Professional Documents
Culture Documents
Authors
Fabian Öttl Fabian.Oettl@omicronenergy.com
Martin Anglhuber Martin.Anglhuber@omicronenergy.com
Date
19.01.2017
Application Area
Rotating Machines
Version
v1.1
Document ID
ANP_16002_ENU
Abstract
This application note shows you how to perform Dissipation Factor (Power Factor) and Capacity
Measurements on rotating machines using the CPC 100 in combination with the CP TD1 and the CP CR500.
© OMICRON Page 1 of 34
Content
1 Safety instructions .......................................................................................................................... 3
2 Using this document ....................................................................................................................... 3
2.1 Operator qualifications and safety standards ............................................................................. 3
2.2 Safety measures ....................................................................................................................... 4
2.3 Related documents ................................................................................................................... 4
3 Dielectric measurement on rotating machines .............................................................................. 5
3.1 Dissipation factor theory............................................................................................................ 5
3.2 Dissipation factor vs. power factor ............................................................................................. 6
4 Preparing the dissipation factor test .............................................................................................. 8
4.1 CPC Editor and Test Card overview .......................................................................................... 8
4.1.1 Choosing the right parameter in the TanDelta PF test card ............................................................9
5 Measurement Setup .......................................................................................................................10
5.1 Compensation .........................................................................................................................11
5.1.1 Choosing the right compensation................................................................................................ 11
5.1.2 Steps to perform the compensation ............................................................................................ 15
5.1.3 OMICRON TD1 High-Voltage Source Test Card ......................................................................... 16
5.1.4 OMICRON Excel compensation tool ........................................................................................... 17
5.2 Preparation of the test object ...................................................................................................18
5.3 Buildup of the test circuit ..........................................................................................................18
5.3.1 Dissipation factor measurement between two phases ................................................................. 23
5.4 Overview: Dissipation factor measurement step by step ...........................................................24
6 Assessment of the measurement ..................................................................................................25
6.1 Influence of the end potential grading.......................................................................................25
6.1.1 Practical example ...................................................................................................................... 28
6.2 Fingerprint measurement .........................................................................................................29
6.2.1 Phase comparison ..................................................................................................................... 29
6.3 Parameters of the dissipation factor measurement ...................................................................30
6.3.1 Use cases ................................................................................................................................. 30
6.3.2 Capacitance measurement......................................................................................................... 32
6.3.3 Limitation of the measurement.................................................................................................... 33
Please use this note only in combination with the related product manual which contains several important safety
instructions. The user is responsible for every application that makes use of an OMICRON product.
OMICRON electronics GmbH including all international branch offices is henceforth referred to as OMICRON.
© OMICRON 2017. All rights reserved. This application note is a publication of OMICRON.
All rights including translation reserved. Reproduction of any kind, for example, photocopying, microfilming, optical character
recognition and/or storage in electronic data processing systems, requires the explicit consent of OMICRON. Reprinting,
wholly or in part, is not permitted.
The product information, specifications, and technical data embodied in this application note represent the technical status
at the time of writing and are subject to change without prior notice.
We have done our best to ensure that the information given in this application note is useful, accurate and entirely reliable.
However, OMICRON does not assume responsibility for any inaccuracies which may be present.
OMICRON translates this application note from the source language English into a number of other languages. Any
translation of this document is done for local requirements, and in the event of a dispute between the English and a non-
English version, the English version of this note shall govern.
DANGER
Death or severe injury caused by high voltage or current if the respective
protective measures are not complied.
Carefully read the content of this instruction as well as the manuals of the
involved devices before taking them in operation.
Contact OMICRON Support if you have any questions or doubts regarding
the safety or operating instructions.
Follow the instructions listed in the manuals, especially the safety
instructions, since this is the only way to avoid danger that can occur when
working on high voltage or high current systems.
Only use the involved equipment according to its intended purpose to
guarantee a safe operation.
Existing national safety standards for accident prevention and
environmental protection may supplement the equipment’s manual.
Only experienced and competent professionals that are trained for working in high voltage or high
current environments may perform this application note. Additional the following qualifications are
required:
• Authorized to work in environments of energy generation, transmission or distribution and
familiar with the approved operating practices in such environments.
• Familiar with the five safety rules.
• Good knowledge of the CPC 100, CP TD1 and CP CR500.
Moreover, additional relevant laws and internal safety standards have to be followed.
Title Description
Contains information on how to use the CPC 100 test system and
CPC 100 Reference Manual
relevant safety instructions.
Contains information on how to use the CP TD1 test system and
CP TD1 Reference Manual
relevant safety instructions.
Contains information on how to use the CP CR500 test system
CP CR500 Reference Manual
and relevant safety instructions
Application Guide: Capacitance and
Contains general information about dissipation factor (power
Dissipation Factor Measurement with
factor) measurement on different assets.
CPC 100 + CP TD1
Dielectric tests of rotating machines can help to identify potential insulation problems before defects
or damage occurs.
The dielectric measurement is performed with high AC voltage at nominal frequency in order to have
a close to realistic behavior of the insulation system. The test is non-destructive for healthy insulation
systems and is performed during a standstill of the machine.
Figure 1: Parallel equivalent circuit diagram and vector diagram of a rotating machine insulation system.
Applying a voltage to the parallel components causes a current IC to flow through the capacitance as
well as through the resistivity IR. The overall current I therefore has a resistive and a capacitive
component. A causal relation between losses and the resistive part can be assumed, as the higher
the losses are, the higher the resistive current will be. The angle δ = 90° - φ is caused by the resistive
part of the overall current and is proportional to the losses, which leads to the definition of the tan(δ)
expressed in Figure 1 as an indication of the overall condition of the insulation system of an electrical
machine:
1
tan(δ) =
ω ∗ 𝐶𝑃 ∗ 𝑅𝑃
IR = U/Rp
IC = ωCpU
𝐼𝑅
𝑃𝐹 = = cos 𝜑
𝐼
tan 𝛿
𝑃𝐹 =
√1 + tan² 𝛿
If the dissipation factor (tanδ) is very small – typically less than 10 %, which can be presumed as given
when measuring healthy electrical machine insulation, the dissipation factor and the power factor differ
in a negligible amount and can be assumed to have the same value. Table 1 gives an idea about this
statement.
Table 1: Comparison between correlating values of dielectric power factor cos(φ) and dielectric loss factor tan(δ) and their
difference (IEC 60034_27_3).
Switching between the two forms can be done in the CPC software very easy, which is explained in
Figure 2. For reasons of simplicity and to avoid repetition, only the dissipation factor is mentioned in
the following chapter. As the difference between dissipation factor and power factor is minimal. When
testing rotating machines, all of the statements in the following chapter apply to the dissipation factor
as well as to the power factor.
By opening the template file, the CPC editor appears with the test card combination shown in Figure
4. The default template consists of two comment test cards and eight dissipation factor test cards.
The build-up is shown according the test procedure and requires a capacitance measurement and a
check of the resonant circuit after the nameplate information of the generator. The reason for these
two measurements are explained in Chapter 5.
After performing the measurement, the Excel file loader template automatically adopts the
measurement data from the measurement file for a fast and easy report.
Both tools – the test template with the test cards and the excel file loader – can be adapted by the
user according to their needs.
For a detailed description of the CPC start page, please refer to the CPC 100 reference manual.
OMICRON suggests to measure the dissipation factor in steps of 10 % of the maximum voltage
defined for the machine. The resulting ramp is driven upwards (i.e. from 10 % to 100 % of the defined
maximum voltage) and downwards (from 100 % to i.e. 10 % of the maximum voltage).
The reason for driving the ramp in both directions is a plus on information out of the results (more
details are explained in Chapter 6).
Steps of 20 % of the test voltage are also common. The only difference to the OMICRON suggestion
is a lower resolution of the partial discharge measurement, which is potentially performed in parallel.
The voltage steps are defined in the Auto Test Point List in the TanDelta PF test card of the CPC. If
doing the measurement in steps up AND downwards, it is not possible to choose exactly the same
voltage for both ramps as no second auto test point with the same value can be set in the device. In
this case, simply choose a voltage which differs by 1 V (in the example in Figure 5 5999 V instead of
6000 V) from the chosen value.
Figure 5: (left side) Auto Test Points slightly differ in the upwards and downwards ramp; (right side) Number of measurements
for an averaging result.
As for rotating machines, the signal-to-noise level is much higher, so the noise suppression algorithm
is not needed. Additionally, the compensation (see Chapter 5.1) is optimized for one frequency.
Therefore, please set the default frequency in the device to a frequency different than the test
frequency.
A workaround could be to test at 50.01 Hz if 50Hz is the rated frequency, or 60.01 Hz with 60Hz as
rated frequency.
With the number of averaging marked in Figure 5, the number of measurements is chosen to
determine a single result.
In the example shown in Figure 5 above six measurements are averaged to one result and are
performed at each voltage step. When a PD measurement is performed simultaneously, the duration
of one voltage step can be varied by using the averaging number. On the CPC display (not in the CPC
editor), the approximate duration of the step is displayed when changing the value.
The measurement of the dissipation factor has to be performed in GSTg-A+B mode in order to guard
the current from the CP CR500 parallel path (see also Figure 16). The same applies to the capacitance
measurement. The resonance frequency check is performed in GST mode in order to measure the
whole measurement circuit.
5 Measurement Setup
To ensure a lightweight system with a minimum need of power, the OMICRON approach is to use a
parallel resonant system together with the test capacitance. This means that the test object’s large
capacitance (represented by CTest) would cause huge apparent power when applying high voltage. To
minimize this, the capacitance of the test object is compensated with parallel resonators (CR 500).
The remaining required power at rated frequency is caused by losses and the rest of the apparent
power which is not ideally compensated. This is supplied by the CPC 100 in combination with the CP
TD1. To get a better idea of the concept please refer to the following chapter on Compensation.
a) b)
Figure 6: Equivalent circuit diagram of the parallel resonance circuit with vector diagram.
Picture a) in Figure 6 represents an ideal parallel resonance circuit, where the theoretical capacity and
inductivity are free of losses. Picture b) in Figure 6 represents the vector diagram with real lossy
components. The compensation of the reactive part is not done in a perfect way, and the total current
Itotal has a real part as well. The real part results from the losses of the test object itself (resulting in the
loss angle δ in the picture), from losses in the cables to the test object and from the losses of the
compensation reactor.
Nevertheless Itotal is usually much smaller than the needed test current ITest at a certain voltage and
can be supplied by the CPC 100 in combination of the CP TD1.
By establishing a parallel resonant circuit, the capacitive reactive part ITr can be compensated by the
CP CR 500. Considering the ideal circuit in Figure 6, the system can be assumed in resonance if the
following condition is fulfilled:
1
= 2∗𝜋∗𝑓∗𝐿
2∗𝜋∗𝑓∗𝐶
f test frequency
C capacitance of test object
L compensator reactance
1
𝐿=
4 ∗ 𝜋2 ∗ 𝑓2 ∗ 𝐶
f test frequency
C capacitance of test object
L compensator reactance
In our example, a parallel reactor of LComp = 28.78 H would be required for a perfect compensation
displayed in Figure 8. The resulting current ITotal is the remaining sum of the active part from the lossy
inductance as well as from the lossy capacitance.
As OMICRON offers 80 H and 40 H reactors, the best compensation can be achieved by connecting
one 40 H reactor and an 80 H reactor in parallel, which results in a reactance of 26.6 H.
The current ITotal is now slightly higher than in Figure 9 and will be in the range of 100 mA depending
to the losses in the test object and the measurement circuit in general. Nevertheless, a perfect
compensation is not required as the CP TD1 can provide the required current of 100 mA without
problems.
The loss angle δ is not influenced as the current through the compensation coils is guarded.
In general, an inversely proportional relation between the test capacitance and the compensating
reactance is given (i.e. a larger capacitance requires a smaller compensating inductance – please see
the formulas above). Smaller values for the compensating inductance can be achieved by connecting
multiple CP CR500 reactors in parallel.
The following diagram shows the types and quantities of CR 500 that are required to compensate a
certain capacitance. It also shows the current ITotal, which is not compensated and has to be supplied
by the CPC 100 and the CP TD1. The test voltage is assumed as 12 kV, the maximum output current
of the CP TD1 is 300 mA.
Without any compensation, the CPC 100 in combination with the CP TD1 is able to supply an 80 nF
capacitive load. If the test object has a capacitance of e.g. 120nF, a compensating reactor of 80 H
needs to be connected in parallel to reach the 12 kV.
Compensating reactors have to be used to ensure the compensation of capacitances larger than 80 nF
and also for testing on nominal frequency. A combined 40 H/80 H can be used to compensate for
capacities up to about 450 nF. For larger capacitances, further 40 H reactors have to be connected in
parallel.
Due to the insulation level of the LV output of the CP CR 500, connecting in serial
of the coils is not permitted, and will cause a damage of the device!
Choosing the best measurement configuration, respectively the best compensation, is described in
the following Chapter 5.1.2.
The OMICRON test template for rotating machines in the CPC Start page provides the C-MEAS test
card for measuring the capacitance of the test object.
Measurement of the
capacitance on the test
object.
After getting the value for the phase-to-ground capacitance, the compensation calculation can be done
either:
Manually (please refer to the Chapter 5.1.1)
By using the OMICRON high-voltage test card
By using the OMICRON excel compensation tool
The TD1 High-Voltage Source Test Card is designed for using the CP TD1 as a high-voltage source,
but is not able to measure the dissipation factor. However, the feature to measure the capacitance,
calculate the compensation and to measure the resulting resonant frequency is available.
Suggested amount
and type of CR500 to
use and calculated
resonant frequency
Figure 14: View of the high-voltage test card by pressing the options button.
Figure 15: Input Form - All yellow cells are required input values provided by the use.
Test frequency: Frequency at which the test is performed (usually rated frequency).
Highest test voltage: The highest voltage reached during the test.
Test capacitance: Capacitance of the test object including additional capacitances (e.g.
coupling capacitors).
Available coils: Enter the amount of available coils for the measurement (Please note: the
amount of CR500 ≠ amount of coils, 1 x CR500 = 2 coils).
Recommended coil combination: Best combination of coils (with lowest current) for
compensation at the entered test frequency.
Actual inductance (with suggested coils): Total inductance as a result of the suggested
coils.
After you fill in the input form, click on the button “Optimize compensation” and all the calculations will
be executed.
1) Grounding Cable:
Before proceeding with the test setup or switching on the CPC 100, please ensure that all
devices are grounded properly.
The connection is done with the special accessory cable displayed in Figure 17 on the left
side, where the serial plug replaces the CPC 100 safety dongle, and the special plug
terminares the SAFETY A input (Figure 17, right side). The safety dongle also terminates the
SAFETY B plug. By using more than one CP CR500, the connection between the different CP
CR500 units is performed with the special accessory cable. The SAFETY B input of the last
CP CR500 is terminated by the safety dongle.
Figure 18: Connection cables from the CP CR500 to the test object and clamp for connection to the test object.
The CP CR500 cables are non-shielded cables and therefore they can be the starting point of
partial discharge activities, when touching ground potential. Especially when performing a
tan(delta) measurement and a partial discharge (PD) measurement in parallel, this factor
influences the PD measurement. The picture in Figure 19 on the right side shows a PD-free
test setup for a parallel measurement of the tan(delta) and PD activity of the machine.
Figure 19: Measurement set-up at a generator site for a combined dissipation factor and partial discharge
measurement (note that the red cables are not touching ground).
The picture on the left side in Figure 19 shows a fully-connected CP CR500 with the special
plug of the safety cable, the measurement cable from the CP TD1 connected to the banana
socket of the cable (blue banana plug) and the safety dongle terminating the safety B plug. In
this case, both coils of the CP CR500 are used. The housing is grounded via the grounding
cable and is connected at the grounding screw.
Important for not influencing the measurement results is the section at the high voltage
connection to the test object, which has a stress coating in order to ensure a smooth potential
grading from the high voltage to the cable shield.
Under high voltage, this section should not touch any grounded parts and respectively should
have a proper distance to any grounded part according to the high voltage output.
An example is shown in Figure 20, where the first section of the cable from the blocking
impedance BLI 1 is not touching any ground component.
Figure 21: Setup for dissipation factor measurement between phase U and V.
As the mode is changing from the guarded GST-mode (GST-A+B), the settings in the CPC test cards
have to be adapted as well. Using the setup described above channel B is the measurement input and
therefore the UST-B mode is selected (Figure 22).
• Analyze the test results by exporting the data to the Excel file loader
Analyzing the
results
Figure 23: Position of the End Potential Grading (EPG) at the single bar.
The semi conductive paint or tape causes a defined reduction of the high-voltage potential from the
soldering contacts to the grounded laminated core. Even if the insulation is applied at the end
winding area, this area is on high-voltage potential due to the capacitive coupling. The slot portion by
definition has ground potential, therefore a boundary surface with high potential gradients is created
at the end winding area.
Without the EPG, high electrical field gradients would appear at the laminated core, causing high
discharges as displayed in Figure 24.
Figure 24: Simulated field strength without EPG and with EPG.
Figure 25: Different test probes without EPG (top); EPG on the left side (middle); and with EPG (bottom) – (Weidner, 2008).
Silicon carbide (SiC) is the primary component and it is responsible for the behavior of the end potential
grading area during the dissipation factor test. It is well known in the abrasives industry and is applied
as a filler in a varnish or a tape component at the bar. The electrical behavior can be assumed as
micro-varistor. Its conduction mechanism is displayed in Figure 26.
Figure 26: Schematic illustration of the influence of different conduction mechanisms of a micro-varistor.
After reaching the breakdown voltage VBD, the micro-varistor acts as a conductor. For the dissipation
factor measurement this results in a voltage-dependent conducting behavior in the endwinding zone.
It acts as a bypass to the ground wall insulation. Depending on the material properties, the avalanche
point is reached sooner or later, and makes the dissipation factor measurement a fingerprint
measurement as stated above. This electrical behavior of the silicon carbide leads to the equivalent
circuit diagram shown in Figure 27.
Another influence of the EPG behavior can be seen in the capacitance measurement. As with higher
voltage, the SiC-layer becomes more and more conductive. Depending on the voltage, it “extends”
the OCP layer. Therefore, a rise in capacity value is normal during a measurement starting from 0.1 Un
up to 1.0 Un (Un is the highest test voltage). Also PD-activity (partial discharge activity) influences the
capacitance value by changing the dielectric properties of the voids in the insulation. The effect of
capacitance increase can be observed in every machine, no matter if they were in operation over
years (most likely high PD-activity) or new machines (most likely low PD-activity).
Figure 28: Current paths during a tan(delta) measurement – EPG currents are mentioned as “Surface Currents”.
The principle is explained in Figure 29, where the simulated slot section is representing the measuring
electrode and the guard electrodes were used as Input A or B in the CP TD1.
Figure 29: Modified limb of the coil according to IEEE 286/2000, 2001.
The results are represented in Figure 30, where on the left side the measurement setup without guard
electrodes and on the right side the measurement with guard electrodes are displayed.
For the measurement without guarding rings, a much higher increase of the tan(delta) can be
observed, as the EPG is relatively conductive and responsible for an almost linear increase. The initial
value for both diagrams is almost equal, since the EPG is not that conductive at 600V.
On the right side of Figure 30, the tan(delta) value is almost equal until 3kV and starts increasing
slowly up to 2% compared to 3.75% in the measurement setup without guard rings.
IMPORTANT:
Prior to cleaning the end winding area, please look for any traces of PD (e.g. white powder) and
document it for the parallel dissipation factor and PD-measurement (Figure 31).
The traces provide an indication of the PD activity in the end winding and also the possible failure
mechanism.
Figure 31: Partial discharge traces in the end winding area (“white powder”).
The comparison of different measurements over time under the same circumstances (i.e. end winding
surface, temperature, humidity) offers the best possibility to assess the condition of the winding.
By using the OMICRON approach with the decreasing ramp, a fifth parameter, the PD hysteresis, can
be included in the analysis. This gives a statement about the PD activity in the winding (keywords:
inception and extinction voltage). A higher tan(delta) hysteresis is an indicator of higher PD-activity in
the ground wall insulation. Generally an assessment can be done by comparing the absolute tan(delta)
values or using the graph of dissipation factor over voltage.
The example in Figure 33 shows a relatively constant dissipation factor value at lower voltages. At
4 kV, the EPG becomes more conductive. Approximately at the same voltage, PD activity also starts.
This was confirmed by the parallel PD measurement. The rise of tan(delta) is approximately 2 %
starting from 1 % at 1 kV up to 3 % at 12 kV.
The example in Figure 34 shows a generator from 1968 with low PD activity (no PD hysteresis until
6kV) and a relatively non-conductive EPG up to 4kV. In general the tan(delta) value is quite low for an
entire winding measurement and increases from 0.6 % up to 0.85 %.
Figure 35 shows results from a brand new generator. The machine shows no PD activity but has a
very conductive EPG. Therefore, the tan(delta) values are rising up to close to 4%. Another parameter
increasing the dissipation factor is the fact that the machine is a very slow hydro generator with
relatively short slot section but a high number of slots. This means a high-end winding surface area in
comparison with the slot portion.
As mentioned above in the EPG description, the capacitance will increase due to the behavior of the
semi conductive area. Figure shows two different capacitance measurements with a maximum
increment of ~3% and ~4%.
a) b)
Figure 36: Capacitance measurement of two different generators with an increment of the capacitance value of ~3% and ~4%.
Figure 36 a) is the capacitance measurement from the dissipation factor measurement in Figure 33
and Figure 36 b) is correlating with the measurement in Figure 32.
The latter case is potentially more severe regarding the longevity of the winding. In such cases, where
high dissipation factor values or high tip-up factor values can be observed, further investigations like
visual inspections or PD measurements should be executed.
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