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Application of Tandem Techniques with

Contact Mono-Elements or Phased Array
Probes: Simulation and Experiments

Article · April 2005

DOI: 10.1063/1.1916771

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APPLICATION OF TANDEM TECHNIQUES WITH CONTACT
MONO-ELEMENTS OR PHASED ARRAY PROBES: SIMULATION
AND EXPERIMENTS

R. Raillon1, M. Lozev2, R. Spencer2, E. Kerbrat1 and S. Mahaut1

1
Commissariat à l’Énergie Atomique, DRT/LIST,
CEA Saclay Bât. 611, 91191 Gif-sur-Yvette cedex, France
2
Edison Welding Institute, Columbus, OH , United States

ABSTRACT. Ultrasonic tandem inspection techniques are widely used to detect midwall defects.
Conventionally, a pair of probes scans the specimen, one transducer at transmission, one at reception.
An alternative application relies on the selection of different elements over an array, some at
transmission, others at reception. Simulation tools for tandem inspection have been integrated into the
Civa software developed at CEA, with support from EWI. This paper presents some simulation
examples for contact monolithic and phased arrays probes.

INTRODUCTION

Ultrasonic techniques (UT) inspections are commonly used to detect volumic or

crack-like defects located inside thick specimen. Surface breaking vertical cracks
(perpendicular to the backwall), for instance, may easily be detected using a 45° shear waves
examination with a pulse echo probe, as the UT path follows a reflection on the defect and on
the backwall, so that the beam bounces back to the transmitter/receiver probe along a so-
called "corner echo", as illustrated on Fig. 1(a). However, if the defect is not anymore located
close to the backwall, the amplitude of this corner echo may rapidly fall as the reflected beam
would not bounce back to the probe, as displayed on Fig. 1(b). In such a case, diffraction
echoes scattered at the defect edges may be used to identify and to size the defect, but the
amplitude of these echoes are usually very low compared to specular reflection, especially for
real defects (whose edges geometry are rough and do not lead to coherent edge waves
generation). In addition, the structural noise that can possibly be obtained for different
materials (inconel, stainless steel, welds), especially in the vincinity of welds, may lead to a
signal-to-noise ratio incompatible with diffraction echo detection. In order to assess such
mid-wall defect using a specular reflection mode, tandem techniques based on separate
probes at transmission and reception can be carried out , as illustrated on Fig. 1(c).
 a) TR
b) Scattered
ultrasound
Scattered
ultrasound

c) Scattered
ultrasound

FIGURE 1. Assessment of surface breaking a) and mid-wall defects b) with a pulse echo technique, and c)
tandem technique for mid-wall defect detection.

In most applications, as illustrated on Fig. 1(c), a pair of jointed probes is used to scan
the specimen, one transducer for transmitting waves, the other one for receiving scattered
echoes. The distance between both probes and their characteristics (refraction angle and
generated modes - L or T beams -) allow to master the inspection characteristics (mostly in
terms of defect detectability over depth). An alternative way to perform such a technique is
the use of a phased array probe for which one can define different groups of elements in
transmission and reception mode, as well as different delays settings for these groups. Such
skills therefore provide an increased flexibility and versatility compared to standard pair of
probes.
This paper presents simulation tools, which have been developed and integrated into
the Civa software developed at the french Atomic Energy Commission (CEA), to deal with
these techniques, as well as selected applications using pair of probes and phased arrays.
These developments were originally supported by the Edison Welding Institute (EWI).

SIMULATION OF INSPECTION FOR PULSE ECHO AND TANDEM

TECHNIQUES

Main Basis of the Field-to-flaw Interaction

Different defect scattering computations approximations may be used, depending on

the type of method and on the defect. As long as void cracks are dealt with, the Kirchhoff
approximation is used for the defect scattering computation. This method assumes that the
echoes generated by an insonified defect are obtained from the summation of contributions
from each elementary surface of the defect. Those contributions may be seen as scattered
wavelets, which relative amplitudes are calculated using the incident wave field distribution –
computed using the pencil method developed at CEA [1] -, and the complex diffraction
coefficient at the defect. Finally, an argument based on Auld’s reciprocity is used to predict
the sensitivity at reception, that-is-to-say the signal observed by the receiving probe. Each
possible echo formation, in Longitudinal (L) waves mode, Transverse (T) waves mode or
using mode conversion at the backwall or at the defect are individually computed. The
overall response obtained for the simulation results from the summation of these individual
echoes [2-4].
Specific Settings for Tandem Techniques with Pair of Probes

The simulation tools allow to use contact probes with the following characteristics:
• same or distincts probes in terms of :
o refraction angle (for L and/or T waves generation)
o apertures size and shape (circular, rectangular)
o focusing pattern (flat or focused probes)
• adjustable distances between probes :
o in the plane of incidence (both probes axis lie in the same plane, along
the scanning)
o out of the plane of incidence
Both probes are simultaneously moved over the specimen (they cannot be moved
separately).

Specific Settings for Tandem Techniques with Phased Arrays

The simulation tools allow to use phased arrays with the following characteristics :
• one phased array probe with the following adjustables settings for
transmission and reception group :
o number of elements at transmission and reception
o position of elements groups
o arbitrary delay laws for elements at transmission and reception
o fixed or electronically commuted sets
• combination of scanning and electronic commutation of transmission and
reception groups

EXAMPLES OF SIMULATION OF TANDEM TECHNIQUES WITH A PAIR OF

CONTACT PROBES

Influence of Paired Probes Configuration over Defect Depth Detectability

The following example deals with a fairly simple configuration which illustrates the
influence of the relative positions of two probes used in tandem inspection over a planar
specimen containing vertical defects at depths varying from 25 to 40 mm. Both probes share
the same characteristics : 2 MHz frequency, 20x20 mm² aperture, generating 45° shear
waves. Such a simulation would therefore be carried out to predict the inspection
performances for different defect depths around a presumed defect depth, or to adjust the
probes distance for a given arbitrary presumed defect depth.
Two simulations have been performed, the first one with a distance between probes of
60 mm, the second one with a distance of 50 mm. The simulation results images displayed on
Figure 2 shows that the defects responses versus depth vary according to the distance
between probe : the maximum echo response is obtained for the 30 mm depth reflector for
the probes axis distance of 60 mm (Fig. 2(b)), while the maximum response is obtained for
the 40 mm depth reflector for the probes axis distance of 50 mm (Fig. 2(c)). It can be readily
pointed out that a simple assumption over the intersection of the transmitter and receiver axis
could give a fair approximation of the optimal defect depth detection, as reported on the left
side of Figs 2(b) and 2(c). However, such a simple approximation fails if the probes get
different characteristics in terms of beam divergence (different generated modes and/or
apertures), or if the flaw is tilted.
 a) Scanning

b) Echodynamic curve

Time of flight (µs)

d=60mm Bscan image (d = 60 mm)

Amplitude (au)
T corner echoes
Scanning (mm) Scanning (mm)

d=50mm
c) Echodynamic curve
Time of flight (µs)

Bscan image (d = 50 mm)

Amplitude (au)
A max
T corner echoes
Scanning (mm) Scanning (mm)
FIGURE 2. Simulation of Tandem inspection with a pair of probes over a planar specimen. a) configuration,
and simulation results for probes axis distant from 50 mm b) or 60 mm c).

Study of the Influence of Defect Orientation

This example deals with another pair of probes, used to scan a pipe which contains
planar flaws of different orientations, all located at the same depth (mid-wall of a 25 mm
thickness pipe of 125 mm outer radius). In such a case, the simulation helps for predicting the
inspection performances over misorientation of presumed defects. As expected, the amplitude
rapidly decreases if the flaw orientation doesnot fit the optimal geometric configuration to
"catch" the reflected beam with the receiving probe. The 12° tilted defect for instance is
about 19 dB lower than the 0° tilt defect used as a reference.

a) b) Echodynamic curve
0 dB
Amplitude
(au)

- 19 dB
Tilt 0°
Bscan image
Tilt 4°
Time of flight (µs)

Tilt 8°

T corner echoes
Tilt 12°
Scanning (mm)
FIGURE 3. Simulation of Tandem inspection with a pair of probes over a pipe specimen with different tilted
defects located at the same depth : a) configuration, and b) : simulation results.
 Amplitude (a.u.)
128
Scanning Plane of tandem
probes

0
3 2 1 Planar defects
-10° Scanning (rotation) +40°
along curvature

0
Time of flight (in µs)
Transmitter Receiver

Defect 1
50 mm

Defect 2
Defect 3
20

FIGURE 4. Simulation of Tandem inspection over a pipe with a pair of contact probes

EXAMPLES OF SIMULATION OF TANDEM TECHNIQUES WITH PHASED

ARRAYS

Comparison of Tandem Application with a pair of Probes and a Phased Array

Figure 4 hereafter shows a simulated inspection carried out using a pair of probes over
a cylindrical mock-up (external diameter of 400 mm, and 50 mm thickness) containing three
planar defects of 10x5 mm² (height and extension) which ligaments (distance from the lower
extremity of the defect to the backwall) are 7, 17 and 27 mm. The gap between both probes -
contact planar probes of 18x15 mm² aperture radiating 45° shear waves - as well as the
refraction angle lead to an optimised inspection for the planar defect related to the medium
ligament, as displayed on the Fig. 4. As a result, the simulated inspection of the different
defect obtained over a cylindrical scanning shows that this defect exhibits the stronger
amplitude response.

An alternative way to perform such a technique relies on the selection of different

groups of elements over an array, some elements being in transmission mode, other elements
in reception mode. As those elements may be arbitrarily selected, and, in addition, with
arbitrary delay laws applied, phased array allows a significantly more flexible tool for tandem
inspections. Figure 5 illustrates an example of simulation with the same mock-up, to improve
defect detection over other defects. A contact phased array made of 48 elements is used with
separate elements at transmission and reception, to replace the pair of probes. Inspections
have been simulated for three different settings of the phased array probe, each setting
designed to optimise the inspection of one defect. The delay laws are computed to focus
shear waves at the selected defect depth, in direct mode for elements used at reception, and
focusing after backwall reception for elements used at reception.
 Receiving
Transmitting elements
Scanning
elements

3 2 1
Planar defects
along curvature

128
Amplitude

3 2 1 3 2 1 3 2 1
0

-10° Scanning (rotation) +40°

Time of flight (in µs)
0
20

FIGURE 5. Simulation of Tandem inspection over a pipe using a phased arrays and settings for each defect

Simulation of Electronic Commutation with a Fixed Distance between Transmission

and Reception Groups of Elements

The previous example dealt with the inspection of a pipe performed using three
different fixed settings and a scanning pattern over the perpendicular plane. Another
application displayed hereafter (see Fig. 6) consist in using electronic commutation of
elements at Transmission and Reception with a fixed set of parameters. In such a
configuration, one advantage of the method is that one preserves the beam orientation while
keeping the ability to scan the specimen without mechanical displacement. Figure 6(a)
displays the configuration settings : an electronic commutation is performed, using the
translation of both transmission and reception groups, in order to scan the specimen. The
delays setting applied for the simulation result displayed on Fig. 6(b) corresponds to the same
geometrical focusing point assessed after backwall reflection for the transmitted mode, and
using direct mode (without backwall reflection) for the received mode. Three defects are
located inside the specimen (at 25%, 50% and 75% of thickness depth), and the focusing
point is located at the mid-wall. It can be observed on the simulation result that the mid-wall
defect, for which the focusing point was optimally chosen, has the strongest amplitude as
expected.
 a) R elements
T elements

Sequence 0 Sequence i
Local Local
frame P frame
b) Commutation Echodynamic curve

Amplitude
Bscan image

Time of flight (µs)

T corner echoes

Commutation (sequences)
FIGURE 6. Simulation of Tandem inspection over a pipe using a phased arrays and settings for each defect

Study of the Influence of Failed Elements over the Array

All phased arrays inspection techniques relie on the use of all, ore partial groups of
the elements aperture. Therefore there's a crucial need to predic the inspection performances
degradation if some elements of the array are lost (due to connection cables for instance).
Such degradations may be predicted using simulation tools, as discussed hereafter.

a) All transmitter elements active

0 dB (reference)

b) Some elements are failed

(4 elements over 16)

-2.4 dB

FIGURE 7. Demonstration of the influence of failed elements over the radiated beam
 Figure 7 displays the ultrasonic beam radiated by a contact linear phased arrays of 64
elements, using 16 elements. The beam computation has been performed for the whole set of
elements, then post-processed to form the resulting field using 16 active elements (Fig. 7(a)),
as well as the same group of elements, some of them being failed as illustrated on the Fig.
7(b). Although the beam characteristics are fairly similar, the amplitude of the radiated beam
of the degraded aperture is about 2.4 db at transmission (so about 5 dB at
Transmission/Reception). This would therefore correspond to the amplitude loss if a defect is
insonified using this set of elements. Moreover, these degradations may be varying as
function of the sequence, as failed elements may be more or less distributed over the whole
aperture.

CONCLUSION

This paper has presented simulation tools developed at CEA with support from EWI,
which allow to predict and to conceive UT tandem inspection techniques, which may be
carried out either with contact pair of probes, or with a phased array probe with distinct
transmission and reception elements. Such simulation tools have been applied for different
simulation cases, which illustrates its different skills. These simulations show that phased
arrays examinations can provide extended performances in terms of verstility compared to
contact monolithic probes, as one can combine mechanical displacement as well as advanced
settings (electronic commutation of either transmission and/or reception elements, separate
delays for transmission and reception elements). Experiments on real application cases are
currently carried out at EWI.

REFERENCES

1. Gengembre, N. and Lhémery, A., Review of Progress in QNDE, Vol. 19, eds. D. O.
Thompson and D. E. Chimenti, AIP Conference Proceedings 509, Melville, 2000, p. 977.
2. Mahaut, S., Calmon, P., Chatillon, S. and Raillon, R., Review of Progress in QNDE, Vol.
22, op. cit. AIP Conference Proceedings 657 (2003), p. 777.
3. Chatillon, S., Lhémery, A., Cartier, F. and Calmon, P., Review of Progress in QNDE,
Vol. 20, op. cit. AIP Conference Proceedings 557 (2001), p. 710.
4. Raillon, R. and Lecœur-Taïbi, I., Ultrasonics 38, 527 (2000).

Keywords
1. Phased Array
2. UT simulation
3. Tandem techniques
 Keywords
1. Phased Array
2. UT simulation
3. Tandem techniques

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