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Abstract
The reliability of power electronics system such as three phase inverter is important in various applications. Different types of
faults occur in it, which may influence the operation of system. Such faults require unexpected maintenance, which increases the
cost of manufacturing. Therefore fault diagnosis of such devices plays vital role in industry. One possible fault that occurs in
inverter is an open switch fault. This paper provides a new technique based on diagnostic variable which detects single as well as
multiple open switch fault in three phase inverter. In this method, diagnostic variables are used to detect faulty phase. Along with
these diagnostic variables, an average current of three phase inverter is used for the detection of single as well as multiple faulty
switches.
97% with high power factor through all load and speed 3.2 Normalization of currents:
ranges. Fig. 1 shows basic structure of a three phase voltage
source inverter. In this model S1 to S6 are Insulated Gate The proposed method uses the dq transformation which
Bipolar Transistors (IGBTs) which can be on or off transforms three phase current into two phase. This method
Sinusoidal pulse width modulation (SPWM) is a common requires only three phase currents as inputs and it does not
technique for controlling the switches. The average value of require any extra sensors.
voltage fed to the load is controlled by turning the switch DQ Transformation
5
-1
-2
-3
-4
-5
-5 -4 -3 -2 -1 0 1 2 3 4 5
In open circuit fault condition, the IGBT falls in the off state
and remains in this situation regardless of the gate voltage
value. Open-circuit fault occurs due to lifting of bonding
wires caused by thermic cycling. It may be caused by a Fig -2: DQ transformation
driver fault or a short-circuit-fault-induced IGBT rupture.
Open circuit faults generally do not cause system shutdown, Therefore, system complexity reduces. The normalization of
but degrade its performance. Therefore, these diagnostic measured current is used to overcome the problem of
methods can be used in device-fault-tolerant systems. operating condition dependency and false diagnostics [8].
For normalization, dq transformation or Parks vector
3. FAULT DIAGNOSTIC METHOD: approach is used to calculate Parks vector modulus, given
as
+
3.1 Parks vector approach:
= (3)
The Parks vector approach or dq transformation is
mathematical transformation which simplifies three phase Where and are the Parks vector components. The
circuit. This method is used to transform three phase current normalization is done by dividing three phase current by
of voltage source inverter ( , , ) into two phase current Parks vector modulus. The normalized three phase current
( , ). The Parks vector components are given by [1], is given by,
2 1 1 (4)
= (1)
3
=
6 6
i = (i i )
Where n=a,b,c. Therefore, assuming that the motor is fed by
a healthy inverter generating a perfectly balanced three-
(2)
phase sinusoidal current system
= %& sin()* + + ,)
$
Using dq transformation the current patterns can be obtained
= %& sin -)* + + ,01
.
(5)
which indicates faulty situation of inverter current. It gives
/
#
different six patterns. A normal operation is represented by a =
= %& sin -)* + + + ,0
.
"
circle. If an open switch fault has occurred, there is a change
in the phase current value at the location of fault. Therefore, /
$ = sin ()* + + ,)
to measure the three phase current and voltage. Measuring
5
5
/ of current and voltage is done with different conditions.
# / /
(6) further processing.
5
5 = sin ()* + + + ,)
.
"
Table -1: Diagnostic signatures for faulty switch detection
/ /
Faulty Ea Eb Ec Ma Mb Mc
3.3 Average absolute value of currents: Switches
S1 P N N L - -
28 8 3
S6 N N P - - H
> S1,S2 D - - - - -
S3,S4 - D - - - -
3.4 Diagnostic variables: S5,S6 - - D - - -
The three diagnostic variables A (where n=a,b,c) are
S1,S3 P P N L L H
S2,S4 P P N H H L
obtained from the errors of the normalized currents average
S3,S5 N P P H L L
A = B (8)
absolute values, given by
K LA <0
detect faulty switches.
$0 L 0 A < N
O1
J = (9)
# P L NO A < N
" Q LA N
U L < 01
S =T
V L >0
(10)
_______________________________________________________________________________________
Volume: 02 Issue: 12 | Dec-2013, Available @ http://www.ijret.org 638
IJRET: International Journal of Research in Engineering and Technology eISSN: 2319-1163 | pISSN: 2321-7308
ea
-0.1
converts analog waveforms into digital values for
-0.2
to electrical signal and signal conditioning circuitry to 0 1000 2000 3000 4000 5000 6000 7000 8000
<IaN>
0.8 <IbN>
<IcN>
0.6
0.4
MATLAB for every fault mode. In this paper three distinct -0.4
-0.8
fault, a single-phase open-circuit fault (double fault in the 0 1000 2000 3000 4000 5000 6000 7000 8000
-3
immediately increases, -4
0 1000 2000 3000 4000 5000 6000 7000 8000 9000 10000
converging to a value of 0.23. The other two remaining
errors will decrease until they reach a value of (a)
Diagnostic Variables
approximately 0.08. S1 is upper switch of phase a, 0.6
ea
0.2
-0.1
Fig. 5 shows simulation results for single phase open circuit -0.2
fault in IGBT S1 and S2. In this case, the fault is introduced 0 2000 4000 6000 8000
0.2
-0.4
(c)
phase will decreases to negative value.
Three phase current of inverter
Fig -5: Simulation results of (a) inverter three phase
4
Ia current,(b) diagnostic variables and (c) normalized currents
3 Ib
2
Ic
average values when open switch fault introduced in switch
1 S1 and S2.
0
-1
-2 CONCLUSION
-3
-4
-5
0 1000 2000 3000 4000 5000 6000 7000 8000 9000 10000
In this paper, a new diagnosis scheme for three phase
inverter IGBT open switch faults is presented. In proposed
(a) method, three phase current of inverter is used as input to
_______________________________________________________________________________________
Volume: 02 Issue: 12 | Dec-2013, Available @ http://www.ijret.org 639
IJRET: International Journal of Research in Engineering and Technology eISSN: 2319-1163 | pISSN: 2321-7308
REFERENCES
_______________________________________________________________________________________
Volume: 02 Issue: 12 | Dec-2013, Available @ http://www.ijret.org 640
IJRET: International Journal of Research in Engineering and Technology eISSN: 2319-1163 |
pISSN: 2321-7308
___________________________________________________________________________
____________
Volume: 02 Issue: 12 | Dec-2013, Available @ http://www.ijret.org 641