drive Min DC Bus
500
450
400
350
300
40 50 60 70 80 90 100 110 120 130 140 150 160 170 180 190 200 210 220 230 240
MicroFarad/Hp
0.8
1 1
Two-
Vol tag e [pu]
Voltage [pu]
0.8 0.8
Approximation matches
Phase 0.7 0.7
with actual dip type
Voltage 0.6 0.6
Dip 0.5 0.5
0.4 0.4
0 2 4 6 8 0 2 4 6 8
Formerly Type C Time [Cycles] Ti me [Cycl es]
1.1 1.1
1 1
Three-
Vo ltag e [pu]
Voltage [pu]
0.8 0.8
Approximation matches
Phase 0.7 0.7
with actual dip type
Voltage 0.6 0.6
Dip 0.5 0.5
0.4 0.4
0 2 4 6 8 0 2 4 6 8
Formerly Type A Time [C ycle s] Time [Cycl es]