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Reliability
• Generally defined as the ability of a
product to perform as expected over
time
• Formally defined as the probability that
a product, piece of equipment, or
system performs its intended function
for a stated period of time under
specified operating conditions
Tapan Bagchi TQM IEM Reliability 2
a1
Maintainability
• The probability that a system or product
can be retained in, or one that has
failed can be restored to, operating
condition in a specified amount of time.
Types of Failures
• Functional failure – failure that occurs
at the start of product life due to
manufacturing or material detects
• Reliability failure – failure after some
period of use
a2
Types of Reliability
• Inherent reliability – predicted by
product design
• Achieved reliability – observed during
use; based on observed failure data
a3
Failure Rate Curve
“Infant
mortality
period”
a4
Average Failure Rate = 0.02
installation errors,
operator & maintenance errors
Useful life
Early Wear-out has a low, constant failure rate
Failure Useful Failure
Life
Wear-out failure
Time parts approach the end of life
a5
Measuring Reliability
Reliability R(t):
The probability of operating to an
agreed level of performance
Unreliability F(t):
The probability of failing to operate
to an agreed level of performance
R(t ) + F (t ) = 1
a6
In general, Failure Times fit
Weibull Distribution
In probability theory and statistics, the Weibull distribution is a
continuous probability distribution with the probability density function
a7
The Weibull Distribution
expressions
r(t) =
Observed Reliability
No. of Cumulative No. f(t)= n(t)/
R(t)=
Failure of n(t)/ avg S(t)/20
Time t s n(t) Failures Surviving S(t) 2000 S 00 F(t) = 1 - R(t)
a8
r(t) and R(t) Calculations displayed
2.000
0.500
0.000
0 1 2 3 4 5 6 7 8 9 10
Time
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Reliability of Repairable Items
Tup1 Tup2 Tup3
Td1 Td2 Td3
T
Availability
• Operational availability
MTBF MTBM = mean time between
AO =
MTBM + MDT maintenance
MDT = mean down time
• Inherent availability
MTBF = mean time between
MTBF failures
A=
MTBF + MTTR MTTR = mean time to repair
a10
Design for Reliability
Element selection
elements with well-established failure rate data
Environment
elements can withstand normal working environment
Minimum complexity
fewer elements (series systems)
Redundancy
several identical elements in parallel
Diversity
a give function is carried out by two parallel systems
Series Systems
1 2 n
RS = R1 R2 ... Rn
a11
Reliability of Series System
Reliability of a series
I O system is the product of
R1 R2 Rn individual element
reliabilities.
= e −( λ1 + λ2 +⋅⋅⋅+ λn ) t
Tapan Bagchi TQM IEM Reliability 23
Parallel Systems
a12
Reliability of Parallel System
R1 Reliability of a parallel
system is determined by
I R2 O
the product of individual
Rn
element unreliabilities.
System reliability is
Rsystem = 1 − F1 ⋅ F2 ⋅ ⋅ ⋅ Fn
greater than the
= 1 − (1 − e−λ1t ) ⋅ (1 − e−λ2t ) ⋅ ⋅ ⋅ (1 − e−λnt )
greatest element
reliability
Series-Parallel Systems
C
RA RB RD
RC
A B D
C
RC
• Convert to equivalent series system
RA RB RD
A B C’ D
RC’ = 1 – (1-
(1-RC)(1-
)(1-RC)
Tapan Bagchi TQM IEM Reliability 26
a13
Reliability Management
• Define customer performance requirements
• Determine important economic factors and
relationship with reliability requirements
• Define the environment and conditions of
product use
• Select components, designs, and vendors
that meet reliability and cost criteria
• Determine reliability requirements for
machines and equipment
• Analyze field reliability for improvement
Tapan Bagchi TQM IEM Reliability 27
Configuration Management
1. Establish approved baseline
configurations (designs)
2. Maintain control over all changes in the
baseline programs (change control)
3. Provide traceability of baselines and
changes (configuration accounting)
a14
Design Issues
• Access of parts for repair
• Modular construction and
standardization
• Diagnostic repair procedures and
expert systems
Maintainability
a15
Reliability Engineering
• Standardization
• Redundancy
• Physics of failure
• Reliability testing
• Burn-in
• Failure mode and effects analysis
(FMEA)
• Fault tree analysis (FTA)
Tapan Bagchi TQM IEM Reliability 31
FTA
a16
Fault Tree Analysis (FTA)
Bulb
Fails
Example:
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Faults/Pathways Magnified N-fold for a
Simple Manufacturing Process!
FMEA
a18
High-Level Combinations of
Severity and Probability
Increasing Probability of
High Risk
Occurrence
Medium
Risk
Low
Risk
FMEA – Why?
• Why FMEA’s?
FM • Definition, Purpose,
EA
Types, Benefits
• Team Approach
Introduction
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FMEA – Definition
FMEA – Purpose
Failures
FMEA
Crisis Time
(Production start)
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FMEA – Purpose
a21
Severity (Weightfactor)
None AcceptedTapan
failure
Bagchi TQM IEM Reliability D 44
a22
Potential Cause of Failure
Manufacturing misbuilds
+ +
- -
a23
Manufacturing misbuilds
+ +
- -
“Text
unreadable”
a24
Cause of failure – “Why”-ladder
“Text unreadable”
Sentencing Technique: Is it an
effect or a cause?
Failure
Mode Due to
Cause
a25
Sentencing Technique -
Example
Dissatisfied
Could result in customer
“Text
Unreadable”
Due to Surface
roughness
(designreq.)
Product-FMEA – Occurrence
a26
Rating criteria
of occurrence
Very high ≥ 1 of 3 5
> 1 of 20 4
> 1 of 15000 2
Product-FMEA – Actions/Solutions
a27
Do the Bicycle exercise again—by
FMEA
a28