SET: Single Event Transient: A glitch caused by single event effect, which travels through

combinational logic and is captured into storage element.

SEU Single Event Upset: Storage element state change may affect a single bit or multiple bits.

SEE Single Event Effects: Single Event Upset

LET is strictly defined in terms of energy divided by distance, e.g., MeV/cm, eV/nm, keV/nm.

However, since the energy lost is directly proportional to the density of the material
traversed, it is useful to divide the LET by the density of the material.

Units are typically expressed as

MeVcm2/mg
(i.e., MeV/cm divided by mg/cm2),
is also referred to as linear energy transfer (LET).

Single Event Effect: SEE is electrical noise induced by

the natural space environment (high energy ionising
particles) e.g. Ionisation mechanism

Single Event Transient: A glitch caused by single event

effect.
SEU Single Event Upset: Storage element state change
due to single event effect.
Single Event Effect is classified into three categories:
1) Single Event Upset
2) Single Event Latch
3) Single Event Burnout
Single Event Effect: SEE is electrical noise induced by the natural space environment (high
energy ionising particles) e.g. Ionisation mechanism

SET: Single Event Transient: A glitch caused by single event effect, which travels through
combinational logic and is captured into storage element.

SEU Single Event Upset: Storage element state change may affect a single bit or multiple bits.

Formula for (1/T)=(K0/qND)

Where K is proportional constant
0 is permittivity of free space
q is charge of electron
is mobility
ND is doping concentration