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not measurement;

SENSITIVE I

MIL-STD-1Q5E
10 MAY 1989

SUPERSEDING
MIL-STD-1G5D
29 APRIL 1963

MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES

AMSC N/A AREA QCIC

DISTRIBUTI ON STATEMENT A. Approved for public release; distribution is unlimited.


MEL-STD-105E

DEPAKIfrENT OF DEFENSE
Washington, DC 20301

SAILING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

1. This military standard is approved for use by all Departments and Agencies
of the Department of Defense,

2. Beneficial comments (reccnmendations, additions, deletions) and any


pertinent data which may be of use in iirprcrving this document should be
addressed to:

Ccmnander
U.S. Army Armament Research, Development and
Engineering Center
ATTN: SMCAR-BAC-S/Blcig. 6
Picatinny Arsenal, NJ 07806-5000

by using the self-addressed Standardization Document Inprovement Proposal


(DD Form 1426) appearing at the end of this ctocument or letter.

li
MIL-STD-IOSE

FOREWORD

This publication provides sampling procedures and reference tables for use in
planning and conducting inspection by attributes- The sanpling concept is based
on the probabilistic recurrence of events when a series of lots or batches are
produced in a stable environment

This publication should be used to guide the user in the development of an


inspection strategy that provides a cost effective approach to attaining
confidence in product ccnpliance with contractual technical requirements . The
user is warned of the assumed risks relative to the chosen sairple size and
AQL.

Military specifications should not contain requirements for use of specific


sanpling plans, nor should they provide AQL's or LTPD's as a requirement.

Sanpling plans for continuous, rather than lot inspection, are contained in
MIL-STD-1235, "Single and Multi-Level Continuous Sanpling Procedures and Tables
for Inspection by Attributes".

111
MIL-STD-105E

CONTENTS
Page
Paragraph
1 . SCOPE . .
1

1.1 Purpose . . . *

1.2 Application • 1

2. REEERENCED DOOMENTS 1

2.1 Not applicable 1

3. DEFINITIONS • • 1

3.1 Acceptable Quality Level (AQL) 2


3.2 Average Outgoing Quality (AOQ) 2
3.3 Average Outgoing Quality Limit (AOQL) 2
3.4 Classification of Defects 2
3.5 Critical Defect 2
3.6 Critical Defective • 2
3.7 Defect. 2
3.8 De feet ive 3
3.9 *
Defects Per Hundred Units 3
3 10. Inspection. . . . 3
3.11 Inspection by Attributes 3
3.12 Lot or Batch 3
3.13 Lot or Batch Size 3
3.14 Major Defect 3
3.15 Major Defective. - • 3
3.16 Minor Defect 3
3.17 Minor Defective .3

3 18 Percent Defective 4
3 .19 Process Average 4
3.20 Sarrple 4
3.21 Sairple Size Code Letter 4
3.22 Sairpling Plan 4
3.23 Unit of Product 4

4. GENEK^.PEQUIREMENTS 4

4 . Written Procedures. 4
4.2 Nonconformance 4
4.3 Formation and Identification of Lots or Batches... 5
4.4 AQL 5
4.4.1 AQL Use 5
4.4.2. Limitation 5
4.4.3 Choosing AQLs 5

IV
MIL--STD-105E

CONTENTS - Continued.
Page
Paragraph
4.5 Sampling 5
4.5.1 Representative Sampling 5
4.5.2 Time of Sanpling... 5
4.5.3 Double or Multiple Sanpling 5
4 . Inspection Procedures. 6
4 . Switching Procedures 6
4.7.1 Normal to Tightened 6
4.7.2 Tightened to Normal 6
4.7.3 Normal to Reduced... 6
4.7.4 Reduced to Normal 6
4 . Discontinuation of Inspection 7
4 . Sanpling Plans . 7
4.9.1
4.9.2
4.9.3
Inspection Level
Code Letters
Ctotaining Sanpling Plan
- • — 7
7
7
4.9.4 Types of Sanpling Plans 8
4 . 10 Determination of Acceptability 8
4.10.1 Percent Defective Inspection 8
4.10.1.1 Single Sampling Plan.. 8
4.10.1.2 Double Sanpling Plan 8
4.10.1-3 Multiple Sanpling Plan 8
4.10.1.4 Special Procedure for Reduced Inspection 8
4 10 .2
. Defects Per Hundred Units Inspection 9
4 11 Limiting Quality Protection 9
4.12 Curves. 9
4.12.1 Operating Characteristic Curves 9
4.12.2 Average Sample Size Curves. 9

5. TABLES 11

Table
I . Sample Size Code Letters 13
II-A. Single Sanpling Plans for Normal
Inspection (Master table) 14
II-B. Single Sampling Plans for Tightened
Inspection (Master table) 15
II-C. Single Sampling Plans for Reduced
Inspection (Master table) 16
III-A. Double Sanpling Plans for Normal
Inspection (Master table) 17
III-B. Double Sampling Plans for Tightened
Inspection (Master table) 18
III-C. Double Sanpling Plans for Reduced
Inspection (Master table) 19

v
MTL-STD-1Q5E

CONTENTS - Continued.

Page
Table
IV-A. Multiple Sanpling Plans for Normal
Inspection (Master table) 20
IV-B. Multiple Sampling Plans for Tightened
Inspection (Master table) 22
IV-C. Multiple Sanpling Plans for Reduced
Inspection (Master table) 24
V-A. Average Outgoing Quality Limit Factors for
Normal Inspection (Single Sanpling) 26
V-B. Average Outgoing Quality Limit Factors for
Tightened Inspection (Single Sanpling) 27
VI-A. Limiting Quality (in Percent Defective) for
which a Pa = 10% (for Normal Inspection,
Single Sanpling) 28
VI-B. Limiting Quality (in Defects per Hundred
Units) for which the Pa = 10% (for Normal
Inspection, Single Sairpling) 29
VII-A. Limiting Quality (in Percent Defective) for
which the Pa - 5% (for Normal Inspection,
Single Sanpling) 30
VII-B. Limiting Quality (in Defects per Hundred
Units) for which the Pa « 5% (for Normal
Inspection, Single Sanpling) 31
VIII. Limit Nuntoers for Reduced Inspection 32
IX. Average Sanple Size Curves for Double and
Multiple Sanpling 33
Sanpling Plans and Operating Characteristic
Curves (and Data) for:
X-A. Sanple Size Code Letter A 34
X-B. Sanple Size Code Letter B 36
X-C. Sanple Size Code Letter C 38
X-D. Sanple Size Code Letter D 40
X-E. Sanple Size Code Letter E 42
X-F. Sanple Size Code Letter F 44
X-G. Sanple Size Code Letter G 46
X-H. Sanple Size Code Letter H - 48
X-J. Sanple Size Code Letter J 50
X-K. Sanple Size Code Letter K 52
X-L. Sanple Size Code Letter L . . 54
X-M. Sanple Size Code Letter M 56
X-N. Sanple Size Code Letter N 58
X-P. Sanple Size Code Letter P 60
X-Q. Sanple Size Code Letter Q. 62
X-R. Sanple Size Code Letter R •• 64

vi
MIL-STD-105E

CONTENTS - Continued.

Page

X-S. Sairple Size Code Letter S 66

Paragraph
6. NOTES 67

6. Intended Use • 67
6.2 Subject Term (keyword) Listing 67
6.3 Changes from Previous Issue 67

CONCLUDING MATERIAL 68

Vll
MIL-STD-105E

SAMPLING PROCEDURES AND TABLES


FOR INSPECTION BY ATTRIBUTES

1. SCOPE

1.1 Purpose . This publication establishes lot or batch sarrpling plans and
procedures for inspection by attributes. This publication shall not be inter-
preted to supercede or conflict with any contractual requirements. The words
"accept", "acceptance" , "acceptable" etc f refer only to the contractor's use of
f

the sampling plans contained in this standard and do not irrply an agreement by
the Government to accept any product. Determination of acceptability by the
Government shall be as described in contractual documents The sampling plans
.

described in this standard are applicable to AQL's of .01 percent or higher and
are therefore not suitable for applications where quality levels in the defective
parts per million range can be realized.

1.2 Application Sampling plans designated in this publication are applicable


.

but not limited, to inspection of the following:

a. End items.

b. Components and raw materials.

c. Operations or services.

d. Materials in process.

e. Supplies in storage.

f. Maintenance operations.

g. Data or records.

h. Administrative procedures.

These plans are intended primarily to be used for a continuing series of lots
or batches. The plans may also be used for the inspection of isolated lots or
batches, but, in this latter case, the user is cautioned to consult the operating
characteristic curves to find a plan which will yield the desired protection
(See 4.11)

2. REFERENCED DOOJMENTS

2.1 Not applicable.

3 DEFINITIONS
MIL-STD-105E

3.1 Acceptable Quality Level (AQL) . When a continuous series of lots is


considered, the AQL is the quality level which, for the purposes of sampling
inspection, is the limit of a satisfactory process average (See 3.19) .

NOTE: A sampling plan and an AQL are chosen in accordance with the risk assumed.
Use of a value of AQL for a certain defect or group of defects indicates that the
sairpling plan will accept the great majority of the lots or batches provided the
process average level of percent defective (or defects per hundred units) in these
lots or batches be no greater than the designated value of AQL. Thus, the AQL is
a designated value of percent defective (or defects per hundred units) for which
lots will be accepted most of the time by the sairpling procedure being used. The
sanpling plans provided herein are so arranged that the probability of acceptance
at the designated AQL value depends upon the sanple size, being generally higher
for large sanples than for small ones, for a given AQL- The AQL alone does not
identify the chances of accepting or rejecting individual lots or batches but more
directly relates to what might be expected from a series of lots or batches,
provided the steps indicated in this publication are taken. It is necessary to
refer to the operating characteristic curve of the plan to determine the relative
risks*

3.2 Average Outgoing Quality (AOQ) . For a particular process average, the AOQ is
the average quality of outgoing product including all accepted lots or batches,
plus all rejected lots or batches after the rejected lots or. batches have been
effectively 100 percent inspected and all defectives replaced by non-defectives.

3.3 Average Outgoing Quality Limit (AOQL)


1
. The AOQL is the maximum AOQ fora
given~acciptance sampling' plaru" Factors for ccnputing AOQL values are given in
Table V-A for each of the single sampling plans for normal inspection and in
Table V-B for each of the single sampling plans for tightened inspection.

3.4 Classification of Defects . A classification of defects is the enumeration of


possible defects of the unit of product classified according to their seriousness.

3.5 Critical Defect . A critical defect is a defect that judgement and experience
indicate would result in hazardous or unsafe conditions for individuals using,
naintaining, or depending upon the product, or a defect that judgement and
experience indicate is likely to prevent performance of the tactical function of a
major end item such as a ship, aircraft, tank, missile, or space vehicle.

3.6 Critical Defective . A critical defective is a unit of product which


contains one "or more critical defects and may also contain major and/ or minor
defects

3.7 Defect. A defect is any nonconformance of the unit of product with


specified requirements
MI.L-STD-105E

3.8 Defective . A defective is a unit of product which contains one or more


defects.

3.9 Defects per Hundred Unit s. The number of defects per hundred units of any
given quantity of units of product is one hundred times the nurriber of defects
contained therein (one or more defects being possible in any unit of product)
divided by the total number of units of product, i.e.

Defects per = Number of defects x 100


hundred units Number of units inspected

3.10 Inspection . Inspection is the process of measuring/ examining, testing,


or otherwise comparing the unit of product with the requirements.

3.11 Inpection by Attributes Inspection by attributes is inspection whereby


either the unit of product is classified siirply as defective or non-defective, or
the. number of defects in the unit of product is counted, with respect to a given
requirement or set or requirements.

3.12 Lot or Batch . The term lot or batch shall mean "inspection lot" or
"inspection batch", i.e., a collection of units of product from which a sample
is to be drawn and inspected and may differ from a collection of units designated
as a lot or batch for other purposes (e.g., production, shipment, etc.) .

3 13
. Lot or Batch Size . The lot or batch size is the number of units of product
in a lot or batch.

3.14 Major Defect . A major defect is a defect, other than critical, that is
likely to result in failure, or to reduce materially the usability of the unit
of product for its intended purpose.

3 15 Major Defective
. A major defective is a unit of product which contains one
.

or more major defects, and may also contain minor defects but contains no critical
defect

3.16 Minor Defect . A minor defect is a defect that is not likely to reduce
materially the usability of the unit of product for its intended purpose, or is a
departure from established standards having little bearing on the effective use or
operation of the unit.

3.17 Minor Defective A minor defective is a unit of product which contains one
.

or more minor defects but contains no critical or major defect.


MIL-SID-IOSE

3.18 Percent Defective The percent defective of any given quantity of units
.

of product is one hundred tines the number of defective units of product contained
therein divided by the total number of units of product, i.e.:

Percent Defective * Number of defectives x 100


Number of units inspected

3.19 process Average The process average is the average percent defective or
.

average number of defects per hundred units (whichever is applicable) of product


submitted by the supplier for original inspection. Original inspection is the
first inspection of a particular quantity of product as distinguished from the
inspection of product which has been resubmitted after prior rejection.

3.20 Sample . A sairple consists of one or more units of product drawn from a lot
or batch, the units of the sairple being selected at random without regard to their
quality. The number of units of product in the sairple is the sairple size.

3.21 Sample Size Code Letter The sample size code letter is a device used
.

along with the AQL for locating a sampling plan on a table of sampling plans.

3.22 Sanpling Plan , A sampling plan indicates the number of units of product
from each lot or batch which are to be inspected (sanple size or series of
sanple sizes) and the criteria for determining the acceptability of the lot or
batch (acceptance and rejection numbers)

3.23 Unit of Product The unit of product is the "thing inspected in order to
.

determine its classification as defective or non-defective or to count the number


of defects. It may be a single article, a pair, a set, a length, an area, an
operation, a volume, a conponent of an end product, or the end product itself.
The unit of product may or may not be the same as the unit of purchase, supply,
production, or shipment.

4. GENERAL REQUIREMENTS

4.1 Written Procedures Written procedures are ordinarily developed and made
.

available for the Government representative's review, upon request. When the
written procedures indicate use of this standard, they shall cortply with the
requirements of this standard and reference appropriate parts as necessary.

4.2 Nonconformance The extent of nonconformance of product shall be expressed


. '

either in terms of percent defective or in terms of defects per hundred units.


MIL-STD-105E

4.3 Formation and Identification of Lots or Batches. The product shall be


assembled into identifiable lots, sublets, batches, or in such other manner as
may be prescribed. Each lot or batch shall, as far as is practicable, consist
of units of product of a single type, grade, class, size, and composition,
manufactured under essentially the same conditions, and at essentially the same
time. The lots or batches shall be identified by the contractor and shall be kept
intact in adequate and suitable storage space.

4.4 AQL .

4.4.1 AQL Use . The AQL, together with the Sample Size Code Letter, is used for
indexing the sampling plans provided herein.

4.4.2 Limitation . The selection or use of an AQL shall not iirply that the
contractor has the right to simply any defective unit of product.

4.4.3 Choosing AQLs . Different AQLs may be chosen for groups of defects
considered collectively, or for individual defects. An AQL for a group of defects
may be chosen in addition to AQLs for individual defects, or subgroups, within
that group. AQL values of 10.0 or less may be expressed either in percent
defective or in defects per hundred units; those over 10.0 shall be expressed in
defects per hundred units only.

4.5 Sampling .

4.5.1 Representative (Stratified) Sampling When appropriate, the number of


.

units in the sample shall be selected in proportion to the size of sublots or


sub-batches, or parts of the lot or batch, identified by sane rational criterion.
When representative sampling is used, the units from each sublet, sub-batch or
part of the lot or batch shall be selected at randan.

4.5.2 Ting o f Sampling . A sanple may be drawn after all the units comprising
the lot or batch have been assembled, or sample units may be drawn during assembly
of the lot or batch, ijn which case the size of the lot or batch will be determined
before any sanple units are drawn. If the sanple units are drawn during assembly
of the lot or batch, and if the rejection number is reached before the lot is
completed, that portion of the lot already completed shall be rejected. The cause
of the defective product shall be cteterndned and corrective action taken, after
which a new lot or batch shall be begun.

4.5.3 Double or Multiple Sampling . When double or multiple sampling is to be


used, each sanple shall be selected over the entire lot or batch.
MIL-STD-105E

4.6 Inspection Procedures . Normal inspection will be used at the start of


inspection. Normal, tightened or reduced inspection shall continue unchanged for
each class of defects or defectives on successive lots or batches except where the
switching procedures given below require change. The switching procedures shall
be applied to each class of ctefects or defectives independently.

4.7 Switching Procedures .

4.7.1 Normal to Tightened When normal inspection is in effect, tightened


.

inspection shall be instituted when 2 out of 2, 3, 4, or 5 consecutive lots or


batches have been rejected on original inspection (i.e., ignoring resubmitted lots
or batches for this procedure)

4.7.2 Tightened to Normal . When tightened inspection is in effect, normal


inspection shall be instituted when 5 consecutive lots or batches have been
considered acceptable on original inspection.

4.7.3 Normal to Reduced . When normal inspection is in effect, reduced inspection


shall be instituted provided that all of the following conditions are satisfied:

a. The preceding 10 lots or batches (or more, as indicated by the note to


Table VIII) have been on normal inspection and all have been accepted on original
inspection; and

b. The total number of defectives (or defects) in the sanples from the
preceding 10 lots or batches (or such other number as was used for condition "a"
above) is equal to or less than the applicable number given in Table VIII. If
double or multiple sairpling is in use, all samples inspected should be included,
not " first sanples only; and
,f

c. Production is at a steady rate; and

d. Reduced inspection is considered desirable.

4.7.4 Reduced to Normal . When reduced inspection is in effect, normal inspection


shall be instituted if any of the following occur on original inspection:

a. A lot or batch is rejected; or

b. A lot or batch is considered acceptable under the procedures of


4.10.1.4, or

c. Production becomes irregular or delayed; or

d. Other conditions warrant that normal inspection shall be instituted.


MIL-STD-105E

4.8 Discontinuation of Inspection If the currenulative number of lots not


,

accepted in a sequence of consecutive lots on original tightened inspection


reaches five, the acceptance procedures of this standard shall be discontinued.
Inspection under the provisions of this standard shall not be resumed until
corrective action has been taken. Tigthened inspection shall then be used as if
4.7.1 had been invoked.

4.9 Sampling Plans .

4.9.1 Inspection Level . The inspection level determines the relationship between
the lot or batch size and the sample size. The inspection level to be used for
any particular requironent will be as prescri±)ed by the contractor's written
procedures. Three inspection levels: I, II, and III, are given in Table I for
general use (see 4.1) Normally, Inspection Level II is used. However,
.

Inspection Level I may be used when less discrimination is needed, or Level III
may be used for greater discrimination. Four additional special levels:
S-l, S-2, S-3, and S-4, are given in the same table and may be used where
relatively small sample sizes are necessary and large sampling risks can or must
be tolerated.

NOTE: In the selection of inspection levels S-l to S-4, care must be exercised to
avoid AQLs inconsistent with these inspection levels. In other words, the purpose
of the special inspection levels is to keep sanples small when necessary. For
instance, the code letters under S-l go no further than D, equivalent to a single
sample of size 8, but it is of no use to choose S-l if the AQL is 0.10 percent for
which the minimum sample is 125.

4.9.2 Code letters . Sairple sizes are designated by code letters. Table I shall
be used to find the applicable code letter for the particular lot or batch size
and the prescribed inspection level.

4.9.3 Obtaining Sampling Plan .The AQL and the code letter shall be used to
obtain the sampling plan from Tables II, III, or IV. When no sampling, plan is
available for a given combination of AQL and code letter, the tables direct the
user to a different letter. The sample size to be used is given by the new code
letter, not by the original letters If this procedure leads to different sample
sizes for different classes of defects, the code letter corresponding to the
largest .sample size derived may be used for all classes of defects
. As an
alternative to a single sampling plan with an acceptance number of 0, the plan
with an acceptance number of 1 with its correspondingly larger sample size for a
designated AQL (where available) , may be used.
MIL-STD-105E

4 9 4 Tvpes of Sampl ing Plans Three types of sampling plans: Single, Double,
.

IV, respectively. When several


and Wtiple, are given in Tables II, III, and
and code letter, any one may be used.
types of plans are available for a given AQL when available
multiple,
A decision as to type of plan, either single, double, or comparison between
based upon the
for a given AOL and code letter, will usually be plans.
sizes of the available
the administrative difficulty and the average sample in the
for double (except
The average sample size of multiple plans is less than
both of these are always
case corresponding to single acceptance number 1) and
less than a single sample size (see Table IX)
Usually the administrative
.

sample are less than


difficulty for single sampling and the cost per unit of the
for double or multiple.

4.10 Determination of Acceptability .

4 10 l percent Defective Inspection To determine acceptability of a lot or


.

plan shall be
batch under percent defective inspection, the applicable sampling
4.10.1.3, and 4.10.1.4.
used in accordance with 4.10.1.1, 4.10.1.2,

4.10.1.1 Single Sampling Plan The number of sample units inspected shall be
. _

defectives found in
equal to the sample size given by the plan. If the number of
than the acceptance number, the lot or batch shall
the sample is equal to or less
be considered acceptable. If the number of defectives is equal to or greater than
the rejection number, the lot or batch shall be rejected.

4.10.1.2 Double Sampling Plan A number of sample units equal to the first
.

sample size given by the plan shall be inspected. If the number of defectives
found in the first sample is 'equal to or less than the first acceptance number,
the lot or batch shall be considered acceptable. If the number of defectives
rejection number,
found in the first sample is equal to or greater than the first
in the
the lot or batch shall be rejected. If the number of defectives found
first sample is between the first acceptance and rejection numbers, a
second
found in
sample of the same size shall be inspected. The number of defectives
If the cumulative number of
the first and second samples shall be accumulated.
or batch
defectives is equal to or less than the second acceptance number, the lot
is equal
shall be considered acceptable. If, the cumulative number of defectives
shall be
to or greater than the second rejection number, the lot or batch
rejected.
shall be
4.10.1.3 Multiple Sample Plan . Under multiple sampling, the procedure
similar to that specified in 4.10.1.2, except that the number of successive
samples required to reach a decision may be as many as seven.

4.10.1.4 Special Procedure for Reduced Inspection Under reduced inspection, the
.

sampling procedure may terminate without either acceptance or re ject ion criteria
^

having been met. In these circumstances, the lot or batch will be considered
lot or
acceptable, but normal inspection will be reinstated starting with the next
batch (see 4.7.4.b) .
MEL-STD-105E

4.10.2 Defects per Hundred Ooits Inspection . To determine the acceptability of a


lot or batch under defects per hundred units inspection, the procedure specified
for percent defective inspection above shall be used, except that the word
"defects" shall be substituted for "defect ives".

4.11 o«iHty Protection . The sampling plans and associated procedures


T.4TTi-n--!og

given in this publication were designed for use where the units of product are
produced in a continuing series of lots or batches over a period of time. However,
if the lot or batch is of an isolated nature, it is desirable to limit the
selection of sampling plans to those, associated with a designated AOL value, that
provide not less than a specified limiting quality protection. Sampling plans for
this purpose can be selected by choosing a Limiting Quality (LQ) and a consumer'
risk to be associated with it. Tables VT and VTI give values of LQ for the
the commonly used consumer's risks of 10 percent and 5 percent respectively. If a
different value of consumer's risk is required, the O.C. curves and their tabu-
lated values may be used. The concept of LQ may also be useful in specifying the
AQL and Inspection Levels for a series of lots or batches, thus fixing minimum
sample size where there is some reason for avoiding (with more than a given
consumer' s risk) more than a limiting proportion of defectives (or defects) in any
single lot or batch.

4.12 Curves .

4.12.1 Operating Characteristic Curves . The operating characteristic curves for


normal inspection, shown in Table X, indicate the percentage of lots or batches
which may be expected to be accepted under the various sampling plans for a given
process quality. The curves shown are for single sampling; curves for double and
multiple sampling are matched as closely as practicable. The O.C. curves shown
for AQLs greater than 10.0 are based on the Poisson distribution and are appli-
cable for defects per hundred units inspection; those for AQLs of 10.0 or less and
sample sizes of 80 or less are based on the binomial distribution and are
applicable for percent defective inspection; those for .AQLs of 10.0 or less and
sample sizes larger than 80 are based the Poisson distribution and are applicable
either for defects per hundred units inspection, or for percent defective
inspection (the Poisson distribution being an adequate approximation to the
binrmial distribution under these conditions) . Tabulated values, corresponding to
selected values or probabilities of acceptance (Pa, in percent) are given for each
of the curves shown, and, in addition, for tightened inspection, and for defects
per hundred units for AQLs of 10.0 or less and sample sizes of 80 or less.

4.12.2 Average Sample Size Curves . Average sample size curves for double and
multiple sampling are in Table IX. These show the average sample sizes which may
be expected to occur under the various sampling plans for given levels of process
quality. The curves assume no curtailment of inspection and are approximate to
the extent that they are based upon the Poisson distribution, and that the sample
sizes for double and multiple sampling are assumed to be 0.631n and 0.25n
respectively, where n is the equivalent sample size.
MH-STD-105E

SECTION 5

TABLES AND CURVES

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MIL-STD-105E

6. NOTES

6.1 Intended Use Sampling procedures and tables for inspection by


.

attributes are intended to be used in the acquisition of Defense material.

6.2 Subject Term (Key Word) Listing ,

Acceptable Quality Level (AQL)

Average Outgoing Quality (AOQ)

Defect

Defective

Lot or Batch

Process Average

Sanple

Sampling Plan

Unit of Product

6.3 Changes from Previous Issue Vertical lines or asterisks are not used in
.

this revision to identify changes with respect to the previous issue due to
'

the extensiveness of the changes.

67
MIL-STD-105E

CONCLUDING MATERIAL

CXist odians Preparing Activity:


Army - AR Army - AR
Navy - OS
Air Force - 23

Review Activities:
Army - MI, EA, TE, AV, ER (Project QCIC-0085)
Navy - AS, EC, IVC, CM, SA,
SH, ID, YD
DLA - ES, GS, SS
OSD - IP, SO

User Activities:
Army - ME
DLA - ES, SS

68

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