Synchrotron radiation:

A charged particle constrained to move in curved path experiences a centripetal

acceleration. Due to it, the particle radiates energy according to Maxwell
equations. A non-relativistic particle emits radiation primarily at its frequency
of revolution, with the characteristic pattern shown in figure 1(a). However, as
the speed of the particle approaches the speed of light, the radiation pattern is
distorted by relativistic effects and shrinks to a narrow cone of with angular
spread ∆φ (see b). The latter type of radiation is called synchrotron radiation

a b
 2
The relativistic electron has an energy E = γ m o c
1
With: γ =
v2
1− 2
c
Synchrotron radiation is emitted in a cone of width θ=γ-1
3cγ 3
For an orbital radius Rb, emission occurs up to an energy Ec =
2 Rb

Dipole radiation
of accelerated
charge

Frame of reference moving Laboratory frame of reference

with the electrons
k’ k
Θ’ kx=k’x
k’x
k’z
kz=2γk’z
2π kx k' tan θ ' 1
k'= θ= = x' = =
λ' k z 2γk z 2γ 2γ
Lay-out of Synchrotron light source
Light is extracted bending magnet
with insertion
devices

A wiggler consists of a periodic

series of magnets, placed in a ring section
where the electron path would otherwise
be straight; because of its action, the electrons
are forced to oscillate around the straight path. The undulator
result is a very high flux of X-rays along the wiggler
beamline. An undulator is similar to a wiggler except that it
forces the electrons into a much weaker zig-zag, so that during the entire zig-zag
motion synchrotron light continues to illuminate the undulator beamline. The result
is a longer pulse of light rather than a series of short bursts. Without short pulses,
there is no wide band of wavelengths, thus the undulator emission is not spread in
a wide band but concentrated, producing high levels of flux and brightness. The
technical specification of undulators and wigglers make it possible to perform
record levels of flux and brightness.
Three possibilities: Bending magnet, wiggler, undulator
Synchrotron Radiation
Emitted by a Dipole
Bending Magnet
Synchrotron Radiation
Emitted by a Wiggler
Array of Magnets
 Double
relativistic
effect

Note the K2 term,

determined by the
magnetic field
intensity,B0, which
allows to tune the
undulator frequency
 Wiggler

Undulators and
Wigglers

Energy (eV)

Light pulses Dipole Wiggler Undulator

Continuous Light
Monochromators
Focussing X-rays: Mirrors
Fresnel Zone Plate
Focussing X-rays: Fresnel zone plates
 Brillance: definition
Brightness is defined as radiated power per
unit area and per unit solid angle at the source

∆P
B=
∆A ⋅ ∆Ω
Brightness is a conserved quantity in
perfect optical systems, and thus is
useful in designing beamlines and
synchrotron radiation experiments .
which involve focussing to small areas.

∆P
B∆ω / ω =
∆A ⋅ ∆Ω ⋅ ∆ω / ω
.Spectral brightness is that portion of the
brightness ∆ω/ω lying within a relative
spectral bandwidth
Time evolution of achieved brightness

Note that Avogadro’s number is 1023

Spectral Intensity Distributions
for a Variety of
Standard Photon Sources and
Synchrotron Radiation Sources
SPring 8 Japan
 Beamlines

High resolution beamline

Injector Lay-out of ELETTRA
(Trieste, Italy)
ELETTRA is an example
of synchrotron
radiation source of
third-generation, i.e.
explicitly dedicated to
produce light
characterized by high
brilliance
Synchrotron Radiation (SR): Basic Features
•Bending Magnets vs. Insertion Devices (Undulators, Wigglers)
•Full Exploitation of Selection Rules
•Photon Energy (hν ν) Tunability:
•Surface vs. Bulk
• hν
ν-Dependent Cross Sections (PDOS)
•ARPES Band Mapping
•Resonant Photoemission
•Cooper Minimum Photoemission
•SR Polarization: Linear, Circular, Elliptical
•Time Structure:
•Pulse Width ≈ 10-50 ps
•Bunch-to-Bunch ≈ 1-1,000 ns
•High Brilliance:
•High Photon Fluxes
•Low Concentration Systems
•Tiny Specimens
•Fast Photoemission
•High E-Resolution
•Spectromicroscopy
 Focalization
spatial resolution
Microscopy and spectromicroscopy with X Rays

200 – 300 nm
Ad Elettra: Lunghezza di coerenza 250 micron a E=17 keV