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INSTRUCTION MANUAL

MODEL U-4100 SPECTROPHOTOMETER

(MAINTENANCE MANUAL)

24-14, Nishi-Shimbashi 1-chome, Minato-ku, Tokyo, Japan

14th Edition, July 2014


Copyright C Hitachi High-Tech Science Corporation 2013. 1st Edition, 2000
All rights reserved. Printed in Japan. Part No. 134-9011-13 HS-N (HMS)
Be sure to read through and understand the following
points with regard to this manual.
1. Information contained in this document is subject to
change without notice for improvement.
2. This manual is copyrighted by Hitachi High-Tech
Science Corporation with all rights reserved.
No part of this manual may be reproduced,
transmitted or disclosed to a third party in any form or
by any means without the express written permission
of Hitachi High-Tech Science Corporation.
3. Hitachi High-Tech Science Corporation assumes no
liability for any direct, indirect, or consequential
damages arising from use not described in this
manual.
Utmost care must be exercised when using the
instrument.
4. This document does not provide any warranty or
permission for industrial properties or any rights to
grant license lawfully and without infringement.
PREFACE
We thank you for purchasing the Hitachi Model U-4100
Spectrophotometer.

The Model U-4100 Spectrophotometer is designed for


spectrophotometer and should not be used for the other
purposes.
Note that samples that may have been infected with bacteria or
viruses are not applicable to this instrument.

The Model U-4100 Spectrophotometer is intended for use by


persons having a basic knowledge of chemical analysis
procedures.
Keep in mind that improper use of analytical instruments,
chemicals or samples would result not only in wrong
analytical data but also in consequences adverse to safety.
Note that it is allowed only for persons having a basic
knowledge of chemical analysis procedures to use the
Model U-4100 Spectrophotometer.

Please read this instruction manual carefully before attempting


operation and acquaint yourself the Model U-4100
Spectrophotometer for its correct use.

Careful read and understand all of the safety instructions prior to


operation or maintenance of the Model U-4100
Spectrophotometer.

After reading through this instruction manual, keep it handy so


that it can be referred to whenever needed.

-1-
ABOUT THIS MANUAL
This instruction manual consists of the following two manuals.

• Instruction manual for Model U-4100 Spectrophotometer:


Maintenance Manual
• Instruction manual for Hitachi Spectrophotometer Series:
UV Solutions Program Operation Manual

This instruction manual has been prepared for the user of the
Model U-4100 Spectrophotometer. It describes how to handle
the Model U-4100 Spectrophotometer and points to notice
especially. The operating procedures and maintenance/
inspection instructions for the instrument are contained in this
manual.

First of all, be sure to read “IMPORTANT” and “SAFETY


SUMMARY” at the beginning of this manual.

The contents of “IMPORTANT” and “SAFETY SUMMARY”


described hereafter apply to the accessories of this instrument
also.

-2-
IMPORTANT
Precautions on CE Conformity Marking

In consideration of use in the European countries, this instrument


bears the CE mark indicating the conformity to the requirements
mentioned below.

1. Electromagnetic Compatibility Requirement

This instrument is designed to satisfy the European Norm


EN61326-1 (2006) for the CE conformity marking through
conformity to the EMC Directive 2004/108/EC.

This instrument is classified as Class A of EN61326-1. So, this


instrument must not be used in domestic establishments nor in
establishments directly connected to a low voltage power supply
network which supplies buildings used for domestic purpose.

And this instrument is also designed to comply with table 1


"Basic immunity test requirements" in the above European
Norms. If the instrument is used near an intense
electromagnetic source, however, interfering noise may be given
to the instrument to cause an adverse effect on its performance
or functionality.

2. Safety Requirement

This instrument is also designed to satisfy the European Norm


EN61010-1 (2010) for the CE conformity marking through
conformity to the LVD Directive 2006/95/EC.
This instrument is requested to be used in a suitable
environment and grounded appropriately.

IMPORTANT - 1
Information for Users on WEEE (only for EU Countries)

This symbol is in compliance with the Waste Electrical and


Electronic Equipment directive 2002/96/EC (WEEE).
This symbol on the product indicates the requirement NOT to
dispose of the equipment as unsorted municipal waste, but use
the return and collection systems available.

Information on Disposal for Users

1. In the European Union

If you need to discard this product or discard user serviceable


parts:
Please contact your local sales representative or distributor who
will inform you of the recycle of the product.
You might be charged for the costs arising from take-back and
recycling.

2. In other Countries outside the EU

If you wish to discard this product, please contact your local


authorities and ask for the correct method of disposal.

Instruction Manual for U-4100

Cautions

The following is a statement of notice about EMC for Korea.


A 급 기기 (업무용 방송통신기자재)
이 기기는 업무용(A 급) 전자파적합기기로서 판매자 또는 사용자는
이 점을 주의하시기 바라며,
가정외의 지역에서 사용하는 것을 목적으로 합니다. (O)

IMPORTANT - 2
Warranty on Product

This product, inclusive of its accessories, is warranted to be free


from defects in material or workmanship under normal use within
the product specifications indicated in this manual and under
conditions given below.
This warranty is void if the instrument is not used according to
the instruction manual.

(1) Scope of Warranty

Any parts that prove to be defective in design or


workmanship during the warranty period will be repaired,
adjusted or replaced without charge. A substitute part
may be used for repair, or replacement with an equivalent
product may be made instead of repair. Such system
components as a personal computer and printer to be
updated frequently for improvement may not be available in
original versions at the time of replacement.
The manufacturer assumes no liability for any damage to
data or application software due to any possible fault or
failure of this instrument.

(2) Warranty Period

One year from the date of initial installation


(In case a separate warranty document has been issued,
the warranty period indicated in it takes precedence over
the above period)
Consumables such as WI and D2 lamps are excluded from
warranty.

IMPORTANT - 3
(3) Limitations and Exclusions on Warranty

Note that the following cases are excluded from the scope
of this warranty, i.e., these cases are beyond the coverage
of free-of-charge repair even during the warranty period
indicated above.

(a) Failure due to operation at a place not meeting the


installation requirements specified by the
manufacturer.

(b) Failure due to power supply voltage/frequency other


than specified by the manufacturer or due to
abnormality in power supply.

(c) Corrosion or deterioration of the piping due to


impurities contained in gas, compressed air or
cooling water supplied by the user.

(d) Corrosion of the electric circuits or deterioration of


the optical elements due to highly corrosive
atmospheric gas.

(e) Failure due to use of software, hardware or spare


parts not supplied by the manufacturer.

(f) Failure due to use not described in the manual or


improper repair not approved by the manufacturer.

(g) Failure due to maintenance or repair by other than


service personnel qualified by the manufacturer.

(h) Failure due to relocation or transport conducted not


under the supervision of the manufacturer after the
initial installation of the instrument.

(i) Failure due to disassembly, modification or relocation


not approved by the manufacturer.

(j) Failure due to acts of God, including fire, earthquake,


storm, flood, lightning, social disturbance, riot, crime,
insurrection, terrorism, war (declared or undeclared),
radioactive pollution, contamination with harmful
substances, etc.

IMPORTANT - 4
(k) Failure of the hardware, or damage to the system
software, application software or data due to
computer virus infection.

(l) After disposal of this instrument, after its resale


without prior approval from the manufacturer,
consumable parts, and failure of any part that have
reached the end of its service life.

(m) Failure due to a life-limited part that has exceeded


the end of its useful lifetime.

(4) Disclaimer of Warranty

THE MANUFACTURER MAKES NO WARRANTIES,


EITHER EXPRESS OR IMPLIED, EXCEPT AS
PROVIDED HEREIN, INCLUDING WITHOUT LIMITATION
THEREOF, WARRANTIES AS TO MARKETABILITY,
MERCHANTABILITY, FOR A PARTICULAR PURPOSE
OR USE, OR AGAINST INFRINGEMENT OF ANY
PATENT. IN NO EVENT SHALL THE MANUFACTURER
BE LIABLE FOR ANY DIRECT, INCIDENTAL OR
CONSEQUENTIAL DAMAGES OF ANY NATURE, OR
LOSSES OR EXPENSES RESULTING FROM ANY
DEFECTIVE PRODUCT OR THE USE OF ANY
PRODUCT.
NO ORAL OR WRITTEN INFORMATION OR ADVICE
GIVEN BY THE MANUFACTURER, ITS DEALERS,
DISTRIBUTORS, AGENTS OR EMPLOYEES SHALL
CREATE A WARRANTY OR IN ANY WAY INCREASE
THE SCOPE OF THIS WARRANTY.

IMPORTANT - 5
Service Life of This Instrument

This instrument has a useful service life of seven years after the
date of its initial use (installation), which is estimated under the
condition that periodic maintenance, checkup, replacement of
life-limited parts, and repair of worn parts are carried out as
specified in the present instruction manual.
(In use of the instrument under standard operating conditions
(8 h/day, 20 days/month))
For using the instrument beyond the useful service life, it shall be
checked for safety by Hitachi High-Technologies Corporation
sales representative or service office of Hitachi High-
Technologies Corporation sales representative. (This safety
check will be available on a chargeable basis.)
If use of the instrument is continued without receiving the safety
check, the instrument might become faulty and cause a danger.
Note that replacement may be recommended as a result of the
safety check.

Installation, Relocation and After-sale Technical Service

(1) Installation and Relocation

(a) Installation at delivery shall not be carried out by the


user. It shall be carried out by our sales
representative or the engineers who have been
trained and qualified for this purpose by us in order to
use the instrument safely and accurately.

(b) Before installation, the user shall make preparations


for satisfying the installation requirements in
accordance with this instruction manual.

(c) If relocation becomes necessary after initial


installation (delivery), please contact the dealer from
whom you purchased the instrument or our sales
representative.

(2) After-sales Service

(a) For after-sales service, contact our sales


representative or service office of our sales
representative.

IMPORTANT - 6
(b) For service after the warranty period, consult our
sales representative or service office of our sales
representative with regard to a maintenance and
inspection service contract. (Service will be available
on a chargeable basis.)

(c) The maintenance and consumables of the instrument


can be supplied within the useful service life of the
instrument (7 years). Even after the period of useful
service life, the parts and units can be supplied
(within 10 years after the date of initial use) so far as
they are obtainable. However, this measure will not
lead to an extension of the 7-year useful service life
which is assured by the manufacturer.
And, if a part or unit is unavailable due to the
discontinuance of its manufacture, a substitute part
or unit may be supplied, for which we request your
understanding.

(d) It may be impossible to supply the main unit


components other than the maintenance parts and
consumables due to the discontinuance of main-unit
manufacture, etc. If the instrument becomes faulty,
it might be irreparable due to lack of such
components. In this case, the user is requested to
stop operation and replace the instrument with a new
one.

Technical Seminars and Training Courses for Users

We offer technical seminars and training courses at either our or


user’s facilities to ensure proper and safe operation of the
analytical instrument to its full performance. For further
information, contact our sales representative. (Applicants will
be charged.)

IMPORTANT - 7
Other Precautions

1. Handling of Chemicals and Samples

(1) The user is responsible for following relevant legal


standards and regulations in handling, storage and
disposal of chemicals and samples used in analytical
operations with this instrument.

(2) Reagents, standard solutions and accuracy-control


samples shall be handled, stored and discarded as
instructed by the respective suppliers.

(3) Samples that may have been infected with bacteria or


viruses are not applicable to this instrument.

2. Trademark Acknowledgments

Microsoft, Windows, Microsoft Excel, Microsoft Word, and


Windows XP are registered trademarks of Microsoft Corporation
of the USA. All other brand names and product names used in
this manual are registered trademarks or trade names of their
respective holders.

IMPORTANT - 8
SAFETY SUMMARY
General Safety Guidelines

Before using the Model U-4100 Spectrophotometer, be sure to


read the following safety instructions carefully.

The hazard warnings which appear on the warning labels on the


product or in the manual have one of the following alert headings
consisting of a safety alert symbol and signal word DANGER,
WARNING or CAUTION.

: Safety alert symbol used for calling


attention to a potential hazard which
could cause personal injury.
To avoid possible injury or death,
observe all the safety messages
following this symbol.
DANGER : Indicates an imminently hazardous
situation which, if not avoided, will result
in death or serious injury.
(This warning does not apply to this
product.)
WARNING : Indicates a potentially hazardous
situation which, if not avoided, can
result in death or serious injury.
CAUTION : Indicates a hazardous situation which, if
not avoided, can result in minor or
moderate injury.
NOTICE : Indicates a hazardous situation which, if
avoided, can result in damage to
property.

In addition to the above, the following signal word is used to


indicate instructions for ensuring proper use of the product.

NOTE: Indicates an instruction for ensuring correct use of


the product and accurate analysis therewith.

SAFETY - 1
SAFETY SUMMARY
Common Safety Precautions

Prior to Use

 Before using the instrument, be sure to read this instruction


manual carefully to attain a full understanding of its
operations.

 Keep the instruction manual handy nearby so it can be


referred to whenever needed.

 Be sure to observe the procedures specified in the manual.

 Be sure to understand and follow all the safety instructions


given in the manual.

 Be sure to observe all the hazard warnings attached to the


instrument or provided in the manual. Failure to do so could
result in personal injury or damage to the instrument.

 Be sure to follow all the methods of use instructed in the


manual for proper application of the product.

 Absolutely avoid modifying the product, using non-specified


parts, or removing safety devices as it could be hazardous.

 Do not perform any operation or action other than described


in the manual.
On occurrence of any trouble in the instrument, notify your
nearest Hitachi High-Technologies Corporation sales
representative or service office of Hitachi High-Technologies
Corporation sales representative.

 When using chemicals for the instrument, be sure to provide


proper ventilation of the room. Inadequate ventilation could
endanger human health.

 Keep in mind that the hazard warnings in the manuals or on


the product cannot cover every possible case, as it is
impossible to predict and evaluate all circumstances
beforehand. Always be alert and use your common sense.

SAFETY - 2
SAFETY SUMMARY
Common Safety Precautions (Continued)

In Use

If an abnormality such as unusual noise, odor, fuming or gas


leakage occurs during operation of the instrument, immediately
disconnect power to the instrument, and take proper safety
measures as required. Then, notify your nearest Hitachi High-
Technologies Corporation sales representative or service office
of Hitachi High-Technologies Corporation sales representative.

Installation, Maintenance, and Relocation

 At the time of delivery, installation of the instrument shall be


carried out by or under supervision of qualified service
personnel of the manufacturer or its authorized service agent
for ensuring safety and high accuracy in operation of the
instrument. It is not permitted for the user to carry out
installation.

 After completion of installation, check that all the standard


parts are equipped. If the instrument is made active with any
one of the standard parts not equipped, a failure could occur
to result in a hazardous condition.
If any item is missing or damaged or if you have any question,
notify the installation personnel at site or your nearest Hitachi
High-Technologies Corporation sales representative or
service office of Hitachi High-Technologies Corporation sales
representative.

 The maintenance and checkup procedures to be taken by the


user are only those described in the manual. When taking
the maintenance and checkup procedures described in the
manual, attain a clear understanding of them.
Do not perform other maintenance and checkup procedures
to avoid jeopardizing safety and causing troubles in the
instrument.

SAFETY - 3
SAFETY SUMMARY
Common Safety Precautions (Continued)

 After installation, do not relocate the instrument. If the


instrument is relocated, vibration or impact to be applied
during relocation could cause a malfunction in the optical
components that have been adjusted precisely.

 If any warning/caution label has become illegible due to


deterioration with age or it has been damaged due to any
cause, notify your nearest Hitachi High-Technologies
Corporation sales representative or service office of Hitachi
High-Technologies Corporation sales representative for
replacement with a new one.

 The parts having a useful lifetime indicated in this manual


must be replaced periodically as specified. If the instrument
is operated though the replacement of life-limited parts has
already been required, the instrument might become faulty
due to part deterioration, etc., causing leak, fuming,
combustion or the like trouble on safety.
For other than the replacement procedures instructed in this
manual, contact your nearest Hitachi High-Technologies
Corporation sales representative or service office of Hitachi
High-Technologies Corporation sales representative.

 For reducing a risk of trouble occurrence due to physical


deterioration, it is requested to carry out the safety check
(available on a chargeable basis) or replacement with a new
one when the instrument has reached the end of its useful
service life.

SAFETY - 4
SAFETY SUMMARY
Safety Instructions in This Manual

Shown below are the safety instructions contained in this manual


and their relevant sections in it.

DANGER Indications

The indication “ DANGER” does not apply to this instrument.

WARNING Indications

Electric Shock due to Contact with Power Supply Voltage

 In contact with power supply voltage, you may receive an


electric shock to cause fatal or serious injury.
Before confirming the voltage and fuse, make sure the power
cord is disconnected.
(Section 1.5)

 In contact with power supply voltage, you may receive an


electric shock to cause fatal or serious injury.
Before connecting the power cord, be sure to turn off the
POWER switch.

(Section 1.5)

 In contact with power supply voltage, you may receive an


electric shock to cause fatal or serious injury. Be sure to
turn off the power switch and connect the power cord of the
spectrophotometer main unit after all the others.

(Section 1.5)

SAFETY - 5
SAFETY SUMMARY
WARNING Indications (Continued)

Injury due to Light Source Lamp

 The D2 lamp uses a power supply voltage of 500 V.


Touching the lamp with power on could give you an electric
shock, resulting in fatal or serious injury. Make sure the
spectrophotometer POWER is OFF before replacing the lamp.
(Section 5.3)

SAFETY - 6
SAFETY SUMMARY
CAUTION Indications

Touching Hot Part Could Result in Burns

 The D2 lamp or WI lamp become very hot during use, and you
may be burned if you touch them. Turn OFF the
spectrophotometer POWER switch and wait until the lamps
cool down before attempting to replace them.
(Section 5.3)

Oxygen Deficiency due to Presence of Nitrogen


(when using Ultra Violet region measurement system)

 If nitrogen purging is carried out for long hours in a narrow


room without operating an exhaust duct, the oxygen
concentration in the room will decrease and an oxygen
deficiency could result. Be sure to operate an exhaust duct
or else open a window during the purge for ventilation
purposes.
(Section 5.3)

Fatigue due to Long-hour Operation

 If you keep working with the display monitor and keyboard for
long hours, your eyes and body will be fatigued to jeopardize
your health. When working with the display monitor for a
long time, take a break for 10 to 15 minutes per hour for the
health of your eyes and body.
(Chapter 3)

SAFETY - 7
SAFETY SUMMARY
NOTICE

Electricity

 Confirm the power supply to the spectrophotometer.


Fluctuation in voltage or noise on the power line would not
only affect the spectrophotometer main unit adversely but
may also cause an accident.

 Be sure to provide grounding connection along with power


connection. Make sure that the spectrophotometer is
grounded at a grounding resistance of 100  or less.
If grounding is improper, the spectrophotometer is easily
affected by external noise and floating voltage generated in it
endangers physical safety.

 High-voltage circuits are used inside the spectrophotometer.


Do not open any other cover than necessary for operation.

Fire

 Avoid smoking or using a flame in the vicinity of the


spectrophotometer.

Data Backup

 Data stored on the hard disk may become unusable due to a


system failure, wrong operation, computer virus infection, etc.
To ensure data integrity in case of accidental damage to the
hard disk, periodically make backup copies of hard disk
files onto floppy disks.
To prevent an erroneous operation on the hard disk, always
reserve approx. 100 MB of free space as a working area for
application software.

SAFETY - 8
SAFETY SUMMARY
NOTICE (Continued)

Computer Virus

 If programs or data has suddenly been destroyed, if an


unexpected operation takes place or if an abnormal display
appears on the screen, your personal computer may have
been infiltrated by a computer virus. The computer virus is a
rogue program that secretly invades a personal computer and
operates it willfully while destroying memorized data.
A program for eliminating the virus is called a vaccine
program.There is a possibility of contamination with a
computer virus by downloading through communication a
program including a computer virus, or by using an
exchangeable recording medium such as a floppy disk that
contains a computer virus. Also, it is possible to transmit the
virus from one personal computer to another via
communication or recording media. So avoid using a
program or recording medium that might include a virus.
Carry out check using a vaccine program if there is a
possibility of contamination with a virus. But depending on
the type of vaccine program, it may be impossible to eliminate
the virus.
It is therefore recommended to back up the contents of
the hard disk beforehand.
Note that the preparation of a vaccine program and the
elimination of a computer virus must be carried out by the
user.
Do not attempt to check by running a vaccine program while
the instrument is on operation.

Power Failure

 A power failure or momentary voltage drop of the power


supply due to lightning, etc. may cause failure of the personal
computer used with the instrument and also damage the
system software, application software and other data.
To avoid such problems, it is recommended to use an AC
uninterruptible power source.

SAFETY - 9
SAFETY SUMMARY
NOTICE (Continued)

Personal Computer (PC)

 Do not turn off the PC power supply alone. If the PC power


supply is turned off during access to the hard disk or floppy
disk, the PC may malfunction and the data or software stored
in it may be destroyed. To turn off the PC power supply, be
sure to complete the spectrophotometer control and data
processing program before taking the shutdown procedure for
the system software.

Disposal of Waste Solution

 Be sure to collect waste solution and treat it for proper


disposal in accordance with the relevant laws and regulations
regarding water pollution control and sewage treatment.
Improper treatment of waste solution may result in
environmental pollution and could also lead to a penalty.

Accuracy and Precision of Measured Values

 Carry out periodic inspection and check whether the system is


operating normally. If necessary, conduct measurement on
a control sample.

SAFETY - 10
SAFETY SUMMARY
Warning Labels

The warning labels shown below are attached on the Model U-2900 UV-VIS Spectrophotometer.
Read the warning labels carefully, and check the instructions on them to attain a clear understanding with reference to actual parts. Periodically check the appearances of these
warning labels to see if they are clean to allow easy reading over a safe distance. If any one of the warning labels becomes illegible due to deterioration, contact your local Hitachi
High-Technologies Corporation sales representative or service office of Hitachi High-Technologies Corporation sales representative for replacement with a new one.

High temperature
Can cause burns.

Light source lamp and lampchamber


remain hot for a while even after
Power-off.
Before lamp replacement, turn
power off and wait at least
20 minutes.
134-1973

High voltage : 500V


Can cause fatal or
serious injury.

Before removing light source


cover, turn power switch off,
Never release safety
mechanism inadvertently.

134-1971

SAFETY - 11
SAFETY SUMMARY
Warning Labels (Continued)

High voltage : 1000V Electric shock


Can cause fatal or Can cause fatal or
serious injury. serious injury.

Before handling photomultiplier, Provide proper grounding


unplug power cord. connection.
Don't remove instrument cover
except service personnel.
134-1970 134-1972

SAFETY - 12
CONTENTS

PREFACE .........................................................................................................................1

ABOUT THIS MANUAL .....................................................................................................2

IMPORTANT .............................................................................................. IMPORTANT-1


Precautions on CE Conformity Marking .......... IMPORTANT-1
Information for Users on WEEE
(only for EU Countries) ................................... IMPORTANT-2
Warranty on Product ....................................... IMPORTANT-3
Service Life of This Instrument........................ IMPORTANT-6
Installation, Relocation and After-sale
Technical Service............................................ IMPORTANT-6
Technical Seminars and Training Courses
for Users ......................................................... IMPORTANT-7
Other Precautions ........................................... IMPORTANT-8

SAFETY SUMMARY ...................................................................................SAFETY-1


General Safety Guidelines ................................SAFETY-1
Common Safety Precautions ............................SAFETY-2
Safety Instructions in This Manual ....................SAFETY-5
DANGER Indications....................................SAFETY-5
WARNING Indications .................................SAFETY-5
Electric Shock due to Contact with
Power Supply Voltage ..................................SAFETY-5
Injury due to Light Source Lamp ..................SAFETY-5
CAUTION Indications ...................................SAFETY-7
Touching Hot Part Could Result in
Burns ...........................................................SAFETY-7
Oxygen Deficiency due to Presence of
Nitrogen (when using Ultra Violet region
measurement system) .................................SAFETY-7
Fatigue due to Long-hour Operation ............SAFETY-7
NOTICE ..................................................................SAFETY-8
Warning Labels ................................................SAFETY-11

1. INSTALLATION (FOR REFERENCE) .................................................................... 1-1


1.1 Unpacking ............................................................... 1-1
1.2 Power Requirements ............................................... 1-2
1.2.1 Power Supply Voltage ................................. 1-2
1.2.2 Frequency ................................................... 1-2
1.2.3 Power Capacity ........................................... 1-2
1.2.4 Grounding Line............................................ 1-2

-i-
1.3 Installation Conditions ............................................. 1-3
1.3.1 Installation Area .......................................... 1-3
1.3.2 Withstanding Load ...................................... 1-4
1.3.3 Environmental Conditions............................ 1-4
1.4 Check of Contents ................................................... 1-5
1.5 Assembly ................................................................. 1-5
1.5.1 Removal of Securing Parts
for Transport ............................................... 1-5
1.5.2 Confirmation of voltage and fuse ................. 1-9
1.5.3 Connection of Power Cord
and Grounding Wire .................................... 1-10
1.5.4 Connection of Cords ................................... 1-12
1.5.5 Fixing of Spectrophotometer ....................... 1-12
1.5.6 Connection of Printer .................................. 1-12
1.5.7 Connection of N2 Inlet (when using Ultra
Violet region measurement system) ............ 1-13
1.6 Checkup after Installation and Assembly ................. 1-14
1.7 Turning on Power .................................................... 1-14
1.8 N2 Purge (when using Ultra Violet region
measurement system) ............................................. 1-15
1.9 Installation of UV Solutions Program ....................... 1-15
1.10 Installation of Model U-4100 Utility
(exclusive for service) .............................................. 1-16

2. FUNCTION ............................................................................................................. 2-1


2.1 Configuration ........................................................... 2-1
2.2 Name and Function of Each Part of
Spectrophotometer Main Unit .................................. 2-2
2.3 Application ............................................................... 2-6
2.4 Operating Principle ................................................ 2-7
2.4.1 Optical System ............................................ 2-7
2.4.2 Signal Processing and Control System ....... 2-11
2.4.3 Baseline Correction ..................................... 2-13
2.4.4 Automatic Calibration and Self-diagnosis .... 2-13
2.5 Proper Use of Spectrophotometer ........................... 2-14
2.5.1 Selection of Solvent .................................... 2-14
2.5.2 Special Samples ......................................... 2-15
2.6 Performance Specifications ..................................... 2-16

3. INSTRUMENT CALIBRATION ............................................................................... 3-1


3.1 Introduction ............................................................. 3-1
3.2 Wavelength Calibration ........................................... 3-2
3.3 System Baseline Measurement ............................... 3-2
3.4 Function of PbS 0 Switch ........................................ 3-4

- ii -
4. MAINTENANCE AND INSPECTION ...................................................................... 4-1
4.1 Introduction ............................................................. 4-1
4.2 Self-diagnosis and Automatic Adjustment ............... 4-1
4.3 Confirmation of Specifications ................................. 4-1
4.3.1 Wavelength Accuracy ................................. 4-1
4.3.2 Spectrum Band Width ................................. 4-3
4.3.3 Baseline Flatness ........................................ 4-3
4.3.4 Noise Level ................................................. 4-6
4.4 Periodical Inspection ............................................... 4-8
4.4.1 Cleaning of Sample Compartment .............. 4-8
4.4.2 Cleaning of Sample Compartment
Window Plate .............................................. 4-11
4.5 Check of Lamp ON Time ......................................... 4-12
4.6 Storage.................................................................... 4-13
4.6.1 After Completion of Measurement ............... 4-13
4.6.2 When Unused for a Long Time ................... 4-13
4.7 Troubleshooting Table ............................................. 4-14

5. REPLACEMENT PARTS ........................................................................................ 5-1


5.1 Introduction ............................................................. 5-1
5.2 Consumables and Spare Parts ................................ 5-1
5.3 Replacement of Light Source Lamp ........................ 5-2

APPENDIX .....................................................................................................APPENDIX-1

INDEX ................................................................................................................... INDEX-1

- iii -
1.1

1. INSTALLATION (FOR REFERENCE)

The instrument is installed by our qualified service personnel.


Make reference to this section for system configuration.

1.1 Unpacking

Unpack the shipping crate, carefully take out the


spectrophotometer and place it on a table.
Take utmost care when taking out the instrument.
Figure 1-1 shows the appearance of the Model U-4100.

C000077

Fig. 1-1 Model U-4100 Spectrophotometer

1-1
1.2 Power Requirements

Fig. 1-2 U-4100 Spectrophotometer


(liquid sample measurement system)

NOTICE: The light source switching mirror is secured with


a sponge during transport. Before use, detach
the light source cover and remove the sponge.

1.2 Power Requirements

1.2.1 Power Supply Rated voltage: 100, 115, 220, 230 or 240 V AC
Voltage Allowable fluctuation is within 10% of the rated voltage.

1.2.2 Frequency Rated frequency: 50 or 60 Hz


Allowable fluctuation is within 0.5 Hz of the rated frequency.

1.2.3 Power Capacity 1 kVA or more (excluding power for computer and printer)
Prepare a power capacity of 1.5 kVA or more considering use of
peripherals (computer and printer).

1.2.4 Grounding Line Grounding resistance: 100  or less

1-2
1.3.1

1.3 Installation Conditions

1.3.1 Installation Area An installation area of 2000 (W) mm  1300 (D) mm or more is
required for the spectrophotometer main unit. Space is also
needed for a PC and printer.
Provide a space of 700 mm or more for replacement of the light
source at the left side of the main unit. It is advisable to provide
a space of 400 mm or more for access to the main unit at the
rear. Provide a space of 200 mm at least.

Rear wall

200 mm min.

Spectrophotometer
Left side wall

800 mm
main unit
(sample compartment: 1300 mm min.
standard)
700 mm min.

Sample
compartment
opened/closed
at front

730 mm 200 mm min.


1800 mm min.

Rear wall

200 mm min.

Spectrophotometer
Left side wall

800 mm

main unit
(sample compartment: 1300 mm min.
large)

700 mm min.
Sample
compartment
opened/closed
at front
930 mm
200 mm min.
2000 mm min.

Fig. 1-3 Installation Area

1-3
1.3 Installation Conditions

1.3.2 Withstanding For installation, select a level floor capable of withstanding a


Load weight of 150 kg or more.

1.3.3 Environmental (1) Operating Temperature : 5 to 3 5 C.


Conditions
For measurement in the most stable conditions, it is
recommended to install the instrument in a room which is
air-conditioned at 20 to 25 C.

(2) Operating Humidity : 45 to 85%

(3) Storage Temperature : -20 to 70 C

(4) Atmospheric Gas

The installation room should be free from the following.


 Acidic, alkaline and other gases which may corrode
metals significantly
 Gaseous organic solvents (particularly benzine and
thinner) which may dissolve paint

(5) Other General Cautions

(a) The instrument should not be exposed to direct


sunlight (which adversely affects the optical
performance). Install it as far away from a window as
possible.

(b) The instrument should be free from noticeable


vibration or shock (which adversely affects the fine
control mechanism).

(c) There should be no heat radiating equipment such as


a gas burner, electric heater, oven, etc. to prevent the
main unit cover being heated (to 70 C or more).

(d) The instrument should not be located near a device


producing a strong electric field (electric welding
machine, high-frequency electric furnace or pole
transformer for example).

(e) The installation site should be free from excessive dust


(which adversely affects the optical performance).

(f) The instrument should be free from abrupt variation of


power supply voltage (which constitutes a noise
source).

1-4
1.5.1

(g) Avoid frequently turning on/off the power for electric


equipment (stirrer, vibrator, etc.) not provided with a
noise suppressor on the same power line as for the
main unit.

NOTICE: The optical system is very delicate. The control


system incorporates parts constructing the high-
density electronic circuit which functions as a
computer. So careful consideration should be
given to the above items.

1.4 Check of Contents

Upon completion of unpacking, check the contents of delivery


against the packing list. If any part is missing or damaged, or if
you have a question, then contact our local sales representative.

1.5 Assembly

1.5.1 Removal of NOTICE: Before turning on the power supply to the


Securing Parts spectrophotometer main unit, be sure to remove
for Transport the securing parts for transport. The instrument
does not operate normally unless the securing
parts are removed.

The instrument is shipped with the important mechanical parts


secured to prevent the performance being adversely affected by
shock or the like during transport. At the time of installation, all
securing parts must be removed.

No. Location How to Remove How to Secure


1 Light source Remove tape. Secure with tape.
switching mirror
2 Grating assy Cut wire binder. Fasten with wire
binder.
3 Sign bar assy Remove fixture. Secure with
fixture.

1-5
1.5 Assembly

(1) Remove the parts securing the light source switching mirror.

(a) Open the light source compartment door.

Light source
compartment door

C000076

Fig. 1-4

(b) Remove the two screws retaining the left side cover.

Left side cover

Retaining screw

Light source section

C000079

Fig. 1-5

1-6
1.5.1

<When using Ultra Violet region measurement system>


Remove the two screws retaining the left side cover.
With the Ultra Violet region measurement system, also
remove the purge cover.

Left side cover

Retaining screws
Purge cover

Light source section

Fig. 1-6 With Ultra Violet Region Measurement System

(c) Open the left side cover.

(d) Remove the tape and sponge securing the light source
switching mirror.

(e) Remove the leaf spring holding the WI lamp.


Screws

Leaf spring
Light source
switching mirror

WI lamp

Fig. 1-7 Light Source Switching Mirror Section

(2) Remove the parts securing the grating assy and sine bar
assy.

(a) Open the left side cover, remove the two thumb nuts
from the 1st monochromator cover and detach it.

1-7
1.5 Assembly

(b) Cut the wire binder securing the grating assy with
nippers or the like.

(c) Upon detachment of the monochromator lid, the sine


bar and cam of the 1st monochoromator can be seen.

(d) Remove the fixture securing the sine bar and cam.

NOTICE: Take utmost care not to damage the grating by


the hand or cut wire binder.

Grating base

Wire binder

Cam Fixture

Sine bar

Fig. 1-8 Inside 1st Monochromator

NOTICE: Store the removed fixture and screws. They are


needed for securing when the instrument is
retransported for relocation.

(e) Upon completion of the above work, attach the


monochoromator cover and fasten the left side cover.

1-8
1.5.2

1.5.2 Confirmation of
Voltage and
WARNING
Fuse Electric Shock due to Contact with Power Supply
Voltage
In contact with power supply voltage, you may receive an
electric shock to cause fatal or serious injury.
Before confirming the voltage and fuse, make sure the
power cord is disconnected.

Confirm the power supply voltage and the usable voltage of the
spectrophotometer, which is indicated near its power plug.

NOTICE: When 100 or 115 V is indicated, the instrument


is unusable on the 200 V power line.
Voltage changeover is required inside the
spectrophotometer. The same is true for use
on the 100 V power line when the 200 V line is
indicated.

Fuse holder

C000078

Fig. 1-9 Power Unit

 Confirmation of Fuse
Make sure that the fuse has a capacity matched with the line
voltage to be used.

Table 1-1
Voltage Fuse Capacity Part No.
100 V line (100, 115 V) 5 A (time lag) J821399
200 V line (220, 230, 240 V)

1-9
1.5 Assembly

1.5.3 Connection of WARNING


Power Cord and
Grounding Wire Electric Shock due to Contact with Power Supply
Voltage
In contact with power supply voltage, you may receive an
electric shock to cause fatal or serious injury.
Before connecting the power cord, be sure to turn off the
POWER switch.

(1) Plug the power cord securely into the connector of the main
unit.

(2) When using a plug adapter or table tap, connect its


grounding wire to the grounding terminal.

1 - 10
1.5.3

COMMON COMMON HOT


W (WHITE)
GROUND

GROUND GROUND
HOT (RED)
HOT (GREEN) COMMON
S
Power Cord

Power Supply Voltage 100 V Line 200 V Line


HOT Black Brown (N)
COMMON White Blue (S)
GROUND Green Green/Yellow

Wall Power inlet


Plate
Plate retaining screw
Outlet Grounding plug
J832804
Grounding terminal Main unit

Power
Grounding cord
wire
Metal box

Underground Details

75 cm or more underground
Copper plate

300 mm

10 mm
2 mm

Fig. 1-10 Grounding Connection

1 - 11
1.5 Assembly

1.5.4 Connection of Connect cords according to Fig. 1-9.


Cords
WARNING
Electric Shock due to Contact with Power Supply
Voltage
In contact with power supply voltage, you may receive an
electric shock to cause fatal or serious injury. Be sure to
turn off the power switch and connect the power cord of the
spectrophotometer main unit after all the others.

To AC power supply

Communication cable Printer cable

RS-232C COM1 Printer

Printer

PC

Spectrophotometer main unit

Fig. 1-11 Connection of Cords

1.5.5 Fixing of The spectrophotometer is provided with height adjusters at four


Spectrophoto- bottom corner. Securely fix it at a level.
meter

1.5.6 Connection of Use a printer suitable for the OS being used.


Printer Connect the printer with reference to the instruction manual
furnished with it.

NOTE: The printer and printer cable should be prepared


separately.

1 - 12
1.5.7

1.5.7 Connection of N2 A connection port for introduction of N2 is provided on the lower


®
Inlet (when using right side of the spectrophotometer main unit. A Swagelok
Ultra Violet (SUS) joint of 6 mm O.D. is used for the connection.
region Tubing outside the instrument should be prepared separately.
measurement A tube of 6 mm O.D. (made of SUS or plastic) and a regulator
system) that can supply N2 at 50 L/min and 0.3 MPa max. are required.

(1) Loosen the nut of the joint, and insert the tube for N2
introduction into the joint. Upon confirming the tube is
securely fitted into the joint, finger-tighten the nut.

(2) Fasten the joint itself firmly with a wrench, and rotate the
nut another 1-1/4 turns.

®
Joint (Swagelok , made of SUS)
Spectrophotometer
main unit

Nut Tube

Fig. 1-12 Connection of Joint and Tube

NOTICE: When the prepared tube is made of soft plastic,


put a SUS insert into the tube prior to connecting
to the joint to ensure a firm connection.

1 - 13
1.6 Checkup after Installation and Assembly

1.6 Checkup after Installation and Assembly

Upon completion of installation and assembly, check the


following items.

(1) Check if the installation site is normal.

(2) Check if the string for transport is removed from the light
source switching lever.

(3) Check if the power supply voltage is confirmed and set


properly.

(4) Check if the power cord is connected properly and the


grounding wire is connected as specified.

(5) Check if the connecting cord is properly connected


between the spectrophotometer main unit and data
processing unit.

(6) Check if the printer is installed and connected properly.

(7) Check if an object which shuts out the light beam is set in
the sample compartment of the spectrophotometer or there
is any other abnormality.

1.7 Turning on Power

Turn on the power supply in the following procedure.

(1) Turn on the power switch of the printer.

(2) Turn on the power switch of the spectrophotometer main


unit.

(3) Turn on the power switch of the CRT unit.

(4) Turn on the power switch of the personal computer.

1 - 14
1.8

1.8 N2 Purge (when using Ultra Violet region measurement system)

Carry out N2 purge in the following procedure.

(1) Check that the N2 inlet tube is connected correctly to the


Swagelok joint of the spectrophotometer main unit.

(2) Start the N2 purge. Amount of N2 to be introduced should


be in a range of 15 to 25 L/min. After starting the purge, it
takes about 30 minutes until measurement can be made.
Note that if the inflow volume of N2 changes during the
purge, it may have an effect on the measurement data.
Purge should thus be performed at a constant inflow
volume.

CAUTION
Oxygen Deficiency due to Presence of Nitrogen
(when using Ultra Violet region measurement system)
If nitrogen purging is carried out for long hours in a narrow
room without operating an exhaust duct, the oxygen
concentration in the room will decrease and an oxygen
deficiency could result. Be sure to operate an exhaust duct
or else open a window during the purge for ventilation
purposes.

1.9 Installation of UV Solutions Program

Refer to Section 1 in the operation guide.

1 - 15
1.10 Installation of Model U-4100 Utility (exclusive for service)

1.10 Installation of Model U-4100 Utility (exclusive for service)

NOTE: Work by use of this utility is not done at installation.


It is used in ROM version change, etc.

For installation, take the following procedure.

(1) Click the start button on Windows, specify the file name,
select execution and input “a:¥setup”.

(2) Installation starts. Operate according to the message.


Install the program in C:¥Program Files¥UV Solutions, like
UV Solutions.

(3) The installed program is exclusive for service. To prevent


erroneous operation by the user, avoid registering the
program in the startup group or generating a shortcut to the
program.

For installation of UV Solutions program, refer to Section 1 in the


operation guide.

1 - 16
2.1

2. FUNCTION

2.1 Configuration

This instrument consists of the spectrophotometer main unit and


data processing unit.
Figure 2-1 shows the appearance of the instrument.

Data processing unit CRT


(personal computer)

C990827

Spectrophotometer Keyboard Mouse


main unit

Fig. 2-1 Appearance of Model U-4100 Spectrophotometer

2-1
2.2 Name and Function of Each Part of Spectrophotometer Main Unit

2.2 Name and Function of Each Part of Spectrophotometer Main Unit

The spectrophotometer main unit is composed of the light source,


monochromator, sample compartment, detector, mechanical
system and electrical system for control.
Figures 2-2 to 2-4 show the name and function of each part.
(2) Sample compartment

(3) RUN lamp

(1) POWER switch (4) Joint (for Ultra


Violet region
measurement
system)

C000077
Fig. 2-2 Appearance of Model U-4100 Spectrophotometer
Main Unit

(2) Sample compartment

(3) RUN lamp

(1) POWER switch

Fig. 2-3 Appearance of U-4100 Spectrophotometer


Main Unit (liquid sample measurement system)

2-2
2.2

(1) POWER Switch

Power switch of the spectrophotometer main unit.


Power is supplied by turning on this switch.

(2) Sample Compartment (solid, Ultra Violet region


measurement system)

Used as a detector in this sample compartment is a 60 mm


dia. integrating sphere which incorporates a Photomultiplier
tube (R928) and PbS (cooled type). The integrating sphere
can be moved according to the size of a sample to be
measured and the purpose of measurement (transmittance
measurement, reflectance measurement, etc.)
However, moving the integrating sphere detector changes
the size of light beam irradiating the sample and those at the
entrance and exit (sub white plate position) in the integrating
sphere. It is necessary to obtain the light beam size proper
to the sample according to the interacting position with the
integrating sphere. For details, refer to Appendix A
(guidelines for optical design of sample compartment).

C000086

Fig. 2-4 Structure of Sample Compartment

<Liquid Sample Measurement System>

Fig. 2-5 Structure of Sample Compartment

2-3
2.2 Name and Function of Each Part of Spectrophotometer Main Unit

(3) RUN Lamp

This lamp stays lit while the power is supplied to the


instrument.

(4) Joint (Ultra Violet region measurement system)

Used for connecting the N2 tube with the spectrophotometer


main unit for N2 purge. The joint is a Swagelok® type for
tubes of 6 mm O.D.

(6) Communication
connector

(5) Connector

C000078

Fig. 2-6 Rear View of Model U-4100 Spectrophotometer


Main Unit

(5) Connector

Used to connect the power cord.

(6) Communication Connector (RS-232C)

Used to communicate with the personal computer

2-4
2.2

(7) C. READY lamp

(8) D. READY lamp

(9) ALARM lamp

(11) PbS 0 switch

(10) Analog output terminal

(12) ACC
connector

C000080

Fig. 2-7 External View of Spectrophotometer Main Unit

(7) C. READY Lamp

In addition to the personal computer, a computer chip


(Hitachi SH2) for control is built in the spectrophotometer
main unit. This lamp monitors the operation of the
computer. The lamp is lit when the computer operates
normally. If the lamp is extinguished or flickers, the
computer is abnormal.

(8) D. READY Lamp

The cooled type PbS is used as a detector in the near


infrared region. When the detector is cooled down to the
specified temperature, this lamp comes on. The lamp
normally comes on several seconds after power supply.
If the lamp does not come on, the detector cooling system
is defective. Measurement is impossible in the infrared
region, but possible in the ultraviolet and visible regions.

2-5
2.3 Application

(9) ALARM Lamp

This lamp indicates the condition of communication


between the spectrophotometer and personal computer.
The lamp stays extinguished if communication is normal,
and comes on if any abnormality is caused in
communication.

(10) Analog Output Terminals

REC H, L, G : Analog output terminals


+, - : Synchronous contacts for analog output

(11) PbS 0 Switch

Used to correct the fluctuation of 0%T in the PbS area.


For usage, refer to section 3.4.

(12) ACC Connector (I/O)

For input/output signal for control of the auto sampler


(separately available) or any other external device.

2.3 Application

The spectrophotometer can be utilized for quality control,


research and development of samples in various sizes in the
fields of optical materials, semiconductors, liquid crystal, new
materials and food chemistry.

2-6
2.4.1

2.4 Operating Principle

2.4.1 Optical System The U-4100 spectrophotometer is available mainly in three


different systems. Described here are the differences in the
optical systems of the three versions.

<U-4100 Solid Sample Measurement System (prism-grating)>

The instrument adopts a double monochromator system in which


two monochromators are coupled in series.
The prism-grating type system employs an ultrahigh-precision
prism made of anhydrous synthetic quartz and having an apex
angle of 30° as a dispersing element for the 1st monochromator.
It is a Littrow type monochromator having a prism with a large
light receiving area and long base length to improve the
monochromator brightness and resolution.
The 2nd monochromator is of a Czerny-Turner type employing
two diffraction gratings as a dispersing element. Each grating
adopts a multi-blaze system to provide sufficient spectral energy
at all the wavelengths used.
Also, the use of an integrating sphere for the detector provides a
high accuracy for measurement of not only transmittance but
reflectance as well.

2-7
2.4 Operating Principle

st nd
1 2
monochromator monochromator
M3 M6 M7

G1 M15 Reference side M16


P
G2 Integrating
S2 S3 sphere
M4 M5 M11 M13
WI lamp Sample side
CH M12
S1
M1 M14
M2
M8 M9 M10 Detector
D2 lamp (PbS/PMT)

1st monochromator: CH: Mechanical chopper S1, S2, S3: Slits


Prism, Littrow type M1: Light source mirror M10 : Plane mirror
2nd monochromator: M2: Toroidal mirror M11 : Toroidal mirror
2 diffraction gratings used, M3: Collimating mirror M12 : Sector mirror
Czerny-Turner type M4: Plane mirror M13 : Plane mirror
D2 : Deuterium discharge lamp, M5: Plane mirror M14 : Plane mirror
for ultraviolet region M6: Collimating mirror M15 : Plane mirror
WI : Tungsten iodide lamp, for M7: Camera mirror M16 : Toroidal mirror
visible-near infrared region M8: Toroidal mirror PbS : Detector for near
infrared M9: Plane mirror region (cooled type)
P : Prism made of anhydrous PMT : detector for
ultraviolet-
synthetic quartz, having an visible region (R-928)
apex angle of 30°
G1 : Multi-blazed grating for
ultraviolet-visible region
G2 : Multi-blazed grating for near
infrared region

Fig. 2-8 Optical System of U-4100 Solid Sample Measurement System (prism-grating)

2-8
2.4.1

<U-4100 Ultra Violet Region Measurement System


(grating-grating)>

The instrument adopts a double monochromator system in which


two monochromators are coupled in series.
The 1st monochromator is a Littrow type using two diffraction
gratings as a dispersing element.
The 2nd monochromator is a Czerny-Turner type also using two
diffraction gratings as a dispersing element.
The grating for the ultraviolet-visible region is a single-blazed
type providing a high diffraction efficiency particularly at short
wavelengths; the one for the near infrared region is a multi-
blazed type offering sufficient spectral energy at all the
wavelengths used.

st nd
1 2
monochromator monochromator
M3 M6 M7

G1G G1 Reference side


M15 M16
G2G G2
S2 S3 Integrating
sphere
F
WI lamp M4 M5 M11 M13
CH M12 Sample side
S1 M14
M1
M2
M8 M9 M10
Detector
D2 lamp
(PbS/PMT)

1st monochromator: CH : Mechanical chopper S1, S2, S3: slits


2 diffraction gratings used, Littrow F : Secondary light cutoff M10 : Plane mirror
type filter M11 : Toroidal mirror
2nd monochromator: M1 : Light source mirror M12 : Sector mirror
2 diffraction gratings used, M2 : Toroidal mirror M13 : Plane mirror
Czerny-Turner type
D2 : Deuterium discharge lamp, M3 : Collimating mirror M14 : Plane mirror
for ultraviolet region M4 : Plane mirror M15 : Plane mirror
WI : Tungsten iodide lamp, for M5 : Plane mirror M16 : Toroidal mirror
visible-near infrared region M6 : Collimating mirror PbS : Detector for near infrared
G1G: Single-blazed grating for M7 : Camera mirror region (cooled type)
ultraviolet-visible region M8 : Toroidal mirror PMT: Detector for ultraviolet-
G2G: Single-blazed grating for M9 : Plane mirror visible region (R-955)
near infrared region
G1 : Single-blazed grating for
ultraviolet-visible region
G2 : Multi-blazed grating for near
infrared region

Fig. 2-9 Optical System of U-4100 Ultra Violet Region


Measurement System (grating-grating)

2-9
2.4 Operating Principle

<U-4100 Liquid Sample Measurement System (prism-grating)>

Although the monochromator configuration is basically the same


as for the solid sample measurement system described before, a
feature of the liquid sample measurement system is its detector.
Light enters the detector directly in this system which allows
measurement with a low noise level.

st nd
1 2
monochromator monochromator
M3 M6 M7

Sample compartment
ATT

G1 M15 Reference side M16


P
G2 M17
S2 S3
M11 M17
WI lamp M4 M5 M13 Detector
CH LC M12 Sample side (PbS/PMT)
S1
M1 M14 M16
M2
M9 M10
M8
D2 lamp

1st monochromator: M1: Light source mirror M10 : Plane mirror


Prism, Littrow type M2: Toroidal mirror M11 : Toroidal mirror
2nd monochromator: M3: Collimating mirror M12 : Sector mirror
2 diffraction gratings used, M4: Plane mirror M13 : Toroidal mirror
Czerny-Turner type M5: Plane mirror M14 : Plane mirror
D2 : Deuterium discharge lamp,
for ultraviolet region M6: Collimating mirror M15 : Toroidal mirror
WI : Tungsten iodide lamp, for M7: Camera mirror M16 : Toroidal mirror
visible-near infrared region M8: Toroidal mirror M17 : Toroidal mirror
P : Prism made of anhydrous M9: Plane mirror PbS : Detector for near
synthetic quartz, having an S1, S2, S3: Slits infrared region (cooled
apex angle of 30° type)
G1 : Multi-blazed grating for PMT: Detector for ultraviolet-
ultraviolet-visible region visible region (R-928)
G2 : Ulti-blazed grating for near
infrared region
CH : Mechanical chopper
ATT : Attenuator
LC : Light intensity control
mechanism

Fig. 2-10 Optical System of U-4100 Liquid Sample


Measurement System (prism-grating)

2 - 10
2.4.2

2.4.2 Signal Processing Figure 2-6 shows the signal processing and control system of the
and Control Model U-4100 Spectrophotometer.
System The instrument is roughly divided into two units: main unit for
mechanical control of the spectrophotometer and personal
computer unit for setting of measuring conditions and secondary
processing of measurement result data. Each unit has the
following functions.

(1) Spectrophotometer Main Unit

The main unit incorporates an exclusive microcomputer,


and conducts mechanical control (wavelength scan,
switching of light source, grating and detector, etc.), A/D
conversion of output from the detector for the ultraviolet-
visible/near infrared region, D/A conversion for high voltage
applied to the detector for the ultraviolet-visible region and
external analog recorder (option) and communication with
the personal computer unit.
For reference signal R, sample signal S and zero signal Z
obtained in synchronization with the rotating mirror for
dividing the light beam, the photometric output from the
detector is A/D-converted through the preamplifier.
Thereafter, the transmittance (%T) is determined through
calculation of (S - Z)/(R - Z) by the microcomputer.
This photometric value is sent to the personal computer
through communication. The applied voltage is controlled
in the ultraviolet-visible region and the slit in the near
infrared region on the basis of the reference signal level.
For this purpose, Hitachi’s unique differential feedback
system is adopted. These programs are held in ROM of
the spectrophotometer main unit. In addition, the
wavelength calibration value is memorized.

(2) Personal Computer Unit

The measuring conditions, print items, etc. are set with the
mouse and keyboard. The measuring conditions are sent
to the spectrophotometer main unit though communication
for control of the spectrophotometer. The received
measured values are subjected to LOG calculation to
determine the absorbance (Abs). The results thus
obtained are output onto the CRT and printer.
In addition, smoothing, differentiation, area calculation,
rescaling, data storage, etc. are carried out for the
measurement results.

2 - 11
2.4 Operating Principle

Spectrophotometer Main Unit

Detector
PMT/PbS
Photointerrupter Conversion
signal Preamplifier
Rotating mirror Light

High voltage generator

A/D start

Mechanism

Control Unit

ROM RAM Digital D/A A/D


256 kW 512 kW I/F converter converter

External I/O such


MPU as sipper or 6-cell
positioner

Communication D/A
I/F converter

Analog
Personal Computer recorder

Printer
PC

Fig. 2-11 Signal Processing and Control System

2 - 12
2.4.3

2.4.3 Baseline The baseline is not stored in the backup RAM of the
Correction spectrophotometer main unit. So it is erased when the power
supply is turned off. Upon turning on the power supply, be sure
to carry out baseline measurement.
• System baseline
• User baseline

2.4.4 Automatic The spectrophotometer has the following diagnosis and


Calibration and calibration functions.
Self-diagnosis • D2 lamp
• WI lamp
• Wavelength initialize
• Calibration
• ROM
• RAM
• Signal (sector/chopper synchronization)
• Slit initialize
• VIS/NIR cam change initialize
• Wavelength calibration value destruction
• 6-cell initialize
• Filter initialize
• Light control motor initialize
• Automatic wavelength calibration function

2 - 13
2.5 Proper Use of Spectrophotometer

2.5 Proper Use of Spectrophotometer

2.5.1 Selection of When selecting a solvent for sample preparation, keep the
Solvent following requirements in mind.

• Small absorption in measurement wavelength range


• Non-interactive with solute
• Low volatility

Table 2-1 lists the applicable wavelength ranges of common


organic solvents.

Table 2-1 Applicable Wavelength Ranges


(indicated by solid lines)

Wavelength
Solvent 200 nm 300 nm 400 nm

Cyclohexane 200 nm

Ethyl alcohol 220 nm

Methyl alcohol 220 nm

Ethyl ether 220 nm

Dioxane 220 nm

Hexane 220 nm

Chloroform 250 nm

Isopropyl alcohol 250 nm

Acetic acid 250 nm

Ethyl acetate 270 nm

Carbon tetrachloride 275 nm

Benzene 280 nm

Methyl ethyl ketone 335 nm

Acetone 340 nm

Carbon disulfide 380 nm

2 - 14
2.5.2

2.5.2 Special Samples Note that Bouguer-Beer’s law is not applicable to the following
special samples.

• Fluorescing sample
• Appreciably turbid sample

In measurement of a solid sample as glass plate, the energy of


beam radiation undergoes a loss (r) due to reflection on the
surface of solid substance. In this case, the following equation
is set up.

It/I0 = 10 -ε⋅c⋅l - r

Where, “r” varies depending on the reflectance of substance.

2 - 15
2.6 Performance Specifications

2.6 Performance Specifications

<Solid Sample Measurement System (prism-grating)>

Settable wavelength 175 to 3300 nm


range
Measurable 240 to 2600 nm
wavelength range
Monochromator Prism-grating double monochromator
Pre-monochromator : Littrow type using prism
Main monochromator : Diffraction grating (switchover between 2
gratings), Czerny-Turner type monochromator
Detector Photomultiplier tube (UV-VIS), cooled type PbS (NIR)
60 mm dia. integrating sphere whose inner wall is coated with BaSO4
Incident angle for reflective sample: 10° at both standard and reference
sides
Sample Table-top sample compartment adaptable to very large samples
compartment Compartment inner dimensions:
480 W × 470 D × 200 H mm (standard)
680 W × 470 D × 300 H mm (large type)
Beam spacing: 200 mm
Wavelength In 0.01 nm steps
indication
Slit width indication UV-VIS region : Automatic control system and selection in 0.01 (0.02)
nm steps in a range of 0.01 to 8.0 nm (0.02 nm steps
when slit width is 2.4 nm or larger)
NIR region : Automatic control system and selection in 0.1 nm steps
in a range of 0.1 to 20.0 nm
Wavelength UV-VIS region : ±0.2 nm
accuracy NIR region : ±1.0 nm
Auto wavelength calibration function provided
Wavelength setting UV-VIS region : ±0.1 nm
reproducibility NIR region : ±0.5 nm
Wavelength scan 0.3(0.75), 3(7.5), 15(37.5), 30(75), 60(150), 120(300), 300(750),
speeds 600(1500), 1200(3000), 2400(6000) nm/min
* Wavelength scan speeds in NIR region are given in parentheses.
Go to λ: 3600 (9000) nm/min
Light source UV region : Deuterium lamp (quick mounting type)
VIS-NIR region : 50W tungsten-halogen lamp (lamp lifetime 1000 h)
Switching of light Automatic switching linked with wavelength
source Switching wavelength optionally settable in a range of 325 to 370 nm
Photometric system Double beam direct ratio photometry (negative absorbance or
transmittance/reflectance of 100% or more measurable by Hitachi’s unique
differential feedback system)
UV-VIS region : Negative voltage control system and slit control system
NIR region : Slit control system and fixed slit system
Photometric modes Absorbance (Abs), transmittance (%T), reflectance (%R), reference-side
energy (E(R))/sample-side energy (E(S))
Photometric range Absorbance : -2 to +5.0 Abs(in 0.001 Abs steps)
Transmittance/reflectance : 0 to 999.99 (in 0.01% steps)
Photometric ±0.002 Abs(0 to 0.5 Abs), ±0.004 Abs (0.5 to 1.0 Abs), ±0.3%T
accuracy Checked with NIST SRM 930

2 - 16
2.6

(cont'd)
Photometric ±0.001 Abs(0 to 0.5 Abs), ±0.002 Abs (0.5 to 1.0 Abs), ±0.1%T
reproducibility Checked with NIST SRM 930
Response Optimum value automatically set in linkage with slit width and wavelength
scan speed
Baseline memory 3 channels (1 channel for system baseline, 2 channels for user baseline)
Baseline flatness UV-VIS
< ±0.002 Abs (240 to 850 nm, slit of 4nm)
NIR
< ±0.002 Abs (850 to 2200 nm, slit automatically controlled)
< ±0.004 Abs (2200 to 2600 nm, slit automatically controlled)
Noise level < ±0.00075 Abs (at 500 nm, slit 4 nm, sampling interval 1 s)
< ±0.0005 Abs (at 1100 nm, slit automatically controlled, sampling interval
1 s)
Baseline stability Within 0.0004 Abs/hr (at 340 nm) 2 hours after power on
Data processor PC: OS WindowsXP
Operating 15 to 35 °C
temperature
Operating humidity 45 to 80% (non-condensing, within 70% at 30 °C or higher)
Power consumption 100, 115, 220, 240V AC, 50/60 Hz, 500 VA
Dimensions 730 W × 800 D × 880 H mm (standard sample compartment type)
(spectrophotometer 930 W × 800 D × 980 H mm (large sample compartment type)
main unit)
Weight 120 kg

<Ultra Violet Region Measurement System (grating-grating)>

Settable wavelength 175 to 3300 nm


range
Measurable 175 to 2600 nm
wavelength range
Monochromator Grating-grating double monochromator
Pre-monochromator : Diffraction grating (switchover between 2
gratings), Littrow type monochromator
Main monochromator : Diffraction grating (switchover between 2
gratings), Czerny-Turner type monochromator
Detector Photomultiplier tube (UV-VIS), cooled type PbS (NIR)
60 mm dia. integrating sphere whose inner wall is coated with Spectralon
Incident angle for reflective sample: 10° at both standard and reference
sides
Sample Table-top sample compartment adaptable to very large samples
compartment Compartment inner dimensions:
480 W × 470 D × 200 H mm (standard)
680 W × 470 D × 300 H mm (large type)
Beam spacing: 200 mm
Wavelength In 0.01 nm steps
indication

2 - 17
2.6 Performance Specifications

(cont'd)
Slit width indication UV-VIS region : Automatic control system and selection in 0.01 (0.02)
nm steps in a range of 0.01 to 8.0 nm (0.02 nm steps
when slit width is 2.4 nm or larger)
NIR region : Automatic control system and selection in 0.1 nm steps
in a range of 0.1 to 20.0 nm
Wavelength UV-VIS region : ±0.2 nm
accuracy NIR region : ±1.0 nm
Auto wavelength calibration function provided
Wavelength setting UV-VIS region : ±0.1 nm
reproducibility NIR region : ±0.5 nm
Wavelength scan 0.3(0.75), 3(7.5), 15(37.5), 30(75), 60(150), 120(300), 300(750),
speeds 600(1500), 1200(3000), 2400(6000) nm/min
* Wavelength scan speeds in NIR region are given in parentheses.
Go to λ: 3600 (9000) nm/min
Light source UV region: deuterium lamp (quick mounting type)
VIS-NIR region: 50W tungsten-halogen lamp (lamp lifetime 1000 h)
Switching of light Automatic switching linked with wavelength
source Switching wavelength optionally settable in a range of 325 to 370 nm
Photometric system Double beam direct ratio photometry (negative absorbance or
transmittance/reflectance of 100% or more measurable by Hitachi’s unique
differential feedback system)
UV-VIS region : Negative voltage control system and slit control system
NIR region : Slit control system and fixed slit system
Photometric modes Absorbance (Abs), transmittance (%T), reflectance (%R), reference-side
energy (E(R))/sample-side energy (E(S))
Photometric range Absorbance : -2 to +5.0 Abs(in 0.001 Abs steps)
Transmittance/reflectance : 0 to 999.99 (in 0.01% steps)
Photometric ±0.002 Abs(0 to 0.5 Abs), ±0.004 Abs (0.5 to 1.0 Abs), ±0.3%T
accuracy Checked with NIST SRM 930
Photometric ±0.001 Abs(0 to 0.5 Abs), ±0.002 Abs (0.5 to 1.0 Abs), ±0.1%T
reproducibility Checked with NIST SRM 930
Response Optimum value automatically set in linkage with slid width and wavelength
scan speed
Baseline memory 3 channels (1 channel for system baseline, 2 channels for user baseline)
Baseline flatness UV-VIS
< ±0.05Abs (175 to 190 nm, slit 8 nm, N2 purge)
< ±0.005Abs (190 to 240 nm, slit 8 nm, N2 purge)
< ±0.002Abs (240 to 850 nm, slit 4 nm)
NIR
< ±0.002 Abs (850 to 2500 nm, slit automatically controlled)
< ±0.004 Abs (2500 to 3300 nm, slit automatically controlled)
Noise level < ±0.00075 Abs (at 500 nm, slit 4 nm, sampling interval 1 s)
< ±0.0005 Abs (at 1100 nm, slit automatically controlled)
Baseline stability Within 0.0004 Abs/hr (at 340 nm) 2 hours after power on
Data processor PC: OS WindowsXP
Operating 15 to 35 °C
temperature
Operating humidity 45 to 80% (non-condensing, within 70% at 30 °C or higher)
Power consumption 100, 115, 220, 240V AC, 50/60 Hz, 500 VA
Dimensions 730 W × 800 D × 880 H mm (standard sample compartment type)
(spectrophotometer 930 W × 800 D × 980 H mm (large sample compartment type)
main unit)
Weight 120 kg

2 - 18
2.6

<Liquid Sample Measurement System (prism-grating)>

Settable 175 to 3300 nm


wavelength range
Measurable 185 to 3300 nm
wavelength range
Monochromator Prism-grating double monochromator
Pre-monochromator : Littrow type using prism
Main monochromator : Diffraction grating (switchover between 2
gratings), Czerny-Turner type monochromator
Detector Photomultiplier tube (UV-VIS), cooled type PbS (NIR)
Sample Table-top sample compartment
compartment Beam spacing: 100 mm
Wavelength In 0.01 nm steps
indication
Slit width indication UV-VIS region : Automatic control system and selection in 0.01 (0.02) nm
steps in a range of 0.01 to 8.0 nm (0.02 nm steps when
slit width is 2.4 nm or larger)
NIR region : Automatic control system and selection in 0.1 nm steps
in a range of 0.1 to 20.0 nm
Wavelength UV-VIS region : ±0.2 nm
accuracy NIR region : ±1.0 nm
Auto wavelength calibration function provided
Wavelength setting UV-VIS region : ±0.1 nm
reproducibility NIR region : ±0.5 nm
Wavelength scan 0.3(0.75), 3(7.5), 15(37.5), 30(75), 60(150), 120(300), 300(750), 600(1500),
speeds 1200(3000), 2400(6000) nm/min
* Wavelength scan speeds in NIR region are given in parentheses.
Go to λ: 3600 (9000) nm/min
Light source UV region: deuterium lamp (quick mounting type)
VIS-NIR region: 50W tungsten-halogen lamp (lamp lifetime 1000 h)
Switching of light Automatic switching linked with wavelength
source Switching wavelength optionally settable in a range of 325 to 370 nm
Photometric Double beam direct ratio photometry (negative absorbance or
system transmittance/reflectance of 100% or more measurable by Hitachi’s unique
differential feedback system)
UV-VIS region : Negative voltage control system and slit control system
NIR region : Slit control system and fixed slit system
Photometric modes Absorbance (Abs), transmittance (%T), reflectance (%R), reference-side
energy (E(R))/sample-side energy (E(S))
Photometric range Absorbance : -2 to +5.0 Abs(in 0.001 Abs steps)
Transmittance/reflectance : 0 to 999.99 (in 0.01% steps)
Photometric ±0.002 Abs(0 to 0.5 Abs), ±0.004 Abs (0.5 to 1.0 Abs), ±0.3%T
accuracy Checked with NIST SRM 930
Photometric ±0.001 Abs(0 to 0.5 Abs), ±0.002 Abs (0.5 to 1.0 Abs), ±0.1%T
reproducibility Checked with NIST SRM 930
Response Optimum value automatically set in linkage with slid width and wavelength
scan speed
Baseline memory 3 channels (1 channel for system baseline, 2 channels for user baseline)

2 - 19
2.6 Performance Specifications

(cont'd)
Baseline flatness < ±0.5 Abs (185 to 200 nm, slit of 2 nm)
< ±0.001 Abs (200 to 850 nm, slit of 2 nm)
< ±0.002 Abs (850 to 2500 nm, slit automatically controlled)
< ±0.004 Abs (2500 to 3300 nm, slit automatically controlled)
Noise level < ±0.0002 Abs (at 500 nm, slit 2 nm, sampling interval 1 s)
< ±0.0001 Abs (at 2000 nm, slit automatically controlled)
Baseline stability Within 0.0004 Abs/hr (at 340 nm) 2 hours after power on
Data processor PC: OS WindowsXP
Operating 15 to 35 °C
temperature
Operating humidity 45 to 80% (non-condensing, within 70% at 30 °C or higher)
Power 100, 115, 220, 240V AC, 50/60 Hz, 500 VA
consumption
Dimensions 730 W × 720 D × 790 H mm
(spectrophotometer
main unit)
Weight 120 kg

2 - 20
3.1

3. INSTRUMENT CALIBRATION

CAUTION
Fatigue due to Long-Hour Operation
If you keep working with the display monitor and keyboard
for long hours, your eyes and body will be fatigued to
jeopardize your health. When working with the display
monitor for a long time, take a break for 10 to 15 minutes
per hour for the health of your eyes and body.

3.1 Introduction

This section describes how to calibrate the instrument.


Calibration should be carried out in the following cases.
• When an error message “Calibrate!” appears as shown
Fig. 3-1
• For accurate measurement of a sample high in absorbance
(low in transmittance)

Error message

Fig. 3-1

NOTICE: Before carrying out instrument calibration, wait


until the spectrophotometer is fully stabilized (at
least 2 hours after turning on power).

3-1
3.2 Wavelength Calibration

3.2 Wavelength Calibration

For wavelength calibration, use the bright line (656.1 nm) of the
D2 lamp (light source lamp).
Make sure that there is nothing in the sample compartment and
close the sample compartment lid properly. After that, click the
Instrument Calibration (C) command - Wavelength Calibration
from the Spectrophotometer (S) menu.
Wavelength calibration is then carried out automatically.

Fig. 3-2 Spectrophotometer Menu

3.3 System Baseline Measurement

The system baseline can be memorized in the following


procedure.

(1) Make sure that there is nothing at the sample side and
reference side of the cell holder. Then click the Baseline
Measurement (B) command from the Spectrophotometer
(S) menu or click the button on the spectrophotometer
tool bar. The window shown in Fig. 3-3 then appears.

Fig. 3-3 Baseline Measurement

3-2
3.3

(2) Select “System” and click the OK button. Set the


parameters as given below and measure the baseline.

Parameter Setting
Data mode Abs
Start wavelength (nm) 3300
End wavelength (nm) 175
Scan speed (VIS) (nm/min) 300
Scan speed (NIR) (nm/min) 750
WI lamp On
D2 lamp On
Slit (nm) 4
PMT mode Auto 1
High Resolution Off
Sampling interval Auto
Lamp change (nm) 340
Detector change wavelength (nm) 850
Attenuation None
Light Control mode Fixed
Detector change correct Off
PbS Gain 2
Light source Auto

3-3
3.4 Function of PbS 0 Switch

3.4 Function of PbS 0 Switch

In measurement in the near infrared region (wavelength range


for PbS detector), the shutter is put on the sample-side light
beam and 0%T is first measured when the sample transmittance
is in the vicinity of 0%T. At this time, 0%T may fluctuate due to
variation of Pbs sensitivity. This switch is used to correct the
fluctuation.

NOTE: This correction is performed at only one wavelength.


It is impossible to correct the 0%T line in the whole
wavelength range.

PbS 0 switch

C000080

Fig. 3-4 PbS 0 Switch

For correction, first insert the shutter on the sample beam.


Then click the wavelength shift button and set the wavelength for
correction.
Open the front door, raise the PbS 0 switch on the front panel to
ON and in this state, wait until the photometric value on the CRT
screen becomes 0.00%T. Release the switch when 0.00%T is
obtained. The switch is set to OFF to complete correction.
After that, measure the 0%T line in the normal procedure.

NOTES: 1. The correction value is stored in the CPU of the


spectrophotometer main unit. It is therefore
unnecessary to carry out correction for each
measurement.
2. Carry out correction again if required at another
wavelength. The latest correction data is stored.

3-4
4.1

4. MAINTENANCE AND INSPECTION

4.1 Introduction

The spectrophotometer requires maintenance. This section


gives information on daily inspection and diagnosis functions.

4.2 Self-diagnosis and Automatic Adjustment

The spectrophotometer conducts self-diagnosis when the power


switch is turned on. It is also possible to check the instrument
performance. Refer to the following section.

4.3 Confirmation of Specifications

4.3.1 Wavelength Check the wavelength accuracy in the following procedure.


Accuracy
(1) Open the Analysis Method setting window by clicking the
Analytical Parameter (M) command from the Edit (E) menu
or by clicking the button on the measurement tool bar.

(2) Select wavelength scan for the measurement mode in the


General tab.

(3) Set the analytical parameters as shown Table 4-1.

Table 4-1 Instrument Tab

Parameter Setting
Data mode E(R)
Start wavelength (nm) 660
End wavelength (nm) 650
Scan speed (nm/min) 15
High Resolution On
Baseline correction System
Delay (s) 0
Zero instrument before each run Off
Light source D2 only
Lamp change (nm) 340
Slit (UV-VIS region) (nm) 0.8
PMT mode Fixed

4-1
4.3 Confirmation of Specifications

(cont’d)
Parameter Setting
PMT voltage (V) Set up voltage according
to peak height
Sampling interval Auto
Replicates 1
Attenuation Unused
Detector change correct Off
Detector change wavelength (nm) 850
Scan speed (nm/min) 37.5
Slit (nm) 2
PbS Gain 4
Light Control mode Fixed

(4) Make sure that there is nothing at the sample side and
reference side of the cell holder, and close the sample
compartment lid properly.

(5) Click the (measurement) button or select the


measurement command from the Spectrophotometer menu.

(6) After completion of measurement, a spectrum is displayed.


Check the peak value in the peak table. If the peak value
is in a range of 655.9 to 656.3 nm, the wavelength accuracy
is normal. If the peak value is out of the range, proceed to
the next step.

(7) Select the Wavelength Calibration (C) command from the


Spectrophotometer (S) menu.

(8) After execution of wavelength calibration, retry


measurement. If the peak value is out of the normal range,
then contact our service office.

(9) The analytical parameters can be stored as an analytical


parameter file. When they are stored, you can proceed to
measurement only by calling out the file.

4-2
4.3.2

4.3.2 Spectrum Band Check the spectrum band width in the following procedure.
Width
(1) Utilize the spectrum acquired in 4.3.1.

(2) Determine the wavelength width (half value width) of the


spectrum at the portion where the height is 1/2 of the peak.
If the width is within ±20% of the slit width specified in 4.3.1,
the band width is normal. For trial at any other slit width,
input it and perform operations in 4.3.1.

Energy
A
A
2
0
Wavelength

Half value width

Fig. 4-1 Check of Spectrum Band Width

(3) If the specified performance is obtained, contact our service


office.

4.3.3 Baseline Flatness Baseline flatness includes the baseline drift and noise. Be sure
to warm up the instrument sufficiently (for at least 2 hours after
turning on power) prior to checking the baseline flatness.

(1) Click the Analytical Parameter command from the Edit


menu to open the Analysis Method setting window.

(2) Select wavelength scan for the measurement mode in the


General tab.

(3) Set analytical parameters as shown in Table 4-2.


Note that the parameters differ somewhat with the system
purchased.

4-3
4.3 Confirmation of Specifications

Table 4-2 Instrument Tab

Parameter Setting
UV Region Meas. System Liquid
Solid Sample
System Used Sample Meas.
Meas. System w/o N2 Purge w/N2 Purge
System
Data mode Abs Abs Abs Abs
Start wave-length(nm) 2600 2600 240 3300
End wave-length(nm) 240 240 175 185
Scan speed (nm/min) 300 300 60 300
High Resolution meas. Off Off Off Off
Baseline measurement User 1 User 1 User 1 User 1
Delay (s) 0 0 0 0
Auto zero before run Off Off Off Off
Light source switching WL 340 340 340 340
(nm)
Repetition 1 1 1 1
Path Length (mm) 10 10 10 10
Light source Auto Auto Auto Auto
Lamp change (nm) 340 340 340 340
Slit (UV-VIS region) (nm) 4 4 8 2
PMT mode Auto 1 Auto 1 Auto 1 Auto 1
Sampling interval Auto Auto Auto Auto
Replicates 1 1 1 1
Attenuation None None None None
Detector change correct Off Off Off Off
Detector change 850 850 850 850
wavelength (nm)
Scan speed (nm/min) 750 750 750 750
Slit (nm) Auto Auto Auto Auto
change change change change
PbS Gain 1 1 1 1
Light Control mode Fixed Fixed Fixed Fixed

(4) Make sure there is nothing placed at the sample and


reference sides of the cell holder, and firmly close the
sample compartment lid.

(5) After measuring the user baseline, click the


(measurement) button or else select the measurement (S)
command from the Spectrophotometer (S) menu.

4-4
4.3.3

Flatness

Noise

Fig. 4-2 Check of Baseline Flatness

As shown in Fig. 4-2, baseline flatness is equivalent to one-


half of the width between maximum and minimum values of
the baseline. The baseline flatness is normal if within the
specification range indicated below. (Flatness is indicated
with a “±” sign before the value.) Note that a large
disturbance in the vicinity of 340 or 850 nm is caused by a
shock associated with the switchover of the light source or
filter. Such disturbance should therefore be excluded from
the baseline flatness.
If the flatness is not within the specification, try measuring
and checking it again. If the specified performance is not
obtained, then contact our service representative.

Solid Sample Measurement System

Wavelength Range Flatness Specification


240 to 850 nm (UV-VIS) < ±0.002 Abs (240 to 850 nm)
850 to 2600 nm (NIR) < ±0.002 Abs (850 to 2200 nm)
< ±0.004 Abs (2200 to 2600 nm)

UV Sample Measurement System

Wavelength Range Flatness Specification


175 to 240 nm (UV N2 < ±0.05 Abs (175 to 190 nm)
purge) < ±0.005 Abs (190 to 240 nm)
240 to 850 nm (UV-VIS) < ±0.002 Abs (240 to 850 nm)
850 to 2600 nm (NIR) < ±0.002 Abs (850 to 2200 nm)
< ±0.004 Abs (2200 to 2600 nm)

4-5
4.3 Confirmation of Specifications

Liquid Sample Measurement System

Wavelength Range Flatness Specification


185 to 850 nm (UV-VIS) < ±0.5 Abs (185 to 200 nm)
< ±0.001 Abs (200 to 850 nm)
850 to 3300 nm (NIR) < ±0.002 Abs (850 to 2500 nm)
< ±0.004 Abs (2500 to 3300 nm)

4.3.4 Noise Level (1) Click the Analytical Parameter command from the Edit
menu to open the Analysis Method setting window.

(2) Select time scan for the measurement mode in the General
tab.

(3) Set analytical parameters as shown in Table 4-3.


Note that the parameters differ somewhat with the system
purchased.

Table 4-3 Instrument Tab

Parameter Setting
Solid Sample UV Region Liquid Sample
System Used
Meas. System Meas. System Meas. System
Data mode Abs Abs Abs
Measurement wavelength (nm) 500 (1100) 500 (1100) 500 (2000)
Measurement time (s) 60 60 60
High Resolution measurement Off Off Off
Baseline correction System System System
Delay (s) 0 0 0
Auto zero before run Off Off Off
Light source Auto Auto Auto
Lamp change (nm) 340 340 340
Slit (UV-VIS region) (nm) 4 4 2
PMT mode Auto Auto Auto
Sampling interval 1 1 1
Replicates 1 1 1
Attenuation None None None
Detector change correct Off Off Off
Detector change wavelength (nm) 850 850 850
Slit (nm) Auto Auto Auto
PbS Gain 1 1 1
Light Control mode Fixed Fixed Fixed

4-6
4.3.4

(4) Make sure there is nothing placed at the sample and


reference sides of the cell holder, and firmly close the
sample compartment lid.

(5) Execute the auto zero function .

(6) Click the (measurement) button or else select the


measurement (S) command from the Spectrophotometer
(S) menu.

After completion of measurement, open the relevant file.


The noise level is a value equivalent to one-half the width
between maximum and minimum values of the measured data.
The noise level is normal if within the specification range given
below. (Noise level is indicated with a “±” sign before the
value.) If the specified performance is not obtained, then
contact our service representative.

Noise level

Fig. 4-3 Noise Level

Solid Sample Measurement System

Wavelength Range Noise Level Specification


(UV-VIS) < ±0.00075 Abs (500 nm)
(NIR) < ±0.0005 Abs (1100 nm)

Ultra Violet Region Measurement System

Wavelength Range Noise Level Specification


(UV-VIS) < ±0.00075 Abs (500 nm)
(NIR) < ±0.0005 Abs (1100 nm)

Liquid Sample Measurement System

Wavelength Range Noise Level Specification


(UV-VIS) < ±0.0002 Abs (500 nm)
(NIR) < ±0.0001 Abs (2000 nm)

4-7
4.4 Periodical Inspection

4.4 Periodical Inspection

4.4.1 Cleaning of The sample compartment is susceptible to contamination.


Sample Foreign matter or dust may cause unexpected trouble.
Compartment Regular inspections should be given to the sample compartment.
Remove the respective parts in the procedure given below.

<Solid and Ultra Violet Region Measurement Systems>

Remove 3 screws.

C000086

Fig. 4-4 Detachment of Intermediate Base

Remove 3 screws .

C000087

Fig. 4-5 Detachment of Reference Base

4-8
4.4.1

<Liquid Sample Measurement System>

• Removal of cell holder and cell holder mount


Remove the cell holder and cell holder mount by one of the
following methods.

(1) To remove the cell holder alone, loosen cell holder


setscrew A shown in Fig. 4-6 using the supplied blade-
edged screwdriver, and pull the cell holder up to remove it.

(2) To remove the cell holder mount, loosen cell holder mount
setscrew B using the supplied Phillips screwdriver and
detach the mount.

(3) By omitting step (1) above and carrying out only step (2),
both the 10 mm rectangular cell holder and cell holder
mount can be detached together.

10 mm rectangular cell
holder

Cell holder mount

Cell holder mount


setscrew B

Cell holder setscrew A

Fig. 4-6 Removal of Cell Holder and Cell Holder Mount

4-9
4.4 Periodical Inspection

<In Case of Liquid Sample Measurement System>

Sample
compartment
bottom plate

Fig. 4-7 Detachment of Reference Base

Fig. 4-8 Empty Sample Compartment

4 - 10
4.4.2

4.4.2 Cleaning of If the transparent window of the sample compartment is


Sample contaminated, detach and clean the window. Before cleaning,
Compartment wash you hands thoroughly. Then wipe off contaminants with a
Window Plate soft paper or cloth soaked with alcohol and ether solution (mixed
in the ratio of 1 to 1).
If it is difficult to detach the transparent window, use adhesive
tape as shown in Fig 4-5.

NOTICE: When setting the transparent window back to the


sample compartment, take care not to leave
fingerprints on the window.

Adhesive tape
Black window frame
200-1052
(Pull it forward with tweezers.)

Optical axis
Spring
L919112
Transparent window
Window frame

Fig. 4-9 Detachment of Sample Compartment


Window Plate

4 - 11
4.5 Check of Lamp ON Time

4.5 Check of Lamp ON Time

It is possible to monitor the WI/D2 lamp ON time. For check,


select the lamp ON time (L) command from the
Spectrophotometer (S) menu.

Fig. 4-10 Lamp ON Time

After lamp replacement, click Reset for each lamp.

4 - 12
4.6.1

4.6 Storage

4.6.1 After Completion (1) Turn off the POWER switch and pull out the plug from the
of Measurement power outlet.

(2) Put the cover in proper size on the instrument.

4.6.2 When Unused (1) The instrument must be free from high temperature (70 °C
for a Long Time or more), low temperature (-20 °C), high humidity (80% or
more) and vibration.

(2) Be sure to put the cover on the instrument.

(3) Prevent acidic, alkaline and other harmful gases from


flowing into the instrument.

(4) When moving the instrument to the storage area, it is


necessary to secure the light source mirror.
The instrument may develop trouble due to shock or
vibration if moved without securing the mirror. To secure
the mirror, reverse the procedure for removal of securing
parts for transport (refer to 1.5.1).

(5) Avoid a location where a magnetic field is produced.

(6) Avoid a dusty environment.

(7) Avoid direct sunlight.

4 - 13
4.7 Troubleshooting Table

4.7 Troubleshooting Table

If any abnormality is found, refer to the following troubleshooting


table.

No. Symptom Cause Remedy


1 RUN lamp fails to come on when Fuse is blown. Replace fuse.
POWER switch is turned on.
2 “D2 lamp!” or “WI lamp” appears Lamp filament is Replace lamp.
on measurement screen. disconnected.
3 Variation in displayed data is too a. Lamp is deteriorated. a. Replace lamp.
large. b. Lamp is contaminated b, c. Eliminate contaminants
with fingerprints. or water drops.
c. Cell or window plate is
contaminated with dust
or water drops.
4 “WL initializing error” appears in Error in wavelength scan Contact service office of our
message box. mechanism sales representative.
5 “ROM status error” appears in ROM is defective. Contact service office of our
message box. sales representative.
6 “RAM status error” appears in RAM is defective. Contact service office of our
message box. sales representative.
7 “Command signal error” appears Error in sector/chopper Contact service office of our
in message box. synchronization sales representative.
8 “Slit initializing error” appears in Error in slit initialization Contact service office of our
message box. sales representative.
9 “VIS/NIR cam initialization error” Error in VIS/NIR cam Contact service office of our
appears in message box. initialization sales representative.
10 “Calibrate!” appears on Wavelength calibration • Carry out wavelength
measurement screen. value is erased. calibration.
• Contact service office of
our sales representative.
11 “Positioner” appears on Error in positioner Contact service office of our
measurement screen. initialization sales representative.
12 “Filter initializing error” appears in Error in filter initialization Contact service office of our
message box. sales representative.
13 “Light control motor initialization Error in light control motor Contact service office of our
error” appears in message box. initialization sales representative.
14 “Signal!” appears in message Sector mirror rotates Restart the
box. abnormally. spectrophotometer, and
contact service office of our
sales representative if the
message appears again.
15 “Hardware!” appears in message Necessary hardware is not Restart the
box. found. spectrophotometer.
16 “Parameter error” appears in Parameter is out of range. Change analytical
message box. parameter.
17 a. Large fluctuation of 0%T in Variation in PbS response Correct with PbS 0 switch
measurement in near infrared sensitivity. referring to section 3.4.
region.
b. Large step or shock appears
in spectral data at detector
changeover.

4 - 14
5.1

5. REPLACEMENT PARTS

5.1 Introduction

Several consumables are used in the spectrophotometer.


To minimize its shutdown time, it is recommended to prepare an
adequate number of those parts.

5.2 Consumables and Spare Parts

The following parts are consumable. It is recommended to


order spares from our sales representative or service office
nearest you before the parts are all used up.

Guaranteed Lifetime of Lamps

Guaranteed Guarantee
Lamp Part No. Where Used
Life Period
WI lamp 1000 h 6 months from 885-1200 Solid/liquid sample
delivery (J851123) measurement
system
D2 lamp 350 h 6 months from 239-0354 Solid/liquid sample
delivery (J384017) measurement
system
High-brightness 350 h 6 months from 132-4700 UV region
D2 lamp delivery measurement
system

5-1
5.3 Replacement of Light Source Lamp

5.3 Replacement of Light Source Lamp

WARNING
Injury due to Light Source Lamp
The D2 lamp uses a power supply voltage of 500 V.
Touching the lamp with power on could give you an electric
shock, resulting in fatal or serious injury. Make sure the
spectrophotometer POWER is OFF before replacing the
lamp.

CAUTION
Touching Hot Part Could Result in Burns
The D2 lamp or WI lamp become very hot during use, and
you may be burned if you touch them. Turn OFF the
spectrophotometer POWER switch and wait until the lamps
cool down before attempting to replace them.

NOTICE: When handling a new lamp, be sure to wear clean


gloves so as not to leave fingerprints on the tube
wall of the lamp. For the D2 lamp, take care not
to leave fingerprints on the protruding part.

For lamp replacement, take the following procedure.

(1) Turn off the power switch. After that, wait for about 20
minutes until the lamp assy cools down sufficiently.

5-2
5.3

(2) Remove the screws P from the side face of the light source
cover, and detach the cover.

Screw P

Light source assy

C000079

Fig. 5-1 Light Source Cover

With the UV sample measuring system, remove four


screws S from the side face of the light source cover, and
detach the cover.

Screws

Fig. 5-2 Light Source Cover

5-3
5.3 Replacement of Light Source Lamp

(3) Replacement of WI Lamp

Pull out the lamp in the arrow direction. Insert a new lamp
securely up to the end.

WI lamp

Fig. 5-3 Replacement of WI Lamp

(4) Replacement of D2 Lamp

(a) Loosen the three screws R and detach the D2 lamp


terminal.

D2 lamp

Screw R

Fig. 5-4 Light Source Compartment

5-4
5.3

(b) Hold the metal part of the D2 lamp and turn it


counterclockwise until it is separated from the holder.

(c) Attach a new D2 lamp by reversing the procedure


described above.

Fig. 5-5 Replacement of D2 Lamp

(5) Put back the light source cover.

5-5
APPENDIX

Design Concept on Sample Compartment Optics

Figure 1 shows the result of ray trace in the horizontal direction


of sample beam in the sample compartment (when viewing the
sample beam from the top),namely in the widthwise direction of
the beam.
Ray trace is made with the slit in the monochromator fully open.
At the imaging points AB and CD, image size remains the same
at different slit widths in the monochromator. Only brightness
changes.
At other than those imaging points, beam size varies in response
to slit width. In case a sample has a unique locality on its
surface, it must be located at the imaging point or in its vicinity.
Given below are considerations depending on the standard
sample compartment optics. In Fig. 1, the monochromatic light
emitted through the exit slit of monochromator forms a mask
image of the light source at 380 mm toward the monochromator
from the exit of sample compartment. That is, optical
calculation assumes that the light source of 19 mm width is
located at the position of the mask image. The beam is incident
on the sample compartment after being reflected by a toroidal
mirror (f=122.2). Then a mask image is formed again at 10 mm
backward of the monochromator from the sub-white-plate plane.
The standard sample compartment of this instrument is not
provided with any lenses.

298 mm 410 mm

Exit of sample compartment Entrance of integrating sphere


Toroidal mirror
(f=122.2) 6 mm

60 mm

C
Exit slit 0.101° Sub white
A 0.588°
plate position
1.277°

B
D
10 mm
Mask image
Slit image Mask image
AB=2.4 mm
158 mm 540 mm CD=8 mm

Fig. 1 Sample Compartment Optics-Ray Trace on


Sample Side (width)

APPENDIX - 1
But it is possible to alter size and position of the mask image by
inserting a thin lens. So an image can be formed at different
positions and in different sizes by altering the position or focal
length (f) of the thin lens. Try your own setting according to
sample size with reference to this example.
The example represents standard optics. For more sophisticated
optics, contact us separately.

(1) Determination of Lens Position

Lens position is determined on condition that an image


within 6 mm (beam width) is formed near the entrance of
the integrating sphere. First, begin with calculation of ray
trace for standard instrument optics.

Lens formula
1 1 1
= +
f a b
Where; f: Focal length of lens
a: Distance between object (light source mask
image AB) and lens
b: Distance from lens to imaging point
(entrance of integrating sphere)

In this case, the formula can be written as follows.


1 1 1
= +
122.2 mm 158 mm b

So we can know the value “b” as 540 (mm).

Formula of Image Size


b
× (object size) = image size
a

The formula can be written as follows.


540
Image size = 2.4 mm × ≈ 8.0 mm
158

Thus, we now know that a mask image is generated again


at 10 mm backward from the sub white plate by the effect
of the toroidal mirror (f=122.2). So to generate a 6 mm
mask image on integrating sphere entrance, a lens must be
inserted before the mask image of standard optics. In this
case, because of a reversion in the relation of location
between object position and lens in formula (1), we must
pay attention to the fact that the sign of value “a” must be
minus (see Fig. 2).

APPENDIX - 2
a
b

Mask image
(without lens)
Mask image
(generated on integrating
sphere entrance by
inserting lens)

10 mm
Inserted lens
50 mm

Fig. 2 Relation between Positions of Optics

Now, determine the position for the lens which generates a


6 mm mask image on the entrance of integrating sphere.
50 mm is the distance between the entrance of integrating
sphere and mask image (see Fig. 2 again), so we can
know the relation between “a” and “b” as follows.
b = − a − 50

From the formula (2):


b
8 mm × = 6 mm
a
The lens is located at the position determined by
“a” = -200 mm, “b” = 150 mm.
Next we determine the focal length (f) of the lens.

(2) Determination of Focal Length (f) of Lens

From the formula (1) above,


a ⋅b 200 × 150
f= = = 600 mm
a + b 200 − 150

We now know that an image of 6 mm (beam width) can be


formed on the entrance of integrating sphere by installing
the lens having a focal length of 600 mm at a point 150 mm
from the entrance.
However, the result of this determination alone is not yet
adequate. We must further determine the proper lens size
and examine the size of beam which is radiated onto the
white plate after being focused on the entrance of
integrating sphere. In case beam size is larger than the
sub white plate, special attention must be paid because the
result of measurement varies significantly.
As an aid to circumventing this, an actual example of ray
trace is shown below.

APPENDIX - 3
(3) Ray Trace (width direction)

We have calculated the lens position and focal length (f) for
forming an image at the desired location and with the
desired width in the above (1) and (2). This result serves
only to judge the profile of the imaging point.
For examination of the optical system it is important to know
the beam trajectory up to imaging and thereafter.

(a) Draw a light source mask image (with size of 8 mm) on


section paper.

8 mm

Fig. 3 Drawing of Light Source Mask Image

NOTE: An enlarged scale is recommended for


ensuring exactness. The next figure has
been drawn on an enlarged scale.

(b) Next draw lines at 0.734°, 1.010° and 1.277° from A


and B points of light source mask as illustrated below.

NOTE: Accuracy tends to become poorer when we


draw these lines while measuring angles.
Instead, it is recommended to draw the lines
according to the result of “tan” calculation.
In the figure below, the exit of sample
compartment is selected for the base.
The horizontal axis has a scale of 1/5.

APPENDIX - 4
Mask image
C Sub white
0.101° plate position
0.588°
1.277°

510 mm

Fig. 4 Drawing of Lines

(c) Extend each line up to the lens position calculated


before (up to the center line of lens assumed to be a
thin one).

(d) Mark the length of image at the imaging position


calculated in the previous step like CD in the figure
below. Draw the lines so those from point A gather at
point D’ and those from point B join at point C’.

142 mm
Center line of lens

C’ Mask image

6 mm

D’

Fig. 5 Joining of Lines

(e) The image CD is formed on the entrance of integrating


sphere. After striking the integrating sphere, the
beam further advances 60 mm, where it encounters
the white plate. The window which mounts the white
plate has a diameter of about 17 mm.
It is ideal for the beam incident on the integrating
sphere to be all radiated to the white plate without
being dispersed outside the plate. To confirm this,
further extend the lines, which have reached C and D,
by 60 mm (up to the white plate).

APPENDIX - 5
Center of lens 60 mm Sub white plate
position

C’

φ17

D’
Image
C’ D’=6 mm

Fig. 6 Extending Lines up to White Plate

The result of the above procedures is summed up in


Fig. 7. This figure clarifies the beam trajectory in
which the light source mask image AB is formed as CD
on the entrance of integrating sphere.

298 mm 410 mm

Exit of sample compartment Entrance of integrating sphere


Mirror (f=122.2)
6 mm Inserted lens (f=553)

60 mm

Exit slit C’ Sub white


plate
A
position

B
D’
Image
Slit image Image
C’D’=3 mm
158 mm 349 mm 142 mm

Fig. 7 Sample Compartment Optics - Ray Trace on Sample Side


(width)

APPENDIX - 6
(4) Confirmation of Beam in Vertical Direction

The beam always has a certain area. Although we have


examined the horizontal width of beam (when viewing it
from the top), the beam must also be checked in the vertical
direction (when viewing it from the front).
Beam can be examined in the vertical direction by the same
method as employed in the horizontal direction.
However, attention must be paid to the differences from the
horizontal beam check.

(a) The lens position and focal length (f) are the same as
those determined in the horizontal direction. The size
and location of the image CD differ slightly between the
horizontal and vertical directions.

(b) Length is larger in the vertical direction than in the


horizontal direction as a whole. This is due to the slit
height.

(c) The location and size of the light source mask image
AB are slightly different from those in the horizontal
direction.

297.3 mm 410 mm
Toroidal mirror
(f=122.2) Exit of sample compartment Entrance of integrating sphere

30.3 mm
6 mm

Exit slit Sub white


C
plate position
A

B
D

Mask image Mask image


AB=3.1 mm Slit image CD=10.6 mm
157.3 mm 544 mm

Fig. 8 Sample Compartment Optics - Ray Trace on Sample Side


(vertical)

APPENDIX - 7
Figure 8 shows another ray trace of the sample
compartment beam. Sample beam is viewed from its
front, namely in the vertical direction.
The monochromatic beam emitted from the
monochromator forms a light source mask image
(erect virtual image) at a point 297.3 mm from the exit
of sample compartment toward the monochromator via
various mirrors. This position is fixed in all cases.
Hence, we assume that a light source (object) of
3.1 mm height is located at this position. Now, by the
effect of toroidal mirror (f=122.2) a mask image is
generated at 6 mm backward from the sub white plate.
Next, we can go to calculation for the ray trace in the
vertical direction as we have done in the horizontal
direction. The lens position has been determined
above already. Then we can know the size of the
7.8 mm mask image at 6 mm forward from integrating
sphere entrance that is generated by inserting the lens.
The whole result of ray trace in the vertical direction is
shown in Fig. 9.

297.3 mm 410 mm

Mirror
(f=122.2) Exit of sample compartment Entrance of integrating sphere

Inserted lens 2.3 mm


30.3 mm (f=600)
57.8 mm
Exit slit
C’ Sub white
plate position
A

B
D’
Mask image
Mask image
Slit image C’D’=7.8 mm

157.3 mm 348.6 mm 144.3 mm

Fig. 9 Sample Compartment Optics with Lens Inserted - Ray Trace


on Sample Side (vertical)

APPENDIX - 8
INDEX

A
ACC connector ................................................................................................................... 2-5, 2-6
ALARM lamp ............................................................................................................................. 2-6
Analog output terminal........................................................................................................ 2-5, 2-6
Application ................................................................................................................................. 2-6
Assembly .......................................................................................................................... 1-5, 1-14
Automatic calibration ............................................................................................................... 2-13

B
Baseline correction .................................................................................................................. 2-13
Baseline flatness ..............................................................................................................2-17, 4-3
Baseline stability...................................................................................................................... 2-17
Bouguer-Beer’s law ................................................................................................................. 2-15

C
C. READY lamp......................................................................................................................... 2-5
Check of contents...................................................................................................................... 1-5
Cleaning of sample compartment.............................................................................................. 4-8
Communication connector......................................................................................................... 2-4
Configuration ............................................................................................................................. 2-1
Confirmation of specifications.................................................................................................... 4-1
Connection of cords................................................................................................................. 1-12
Connection of grounding wire.................................................................................................. 1-11
Connection of printer ............................................................................................................... 1-12
Consumables............................................................................................................................. 5-1

D
D. READY lamp......................................................................................................................... 2-5
D2 lamp ..................................................................................................................2-13, 4-12, 4-14
Deuterium (D2) lamp ................................................................................................................ 2-16

E
Error message ........................................................................................................................... 3-1

INDEX - 1
F
Fixing of spectrophotometer .................................................................................................... 1-12
Frequency.................................................................................................................................. 1-2
Function..................................................................................................................................... 2-1
Fuse........................................................................................................................................... 1-9

G
Grounding line ........................................................................................................................... 1-2

I
Installation ........................................................................................................................ 1-3, 1-15
Instrument calibration ................................................................................................................ 3-1

L
Lamp ON time ......................................................................................................................... 4-12
Lamp replacement............................................................................................................ 4-12, 5-2

M
Maintenance and inspection...................................................................................................... 4-1
Measurement mode................................................................................................................... 4-6

N
Noise level ................................................................................................................................. 4-6

O
Operating principle .................................................................................................................... 2-7
Optical system ........................................................................................................................... 2-7

INDEX - 2
P
POWER switch .......................................................................................................................... 2-2
PbS 0 switch................................................................................................................2-5, 2-6, 3-4
Periodical inspection.................................................................................................................. 4-8
Photometric accuracy .............................................................................................................. 2-16
Photometric mode ................................................................................................................... 2-16
Photometric range ................................................................................................................... 2-16
Photometric reproducibility ...................................................................................................... 2-17
Power capacity .......................................................................................................................... 1-2
Power supply voltage ......................................................................................................... 1-2, 1-9

R
RUN lamp .................................................................................................................................. 2-4
Replacement of light source lamp ............................................................................................. 5-2
Replacement parts .................................................................................................................... 5-1
Response ................................................................................................................................ 2-18

S
Sample compartment ....................................................................................................... 2-3, 2-16
Self-diagnosis ................................................................................................................... 2-13, 4-1
Signal processing and control system ............................................................................ 2-11, 2-12
Spare parts ................................................................................................................................ 5-1
Specifications .......................................................................................................................... 2-16
Spectrum band width................................................................................................................. 4-3
System baseline measurement ........................................................................................ 2-13, 3-2

T
Troubleshooting table .............................................................................................................. 4-14
Tungsten halogen lamp ........................................................................................................... 2-16
Turning on power..................................................................................................................... 1-14

U
UV Solutions program ............................................................................................................. 1-15
Unpacking.................................................................................................................................. 1-1
Utility........................................................................................................................................ 1-16

INDEX - 3
W
WI lamp .......................................................................................................................... 2-13, 4-14
Wavelength accuracy ....................................................................................................... 2-16, 4-1
Wavelength calibration .............................................................................................................. 3-2
Wavelength scan speed .......................................................................................................... 2-16
Wavelength setting reproducibility........................................................................................... 2-16
Withstanding load ...................................................................................................................... 1-4

INDEX - 4

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