SI_HW#2 R06942008

PART1
1.

(a)

(b)
(c)

(d)

(e)
2
(Point_A)

(Point_B)

(Point_C)
PART2

1.
Z0 50
(a) V Vs 2 1 Z s 50()
Z s Z0 Z s 50

2Td 1 109 s Td 0.5 109 s

3 108
Length v p Td 0.5 109 Length 75 mm
4
(b)
di V s
V L V ( s ) L sI s Z s sL
dt I s
Z0 Z Z s sL
s
Z0 Z Z s 100 sL

1
V Vs
2
sL
V s V Vs
2 100 sL

2
Vs t 2u t Vs s
s
sL 2 L
V (s)
2 100 sL s 100 sL

L L
A V t e st dt lim V ( s ) A
s 0 100 100
0

(c)
1 1.5
A ns 0.75 ns L 100 A 75 nH
2
2
(a)
L 0.1nH
Z0 31.62() Z0 50()
C 0.1 pF
Capacitive, Pull down
(b)
L
Let Z0
C
L
Add a capacitor C' , Z Z 0 Capacitive
C C'
L L'
Add an Inductor L ', Z Z 0 Inductive
C

L
Z < Z 0 Capacitive
C
The criterion is
L
Z > Z 0 Inductive
C
3
c
(a) r 4.3 r _ eff 3.24, v p 1.66 108 m / s
3.24
60(mm)
d1 361.4 ps
1.66 108 m / s
120(mm)
d2 722.9 ps
1.66 108 m / s
15(mm)
d3 90.3 ps
1.66 10 m / s
8

(Test Point)

(Device)
(b)
Time 2 d 3 2 90.3 180.6 ps
(c)
ld 3
2 d 3 40 ps d 3 20 ps 20 ps ld 3 v p 20 ps
vp

ld 3 3.32 mm
(d)
Wstub , Z 0 , T
If T is large enough, there will be no time skew at device.