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Micromachining Concept on
GaAs and a mm-Wave
Oscillator Example
By Kamaljeet Singh and Surendra Pal
ISRO Satellite Centre
P
resent technology
Micromachining can place demands reduced
cavities, slots, microstrip manufacturing
lines. air gaps and other cost, size, weight and
mechanical structures improved performance
directly onto the semicon- for wireless and location
ductor substrate material services exploitation like
GPS, as well as for the
millimeter wave devices. This kind of demand Figure 1 · Micromachining examples on
for wider bandwidth along with state-of-the- GaAs wafer.
art performance can be accomplished with the
use of micromachining and MEMS technology
[1]. Developing micromachined technology is based MMIC technology.
also essential for the future of integrating the For compatibility with existing MMIC-
entire communication system on a single chip. based circuits, mostly on GaAs, the process
Presently, the demand is for the develop- has to be well defined for micromachining on
ment of components and devices in ever-high- GaAs. As pHEMT and mHEMT up to 0.15 µm
er frequency bands. At higher frequencies have matured enough compared to SiGe
realization of circuits using planar technology HBTs, the circuits based on GaAs have far
results in modal dispersion along with the more potential at millimeter wave frequen-
decrease in the phase velocity. Also at high cies. Designing components on GaAs sub-
frequency, loss—whose dependency is cubic strates offers the possibility of a full monolith-
with the frequency—creates limitations in the ic system integrated with the active circuits
successful realization of the circuits. To over- built by MMIC technology. In this paper the
come these limitations either the substrate focus will be on the machining aspect of the
has to be shrunk or a substrate-free propaga- GaAs, its realization and further potential,
tion structure has to be built. Micromachining and its application for an integrated reliable
is currently the most suitable method for sub- source at millimeter frequencies.
strate free propagation. And the potential to
enable wide operational bandwidth, eliminate Fabrication Steps on GaAs
off-chip passive components, make intercon- Fabrication of MEMS/micromachining
nect losses negligible, and have process com- devices are carried out mainly by four tech-
patibility with the existing MMIC process are niques—bulk micromachining, surface micro-
added advantages. Both GaAs and Si offer a machining, LIGA and SCREAM. For disper-
wide range of possibilities in this area. High sionless and substrate mode free propagation,
resistivity Si has been considered to be the bulk micromachining is easier in realizing
most suitable candidate due to ease of etching, high frequency circuits. In bulk micromachin-
well defined processes and planes for etching. ing, the 3-D structure is supplied within the
But it is incompatible with the existing GaAs- confines of a wafer by exploiting the anisotrop-
Figure 2 · Concept of slot coupling in GaAs wafer. Figure 3 · Wafer stacking process.
ic etching rates of different atomic off process. For the indigenous pro- lines and micromachined CPW lines
crystallographic planes in the wafer. cess of micromachining, a double have been exploited for high frequen-
The front-end processing consists of sided low resistivity wafer of 650 µm cy circuit realization. Access to both
dielectric and metal deposition. This has to be used. In this case, it was signal and ground planes on the
consists of deposition of Si3N4 of .10- thinned down to 200 µm. The in- same plane, removal of via holes and
.12 µm followed by polyimide using house micromachining on GaAs was high power handling capability,
PECVD and post baking with an aimed to etch out nearly 100 µm from makes the conductor backed CPW
additional thickness of 1.1-1.2 µm. the wafer of 200 µm. The criticality is lines most versatile and easy to use
Use of polyimide increases the aver- the profile and the etch rate which among micromachined lines. The
age power handling capability. The has to be precisely controlled. The in- micromachined line reduces the prop-
thermal resistance of polyimide is house processing steps for the back agation losses, frequency dispersion
about 200 times the thermal resis- side etching are: and non-TEM modes. Membrane sup-
tance of GaAs. Back side etching con- ported lines such as microstrip lines,
sists of opening at the back side using 1. Preparation of the GaAs wafer for shielded membrane microstrip lines,
wet etchants H2SO4/H2O2/H2O and the resist coating using electron microshield lines and shielded strip
using photo resist as a mask. The beam resist. lines. External high Q resonator can
etching of GaAs is highly anisotropic 2. Post baking the resist and writing be replaced using micromachined
and tilt is pronounced at the (011) on it using electron beam lithogra- lines equivalent to air dielectric line
section [2]. Metallization of the pat- phy. with wide transverse dimensions,
tern has to be carried out using a lift 3. De-scum of the wafer so that resulting in high Q at millimeter
residues are removed and ready for wave frequencies as well as increased
Structure Q the etching. average and peak power handling. It
4. Wet etching while controlling the has been found out that the Q of the
Rectangular Wave 8000 etch rate and undercut. micromachined line excited in WGM
guide (nonplanar) 5. Depth measurement using optical mode is comparable to the metallic
microscope. cavity as shown in Table 1 [3,4]. This
Slot resonator 500 knowhow can be most suitable for fil-
over cavity The samples show the depth of ter and oscillator applications, where
100 µm achieved as per the require- the effect of Q is more pronounced in
Microstrip over 234 ment after four samples run on the the insertion loss and phase noise to
membrane wafer. Figure 1 shows the machined a great extent. This article concen-
cavities on the GaAs wafer of the trates on the realization of a micro-
Microstrip over Si 125 dimensions 2400 µm × 400 µm with machined oscillator. The structures,
the gap of 300 µm. The depth was after careful study, have been simu-
DR >10,000 decided to be kept around 100 µm. lated, then implemented practically
for evaluation. The various forms of Q
Table 1 · A comparison of Q Advantages of Machined Lines are related according to the following
obtained using various structures. Both micromachined microstrip equations:
QL–1 = QU–1 + QE–1 dielectric puck is highest but at high Simulated Structures
frequency the size of the puck, along The aim of the simulated struc-
Qloaded = f0/∆f, with the required position accuracy, tures is to show the capability of cre-
makes it unsuitable for realizing a ating a highly stable source using the
Qext = 10–([S21(dB)/20]) · Qloaded relaible oscillator. The use of WGM micromachined concept on the GaAs
mode gives Q factor of around 5000, wafer. CST (Computer Simulation
The comparison summary of which is ideal for realizing planar cir- Technology) software has been exten-
Table 1 shows that the Q of the cuits. sively used for the passive circuits’
October 2006 43
High Frequency Design
MICROMACHINING