Professional Documents
Culture Documents
SENSITIVE I
MIL-STD-1Q5E
10 MAY 1989
SUPERSEDING
MIL-STD-1G5D
29 APRIL 1963
MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES
DEPAKIfrENT OF DEFENSE
Washington, DC 20301
1. This military standard is approved for use by all Departments and Agencies
of the Department of Defense,
Ccmnander
U.S. Army Armament Research, Development and
Engineering Center
ATTN: SMCAR-BAC-S/Blcig. 6
Picatinny Arsenal, NJ 07806-5000
li
MIL-STD-IOSE
FOREWORD
This publication provides sampling procedures and reference tables for use in
planning and conducting inspection by attributes- The sanpling concept is based
on the probabilistic recurrence of events when a series of lots or batches are
produced in a stable environment
Sanpling plans for continuous, rather than lot inspection, are contained in
MIL-STD-1235, "Single and Multi-Level Continuous Sanpling Procedures and Tables
for Inspection by Attributes".
111
MIL-STD-105E
CONTENTS
Page
Paragraph
1 . SCOPE . .
1
1.1 Purpose . . . *
1.2 Application • 1
2. REEERENCED DOOMENTS 1
3. DEFINITIONS • • 1
3 18 Percent Defective 4
3 .19 Process Average 4
3.20 Sarrple 4
3.21 Sairple Size Code Letter 4
3.22 Sairpling Plan 4
3.23 Unit of Product 4
4. GENEK^.PEQUIREMENTS 4
4 . Written Procedures. 4
4.2 Nonconformance 4
4.3 Formation and Identification of Lots or Batches... 5
4.4 AQL 5
4.4.1 AQL Use 5
4.4.2. Limitation 5
4.4.3 Choosing AQLs 5
IV
MIL--STD-105E
CONTENTS - Continued.
Page
Paragraph
4.5 Sampling 5
4.5.1 Representative Sampling 5
4.5.2 Time of Sanpling... 5
4.5.3 Double or Multiple Sanpling 5
4 . Inspection Procedures. 6
4 . Switching Procedures 6
4.7.1 Normal to Tightened 6
4.7.2 Tightened to Normal 6
4.7.3 Normal to Reduced... 6
4.7.4 Reduced to Normal 6
4 . Discontinuation of Inspection 7
4 . Sanpling Plans . 7
4.9.1
4.9.2
4.9.3
Inspection Level
Code Letters
Ctotaining Sanpling Plan
- • — 7
7
7
4.9.4 Types of Sanpling Plans 8
4 . 10 Determination of Acceptability 8
4.10.1 Percent Defective Inspection 8
4.10.1.1 Single Sampling Plan.. 8
4.10.1.2 Double Sanpling Plan 8
4.10.1-3 Multiple Sanpling Plan 8
4.10.1.4 Special Procedure for Reduced Inspection 8
4 10 .2
. Defects Per Hundred Units Inspection 9
4 11 Limiting Quality Protection 9
4.12 Curves. 9
4.12.1 Operating Characteristic Curves 9
4.12.2 Average Sample Size Curves. 9
5. TABLES 11
Table
I . Sample Size Code Letters 13
II-A. Single Sanpling Plans for Normal
Inspection (Master table) 14
II-B. Single Sampling Plans for Tightened
Inspection (Master table) 15
II-C. Single Sampling Plans for Reduced
Inspection (Master table) 16
III-A. Double Sanpling Plans for Normal
Inspection (Master table) 17
III-B. Double Sampling Plans for Tightened
Inspection (Master table) 18
III-C. Double Sanpling Plans for Reduced
Inspection (Master table) 19
v
MTL-STD-1Q5E
CONTENTS - Continued.
Page
Table
IV-A. Multiple Sanpling Plans for Normal
Inspection (Master table) 20
IV-B. Multiple Sampling Plans for Tightened
Inspection (Master table) 22
IV-C. Multiple Sanpling Plans for Reduced
Inspection (Master table) 24
V-A. Average Outgoing Quality Limit Factors for
Normal Inspection (Single Sanpling) 26
V-B. Average Outgoing Quality Limit Factors for
Tightened Inspection (Single Sanpling) 27
VI-A. Limiting Quality (in Percent Defective) for
which a Pa = 10% (for Normal Inspection,
Single Sanpling) 28
VI-B. Limiting Quality (in Defects per Hundred
Units) for which the Pa = 10% (for Normal
Inspection, Single Sairpling) 29
VII-A. Limiting Quality (in Percent Defective) for
which the Pa - 5% (for Normal Inspection,
Single Sanpling) 30
VII-B. Limiting Quality (in Defects per Hundred
Units) for which the Pa « 5% (for Normal
Inspection, Single Sanpling) 31
VIII. Limit Nuntoers for Reduced Inspection 32
IX. Average Sanple Size Curves for Double and
Multiple Sanpling 33
Sanpling Plans and Operating Characteristic
Curves (and Data) for:
X-A. Sanple Size Code Letter A 34
X-B. Sanple Size Code Letter B 36
X-C. Sanple Size Code Letter C 38
X-D. Sanple Size Code Letter D 40
X-E. Sanple Size Code Letter E 42
X-F. Sanple Size Code Letter F 44
X-G. Sanple Size Code Letter G 46
X-H. Sanple Size Code Letter H - 48
X-J. Sanple Size Code Letter J 50
X-K. Sanple Size Code Letter K 52
X-L. Sanple Size Code Letter L . . 54
X-M. Sanple Size Code Letter M 56
X-N. Sanple Size Code Letter N 58
X-P. Sanple Size Code Letter P 60
X-Q. Sanple Size Code Letter Q. 62
X-R. Sanple Size Code Letter R •• 64
vi
MIL-STD-105E
CONTENTS - Continued.
Page
Paragraph
6. NOTES 67
6. Intended Use • 67
6.2 Subject Term (keyword) Listing 67
6.3 Changes from Previous Issue 67
CONCLUDING MATERIAL 68
Vll
MIL-STD-105E
1. SCOPE
1.1 Purpose . This publication establishes lot or batch sarrpling plans and
procedures for inspection by attributes. This publication shall not be inter-
preted to supercede or conflict with any contractual requirements. The words
"accept", "acceptance" , "acceptable" etc f refer only to the contractor's use of
f
the sampling plans contained in this standard and do not irrply an agreement by
the Government to accept any product. Determination of acceptability by the
Government shall be as described in contractual documents The sampling plans
.
described in this standard are applicable to AQL's of .01 percent or higher and
are therefore not suitable for applications where quality levels in the defective
parts per million range can be realized.
a. End items.
c. Operations or services.
d. Materials in process.
e. Supplies in storage.
f. Maintenance operations.
g. Data or records.
h. Administrative procedures.
These plans are intended primarily to be used for a continuing series of lots
or batches. The plans may also be used for the inspection of isolated lots or
batches, but, in this latter case, the user is cautioned to consult the operating
characteristic curves to find a plan which will yield the desired protection
(See 4.11)
2. REFERENCED DOOJMENTS
3 DEFINITIONS
MIL-STD-105E
NOTE: A sampling plan and an AQL are chosen in accordance with the risk assumed.
Use of a value of AQL for a certain defect or group of defects indicates that the
sairpling plan will accept the great majority of the lots or batches provided the
process average level of percent defective (or defects per hundred units) in these
lots or batches be no greater than the designated value of AQL. Thus, the AQL is
a designated value of percent defective (or defects per hundred units) for which
lots will be accepted most of the time by the sairpling procedure being used. The
sanpling plans provided herein are so arranged that the probability of acceptance
at the designated AQL value depends upon the sanple size, being generally higher
for large sanples than for small ones, for a given AQL- The AQL alone does not
identify the chances of accepting or rejecting individual lots or batches but more
directly relates to what might be expected from a series of lots or batches,
provided the steps indicated in this publication are taken. It is necessary to
refer to the operating characteristic curve of the plan to determine the relative
risks*
3.2 Average Outgoing Quality (AOQ) . For a particular process average, the AOQ is
the average quality of outgoing product including all accepted lots or batches,
plus all rejected lots or batches after the rejected lots or. batches have been
effectively 100 percent inspected and all defectives replaced by non-defectives.
3.5 Critical Defect . A critical defect is a defect that judgement and experience
indicate would result in hazardous or unsafe conditions for individuals using,
naintaining, or depending upon the product, or a defect that judgement and
experience indicate is likely to prevent performance of the tactical function of a
major end item such as a ship, aircraft, tank, missile, or space vehicle.
3.9 Defects per Hundred Unit s. The number of defects per hundred units of any
given quantity of units of product is one hundred times the nurriber of defects
contained therein (one or more defects being possible in any unit of product)
divided by the total number of units of product, i.e.
3.12 Lot or Batch . The term lot or batch shall mean "inspection lot" or
"inspection batch", i.e., a collection of units of product from which a sample
is to be drawn and inspected and may differ from a collection of units designated
as a lot or batch for other purposes (e.g., production, shipment, etc.) .
3 13
. Lot or Batch Size . The lot or batch size is the number of units of product
in a lot or batch.
3.14 Major Defect . A major defect is a defect, other than critical, that is
likely to result in failure, or to reduce materially the usability of the unit
of product for its intended purpose.
3 15 Major Defective
. A major defective is a unit of product which contains one
.
or more major defects, and may also contain minor defects but contains no critical
defect
3.16 Minor Defect . A minor defect is a defect that is not likely to reduce
materially the usability of the unit of product for its intended purpose, or is a
departure from established standards having little bearing on the effective use or
operation of the unit.
3.17 Minor Defective A minor defective is a unit of product which contains one
.
3.18 Percent Defective The percent defective of any given quantity of units
.
of product is one hundred tines the number of defective units of product contained
therein divided by the total number of units of product, i.e.:
3.19 process Average The process average is the average percent defective or
.
3.20 Sample . A sairple consists of one or more units of product drawn from a lot
or batch, the units of the sairple being selected at random without regard to their
quality. The number of units of product in the sairple is the sairple size.
3.21 Sample Size Code Letter The sample size code letter is a device used
.
along with the AQL for locating a sampling plan on a table of sampling plans.
3.22 Sanpling Plan , A sampling plan indicates the number of units of product
from each lot or batch which are to be inspected (sanple size or series of
sanple sizes) and the criteria for determining the acceptability of the lot or
batch (acceptance and rejection numbers)
3.23 Unit of Product The unit of product is the "thing inspected in order to
.
4. GENERAL REQUIREMENTS
4.1 Written Procedures Written procedures are ordinarily developed and made
.
available for the Government representative's review, upon request. When the
written procedures indicate use of this standard, they shall cortply with the
requirements of this standard and reference appropriate parts as necessary.
4.4 AQL .
4.4.1 AQL Use . The AQL, together with the Sample Size Code Letter, is used for
indexing the sampling plans provided herein.
4.4.2 Limitation . The selection or use of an AQL shall not iirply that the
contractor has the right to simply any defective unit of product.
4.4.3 Choosing AQLs . Different AQLs may be chosen for groups of defects
considered collectively, or for individual defects. An AQL for a group of defects
may be chosen in addition to AQLs for individual defects, or subgroups, within
that group. AQL values of 10.0 or less may be expressed either in percent
defective or in defects per hundred units; those over 10.0 shall be expressed in
defects per hundred units only.
4.5 Sampling .
4.5.2 Ting o f Sampling . A sanple may be drawn after all the units comprising
the lot or batch have been assembled, or sample units may be drawn during assembly
of the lot or batch, ijn which case the size of the lot or batch will be determined
before any sanple units are drawn. If the sanple units are drawn during assembly
of the lot or batch, and if the rejection number is reached before the lot is
completed, that portion of the lot already completed shall be rejected. The cause
of the defective product shall be cteterndned and corrective action taken, after
which a new lot or batch shall be begun.
b. The total number of defectives (or defects) in the sanples from the
preceding 10 lots or batches (or such other number as was used for condition "a"
above) is equal to or less than the applicable number given in Table VIII. If
double or multiple sairpling is in use, all samples inspected should be included,
not " first sanples only; and
,f
4.9.1 Inspection Level . The inspection level determines the relationship between
the lot or batch size and the sample size. The inspection level to be used for
any particular requironent will be as prescri±)ed by the contractor's written
procedures. Three inspection levels: I, II, and III, are given in Table I for
general use (see 4.1) Normally, Inspection Level II is used. However,
.
Inspection Level I may be used when less discrimination is needed, or Level III
may be used for greater discrimination. Four additional special levels:
S-l, S-2, S-3, and S-4, are given in the same table and may be used where
relatively small sample sizes are necessary and large sampling risks can or must
be tolerated.
NOTE: In the selection of inspection levels S-l to S-4, care must be exercised to
avoid AQLs inconsistent with these inspection levels. In other words, the purpose
of the special inspection levels is to keep sanples small when necessary. For
instance, the code letters under S-l go no further than D, equivalent to a single
sample of size 8, but it is of no use to choose S-l if the AQL is 0.10 percent for
which the minimum sample is 125.
4.9.2 Code letters . Sairple sizes are designated by code letters. Table I shall
be used to find the applicable code letter for the particular lot or batch size
and the prescribed inspection level.
4.9.3 Obtaining Sampling Plan .The AQL and the code letter shall be used to
obtain the sampling plan from Tables II, III, or IV. When no sampling, plan is
available for a given combination of AQL and code letter, the tables direct the
user to a different letter. The sample size to be used is given by the new code
letter, not by the original letters If this procedure leads to different sample
sizes for different classes of defects, the code letter corresponding to the
largest .sample size derived may be used for all classes of defects
. As an
alternative to a single sampling plan with an acceptance number of 0, the plan
with an acceptance number of 1 with its correspondingly larger sample size for a
designated AQL (where available) , may be used.
MIL-STD-105E
4 9 4 Tvpes of Sampl ing Plans Three types of sampling plans: Single, Double,
.
plan shall be
batch under percent defective inspection, the applicable sampling
4.10.1.3, and 4.10.1.4.
used in accordance with 4.10.1.1, 4.10.1.2,
4.10.1.1 Single Sampling Plan The number of sample units inspected shall be
. _
defectives found in
equal to the sample size given by the plan. If the number of
than the acceptance number, the lot or batch shall
the sample is equal to or less
be considered acceptable. If the number of defectives is equal to or greater than
the rejection number, the lot or batch shall be rejected.
4.10.1.2 Double Sampling Plan A number of sample units equal to the first
.
sample size given by the plan shall be inspected. If the number of defectives
found in the first sample is 'equal to or less than the first acceptance number,
the lot or batch shall be considered acceptable. If the number of defectives
rejection number,
found in the first sample is equal to or greater than the first
in the
the lot or batch shall be rejected. If the number of defectives found
first sample is between the first acceptance and rejection numbers, a
second
found in
sample of the same size shall be inspected. The number of defectives
If the cumulative number of
the first and second samples shall be accumulated.
or batch
defectives is equal to or less than the second acceptance number, the lot
is equal
shall be considered acceptable. If, the cumulative number of defectives
shall be
to or greater than the second rejection number, the lot or batch
rejected.
shall be
4.10.1.3 Multiple Sample Plan . Under multiple sampling, the procedure
similar to that specified in 4.10.1.2, except that the number of successive
samples required to reach a decision may be as many as seven.
4.10.1.4 Special Procedure for Reduced Inspection Under reduced inspection, the
.
sampling procedure may terminate without either acceptance or re ject ion criteria
^
having been met. In these circumstances, the lot or batch will be considered
lot or
acceptable, but normal inspection will be reinstated starting with the next
batch (see 4.7.4.b) .
MEL-STD-105E
given in this publication were designed for use where the units of product are
produced in a continuing series of lots or batches over a period of time. However,
if the lot or batch is of an isolated nature, it is desirable to limit the
selection of sampling plans to those, associated with a designated AOL value, that
provide not less than a specified limiting quality protection. Sampling plans for
this purpose can be selected by choosing a Limiting Quality (LQ) and a consumer'
risk to be associated with it. Tables VT and VTI give values of LQ for the
the commonly used consumer's risks of 10 percent and 5 percent respectively. If a
different value of consumer's risk is required, the O.C. curves and their tabu-
lated values may be used. The concept of LQ may also be useful in specifying the
AQL and Inspection Levels for a series of lots or batches, thus fixing minimum
sample size where there is some reason for avoiding (with more than a given
consumer' s risk) more than a limiting proportion of defectives (or defects) in any
single lot or batch.
4.12 Curves .
4.12.2 Average Sample Size Curves . Average sample size curves for double and
multiple sampling are in Table IX. These show the average sample sizes which may
be expected to occur under the various sampling plans for given levels of process
quality. The curves assume no curtailment of inspection and are approximate to
the extent that they are based upon the Poisson distribution, and that the sample
sizes for double and multiple sampling are assumed to be 0.631n and 0.25n
respectively, where n is the equivalent sample size.
MH-STD-105E
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MILr-STD-105E
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66
MIL-STD-105E
6. NOTES
Defect
Defective
Lot or Batch
Process Average
Sanple
Sampling Plan
Unit of Product
6.3 Changes from Previous Issue Vertical lines or asterisks are not used in
.
this revision to identify changes with respect to the previous issue due to
'
67
MIL-STD-105E
CONCLUDING MATERIAL
Review Activities:
Army - MI, EA, TE, AV, ER (Project QCIC-0085)
Navy - AS, EC, IVC, CM, SA,
SH, ID, YD
DLA - ES, GS, SS
OSD - IP, SO
User Activities:
Army - ME
DLA - ES, SS
68