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I = ×V
R
This is the most common form of the Ohm’s Law
L
R= ρ A and L describe the geometry of a sample or a wire.
A
The larger is the cross-section A the smaller is R, the higher is
the current.
The longer is the length L, the higher is R, the smaller is the
current;
σ=qnµ
Correspondingly, ρ = 1/(q n µ)
• Free electrons can freely move along the crystal (colliding with the atoms)
In metals, the atom-to-atom interactions free up one electron from each atom.
The metal crystals have as many free electrons as they do atoms.
Atom concentration N ~ 1023 atoms per 1 cm3. Free
electron concentration, n ~ 1023 cm-3
The metal conductivity is very high.
Silicon crystal
Silicon (Si) is the most important semiconductor material
Si crystal lattice structure, showing the valence electrons associated with each bond.
Note that each silicon atom now has eight valence electrons in the
neighborhood,
but that they are all shared, two with each of its four neighbors.
No free electrons!
Silicon crystal under illumination
The photons – elementary particles of light can break the bonds and
create free electrons in the Si crystal
Silicon crystal at elevated temperature
If the temperature is high enough the crystal lattice vibrates and delivers
extra energy to electrons
Free electrons in semiconductors
The term “free” means that the electrons can move around the crystal
Free electron concentration in semiconductors
• The probability for an electron to acquire the energy high enough
to break the atomic bonds is very low
• This probability is a very strong function of the temperature
(at higher temperatures the lattice vibrations are stronger)
∆EG
−
n = N 0 × e 2 kT
The energy unit used in micro-world - Electron-Volt:
1 eV = 1.6 ×10-19 J
Using the eV-units,
k × T ≈ 4 × 10-21 J ≈ 0.026 eV (at room temperature, T ≈300 K)
In most semiconductors,
EG ≈ (2…10)× 10-19 J = 1 – 3 eV;
In Si, EG = 1.1 eV.
Note, kT << ∆ EG.
Free electron concentration in Silicon
∆E
− G
n = N 0 × e 2 kT
for Si,
N0 ≈ 2×1019 cm-3
At room temperature: kT0 = 0.026 eV;
∆EG = 1.1 eV
∆EG/(2×kT) = 21.15; e -21.15 = 6.5× 10-10
n20C = 1.3×1010 cm-3
At 100 oC: kT = kT0×(397K/300K)
= 0.026 × 1.323 eV = 0.034 eV;
n100C = 1.9×1012 cm-3;
n is much smaller than the Si atom concentration NSi y1023 cm-3
Free electron concentration in Silicon
∆EG
−
n = N0 × e 2 kT
4.50E+14
4.00E+14
3.50E+14
3.00E+14
n, cm-3
When the electron leaves the Si atom, the latter is lacking one electron.
The bonds lacking an electron behave as free POSITIVE charges: holes
In pure (also called intrinsic) Si, free electrons and holes appear in PAIRS
EG
Ignoring the collisions, which are completely random, we can say that
average electron velocity (drift velocity) is proportional to the electric field E:
v~E
v=µE
µ is called the electron mobility: µ = v/E [(m/s)/(V/m) = m2/(V.s)]
Electron mobility example
Semiconductor
I
R1
∆EG I = V / R;
− Temperature
n = N0 × e 2 kT increases
4.50E+14
4.00E+14
3.50E+14 R2
3.00E+14
n, cm-3
R = ∆V/∆I R1 < R2 V
V
Thermistor I- V Characteristics
at different temperatures
0.25
Current - Voltage
0.2
t=27 C
t=77 C
Current, A
0.15 t=127 C
0.1
0.05
0
0 5 10 15 20 25
Voltage, V
Photoconductors
The current through the sample is
Under the illumination, the
concentration of electron and hole
pairs consists of the equilibrium
(dark) concentration and that of the
photoexcited carriers:
n = n0 + nph; p = p0 + pph;
Correspondingly, the current has
two components:
I = ID + Iph
ID – the “dark” current; IPh – the “photo” current
Photoresistor - the semiconductor light sensor
I
R1
I = V / R;
Light intensity
increases
R2
Semiconductor
∆I
∆V
R = ∆V/∆I R1 < R2 V