THIN FILM CERAMIC METALLISATION
THIN FILM CIRCUITS
Thin film circuit metallization schemes at HHV are deposited by magnetron sputtering
method and the deposited metal layers show excellent adhesion compared to other non
vacuum deposition methods. These metallization schemes start with a bonding layer of
TIW or Cr and a conductive layer of Au/Cu on the ceramic substrates. For the resistor
applications TaN or NiCr layer and for the solderable applications Ni or Cu is added ta
‘the metallization scheme.
The sheet resistance of TaN and NiCr layers is available from 10 - 250 Q/sar depending
upon the application. All layers can be deposited in one cycle without breaking the vacuurn
by sputtering method. 1S0-7 Class clean room is specifically established at HHV for the
purpose of depositing defect free metallization coatings.
Standard Metallization schemes:
Tiw 400 - 500A"
SURLY Au 5.0 - 7.0 um
TaN 10 - 250 Dsqr If resistor layer is required
Tiw 400 - 500A*
; Au 3.03.5 im
TOY NIV. o5eaerm
Au 2.0 2.54um
cr 200 - 800A"
cu 4.0 - 5.0 umm
Au 1.8-2.0um
Nicr 200 Oisar
cu 10.0 -15.0m
Nicr 200 O/sqr
Ni 0.1 - 0.15 um
Au 3.0 um
Ti 200 - 800A"
Au 0.5 to um
Standard Metallizatfon thickness:
Ti: 200 - 800A"
Cr: 200 - 8004"
Ni: 0.2 = 1.0m
TaN ar NiGr: 20 - 250 Qisar
TiW: 200 - 2008
Cu: 0.5 - 124m
NiV: 0.5 - 2.0m
Au: 0.5 - 8.Qum
Al: 150A" 2.0um
Applications:
* RF /Mlicrowave integrated circuits
+ Hybrid micro circuits
+ SAW devices
+ RADAR
+ Thin film resistors
posLITHOGRAPHY
HEV has added a new photolithography facility to
develop a thin film circuit fabrication facility
Starting from the metallization of coatings, finished
products with patterned circuits can be realized
at this facility. This facility has been built in an [S0-7
clean room environment and 1SQ-5 class laminar
flow stations. Spin coater, Laser writer, mask
aligner & UV exposure system, wet chemical
benches, ultrasonic cleaning machines, baking
ovens, microscopes and profile projectors are
available at this facility to make the full circuit,
generation over different types of substrates.
Applicatio
“+ RF/Microwave integrated circuits
‘+ Hybrid microwave integrated circuits
+ Thin film resistors
+ SAW devices
+ Reticles
II
Space Appcatons Cente
‘Departmen of oct
Government of Inn
Amedad— 380013,
Goji
‘Gamay ka Siyoyc/ 201703
‘Suey ro sc
Site No. 17, Phas 1, Peeys Indust Arey, Bangor 56058, lds been Qualia by Space Applctons Cente fr 3- jer (Ce-Cu-Aw) metalation proces
‘on 25 mul ick lumina subset ia acondane with ISRO PAX SOS, fe Flight Hardware Realzaion. Dts of Quad Process ae a under,
SeNa, Process Type Capabities
‘Mealiations Cx Cabo
S-layer metlisation proces on 25 mil hick lamina | Sputer Chromium: 200 30
‘brat uring Magnemon Spring Sytem Sputer Copper 5 Miso
Spuiter Gold 8-2 Micons
ag were Ural t4, ode a Ht B | This Coriicate valid up w February 15, 2020
Heat EEA /Reteence Documents
2 sabarer Rete. SAC/SRGIGEN/QTR/L, 207 / Qualication Test Report No. SAC/SRGIGEN/QTR/L0, 2017
> fran pera CEA ¥.: HHV/TFD/MSS/SAC/CCA/05/October, 216 Process Mdentfication Document ID:
HIV /TFD/MSS/8AC/CCA/05/October, 2016 7
- san Hoke
nt we : .
Shem ie a =
mais getaee pent mee
Smee) eatery) tence ca