Anisotropic silicon etching is highly anisotropic: While the 100and 110-crystal planes are being etched, the stable 111 planes act as an etch stop: (111)-orientated wafers are almost not at[100] tacked by the etch. The degree of anisotropy (= etch rate selectivity [110] between different crystal planes), the etch rates, and the etching homogen
Anisotropic silicon etching is highly anisotropic: While the 100and 110-crystal planes are being etched, the stable 111 planes act as an etch stop: (111)-orientated wafers are almost not at[100] tacked by the etch. The degree of anisotropy (= etch rate selectivity [110] between different crystal planes), the etch rates, and the etching homogen
Anisotropic silicon etching is highly anisotropic: While the 100and 110-crystal planes are being etched, the stable 111 planes act as an etch stop: (111)-orientated wafers are almost not at[100] tacked by the etch. The degree of anisotropy (= etch rate selectivity [110] between different crystal planes), the etch rates, and the etching homogen
of Silicon Revised: 2007-03-07 Source: www.microchemicals.eu/technical-information
Anisotropic Silicon Etching
Strong alkaline substances (pH > 12) such as aqueous KOH- or TMAH-solutions etch Si via Si + 4 OH- à Si(OH)4 + 4e-. Since the bonding energy of Si atoms is different for each crystal plane, and KOH/TMAH Si etching is not diffusion- but etch rate limited, Si etching is highly anisotropic: While the {100}- and {110}-crystal planes are being etched, the stable {111} planes act as an etch stop: (111)-orientated Si- wafers are almost not at- [100] tacked by the etch. (100)-orientated wafers form square-based pyra- [111] mids with {111} sur- faces. These pyramids {111} are realised on c-Si solar cells for the purpose of reflection minimization. (110)-orientated wafers f or m perpen di cu l ar trenches wi th {11 1} side-walls, used as e. g. microchannels in micro- me ch an i cs an d mi - [100] crofluidics. [010] The degree of anisotropy [110] (= etch rate selectivity between different crystal planes), the etch rates, and the etching homoge- neity depend on the etchin g tem perature, atomic defects in the sili- Anisotropic con crystal, intrinsic im- etching purities of the Si crystal, {100} {110} impurities (metal ions) by the etchant, and the [100] [110] concentration of Si-at- oms already etched. The doping concentration of the Si to be etched also strongly impacts on the etching: During etch- i n g, B or on d oped S i forms borosilicate glass on the surface which acts {111} as etch stop if the boron doping concentration ex- ceeds 1019 cm-3. Photoresists, developers, remover, adhesion promoters, etchants, and solvents ... Phone: +49 731 36080-409 Fax: +49 731 36080-908 e-Mail: sales@microchemicals.eu MicroChemicals GmbH The following table lists etch rates of Si and the hard masks SixNy and SiO2, and etch selectivity between different crystal planes as a function of the etchant. Etch rate ratio Etch rate (absolute) Advantages (+) Etchant (100)/(111) (110)/(111) (100) Si3N4 SiO2 Disadvantages (-) KOH (-) Metal ion containing 300 600 1.4 µm/min <1 Å/min 14 Å/min (44%, 85°C) (+) Strongly anisotropic TMAH 0.3-1 (-) Weak anisotropy 37 68 <1 Å/min 2 Å/min (25%, 80°C) µm/min (+) Metal ion free (-) Weak anisotropy , toxic EDP 20 10 1.25 µm/min 1 Å/min 2 Å/min (+) Metal ion free, metallic (115°C) hard masks possible
Isotropic Etching of Silicon and SiO2
The following chemical reactions summarize the basic etch mechanism for isotropic silicon etching (steps 1-4), and SiO2 (only step 4) using a HF/HNO3 etching mixture: (1) NO2 formation (HNO2 always in traces in HNO3): HNO2 + HNO3 à 2 NO2 + H2O (2) Oxidation of silicon by NO2: 2 NO2 + Si à Si 2+ + 2 NO2- (3) Formation of SiO2: Si + 2 (OH) 2+ - à SiO2 + H2 (4) Etching of SiO2: SiO2 + 6 HF à H2SiF6 + 2H2O In conclusion, HNO3 oxidises Si, and HF etches the SiO2 hereby formed. Fig. right-hand: High HF : HNO3 ratios promote rate-lim- ited etching (strong temperature dependency of the etch [HF] Increasing etch rate) of Si via the oxidation (1) - (3), while low HF : HNO3 rate tempera- ratios promote diffusion-limited etching (lower tempera- ture depend- ture dependency of the etch rate) via step (4). HNO3- ency free HF etches do not attack Si. The SiO2 etch rate is determined by the HF-concen- Increas- tration, since the oxidation (1) - (3) does not ac- ing selec- count. Compared to thermal oxide, deposited (e. g. tivity Si/ CVD) SiO2 has a higher etch rate due to its poros- SiO2 ity; wet oxide a slightly higher etch rate than dry oxide for the same reason. An accurate control of the etch rate requires a temperature control within ± 0.5°C. Dilution with acidic acid improves wetting of the hy- drophobic Si-surface and thus increases and [H2O]+[CH 3COOH] [HNO3] homogenizes the etch rate. Doped (n- and p-type) silicon as well as phosphorus-doped SiO2 etches faster than undoped Si or SiO2. Our Silicon-Etch Our Silicon-Etch „AFN 549“ for isotropic silicon etching has the composition HF : HNO3 : CH3COOH : H2O = 10.2 % : 39.5 % : 23.2 %: 27.1 % We supply this mixture in 2.5 L sales volumes in MR quality. Other grades/sales volumes available on request.
Photoresists, developers, remover, adhesion promoters, etchants, and solvents ...