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In a tunnel junction
The tunnel junction is, in its simplest form,
a thin insulating barrier between two
conducting electrodes. If the electrodes
are superconducting, Cooper pairs (with a
charge of two elementary charges) carry
the current. In the case that the electrodes
are normalconducting, i.e. neither
superconducting nor semiconducting,
electrons (with a charge of one elementary
charge) carry the current. The following
reasoning is for the case of tunnel
junctions with an insulating barrier
between two normal conducting
electrodes (NIN junctions).
Single-electron transistor
Coulomb blockade
thermometer
A typical Coulomb blockade thermometer
(CBT) is made from an array of metallic
islands, connected to each other through a
thin insulating layer. A tunnel junction
forms between the islands, and as voltage
is applied, electrons may tunnel across
this junction. The tunneling rates and
hence the conductance vary according to
the charging energy of the islands as well
as the thermal energy of the system.
References
1. Prati E (2011). "Valley blockade quantum
switching in Silicon nanostructures". J
Nanosc Nanotech. 11 (10): 8522–8526.
arXiv:1203.5368 .
doi:10.1166/jnn.2011.4957 .
2. Crippa A; et al. (2015). "Valley blockade
and multielectron spin-valley Kondo effect
in silicon". Physical Review B. 92: 035424.
arXiv:1501.02665 .
Bibcode:2015PhRvB..92c5424C .
doi:10.1103/PhysRevB.92.035424 .
3. "nanoHUB.org - Resources: Coulomb
Blockade Simulation" .
doi:10.4231/d3c24qp1w .
4. Couto, ODD; Puebla, J (2011). "Charge
control in InP/(Ga,In)P single quantum dots
embedded in Schottky diodes". Physical
Review B. 84. arXiv:1107.2522 .
Bibcode:2011PhRvB..84l5301C .
doi:10.1103/PhysRevB.84.125301 .
5. Shin, S. J.; Lee, J. J.; Kang, H. J.; Choi, J.
B.; Yang, S. -R. E.; Takahashi, Y.; Hasko, D. G.
(2011). "Room-Temperature Charge Stability
Modulated by Quantum Effects in a
Nanoscale Silicon Island". Nano Letters. 11
(4): 1591–1597. arXiv:1201.3724 .
Bibcode:2011NanoL..11.1591S .
doi:10.1021/nl1044692 . PMID 21446734 .
6. Prati, E.; De Michielis, M.; Belli, M.; Cocco,
S.; Fanciulli, M.; Kotekar-Patil, D.; Ruoff, M.;
Kern, D. P.; Wharam, D. A.; Verduijn, J.;
Tettamanzi, G. C.; Rogge, S.; Roche, B.;
Wacquez, R.; Jehl, X.; Vinet, M.; Sanquer, M.
(2012). "Few electron limit of n-type metal
oxide semiconductor single electron
transistors". Nanotechnology. 23 (21):
215204. arXiv:1203.4811 .
Bibcode:2012Nanot..23u5204P .
doi:10.1088/0957-4484/23/21/215204 .
PMID 22552118 .
7. Wasshuber, Christoph (1997). "2.5
Minimum Tunnel Resistance for Single
Electron Charging". About Single-Electron
Devices and Circuits (Ph.D.). Vienna
University of Technology. Retrieved
12/5/2012. Check date values in:
|access-date= (help)
General
Single Charge Tunneling: Coulomb
Blockade Phenomena in Nanostructures,
eds. H. Grabert and M. H. Devoret
(Plenum Press, New York, 1992)
D.V. Averin and K.K Likharev, in
Mesoscopic Phenomena in Solids, eds.
B.L. Altshuler, P.A. Lee, and R.A. Webb
(Elsevier, Amsterdam, 1991)
Fulton, T.A. & Dolan, G.J. "Observation of
single-electron charging effects in small
tunnel junctions" Phys. Rev. Lett. 59, 109-
112 (1987),
doi:10.1103/PhysRevLett.59.109
External links
Computational Single-Electronics book
Coulomb blockade online lecture
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