ASIAN INSTITUTE OF TECHNOLOGY

SCHOOL OF ENGINEERING AND TECHNOLOGY

AT73.03 Engineering Metrology 3(2-3) Semester: August

Rationale: Knowledge of measurement and instrumentation is of increasing importance in

industry. Advances in automated manufacturing and requirement to conform to various
standards have resulted in a proliferation of computerized and automated inspection techniques
along with the classical metrology methods.

Catalog Description: Introduction. Linear Measurement. Angular Measurement, Thread

Measurement. Measurement of Surface Texture and Roundness. Use of Computer in
Metrology. Traceability.

Pre-requisite: None

Course Outline:

I Introduction
1. Length Standard/ Time Standard
2. Role of Inspection in Automated Manufacturing
3. Errors in Measurement
4. Dimensional, Geometrical and Position Tolerancing
5. Case Studies in Limits, Fits and Tolerancing

II Linear Measurements
1. Slip and Block Gauges
2. Principles and Operations of Linear Measurement Instruments
3. Design of Comparators
4. Interferometers

III Angular Measurement, Thread Measurement

1. Measurement of Taper Gauges, Calibration of Circular Dimensions
2. Optical Instruments for Angular Measurement
3. Measurements of Screw Threads, Gears

IV Measurement of Surface Texture and Roundness

1. Properties of the Surface
2. Methods of Measuring Surface Finish and Its Analysis
3. Roundness Assessment

V Use of Computers in Metrology

1. Coordinate Measuring Machine
 2. In-process Inspection and On-line Sensing
3. Use of Lasers in Measurement
4. Automated Inspection Techniques
5. Measuring Requirements as Stipulated by ISO

VI Traceability
1. Definition
2. Implementation

Laboratory Sessions: LabVIEW programming, Linear and Angular Measurements. Surface

Texture Measurements. Measurement Standards.

Textbook: Lecture Notes

Reference Books:

Gasvik , K.J., Optical Metrology 3rd edition

Harlow, R.H., Busch, Dotson, C., Fundamentals of Dimensional Metrology 4th edition
G. M. S. de Silva , Basic Metrology for ISO 9000 Certification
Figliola, and Beasley, Theory and Design for Mechanical Measurements
Hetch, E., and Zajac, A., Optics
Hariharan, P., Basic of Interferometry
Steel, W.H., Interferometry
Zeid, I., CAD/CAM Theory and Practice

Journals:

CIRP Annals
Measurement

Grading System: The final grade will be computed according to the following weight
distribution: Midsem Exam 25%; Final Exam 30%; Lab/Assignments 25%Report &
Presentation 20%. All exams are usually closed book.

Instructor: Dr. Pisut Koomsap