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Figure 3
Crystal structure of low-temperature Quartz. a) shows the asymmetric unit uad
b) the generated crystal structure by PowderCell .
a) b)
Using subgroup relations the symmetry can be decreased step
by step. Until now the benefit of subgroups is well known but
Figure 2 the use of the information given in International Tables for Crys-
Crystal structure of low-temperature Quartz. a) shows the asymmetric unit and tallography is comparativly difficult for an unexperienced user.
b) the generated crystal structure by PowderCell . To generate the new unit cell and especially the new asymmetric
The generation is running always by this procedure, i.e. all unit is really complicate. PowderCell is able to do this automat-
symmetry matrices will be generated after loading of the crystal ically. The user must only select one of the offered maximal
structure file. For low-temperature Quartz the generated crystal subgroups and the program adapts the dimension of unit cell
structure is shown in Fig.2. On the left side the content of the as well as the atomic coordinates. At the end it Unfortunately,
asymmetric unit within the unit cell is given whereas on the the generation of so-called complete trees of subgroup relations
right side the crystal structure is represented. As well known, is impossible. So sometimes no maximal s but any subgroup
the unit cell contains only 9 atoms, but then no SiO4 -tetrahedron can be used. To keep the overview of the numerous possibilities
is visible because no tetrahedron is completely included. There- seems to be then very difficult. One example is the Perovskite,
fore PowderCell allows to increase the volume in which the where the modifications can be explained by the use of sub-
crystal structure will be generated. Fig.2b) shows 4 joined tetra- groups.
hedra. P m3m
Very often it is wished to know more about the distances and
P 4/m mm
angles between atoms. This has been enabled by two different
ways. On the one hand it is possible to measure distances and P 4mm
bond or torsion angles manually by selection of the atoms, re- C mmm
spectively. On the other hand a table is generated by the pro-
gram which contains all coordinates of generated positions, the P bnm
bond angles, but also general information about the space-group
type used. There the Laue group and point symmetry group are
Figure 4
given, as well as the general and special positions and the type Some subgroup relations for Perovskites which has been observed.
For Perovskite a lot of different modifications exist. The typ- 3.3. Structure manipulation
ical is the cubic but there are also tetragonal, orthorhombic and In PowderCell exist a lot of tools to manipulate the crystal
monocline modifications. Some exclusiv are shown in Fig.4. structure or parts of it. This include e.g.
There is also shown, on which way the symmetry decreases.
But what does it mean or what is the sense of this behaviour? In • rotation and translation of the generated structure
all cases the crystal structure loses symmetry or gains a degree • generation of more than one unit cell
of freedom. This influences neither the atomic positions or the
lattice constants or both simultaneously. • projection of lattice planes
This is demonstrated in Tab.5, where the Wyckoff-splitting • stereo looking by 6◦ -tilted single pictures
is given for the Ca, Ti and O-position of the cubic Perovskite.
In most cases the atomic coordinates feel no additional de- • edit of bonds
gree of fredom. If the threefold axis in case of P 4m mm will
• selection of parts of structure (molecules, single atoms
be excluded, only a splitting of the O position follows, i.e. we
etc.)
have 2 different, non-symmetry eqivalent O positions. However,
these two positions have no degree of freedom. Indeed, the lost 142
Alpo
P o w d e r C e ll 2 . 2
Alpo.x_y
symmetry generates an exclusive axis c, which is independent
from the lattice constant a. From this point of view also the
atomic positions vary so that the absolute atomic configuration
changes. 71
a)
Table 5
Wyckoff-splitting for Perovskites. The Wyckoff letter defines the position. The
j=-20
letter in brackets gives the degree of freedom, i.e. (z) means the coordinate can
vary in direction of z. If no bracket is given no degree of freedom exists for this 0
P o w d e r C e ll 2 . 2
atomic position. Except of the last transformation each case is described by a 155 20
Alpo
21 22 23 24 25
Alpo.x_y
translationengleiche subgroub I. The last one is a klassengleiche subgroup IIc.
P m3̄m I I I I IIc
P 4/m mm P 4mm C mmm P bnm P bnm
b)
78
Ca 1a 1a 1a (z) 2a 2a 4h (x,z)
j=0
Ti 1b 1d 1b (z) 2c 2c 2b
2c 0
P o w d e r C e ll 2 . 2
141 20 21 22 23 24 25
O 3c 1c 1b (z) 2b 2b 4h (x,z) Alpo
Alpo.x_y
71
A mixture between the two possibilities, changing lattice pa-
rameters and/or atomic position, occurs in case of P 4mm. All c) j=+20
atomic positions have the possibility to vary in z without chang-
ing the local symmetry but also the lattice constants a and c
0
can shift. In case of C mmm the relative atomic coordinates are P o w d e r C e ll 2 . 2
104 20 21 22 23 24 25
fixed, but now the lattice has the possibility to relax in all three Alpo
Alpo.x_y
directions: a, b and c. Please notice, that the unit cell has a twice
higher volume because of the C centration. If we reduce the
symmetry furthermore it is possible to describe the structure by
the space-group symmetry P bnm : the third setting of P mna. 52
20 21 22 23 24 25
stay fixed. The Ca atom has even the ability to vary in x as well
in the z coordinate. This example shows, that subgroups rep-
resents a powerful tool for comparison of crystal structures or Figure 5
the investigation of phase transitions. However, there is not only Influence of the position of a C3 NH9 molecule within a cage of a zeolite. The
position of the molecule has been changed by rotation φ — a, b and c. In d) the
one path to a subgroup so that the analysis of subgroup relations
molecule has been deleted. The dots mark the calculated intensity of the correct
is sometimes more complicate than here demonstrated. crystal structure.
The manipulation of crystal structure allows to study the in- rable grain-size distribution, degree of imperfections, homoge-
fluence of shifted or tilted structure parts on the powder pat- nization, preferred orientation etc.). Even in case of identical
tern. Unfortunately, the Wyckhoff symmetry cannot be fixed. experimental conditions comparisons of the diffraction power
Therefore it is absolutely possible that the shift of an atom will of different materials are practicable, although die quantity and
influence its multiplicity. Nevertheless this is a useful tool for the character of the unknown will be underestimated by the re-
crystals with lower symmetry, e.g. the majority of organic com- searcher no rarely.
pound. In Fig.5 it is demonstrated for a zeolite containing an
organic molecule which has been rotated within the cage. The 4.2. Intensity calculation
dots represent the theoretical intensity curve resulting from the The calculation and representation of powder patterns is one
actual crystal structure data. Now the position of the molecule of the main features of PowderCell . The pattern can be evalu-
will be changed by rotation. The variation of the intensity curve ated for a doublet of 11 different radiations (Cr, Mn, Fe, Co, Ni,
influenced exclusively by rotation of the molecule is shown as Cu, Zr, Nb, Mo, Ag and W). Furthermore neutron diffraction
single line. It seems to be that some reflections do not change experiments can be simulated2 .
the intensity whereas other are strongly influenced. If the com- For the simulation of X-ray diffraction pattern the atomic
plete molecule will be deleted we observe a drastic change of scattering factors as well as the anomalous dispersion coeffi-
diffracted intensity — Fig.5d). cients are necessarry. These are included for all radiation used
up to the atomic number 104 using FPRIME (Cromer & Liber-
4. Simulation of powder pattern mann, 1983). For the calculation of the mass attenuation the
total photon interaction cross section3 will be used. Unfortu-
4.1. General remarks nately the final atomic number which has been listed is 96. This
defines a limitation regarding the quantitative analysis of mix-
Since the discovery of X-ray interferences in the beginning
tures. For the radiations of Zr, Nb and W in principle no values
of the last century the correct calculation of the reflection inten-
are given.
sities was an important task. From practical point of view the
Natural crystals are characterized by a so-called mosaic
quantitative phase analysis is one of the important problems.
structure. This causes the higher divergence and the lower co-
Certainly, there the structure data must be known. In contrast to
herency of the reflected beam regarding to the incident beam.
the large group of scientists using e.g. this standard method only
The result is that the reflected beam will be emmited by the
a small number attend to the determination of crystal structure
crystal without a further diffraction. Thus the mosiac structure
data.
represents the ideal case of a defect crystal4 (Massa, 1996). In
However, both groups use the same fundamentals for a cor-
this case the intensity of an interference HKL is proportional to
rect calculation of reflection intensities. Nevertheless the meth-
the square of the structure amplidude |FHKL|:
ods are quite different because of the unknowns, respectively.
For the structure analysis only the relative intensities of a max- IHKL = K · A · PLG · HHKL · |FHKL|2 (2)
imum of considerable reflections are necessary. If it would be
possible to exclude texture effects, in quantitative phase analy- where K is a constant, A represents the mass attenuation, PLG
sis only a single reflection for each phase would be sufficient to describes the polarization, Lorentz and geometry correction and
determine the fraction, respectively. But from the view of a bet- FHKL is the structure factor. HHKL considers the reflection mul-
ter reliability this is not acceptable. It is well known that even tiplicity. However, if a preferred orientation influence the inten-
the preferred orientation can have an essential influence on the sity HHKL must be substitute by OHKL.
result of a quantitative phase analaysis. The scaling factor K is a constant and enables e.g. the nor-
Actually, the basic problem is to recognize which information malization of the relative intensities regarding to the unit cell
are necessary. From the view of structure analysis only the in- volume and/or the mass (density). On this way it is possible to
tensity ratios must be known (and for a deconvolution the more analyse mixtures or to compare the scattering power of different
are available the better). For this case the well-known quadratic materials. Using A the influence of attenuation of the material is
relation between intensity and structure amplitude can be de- considered. Normally, for a crystalline phase only relative inten-
scribed sufficiently using the simple equation for the structure sities will be determined and K and A can be neglected. How-
factor without further corrections. Therefore one finds the math- ever, for an analysis of the scattering power of a single phase A
ematical sign for proportionality between intensity and structure has to be considered during calculation of intensity.
amplitude. Usually the polarization, Lorentz and geometry factor will
However, it should be possible to calculate powder patterns of be combined to a so-called PLG correction (sometimes it is de-
mixtures under consideration of certain assumtions (e.g. compa- scribed as LPG or as LP correction (Allmann, 1994). Therefore,
2 The velocity of the neutrons is fixed by 2200 m/s. So a wavelength of 1.7982 results.
3 given in [barns/atom] / 10, International Tables for Crystalography, Vol.C, Tab. 4.2.4.2.
4 If the crystal is more similar to a perfect crystal i.e. there is approximately no mosaic structure the diffracted beams can be functioned as ”primary” beams. One
observes a lost of intensity which is called primary extinction. For a really perfect crystal the reflection intensity is equivalent to the absolute value of the structure
factor the structure amplitude. For the description of diffraction effects in perfect crystals the dynamic interference theory has been developed. However, usually
powders are not perfect crystals so that the more easy kinematic assumtions are sufficient for the calculation of reflection intensities. Only for semiconductors
dynamic formulations must be considered. On the other hand, if you use single crystals as monochromator you should be know the degree of perfectness.
very often complete PLG correction termes are listed in depen- sum of the product of g j and fij can be imagined as effective
dence of several focusing conditions or different constructions atomic scattering factor describing the position i in the struc-
of diffractometers (Yvon et al., 1977). In PowderCell the iden- ture.
tical corrections as in LAZY PULVERIX will be used. For the Because PowderCell is able to consider the anomalous dis-
Bragg-Brentano geometry the correction has the following de- persion the structure factor actually will be calculated by
pendency r
1 + cos2 2θ 2
fij◦ + ∆ fij + ∆ fij 2 ·
Pn Pn 0 00
PLG = (3) FHKL = i=1 j=1 ki g j
sin2 θ cos θ
The multiplicity HHKL of a lattice plane {hkl} defines the num- 00
(7)
∆f
ij
ber of all symmetry-equivalent lattice planes. On the one hand − 2πi(Hxi +Kyi +Lzi )+arctan
f ◦ +∆ f
0
it depends from the indexing of the lattice plane itselfs, on the · exp ij ij
·Tiiso
j
other hand the given number of all lattice planes are charac-
were fij◦ is the atomic scattering factor and ∆ fij and ∆ fij are cor-
0 00
teristic for the point-group symmetry, respectively. Normally,
the multiplicity will be used to decrease the processing time, rection terms of fij◦ considering anomalous dispersion effects.
because for all symmetry-equivalent lattice planes (or interfer- fij◦ itself will be approximated using the dependency described
ences) all properties (in our case the diffracted intensity) are from Cromer & Mann (1968):
identical5 . If the probability for the occurence for each indi-
vidual (hkl) of {hkl} is not the same this must be considered 4 sin2 θ
X −bjq 2
additionally using the correction factor OHKL. This is described fij◦ (sin θ/λ) = ajq · exp λ +c j . (8)
by different models. A very simple was developed by March q=1
(1932) and will be used in other Rietveld programs, too. Mainly
it is useful for the description of the preferred orientations of ax- The aij , bij and c j has been calculated by M. Wendschuh-Josties
ial crystals. using FPRIME (Cromer & Libermann, 1983).
3
H 4.3. Convolution of line intensities
sin2 ϕi 2
X
2 2
OHKL = o cos ϕi + (4) PowderCell uses symmetric model functions for the convolu-
i=1
o
tion of calculated intensities: Gaussian, Lorentz, Pseudo-Voigt1
This equation has the advantage to contain the increase as and Pseudo-Voigt2. The area content of these curves is normal-
well as the decrease of intensity caused by a preferred orienta- ized to 1. The used functions are well known and will be ap-
tion. The degree of it will be adapted by o. Furthermore, it is plied also in other Rietveld programs (Izumi, 1987). The first
in general use in Rietveld programs to determine the fractions three have no free parameter, except of the full width at half
of multiphase mixtures. The most important disadvantages are maximum (FWHM) whereas the Pseudo-Voigt2 is defined by
the limited validity for crystals with lower symmetry. Addition- two which have to refined manually or automatically.
ally, for crystals with higher symmetry (e.g. the axial crystal The change of peak width FWHM in dependence of the
systems) a general description about the full 2θ range is nearly Bragg angle θ is considered by the Caglioti formula (Caglioti
impossible regarding a constant o. et al., 1958):
PowderCell uses also other models which are more powerful
in case of application for crystal structure analysis (Toraya & FWHM2 = U tan2 θ + V tan θ + W. (9)
Marumo, 1981; Sasa & Uda, 1976). If quantitative phase anal-
ysis is in the focus of interest these models are unsuitable. U, V and W are free parameter which also have to fit. For small
The structure factor FHKL is implemented in PowderCell angle ranges it seems to be sensible to refine W only and if this
using the following equation: describes in average the peak width quiet good, U and V can be
switched on too.
n X
X n
FHKL = ki g j fij exp−2πi(Hxi+Kyi +Lzi ) ·Tiiso
j (5)
5. Refinement
i=1 j=1
There is no doubt that the refinement procedure in PowderCell
in which the isotropic temperature factor will be described by improved the quality of the program especially from the practi-
2 cal point of view. The calculation of the correct line intensity is
sin θ the one hand. The other hand is the ability to compare a exper-
−Bi j
Tiiso = exp λ . (6) imental diffractogram with the theoretical one. It is clear that it
j
is really difficult to adapt the several parameters manually: scal-
ki is the occupation factor, g j is the substitution and fij describes ing factors, zero shift, background polynom, lattice parameters,
the atomic scattering factor. At first it will be summarized about profile parameters and preferred orientation. So an automati-
all atoms j of one and the same atomic position (x, y, z)i . The cal refinement has been implemented where also limits can be
5Though, only the absolute necessary part of reciprocal space must be considered during the generation of the reflection. The size of the considered space is defined
by the point-group or Laue-group symmetry of the given crystal structure. This presupposes a homogeneous orientation distribution of the crystallites.
set. The dialog window for the lattice and profile parameters is For more detailed information The Rietveld Method edited by
shown in Fig.6. Young (1993) and the monograph Modern Powder Diffraction
edited by Bish & Post (1989) are recommended.
b)
c)
Figure 7
Experimental and simulated diffraction pattern for a unknown mixture of Rutile
and Anatase. Therefore both phases are described by the half, respectively. The
Peak width are calculated using a constant default value.
a)
a)
b)
b)
Figure 9 Figure 10
Refinement of the complete measurement. For a better resolution the inten- Refinement of the complete measurement. For a better resolution the inten-
sity scale has been increased. a) shows the result including the background. sity scale has been increased. a) shows the result including the background.
b) represents the superposition (sum of both theoretical diffractograms) with- b) represents the superposition (sum of both theoretical diffractograms) with-
out background. The fitting region has been enlarged because at the end of the out background. The fitting region has been enlarged because at the end of the
angle range measured the influence of a reflection can be observed. angle range measured the influence of a reflection can be observed.
7 This is caused by a wrong 2θ-position of the detector.
8 Always under the preassumption that the mixture contains only crystalline materials. If we consider the strong background we have to admit that this is not correct.
If one defines L as the mean dimension of the crystallites
composing the powder, λ as the wavelength used, K as a con-
stant approximately equal to unity9 , θ◦ as the position of the
peak maximum and e ' (∆d/d) ¯ hkl as an approximate upper
limit of the lattice distortions a linear dependency can be given:
FWHM2
Kλ FWHM
2
= + 16e2 (10) a)
tan θ◦ L tan θ◦ sin θ◦
which allows to determine the crystal size from the slope af the
line. The origin intercept describes the lattice distorsion e.
This dependence is also very useful for the interpretation of
the refined U, V and W because these values define the course of
the FWHM. In Fig.10a) the reflections of Rutile are represented
as small crosses and the line is given as linear approximation.
It shows that for small (FWHM)/(tan θ◦ sin θ◦ ) the coincidence
between the crosses and the fitted line is acceptable but could be b)
better. However, if the refinement of U, V and W is unfavourable
a strong disagreement can be observed in the size and strain
fitting. The coincidence for Anatase inFig.10b) is much better
and indicates a good reliability of the refined U, V , and W . Of
course, if the powder is characterized by a strong anisotropy of Figure 11
Refinement of an X-ray powder pattern. The Background has been substracted
crystal size and/or lattice strain the preassumptions for the use before. a) The first simulation of the powder pattern uses fixed structure fac-
of (9) and (10) are incorrect and this model cannot be used. tors for each reflection. b) After threefold deconvolution and refinement a good
agreement between experimental and theoretical data has been found.
5.3. Deconvolution — a Le Bail likely method
Usually PowderCell needs all structure data and lattice pa- Table 6
Lattice parameter before and after refinement.
rameters to be able to work. However, what one should do if no
structure data are available or unknown? In former times struc- ao bo co β
ture factors have been extracted by hand, e.g. cutting peaks on
the recorded paper and weighting them or using a planimeter. initial 13.156Å 8.853Å 9.046Å 124.53◦
In the beginning of the 70th of the last century peaks have been refined 13.170Å 8.859Å 9.053Å 124.48◦
approximated as triangle (Fayos & Salvador-Salvador, 1971). All structure amplitudes will be written in input files for
Nowadays, mostly the Le Bail (Le Bail et al., 1988), Pawley SHELX: one structure file (∗.ins) and one file containing
(?) and Rudolf and Clearfield methods are used. The Le Bail
the reflection indexing and the adapted structure amplitudes
algorithm persuades by a better stability and a faster execution. (∗.hkl). Now SHELX can be used to separate the crystal struc-
A similar method has been included in PowderCell . It shall ture or segments of it from these data. Repeating this procedure
be explained by an example: UU2 (H2 AsO4 )2 ·H2 O. For the ap- the selected of atomic positions by SHELX describe the powder
plication in PowderCell the lattice parameters and at least the diffraction pattern better reliable so that the refinement works
Laue group describing the multiplicities are necessary. If the more reliable.
space-group type can be extracted it is more reliable because Except for crystal structure analysis the convolution can be
of the use of extiction laws. So it was known: ao = 13.156Å, used also for a lattice parameter refinement how Tab.6 shows.
bo = 8.853Å, co = 9.046Å, β = 124.53◦ and space-group type
C 1 2/c 1 (space-group number: 15). 6. Conclusions
The deconvolution starts using a fixed structure amplitude (in PowderCell is a program which can be used for different ap-
PowderCell = 100) for each reflection. Thus, the intensity of re- plications. It is a tool for practical work but also for crystal-
flection will be determined exclusively by the multiplicity of re- lographers, which are interested in subgroups and their appli-
flections and the PLG correction. The result of this assumption cation on scientific questions. Especially the simple input files
is shown in Fig.11a). Because the difference between experi- and the low level knowledge allows also non-specialists to work
mental and theoretical curve is comparatively big no difference with this program. The combination of structure vizualisation
plot has been given. After three cycles of deconvolution and re- and powder pattern generation offers an intuitive working mode
finement the agreement is surprisingly good. Beside the fitting which is supported by a user-friendly shell. In spite of the rela-
of intensities also the lattice parameter have been refined. These tive simple profile functions used the refinement procedure is an
are listed in Tab:6 acceptable feature for qualitative or quantitative phase analysis.
9 It is common practice to set K equal to unity.
References Le Bail, A., Duroy, H. & Fourquet, J. L. (1988). Mat. res. Bull. 23,
Allmann, R. (1994). Röntgen-Pulverdiffraktometrie. No. 29 in 447–452.
Clausthaler Tektonische Hefte. Köln: Verlag Sven von Loga. March, A. (1932). Z. Kristallogr. 81, 285–297.
Bish, D. L. & Post, J. E. (1989). Modern Powder Diffraction, vol. 20 Massa, W. (1996). Kristallstrukturbestimmung. Teubner Studi-
of Reviews in Mineralogy. Washington: Mineralogical Society of enbücher Chemie. Stuttgart: B. G. Teubner.
America.
McCusker, L., Dreele, R. B., Cox, D. E., Louer, D. & Scardi, P. (1999).
Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Nucl. Instrum. 3, 223– J. Appl. Cryst. 32, 36–50.
228.
Müller, U. (1994). In Fifteenth European Crystallographic Meeting
Cromer, D. & Mann, J. B. (1968). Acta Cryst. A24, 321–324.
(ECM-15), Dresden, 28.8.-2.9.94, p. 203. Munich: R. Oldenburg
Cromer, D. T. & Libermann, D. A. (1983). J. Appl. Cryst. 16, 437. Verlag. Dresden.
Fayos, J. & Salvador-Salvador, P. (1971). J. Appl. Cryst. 4, 159–163. Nolze, G., (1997). Help file in PowderCell. Berlin.
Hahn, T. (1995). Space-group symmetry, vol. A of International
Sasa, Y. & Uda, M. (1976). J Solid State Chem. 18, 63–68.
Tables for Crystallography. Dordrecht/Boston/London: Kluver
Academic Publisher. Sheldrick, G. M. (1990). Acta Cryst. A46, 467–473.
Izumi, F., (1987). Rietveld Analysis System. 1-1 Namiki, Tsukuba, Toraya, H. & Marumo, F. (1981). Mineralogical Journal, 10(5), 211–
Ibaraki 305, Japan. 221.
Klug, H. P. & Alexander, L. (1974). X-ray diffraction procedures. New Young, R. A. (1993). The Rietveld Method. Oxford University Press.
York: John Wiley & Sons, 2nd ed.
Yvon, K., Jeitschko, W. & Parthe, E., (1977). LAZY PULVERIX — a
Kraus, W. & Nolze, G. (1996). J. Appl. Cryst. 29, 301–303. program to calculate theoretical X-ray and neutron diffraction
Kraus, W. & Nolze, G. (1998). CPD Newsletter, 20, 27–29. patterns.