MIL-STD-414

11 blvs7
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ORfkMOO$-10

MILITARY STANDARD

SAMbLING PROCEDURES AND TABLES

FOR INSPECTION BY VARIABLES
FOR PERCENT DEFECTIVE

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mL-sTD-414
11 JEW 1957

OFFICS OF TEE ~ANT SECRETARY OF DE~

Wuhlngkm $5, D. c.

Supply and Logi.ti.. 11 JUIU lb7

Sarnpflng Procedures and Table. for fa.p. ctlo. by

Varl.bl.. for Pe=cent Ddectlva
MIL-STD-414

1. Thi. .tandard h.. ~en approved by the De Pru’ne.t of Defense

and i. mandatory for . . . by the Departm. rAto of the Army, the Navy. and
the M. force, ●ffectivm 11 June 1957.
2. h ●ccordance rnth e.tabli.bed proc.dur., the Sfandardi.. ticm
Diwl. im k.. d-.ifp.t.d tha Chemical -Carp. Bureau of Ordnance. -d
Air For.. , r.. p.ti..ly, . . Amp N.v-Air For.. custodian. .1 thi.
.tandard.

>. Recommended correction.. sddltlenn, or deletion. .hould be

I .: ●ddr . . ..d to the Stanbrdi. atior. Divi. iom, Of fic. of the As. imta.t Sec...
aary of Def.a.e (Su@y and Logistic.), Wa.hin@an Z5. D. C.

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UJlvl-hn-ls

Esu
INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . “ii

SECTION A GENERAL D&9tiRIPT30N OF tibfPL3t4G PL.#JS . . . . . 1

Table,:
Table A-1 U3LConveraion Table . . . . . . . . . . . . . . .
Table A-2 Sample Size Code tiNers . . . . . . . . . . . . . . :
Table A-3 Operating Char.cteri*tie Curve. 10. Sampfiq
Plmm of S.ctiOa# B, C, and D (Graph- for
San@. Sise tie Letters B though Q) . . 5

SECTION B VAR3ABIL1TY UN3U40WK-STANDARD

DEV~TION METHOD

Par: J SINGLE SPECIFICATION LIMIT . . . . . . . . . . . . . . 35

Ex8mpl. *:
Example B- I Example of Cdcafattoiw:, Simgle
sPeciflcatiOn fAmil-Form 1 . . . . . . . . . . . 37
Example B-2 Example of Calculations: Sin~le
Sp*cificatiea Ltmit-l%rm 2 . . . . . . . . . . . 38
Table.:
Treble E.- I M..ter Tabie for Normal ●nd Tighteoed
3nmpecti0n (Form l-Sinnle fAmit) . . . . . 39
Table B-Z Maater Table for Redueed impection
(sOrrnl-singl. LiJnii) . . . . . . . . . . . . . . 40

Part H DOUBLE SPECIFICATION UhUT . . . . . . . . . . , . 41

1s Examplea:
Example B-3 tiample of Cdcrdatiomm: Double Specifi.
c8tioa LAnit-Cke AQL vai.4 far Upper
and Lawe r Specification Limit Combined . . . 43
Exarn@e B-4 Example of Calculatinna: Double Specifi-
cation Umit-DIfferem AC3L values for
Upper sud fmwer Specification Umitm . . . . 44
T, blem:
Table B- 3 Mmmter Table for Normal ●nd Tightened
Impecti.n (Double Limit and f%rm 2-
I ... siIl#le LiInif) . . . . . . . . . . . .. . . . . . . . . 45
Table B-4 Mssier Table for R=duced faspectiom
(Double LImitmnd Form Z-Single Limit) . . . 46
I Table B-5 Table for 3SatimatiaEthe Lot P. rcent
De fective . . . . . . . . . . . . . . . . . . . . . . . . 47

Part f3J EST1MATION OF PROCESS AVZSAGE AND

C3UTE- FOR RZDUCEL AND TIGHTENED
I INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?.

Table, :
I Table B-6 Value. of T for Tigbtenad k#p8!cti011 . . . . . . 54
Table B-? ~ts of Estimated k; P.rcent
Defective far Roduc=d Inspection . . . . . . . . 56
Table L-8 Value. of F for h4asimum Standard
Deviafioa.[MBD) . . . . . . . . . . . . . . . . . . . 58
I
APP=dk B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

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xlL-mTb414
11 Juts 1097

coNTmzTa-caitinmd

SECTION C VASliABILfTY ZINKNOWN-~S METHOD

Part 1 sU40LSSPECZF1CATION LZMIT . . . . . . . . . . . . . . . . 61 .

kxmlfb:
E8urlph c-l Eauanph of Ckicniatidm: Simsle
S~cificatiOa Umit-FOrm i . . . . . . . . . . 63
3hampie C-Z Exuriplm of Cakuiati0a9: StnSle
Specification Limit. Form 2 . . . . . . . . . . 64
Tsblea :
Tsbie C-1 Mast-r Tabie for Normal ●nd Tightene4
Inspection (Form I_ Siql. Limit) . . . . . . . 6S
Tabi* c-z Msst.r Tabls for Reduced lnapecUorI
(FOrml-SiOgl. LImlt) . . . . . . . . . . . . . . 66

1“ Part u DOUBLE SPEC1IVCATION L3M3T . . . . . . , . . . . . . . . b7

Exaf+em:
Ex.mple C-3 Example of Caleulxtioms: Doubl. Sp.eUi -
catiem LiniIt-Oae AQL value [or Upper
and tiwer Spocifieu40m Limit Ckmblaed . , . . 69
Example C-4 Exunple o{ Caiculaiiom: Double Specif{ -
c-ion Limit-D4ifar8st AQL vahm. for
UpPer u8d Lower SPRIcZflcacJon LImitm . . . 70
Table,,
Table C-3 A.hmI.r Tabl. for fdmnul .md Ti#hte.ed
~P=c~a (-ble Limit 4 Ferm z _
Sias!e Z&nit) . . . . . . . . . . . . . . . . . . . . 71
Table C-4 Maater Tabl@ #or Reduced lmpectiom
(Dauble L&nit - Fown&Simgle IAnIt) . . . . 7Z
T.ble C-5 Ttile for Ectinmiinsthe Lot Percent
Dekctive . . . . . . . . . . . . . . . . . . . . . . . 73

Part Zu ESTIWTZON OF PROCESS AVIXfAGE AND

cRZT3ZRJA PVR REDUCED AND TZOHTSNED
INSPECTION . . . . . . . . ., . . . . . . . . . . . . . . . . . . . .

Table.:
Table c-6 Vaium. of T Ior .Tigbtmmd h,pecticm .“. . . . . 80
Table C-7 z-bits Of Eotiated kt S%rcemt
Defective for R.duced Z.cmp.ectioa . . , . .. . . B2
Tablo C-8 Value. of ~ 10, M&um Awe ra~e
Rsn#e(w) . . . . . . . . . . . . . . . . . . . . . 84
.,.
APWIUUB C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85

SEC7WN D VARZASZL3TY WWN

P8rt 1 SZNOZ.E SPSCW1GATZON3A3AZT . . . . . . . . . . . . . . . . ST

Exmpleo :
Exumple D-l ZZxampta of Caieubtlms: Siasis
*c4fkati0n Z.imit-rofm 1 . . . . . . . . . . 89
&urnpZm D-3. Example of c+IeuidzioM: Si+e
Smcification ZAtaia_FOsm Z . . . . . . . . . . 90
Ttbim.,
Tabic D-l Msst*r Table fof Normal d Ti#btened
Zzmpoeuom {Form 1-Sk+ Umlc) . . . . . . ,9I
Tmbb D-Z titer Table [or Reducmd tJ1.p~=tiO_
(FOrml-Slr@*LimitJ . . . .. . . . . . . . . . . 9s

1!
~.—— “-
.. . . . .,.—
....=_
 comzNls-cOfmffwd
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P*T5 u DOUBLE 5PECfF1CAT10N LlhffT . . . . . . . . . . . . . 95

3hampfe*:
3kAmpfe D-3 Esampk af Cdctdationw Double SpecUi-
cation L6mit-Oa* AOL vahm UpPar and
fmwer Specification. fAmit Combirmd . . . . . 97
Exunple D-4 Emmple of .Calculatioms: Double +pecUi -
c-tion L6mit-D3ffereut AOL value- for
UpVr d kwer Specification Limits . . . . 98
Tables:
Table D-3 Master T*le for Normal and Tightened
fn. pectim (Double Limit and Form Z-
Simgleumlt) . . . . . . . . . . . . . . . . . . . . . 99
T.bla D-4 Master T&ble for Reduced 3nop.ctiom
[Ooubk Limit..d Form Z-Single Limit) . . . . 101
T.ble D-5 T-ble for Estimating the fat Percentage
Defective . . . . . . . . . . . . . . . . . . . . . . . . 103

P*rt Ul SST1MATION OF PROCB AVESAG!C AND

CSJT&R3A FOR REDUCED AND TIGHTENED
INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . 104

Tsble#:
Table D-6 Value. of T for Tightened frt. pection . . . . . . 106
Table D-7 Limit- of Ectinutod IAX Percent
Defective for Reduced hmpecfiom . . . . . . . . 108

APP*6 D........ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110

 I
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mlL-8’m-414
llhfislm?

INTRODUCTION

Thi. Stamdardwa. prepmred to meet ● growing IIeeo for tbe U. of standard

●u’npliq ptmm for Jampection by vari*ble. in ti~rnmatn procurement, DIIpply
and .torage, and maintenance ia.pciion opa ratiozm. Tbe variabf.. sampJ&s
plane .pply to ● ●in@e quality characteristic which can be rnea.tirmd on ● coattn-
tm.. scale, and for which quality i. ●xpressed in term. cd percent de fectiue. The
theory unclerlying the developrne.t of the wari.bte. .aniplim~ plaua, including the
oparatiq charact=rimtic curve.. a.awne. that rnea.urem.mt. of tba quattty char.
●cteristic ● re independent, identicslfy di.tribufed normal random varisblea.
1. comparium with atfributa. ..mpfing pfmn., warlah!es umpfiag plamm
have tbe ●dvanta~e of ummfly remdtin~ & cmmide rsble .avinem in #ample ●i-
for .xmnparabl. a..uruice . . to the correctness. of decision. in judging . .in#le
quality characteristic, or for the .arne sample size. greater a.mirance is ob-
I tained using variable, plan.. Attribute. sampling pfan. have the advantage of
greater simplicity, of being applicable to either .ingle or rnuttiple quality char-
acteristi c., and of requiring no knowledge about the distribution of the contlaueu.
rn. a.ur. rmenc. of any d the quality cfur. txeridc..

It 10 imporfsmt to mot. tfut variable. .amptfmp pha. ● rm mot to be um.d

i.di. crirninat.ly, ,impfy bec.u.e. it i. po..ible to obf.in vaxi.bk. tnea.urarnemt
,data. fn conmlderq appfieatlon. where the rmrmatity or irtde~nde.ce ● .smnp-
tion. may be que.ticmcd, the user i. ●dvi.ed to cm-..ult hi. technical agency to
detci-rh in. the fe.. ibility of appfi calion.

Thi8 Srandard 1. divided into four .ectimm. Section A describe. @n. rat
procttlur. a of the .amplimg plan.. Secfic.m. B utd C de.crib. .Pcifi. procedure.
and ●pplic ation. of the .arnpIing plan. when w.=iability i. unknovr., In Section B
the .stirn.te of lot .%and. rd d.vi.tion i. used .s lh. fn. i. 10. an ● .timat. of the
unknc.w. variability, and in Section C the average rams. of the sunpf. 1* used.
Section D desc=ibes the plan. when variability is known.

Each of Sectiono B. C, and D i. divided into fbree part.: (l) SAMPJIIW PIUM
for the Single S~cifieuiom Limit Ca.e, 111)Sampfimg Plans for th. mubl. Spc-
ific. tion Limit Case, and (3JJ) Procedure. JorEsthnation cd Proce.. Average and
Criteria fer Tighmned ● rid Reduced Ja. pection. For tba ●ingle s~cification
limit ca. e, Lhe ●cceptability trite rio. i. giv=n im two foran.: Form 1 amd Form Z.
Either of the fonnc may be u.ed, ●ii-ici they ● rc idettticti a. to .ainple sise -d
deci ion for lot ●cceptability or rejeetabilify. III deciding whether w u.= Form 1
or FQrrn Z, the followin~ poiDt . should be bo=n. in mind. Form I provide. the lot
●ccept ability cri~. rion without ●.titn.tirtg 10I percent defective. The Form 2 101
acceptability criterion require. emtirnates of Jot percent defective. Theme e#li -
mate. at.o .r. ~quimd for e stiznatbn of tha proea ● a ●verage.

Operating Characteristic Curve. fn Table A-3 how fhe r=latioa.ftip betweem

quality and percent of lot. expected to be ●cce~able for the quality cbaractari.tic
inm~et.d. A. stated, the .e Ope rating Characfe ri ‘tic Cur-. are &sed 011tbe
..#urnpiari that meam. mment. ● re .ekctedat raadanalrom a ciorsnti distribution.

The corre spending ●unpfin~ plan. in SectiW. S, C. ~d D w. m mstcbed

●. closely ., po.. ible ~der ● .y.tem Of fixed .unpfe .Ise with re. pcct to their
Opcraling Characteristic Cu?wes. O~raUng Chsracteristjc Cum. in T.bf. A-3
h..= been computed for the .mpling p]an. b... d orj th. ..timate of lof .tudard
deviation ef unknown ..ri.bility, Thy are eqully .pplie.ble ior .arnpllns plan.
hoed on th. averaga range of the .awIpI. of unfmown variability and theme bam.d
on known variabUity.

C.rtaim cln..cmri.:ic. concerning the sunpliag phm. in S..tiom. B amd C

-d tbosa la S9ction D dwufd b, moud. Pkn. baa.d on fba ● mtima& ot umk=09m
Wariablllty require fe~r .M@e wit. for cm~ra~e . ..”ranca -baa tb ● d.
Mate of lcM .taadard tiwl.si~ i. “..d than _bg. ib .~..ae rua~. d ffn .-+
in u.ed: on fhe ottwr tid, plan. Vsbg the .W~.gG r~ge of the #AM@. r.quira

VII

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 mb61v—414
11 June 19s7

●imphr compuuttmm. Plarm umlnn bm=variablltty -qutre con*l&rablT f-r

sample tmk far comwrabk amUJrMC* tbaI ● ich=r of the plans whw =TIabtuty
1s uakam: @we wer, tba roquir=mw.t of k#umII -rkbiUty Is ● ●rtnsent am.
The user 1s. dvised to co.milt MS tectalcal~uc~ bdom WPIYLW cunptiaj
piano U.tng bDOwa w8rIAbuuy.

Tath B-8 provids ● values of tbe f~ctor F to compute tfia maxfmum standard
dewiation hfsD. The hfSD se-s M ● ~uide for the magnitude of tht eatirnate of
lot standard de-scion when u-in Plazm for tbm double spcff ication limit c--e,
based on the ● intimate of lot .taa~rd deviation of un.bn- .arimtdUty. SimifArly
Table C-8 provides vmlue- of the Iactor f to com~te the maximum average range
MAR. The MAR ●or.ew m a g de for tbe magnitude of the average ruige of the
●rnple wk. usin# planm for “ket do.bfe .pecific.tia. limit . . . . . ba.ed . . the
ave rage range of the cunple of unbam wariddlity. Tba edmate of lot ●tmdard
deviation or ● verage range of the ●mpk, U it is Iem thm the hfSD or MAR.re.
●t=ctively. hslps *O immure. but doe. mot guarmt.e, lot accept. bfllty.

AU ●ymbols and their definition. ● re gimn III tha a-ix to Part JU cd the
applicable #*ctim. h Ulumtratim of the com~tiom and proc.durma .~ed IIJ
the .unpling plans i. give. i. the ●nmplec uf Part- I and 11 of tbe spplkable
.ection. The computathmm irwolve simple ● rithmetic operation. such am .dditina,
●ubtractio”. multiplicuion, &d dIvimion of mwnbera, or ● most, the taking of ●
.quare root of ● number. The user should become funiliarwith the g.neral pro-
cedure. of Sectian A. and refer to she ●pplicable sectioa for detailed iawtructiom
regarding ●pccific procedure.. cornpu. ions. md tables for [he Barnpliag plan..

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 ~14
11 Jmfe 14s7

1, SECTION A

1’ GENERAL DESCRIPTION OF SAMPLING PLANS

1’
Al. SCOPE unit of product. Tfm se pfwm may be used
whether pracuremrml inspection i. per.
All Pur Thi 8 Sammkrd =stablimhes km’rmd at the plant of ● prime coatract?r.
mmplnng +’ P anm and procedures for inopec - wbcontractor or vendor. or ● t destination,
ticm by variable ● for use in Government -d -S90 may be uaod when AppTOPrU1O in
P*.c. reme.t. s.ppfyuad stora~., and rnAJl- ●ppfy and storage. and main fanaace fL18pec-
tetts.cc inspection op8rati0rIm. when .ppli - tion ofm rattom.
cabfe this Standard #hall. be referenced in
the specification, contrzct, or in8pcctien in- A3. CLASSIPTCAITO?f OF DEFECTS
.tructic.r. m, and the provision, set forth
AZ. I Mtthodof Cia8sifring~fect@. Asf8m -
herein shall #ovem.
.ificat, c.n al defect- . . the ● rmine ratio. of
defect. of the unit of product claasifi. d
Al. ? III*PC ction. lnmpeclion i. tiw pro . . . .
of measur, ns. ●xamining. testing. gaging. 0. according to their irnporfaace. A defect 19
● deviation of the unit of product fr-am, re-
othe rwise comparing the “unit of product”
(See Al .4) with the appkabfe requirememla. quirement. of the specifications; drawiags,
Purcha.e da~cripfia”., and aay cbu~c
the reto in the contract or order. Defects
AI.3 lnspccti- by Variables. Inspection by
variables i. inspection wherein r+ specified normally belong to one of fhe fOllO*g
classes; however. defects may be plkced k
quality characte-ri. tic (See AI.5) on a unit
of proeuct i. measured on . continuous other ciao. cs.
.cale. .u. h ● . pound-. iwheo, feet per sec- AZ. 1.1 Critical Defeeto. A criticaf defect
ond, etc., And ● rneamtreme. t is recurd. d. i. .“. that iudeme. t and axmrience indicate
coule reeult ;.. hazardou. “or unssfe condi-
A1.4 Unit of Product. The unit of product tions for individual. u.ing or m.imaining
i. the entity of product in.xcted in order the product; or, formajnr end it.rn9 unit~of
to dew rrnine it; measurable quality char- product, such a. ships, aircraft, or famba. ●
1’ ● cteristic. Thim may be a single article, a
pair. a ●et. ● component of an end product,
d.f. ct that could prevent fmrforrnaaco of
their tactic-i fumction.
or the end product itself. The unil of prod-
uct may or may K.t be the sune ● s the unit A2. I.2 Major Defects. A major defect i8 a
of purchame, supply, production, or defect. other than critical, thaf coutd result
thipmer.t. in failure, ormateritlly reduce the usability
of the unit of product for its intended fmrpobe.
A 1.5 Quality Characteristic. The quality
I charact. riatic for varxablee
that characteristic
in. pecti4n is
ef i unit of p,oduct that
A2. I.3 Minor Defects. A minor defect is
on. that doc n not materially reduce the usa-
is actually m.a. uzed, to determim confor- bility of the unit of product for itm intem&d
mance with ● given requirement. Purposa. or i- ● deprfurc from ●stablislmd
atandard9 hating .0 signUi CUIt bOa CinI OrI
A1. b Specificaticm Limit.. The ●peclflca- the effective u.e or operation of th@ unit.
tion Iimtt(e) is the requi rerncnt that ●
quality characleri. tic .hould meet. Thi* A3. PERCENT DE FECTTVE
req.~rement may be exprenmd ● n ● . upper
●prc~f ication limit; or 6 lower pacification A’3.1 =.PT89.88. Of NO. CMtfO_ co. Tti
limit, called herein ● .in~le specification e$fcnt of nonconformance of pro dues 9fnff
limit; or bolh upper and lower .~cifieatiem be expre-scd i. terms of percent &faetive.
limit., called herein a double ●~cificmion
A3.Z Percent f%.feetiwe. Tbe percent d.-
limit.
fectiv-.~acterimtic of ● Ii%.
lox of prodv;t”i. th~ number of unit. of prad-
A 1.7 Sampli.~ Plans. A sampling pfan 1.
uct de fectiwe for that cfuractc ri.tic divided
a PrOCedUr* *h*ch ●peciiies the rmxnber c.< by the tataf number of unitm of product And
units of product from ● lot which ● re to h
itmpected, arid th. cril. rion Xor aecepfabil - multidimd by on. hundred. Expressed ● man
.auatiorx Percen: rkfectiv8 -
ity of the lot. Sampling pfazm desipated in
thi. Standard are ●pplicable to the insPc- Number of Aefectivea x 100
... tfon of ● chgfs quality cbaracteri-fke of a Numbs r of dtm
 1

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Mk+m+la
lx Jlfffe 1957

Ad. ACCEPTABLE QUALITT LEVEL

A4. 1 Acce@abZc Ouaiil bwl. Tba =-
a CBOmlnaf
● A6.2 Choice of SarnfAim Plain. SunpUaB
value ●xpr*s.e.i in farm. of percaat d8f*c - ~D u!d PIWCEOU-9 a:e pro-dad in d8C -
tive .Pcif ied for ● sbigle quUity character- tion B if Variddlity 10 uabnown amd the
iatic. Grtain numeried vaftws o; AOL .taadamf de rf.uion mathd is !mwd, h Soc -
r=~img f ram .04 to 1S.00 parce.nt am ●hO-a ticm C U variability i wunbaewn a?id the range
i. Table A- 1. Whe. . ran- of AOL VUW- matbod i c uced. and in Secfioa D if .ariabUity
i. .pecified. it dull he treated ● s if it wore is bnown. Urdesa otkrwi.e ●pcffied, un.
equal to the WdUC of AQL for which ●mfa2i0c b-n variabiUty, ●-d=rd dewiafim method
plms ● re lu-whed and which i~ bcluded ●unF41rtd plans. and the ●ceef=ablfifv crl -
within the AOL range. When the •~c~ted terbr. d Farm 2 (for the 9ic@e specification
AOL i- a particular value other tb& tivme iimit case) Aaif be used.
for which oamplhg pfanm ● re furniched, the
AOL, which i- to be used in ●pP2yihg the A7. SAMPLE SELECTION
yovi.ions of this Standard, .Itafl be ., .ho~
m Table A- 1. A7. I Determination of Sample Sise. The
.Unpl. .,- h, tha mm’lfmr of unttm of prod-
A4.2 Specifying AOL1 c. Tin particular AOL uct drawn frcan ● lot. Retati~ samph aIws
vafue le be used for ● ●ingle quality char- ● m Aesimated by cute letters. The 8ampf4
● ctarimtic of a given product must be ●pee- sise cod= Iette r“depcitds on the.inq=ticm
ified. fn the CM. of a double ●Pcifi.athm le.ve: and the lot ●1=4. There ● m fiva h-
limit. ● ith. r an AOL value it #PcUied for
•f=ctiOale=J~: L U. fU. IV. -d v. ff~e-~
the total percent de fecti.. muaida of bath othe rwhe ●pecffiod Ia-fmctien Ieval IV shali
up~r -d lower specification Umita, o. t-e k used. The ●unple .i.e cod. letter appli-
AOL value. are specified. om. for the upper cable to the .pcifi.d izi.pectim l.wel arid
limit and another for the lower Ifmit. for lots of given sise .hdl be obtained from
Table A-2.
AS. SUBJbflmAL OF PRODUCT
NOTICE-5P. c ial Reservaticm for
A5. I lat. The tsrrn ,,1ov hall nmmn ,virt-
Critical CharackrnB1ic8. Tbe Go.errm’i.nt
cpecti~lot, -’ i.e., a collection of unit. of
re. e.vo. tbe rmhl to in smct emryunit mb-
product from which ● sample is dram! ad mkkd hy the ;uppfier fos critieti etir.c -
inopec~td to dete rm”me complhrme with fhe te!rimko, uad to reject the remainder of the
I
acceptability criterion.
I lot Immedlafelyafter ● defect is fouud. Tbo

A5. 1.1 Formation of Lots. Each la; shall, GOvemirnent timo rcr:rvee tht right to ●am-
● s far ● mla practicable, con.iwt of unit. cd pfe fo~ criticmf d. f.ctc evm ry let aubmittad
product of ● .ingla type, gssde, ~Ass, size, by tk ●uppUer arid to reject any I-* if A
or cornpo. itkn manufactured under e.. en- sample dr.wm thrnrefr~ is fo-d to contain
ri.Ily the same conditimit. ow or more. criticti da fects.

A5.2 Lot Sise. The lot ● im 1. tha number A7.2 Dr.wimB of Samples. A sample 10 om.
of unit. d product in ● lot, and may differ or mere unit. ol product drawn from . lot.
f rem the quantity de.i#r.atmd h fbs comtraet UnItc of ttn munfdo Aa2i be, ,al~ct,d with-
or order a, ● lot for prod”ctlar., ●biprnellt. O* re#ard to t?bdr q.safity.
or Ether Purpo..,.

A6. LOT ACCEPTABILITY

A6. I Acce Sabfiity Criferien. The ●cca@- Proe.dure ● for ● 8tLmatfmg 22n preeomm
●bility of a lot of material ●iknitid br awrage @ criteria for ticbtaned and re -
imapc:kta ddf be detennh.d byum of ~ dweed in. fmcftan bared = th Umpacthn
of the .ampling plait. a..oeiaf.d~tb. .pec - romiito of pmeedinc lots are provided in
ffied value of the AOL{S). Tbi. Standard Part uf of dactiorm B. C. and D.
provide 8 ●ampliag plaa. baaad ombaowa 4
b- variability. fn the Iatfar can AS. SPECIAL PVOCEOURE POR APPLI-
two affa mativo met+, ● m provitid, - CATION .F MIXED VARIABLBS-
bared on the e ●tfmaia of im ●fattdard dovi. AlTT21BLfTES BA?APLJNG PLANS
atioa and the die r on lb am rqe range of
the t-fate. These .r. r. f.rred to . . the
standard dowiatio. method and tbe rinse
method. For tha case of a single cpeeifiea -
tiatl unlit, lb acc.ptabiu~ criterion I-

--
 I
i
i

● lu prwid=d for tin Miad w8*bl9D-

●ttrlbcuaa -Wunpumg phmm bon18 ad that
tbOM h ,T=tih A-S a- z-t W#idk.]

Condltlon A. Amptm wwI&mc. oximta

I W tbm produ ct cubmittod for iaapctioa IS
● mhctod by Ch #Upfli, Z tO meat tfM ,IWXiZ A lot
Ikatlan ltmit(s) by ● ●creemlng proee ● m mcdm Ui* ●ccef%abi me of
I f rmn ● Iarae r qus.mtity of product which 1. the fouo’wln’ Comtitiem. i. .*tL.fic.&.
not being produced wltbln tba ,Pclfication
Ilmlt(al. A. 7bo lot com~i4s
Camdltkm with
ttn apprsprmta variab14 ● ●cca*bllIty crl -
CodltiaQ B. Other condltiorm adst terlm of section B, C. or D.
tbt warrant tb= u, . of a .arlablac-
mttributem •ara~i4is *-. Caa6itLm B. The Ist cmIPU*s +tb
tbe ●cceptabif ity crita rkm of pragrapb
A9.2 Definition.. 11.1.2 of bAIL-sTD-!05.

A9.Z. 1 in.pactlom by Attrlbut8s. fnspectioa A9.4. 1 U Condition A ia not ●atiefied, pro.

by ●ttribute. I* inwpectkoa wbardc. tba unit coed iri accordance with tk ● tt tibute ● oM’l -
of product is Chsdfied simply m defective plirig plan to meet Condition B.
or mandcfectiwe with reapact to a given re -
qtiire.mom 07 s.t of nqutrnmentm. A9.4.2 lf Condition B ia not cati;lied, the
lot doe # not meet the 8ccepabilicy crlte rian.
A9.Z.Z Mind Variabla ● -Attrib* ● lnmP8c -
tion. tinnd varimhle ● -attributes inmp8ction A9.5 Se=rltY of Iaaopaetion. The proce-
~mgpcction of ● ●arnfie by sttributa ● . in dures for .everity ❑ f m.pecti.m rel=rred to
● ddition to inspection by variable. mmlready in ~rarraph A8 are net ●ppficsbl. for
mad. of ● previo.a ●unple, before . de- mixed Vaziable..attribum. inm~ction.
e ki,on .ao ~o.,*: ca~qsi!iv.o r .*I- c-bili~ ~
● M ctihmtie. ‘. ‘- NOTICE- When Gouerrmtemt drawin#..
SPedfiCatiOmn, or othc.r data ● re u.e4 tar
A9.3 Selection of Samplirtc Plans. The UIY prmme other than In connection wltb a
miaad *arlable.. att Yi- S -plmg plan definitely relamd Government procurement
stall h ●elected in UCOdUICe with thn opa ratloa. thm Lbit.d States Gow rrunent
fcdlovim~ tbe=aby imzur, no re. pm. ibility or my ob-
ligation wbtcoevcr; and the fact that the
A9.3.1 Select the vsrlableo #vnpliag plm Co.ernnteztt may have form.latd. f.rnimbed.
M ● ccorduaca with Section B, C, O, b. or In uIy way ●pplied the ●aid Lrswiags,
●wcificationa, or other data (* II@ t. ‘=
rm~arded by implication or otherwime ● in
mY m-e r licerming the tilde r or any otha r
I pcr*On or corporation, or conveying any
rights or p rmis. ion to m-nufbctufe, u**.
or ●ell aay patented invention thu may in
I mn7 =*T h ra~-td tbreto.

—
ror spd56d A03. va3u.eI Use thh AQl

m
m
a236q WiIhin mmu r-got Vazue

— to 0.049 0.04
““”
0.050 to 0.069 0,O65

0.070 to 0.109 0.10

O.lloto 0.164 0.15

0.165 to 0.Z19 0.Z5

0.Z80 to 0.439 0.40

6610 1JOIB35DF31
0.440 to 0.699 0.65
111 to 180 Be&c I
0.700 Ie 1.09 1.0
181 to 300 Et DFH_j
1.10 to 1.64 1.5
301 to 500 C32GIK
).65 to 2.79 Z.5
501 to 800 DFHJL
2.80 to 4.39 4.0

4.40 to 6.99 6.5

801 t“

1.301 to
1.300

3.200
I EGIKL

FHJLM
7,00 to 10.9 10.0
3.ZO1 to 8.000 Gl Lhi N
11.00 to 16.4 15.0

m
8.001 to 2z,000 HJMNO

ample .i;e code letter. given in body of

Uble ● re appli. abze when the indicated in-
●ptctim levelw are to be “med.

. - --,-
 I

mL-sm-414
11 Smn 1*

TAB- A-S

OpraCinC Clmr.ete.si.tic CtMW9. for Sun@iD* Plan.

of t%cti~m B, C, 4 D

-.
 TABLE A.3

OPERAllNG CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANOARO OEVIATIOM METHOO ii!
;f
SAMPLE SIZE COl)E LETTER
W
4:
B
I Cures * m?l~s p-i bed - ml,. +ti 0“4!.- .V1.wlty “. “.o.lld* iq.k.llnl )

!!
a

—
 .——. .—— .. . ——. .—

TABLE A.3

oPERAnNo WARAC7ERISTIC CURVES FOR SAMPLING PUJ49 SASEO ON STANOARO OEVIATION METHOO

.4

-0 10 so 30 40 w M ‘m 00 w 100
U%RATINO CW#fWTERISTIC CURVES FOR SAMPUNO PLANS BASEO ON STANOARO OEVIATION METHOO
ii~

.
----- .—.__— ._

TABLE h .3

IYERATINO CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD 0EVIA710N METMOD

SAMFI-E SIZE CODE LETTER

E
I b, * t9#wq pm, bed m mm,.dti ●*9k“- ..I.W, m “.”l* +.do”t 1

bo

‘0

#
40 w w !m a 40 loo
-0 10 IQ 30

M,I., rq!lmom - Ut Is#.ul 44,1, 1“1, I., - I“tpn,

”,
 t!

7ASU A.3

OPERAnNG CHARAC~RISTIC CURVES FOR SAMPLING PL;NS BASEO

ON STANOARO OWIATION METHOO

SWR_E SIZE cow LETTER

F :,
,,
[ corm f“ S*, ,19.1,b,,,d m .,”,. 9A,4 9.#t“- ?wI.bm, “
* “,”(++ ,,uk,td )

.- .- .-
hl-,tWllrdcfhh-lMhh
-rw. nM-#An.u.O..,o .
-94 d Iuo9 k , - m,t”b.+”, !
OUAU1’V
0? W3Mt?lC0LOTS I 1.,.md 4./.,!1..)
 *

TASU A.3

OPETiATING CHARACTERISTIC CURVES FO+7 SAMPLING PIANS QASED ON STANDAm OEVIATION ME I MOO

wu SIZE COW $lTER

F I Cenfh.edI ,
 TABLE A .3

OPERATING CHARAC7ER15TfCCU17VESFOR SAMPLING PLANS 8ASEC ON STfi?!DLRD DEVIIITION METHOD

ii
SiMFLE S1ZE COOE LETTER
:~
G *
I C.*.B IV ..v96, p!ru b.n.d w <a’. ..IM •.~ l.- .W1.bflllrw. “...lld+ ~.i..l.nl )

loo

Ri

10

_—
 -.

TMLE A. ;

OPERATING CHARACTERISTIC CURVES FOR SAMPUNQ PL+W 8ASE0 ON STANOARO OWIATION METMOD

SAMFLE SIZE CODE LETTER

G ( Con!lnwd)

Ii
x

OUUllY Or SWMlllfO 10U ( h pod tihdb, I

%.- - - - k.+.bl. B-m, 1“9101. -d hv., m”,

I
l___
 *

-----
TABLE A-3

WERATINQ CHARACTERISTIC CURVES FOR SAMPLING PLANS BASED ON STANDARD OEVIATION METHOO

SAMFtE SIZE CODE LETTER

“
H
I tiwl & ,@h, ,h., b.sd m ,,”,, 44 W4 know,.“i,blll!, “, ,,,,d,+ wI.,IA )
 .

TABLE A.3

OPERATINO CHARACTERISTIC CURVES FOR SAMPLIN6 PLANS BASEO ON STANDARD OWIATION METHOO
 TASLE A.3

OPERAllNO CIWACTERISTIC CURVES FOR SAMF1.lNO PLANS SASEO ON STANDARD DEVIATIDN METHOD

SAMP.-E S1ZE CODE LETTER

I
I hi la st+q tlmt k.d m rm~. AA -t h- .wI*WI, u. .m..lhlb H.1..lrd )

m
. e
-a
 .,

TABLE A -3

OPERATINO CHARACTERISTIC CURVES FOR SAMPLIN13PLANS BASED

ON STANOARD OEVIATION METHOD

SAMPLE SIZE COOE LETTEfi

I ( Contllwl )

?s
 TAME A-3
y
OPERATINO CNAIIACTERISTICCURVES FOR SAMPUNO PLANS BASED ON STANOARO OEVIATII?N METMOD
E!j
SAMW SIZE COOE LETTER
?&
J *
f Cnns for ‘u#l., ph. h,,d m m,, ●w O..*k-l .“lMI, “, “Al+ b+’.w I
 .- .——
I

TASK A .,3

O~RATINO CHARACTERISTIC CURVES FOR SAMPLINIJ PL~NS 8ASErI ON STANDARD DEVIATION METNOD

SAMRE SIZE CODE LETTER

J (Conm.td)
lb.., k M@”, ,1.., b.).t - Is.,. AM##Lu.n,O-l.bill* Um “,-II* Iqwdmf )

I
 .-
,,. 2

TABLE A. 3
y
OPERhTINQ CHARACTERISTICCURVES FOR SAMPLING PLANS BASEO ON STANOARD OEVIATION METHOD
3
Sf+@LE SIZE CODE LETTER
g“ !!
K +
{ C-w, * ,1.@q ,1,., b,,d m ,..,; 4.* “a h.- W,bdll, w, ,,,,”1;4$ qulw.1”1j

!3
 .,

TABLE h .3

OPERATINO CMbRACTERISTICCURVES FOR SAMPLING PLANS BASED 0:1 STANDARD DEVIATION METHOO

SAMFLE SIZE COOE LETTER

K ( Cennn.t~)
{ -t b *I p-t h-i m lul\s - “4 i- .ul.w~ .9 ●***W+ +!”.1-1 I

ht., ~,, m- “ bm+tl. dmltt,1“,!, 1- -d ,“,,o,wz

 TA9LE A-3
=!5
c@ERAnNo CHARACTERISTIC CURVES F(XI SAMPUNG PLANS BASED ON STANDARO DEVIATION METHOO :x

SAMFtE S1ZE CODE LETTER

L
t *8 f- Wt }1- b-d m m,, dn4 -8 in- vul,blhtj w, cud!+ WIV,lon!I

1
f
 o

TASLE A.3

cmmo CMbRACTERNWICCURVES FOR SAMPLING PLANS BASED ON STANDAR5 DEVIATION METHOD

SAMFtE SIZE COOE LETTER

L t Con!h..d )
 TABLE A -3 :!E
~f
OIWMTINO ChARACTERISTIC CUfWES FOR SAMPLING PLANS BASED ON ST.ANOAROOEVIATION METHOD
gln
~y
SAMPLE SIZE CO@E LE TTEII
Cm$
!4” a
,:
I h,,, 1“ ,,q,!h, ,hns b,,,d m ,,.9, ,A,b ,,* hnwmvwl,blhl,w, ,,nwdl,ll, ,,u(v,M }

Tli+n*d mmaItofbl,npwl,* $.h

-W!* 9! - * h “01...19 ul
91UW * - - s 4 419!?IM-. ou4m of WBulmo Lois [ h ,,remtW.nil,. )
?&I,%f,~,,, m,-, “, 8.,,,!,,,, O@,, c“.,, f- w,,, ,“,,,,,,..
,
 TABLE A -3’

OPERATING CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD DEVIATION METHOO

SAMPLE SIZE CODE LETTER

M ( Contln..d )
I W-.sa ?0?snplhl, ,19.s b-d m ““,0 604 “d i.- ..rl.bnll, “. “m!h!lf @!mlWd)

,.

...
..

m+dall?--dtiwr-eh il
etiti—rti-1, “
mb9md d b- * - ● lnwm Wm of WSM171C0
1.079 { 1.ptm! 4.1..!1.,I
m,, ~., * - ..9 k+. 0“.l,t, L“.1. 4- W.*I h+.,llo...

I
 TASLE A .3

OPERATING CHARACTERISTIC CURVES FIX? SAMPLING PLANS BASEO ON STANOARD OEVIAilON METHOO

SAMFtE SIZE CODE LETTER

N
f I&w, b ,udq ,!,”, b,,.d m ,,”,, “Ihd -4 t.- .“l.b.t,l, “. ,,, ”l,tq ~.,.di,,, )

thl*. dm#w9*s!h**-t.4 bh
-=@-- nM-h.b9..9wwnl8 . I
-d 94e h , 4 4M”MI., aumm or woumo LOU I I. ,,,,”1 ..h.th. I
w., nw, - - “. Auvl.bl. 0“.!1!,1“,1, t. “-”, M*,*,*).”
 m

TAGLE A. S

OPERAllNQ CHARACTERISTIC CURVES FOR SAMPUNG PLANS GASED ON STANOARO OEVIATION METHOO_..
 -.
.. .

TABLE A.3

DPERATING CHARACTERISTICCURVES FOR SAMPUNG PLANS BASED

ON STANDARD DEVIATION METHOD

SAMPLE SIZE COOE LETTER

o
i G“, 1“ a+, ,Im, $,,,4 m ,,.,. 44 W, t-mm.ar,.bdlt,w
.— -—-—-—. -——

TASLE A .3

OPERAnNG CHARACTERISTIC CURVES FOR SAMPLINO PLANS BhSED ON STANDARD DEVIATION METHOO

SAMPtE SIZE CODE LETTER

O I Contln.*d)

I Cnrm fw “w-q PIM1bm.d m r9ng.4M -4 k.- v“i.bill!, “. .,,,.lhl~ qll.,1-l I

r5
 .i

TABLE A. 3
~15
OPERATING CHARACTERISTIC CURVES FOR SAhiPLINQ PLANS BASED ON STANOARO oEVIATION METHOO
gi
SAMFtE S! 2E COOE LETTER
:
!/
P d:
t C4WW8
t- ,qll., ,Im, b.,.d m rq. ..fbti .,, &.cu vwl.btit+,,,, ,,,.”1,+ ,,.,..1”1 )

W +., d lb ,Wcmld It, *ml*4 1,“

-w. **ti .,-,, .
*4 d M k , - 4M”MI* 9UALIT7Of 9u9Ul~D LOTS I 1.,,,w,TI d,f,,l),, I
MA) f,~,,, 0! unu “. kr@.b!. Owl,!, L,.,t, t- w.,+ b!,,.,,,o”,
 .—— _ _

TABLE A .3

CURVES FOR SAMPLING PLANS BASED ON STANOARO OEVIATION METHOO

SAMPLE SIZE COOE LETTER

P I Conllnwd1
( e--m 1- -I )Iul W m Ire,, d -4 i“- .“kbllllj “, “oatId+ tq.lnl.! )

lbdat?l-wddbf,-?-abb
---**”O--*, “
Wdd-b@--dak$*Mm OUALIWOr SWUl17t0 101S I 1.,.r.m$ #.1..lh.1
lb,,, nw,., - -. “. k~,.,,. 0,.1!,, L“.1, I- -..1 In,,,,,,..l.
 ,.$,

TASK A -3

opERATING CHARACTERISTIC CURVES ,FOR SAMPLING PLY RA5E0 ON 5T,ANDAR0DEVIATION METHOC

SAMFtE SIZE cooE LETTER

Q
I Cuml fw t.wh”, 01,”,},,.4 m f.”,, ..*W .. . b.- .“i,blmy “, ,,,m,, d,, _“,.,!M! )

mmkuilm~tibl,~,,bb
-.woM*ubal -,,.
-04 d a k * d 41,+.MI.. 1
OUAUW OP $uBMITrCo
LOTS ( h ,.,,,”9 ,.1,,1,.,)
W., flpt .I - W. k.pl.bl. IWI~ L...l, l,, f.x.,1 I,TV,,I,W
 ., .,

TASLE A.3

OPERAllNQ CHARACTERli~lC CURVES FOR SAMPLING PIANS BASED ON STANDARO DEVIATION METHOD

SAMPLE S1ZE COOE LETTER

Q ‘( Cm
fln.,d )
I h, f- ,+*, ,S.., b.,d 01 ,,.,. dti mm,bin.., .whb,hly “. ,,,4+ w@vdcd I
 SSCTIW B

VARIABIIJTY uNKNowN-sTANDAmf DEvlAnoN

Parf I

SINGLE SPEUF3CAT10N LUA3T

S1. SAMPIJNG PLAN FOR SINGLE BS. Z.2 Accepu bility brmant. The acc.pc-
SPECIFICATION LXM!’T dility corutaaf k. correewmt .gtotbemun-
ple size mentioned ia pnagraph B2.2.1, ia
Thi. pArl Of the Standard deocribe. the indicmed in the column of the nuster table
procedure* for us. whh plani for ● oingle cor re~pmxling to tbe applicable A(2L value.
ape .ifiution limit when variability y of fhe Table B-1 i. entered from the fop for nor-
lot with re.pect to the quality charae%eri. - mal inopecfion ● nd from the bottom for
tic i. unknown ● nd the .tandard deviation tightened inspection. Sampling plum for re-
method ia u#ed. The acceptability criterion duced inspection are providd_ in Table B-2.
i. given in two equivalent iorm9. Tbeoe are
identified as Form 1 -d Form.2. B3. LOT-BY-WT ACCEPTABILITY PRO-
CEDURES WHEN PURIM 1 LS USEI?
B1.1 Use of SamPtinfl PlaJw. To deter-
min. whsther the lot me=t. the ● ccept -
B3. 1 Acceptability Criterion. Tbe degree
ability criterion with respect to ● particu-
of conformance of ● q uafit y cb8ractericti c
lar quality cfuracteristic a.ud AQL. -Iue.
with respecf lo ● single specification limit
the applicable campling plan shafJ be uced
.W1 be judg.d by th~, qusntity (u-XJI* or
in ● ccordance with lb. proviaionm of S.c -
fl-L)/i..
uc.n A, Generai Description of Samplmg
Plan. .-d th.. e in %hi, part Of th. Standard.
B 3.2. Corn tatien. TtIt following quantity
B 1.2 Drawi..qof Samplem. AfI .amplew ● hall .haff b- (“-X)/’ ., (x-L)/., d,-
be drawn in accordance -’th paragraph A7. Z. pendiagon whether the specification limit i,
~ qper or lower limit, +ere
B1. 3 Determination of Sample Size Code
~. Th e .smpla ●zce cod ● letter ●ha U i. tk upper specification limit.
be selected from Table A-Z in ● ccordance L i- tbe lower specification limit,
with parasraph A7. 1. X i. the sample mean. and
. i. the ● .tirnate of lot ●sn&rd de.rlatioa.
B2 SELSCTING THE SAMPLING PM
WHEN FORhf 1 IS USED B3.3 Acc ability Crite rfon. Cumpare the
BZ. 1 Maater sampling Tables. Th= muter abifttywmst-nt k. ff (u-x)/m or (x- f.)/a ia
●anmlmn tables for mlana based or. -ria- equal to .ar gre8ter tlun k, the lot meets the
bilit~ -MI for ~ ●ingle specification =cc~tiIf.fty criterion: if (U-X)1.** (X-f-)1~
limit vben using the ctaadard deviation ia l.mm Uu8 k or nerative, 3hrm the M &es
method ● re Tables B-1 .nd B-Z, Table B- I not meef the •=e~llity criterion.
in .m=d ler norm.] and tighter.ed iriapection
art< Table B - Z for reduced imspeetioit. M. t31JM3tMRY FOR OPXRATION OF
B 2. Z Obtaining the Sa?nPlinK PIan. ~~MNG PLAN WREN FORM s m
The
.mnpl.tig plan cons.st. .1 ● .unple .i.e 8d
m ● ~nociafed ●Cc.eptability COtI.unt. 1 The
sampling plan i. obtained from Mater The foLIowfnr ‘soP* •~marise ‘he PrO -
Table B-1 -, B-.?. =~u... t.. . . mllowed:

B2.2.1 Sam Ie Sise. The #ample .ise - Z* (1) Daterrnirw the sxmple .i.ecode lti -
●houm m ~ t e ma.,.. tabl - eo.-.. p-.fing *O ter from Table A-2 by uming the let sise and
.-.1. ..cnple ●ice cute tetter. in.pccfion leeel.
 MIL-m-414
11 Jt333e1957

(2) Obfai. Pk. from Mamer Tab)= B-1 cpecifteation limit. The percentage of Ma-
or B-z by .eleeting the sample size n and coaforming product is cstimattd by wiieria’
the ac..ptabill$y constant k. T~le B-5 with the quglity index and the
sample ● ize.
(3) Select at random the sampl= of n
unit. lrorn the let; inspect ● nd record the B6. Z GE-I utatio” of Qtufit
mea. urernem of she quality characteristic ~-lity~-X)~rnpE~
fer each utiit of the sample. if the specification limit i. ● a upper limit
U, or OL . (X- L)/t if it is a Io-er Jimit L.
(4) Cmnp.te the s.mpIe mean ~ and
estimate of lot sts”dard dcvistic.n . . and Th* quaatitie.. X ● md s. ● re the ●arnpl.
mean ● nd e.timm e of lot standard deviation.
● ISO compute the quantity (u-X)1. for an
respectively.
u per specification limit V or the q~ntity
A-L)/. for ● k.wer .peciticatio~ lids 3..

15) M the quantity (u-X)/s or (X-W.

i. equal co or greater than k, the 10I meets W.
lot
~e
●bove
-ii-t-d P.,. em d.f=~ti-
the upper specification
in d
limit, or
the ●c.ept.bilicy criterion: it’ (u-X)/. or
(X-L)/. i. [e.. (ha--- k or negative, thes the by ?z.. th. estimated percent defective below
lot doe’ rwtmeel Iheaccepttii lily criterion. the lower .pecifi catian limit. Tbe ● stimated
Pc*.=.: defective PU or PL i. obtained by
B5. SELECTING THE SAMPL3NG P2AN enterina Tabk B-5 with Ou or QL and the
WNEN FOfUd Z 5S USED ●ppropriate ●anple size.

S35.1 h4asccr Sampling Table.. Th. ma. ter 336.4 Acceptability Criterion. Gmpare the
.ampJmg tables for plans based onvariabil - estimated lot pereent deIectivepU or pL with
ity unknown for a single specification limit the maximum allowable percent defective M.
when using the m~nd-rd deriatitm method U PU Or Pl, 1. eqUf to or leas thn U, the
lot rneets the acceptability criterion; if Pu
sre Table. B-3 ● nd B-4 of Part If. Tsble
or p~ is greaier than M or if Qu or Q is
B-3 is used for normal a“dai~htened inmpec -
eion and Table B-4 .fc.r reduced.inspection.
,negative, then the 10: does not meet \he
acceptability criterion.
B 5.Z Oblainin~ the Sampling Plan. The
sarnpli”~ plan co. ss.ts of . .unpl. ,Ize and B7. SIJ71SMARY FOR OPERATION OF
sn ● ssociated maximum alk.w=ble percent SAMPL3NG PL.AN WHEN PORM 2 3S
da$eclive. The samplin~ plm i. obtained USED
from MaDter Table B-3 or B-4.
The fellc.rnng step. .umrnariz.e the pro-
65.2.1 Sample Size. T)M ●mnple mice n is cedure. to be fallc.u.ed,
● hewn m the ma. tcr table cortespendin~ 10
each sam>le .iz. code letter. (1) Determine the ●mple .i=e code let -
ter from Table A-2 byu. ing the lot size md
135..?.Z Maxim. mAllow8ble Percent De fee- the inspection level.
t$ve. The rrmxim.tn ● llowable p.=. ent de-
=live M for ample ● stimate. correspond. (Z) Obtain plan from Master T=ble B-3
img to the .unple size m=nt ioned in or B-d by .elecfi.~ the .unple .ixa n attd
pa:agrmph 95.2.1 is ittdicated in the column the maximum allowable percent defective M.
of the nm.ter table .xxre.pondiytg to the
●Pplic=ble AOL value. Tabl. B-3 i. =nt=,.d (3) Select ● t random the #ample of n
from tbe top for normal inspection -d from unit. frmn the Iof; inspect UId record the
the bottom lo, lsghter.ed in. peetion. Sam - m.asurernemt of the quality charact. rimic
-li>g plan. lcIr reduced inspection ● rm pro- cm each .unh of the ●ample.
v-ld ea ,. ~a~,e ~-,.
(4) Cmnpute3h= sample mean X arid the
ectimale of lot .ta”dard devfatian . .

(5) Compute the quality index Q

Jfi:
B6.1 Acceptability Criterion. The dc~ree (U-X)/ * if ● n upp. r .pe.ific.tie,. limit
of conformance Of a quallty characteristic
●P.*ified. or OL = (x. L)/. if ● lctwerspec -
iiication 1;...;. L <. snecif; ed.
with respect m ● ai.ngle specification limit
hall b, judged hy the percent of rmnem-, - (6) Det~rmb-Ic the estimated lot pereent
Iorm,ng product outsidt the upper or low+r de fecnive pu er pL from Table B-5.
%. Ex_pie B. z for .a cemplete ●xample of thb. prOc*dure.

:38
 Mu.-sm4l4
11 Juoe 19S7

fi) ff the e.timated lot percerndefective is~reatertl.an U Orif QuOr C3~ is aepti e,
PU Or PL i. ~ud to or 1... than the maxi. then the lot doe. ml meet the ●ccepmbi r IIY
mum .dlowable percent defective M. the lot criterion.
meet. the ●cc.pt~bil$ty criteriom if PU Or PL

EXAMPLS B-1

Exmnple of Calcufatio.s

Single Speci!icatlon Limit-Form I

Variability Unknown - Standard Deviation Method

ExAmple The rn.timum temperature of operation for ● cer:aindevic. i. .pecifi.d ● . .?09” F.

A lot of 40 item. i. submitted for inspection. Zn. pection Z-evel IV, normal inspec-
tion, with AQL = 1-% i. to be u, cd. From Tables A-2 ● nd B-1 i! i. aee : that a
marnplc 01 sise 5 i. required. Suppose the measurement. obtained are ● . <c.11ow.:
197.. 188-, 184” ,205-, and ZOl ‘: and compliance wfth the acceptability criterion i.
10 be determ%nea.

Line
.— Information Needed Value Obta{ned Explanation

1 Sample Si. e: n 5
~ Sum of Z.@.ur.m..t.: IX 975

3 Sum of Squared Me,, ureznentn: XX2 190,435

4 Correction Factor (CF): (I X)z/n 190,125 (975)2/5

5 Corrected Sum of Sqmre. (SS): s“X~CF 310 190,435 - 190,125

6 Variance (V): SS/(n-1) 77.5 310/4

1 Estimate of Lat Standard Deviation .: fi 8.S.1 -s

8 Sample Mean X: ZXln I 95 97515

9 Specification Limit (upper): u 209

10 The quantit~ w-X)/c 1.5.9 [209 - 195)/S .81

II Aecept~iIity &natant: k 1.53 S.. Table B-1

lZ Acceptiility Criteriozx f2mpare w-X)/O with k 1.59> 1.s3 See Par&. B3.3

The lot rneetm the .cceptabiltty criterion. mince (U. ~)/s is ~remt=r than k.

NOTE: If ● ■ingle lower spcffieat{on limit L is given. fhen compufe the q~ntilY ~-~)f~ in
Iin. 10 -d com~re il with k, the lot meet. the =ccept8bility *rii=.iQn. if (~-Ll/* is
equal to or greafer than k.
 !.

M2~-414
11 June 1957

Single Specification Limit-Form ,?

Variability Unknown - Standard Detiation Method

CUmple The maximum temperature of operation for ● certain device is specified ● s 209” F.
I A JOI of 40 items is ●ubmilted for inspection. 2nspection Uvel IV, normal inspec-
tion, with AOL = 1% in 10 be u.ed. From Table- A-2 and B-1 it i. .een that a
I sample of .ize 5 is required. S.ppome the measurements obtained art ● . follow.:
197., 188-, 184.,205-, and 201 ‘; and compliance with the acceptability criterion in
to be deter rnitied.

Lime
— Inforrntiion Needed Vmlue Ob:.ined tkpl .nati.n

J Sample Size: n 5

z Sum .3[ Mea. urcme.ta: XX 975

3 Sum ef Squared Measurement.: 1X2 190,435

4 Correction F=ctor (CFh (IX)zln 190,125 (975)2/5

5 Corrected Sum of Squares (SS): lX~CF 310 190.435 - 190,1Z5

6 .V.4@I<. (v): SS/(n-11. 77.5 310/4

7 Estimate of b: Standard Deria:icm .: fl 8.81 J-7X5

8 Sample Mean X: ZXln 195 97515

9 Specification Limit (upPer): u Z09

10 O~lity 2ndmc au . (u-x),, 1.59 (Z09-195]/8.81

11 .Z.19% S.. Table B -5

‘“t” ‘f b’ ‘ercen’ D’*”’ %
1?, Mu. A21mv=ble Percent De:.: M 3.32% .%. Table B-3

13 Acceptability Criterion: Compare Pu vilh M 2.19% < 3.32% See Para. B6.4

T3U let rmet. the ●cccptablzsty critarion, ●6nce pu is 1.-0 tti M.

NOTE: U a sin@. lower specification limit L is Siven, then compute the quality index OL =
(X-L)/s i“ line 10andobuLn the ● .timate of lot percent defective p . Compar. PL rnth
M; the lot meets the acceptability criterion. it pL is equal to 0? 1-
C*S lbn M.

! - -- -—--M
 ...
I
I

TABLE B-1 Standard Deviatiom Methc.d

MIster Table Far Normal &.d Ti~htened fn. pectlo. for PlaIJs Based on Variability Unknown
[Single Specification Limit– Form 1)

Acceptable (
-
allty .CVCIS (normal inspection)
.—
Sample size
code letter
Gi- ,10 ,15 .25 .40 .65
m
1.50 2.s0 4.00 m 10.00 15.00

T
k +k k kk T k k k k k k k

B 1.12 .958 .765 .566 .341

l-k
7 v . .
c $ 1.45 1.34 1,17 1.01 .814 .617 .393
—
D 5 1.65 1.53 1.40 1.24 I .07 .874 .67S .4s5
k
E 7 2.00 1.88 ).15 1,62 1.50 1.33 1,;l 5 .955 .7s5 .516

F 10 t i .?.24 2.11 1.98 1.04 1.72 1.58 1.41 1.23 1.03 .82n .611
— — 1 —
G 15 2.64 2.53 2.42
I 2.3?. 2.2o 2.06 1.91 t.79 1,65 1.47 1.30 1.09 .886 .664

g
34 20 2.69 2.58 2.47
I 2.36 2.24 ,?,11 1.96 1.8.? 1.69 1,51 1.3) 1.12 .917 .69s

,1 25 2.72 2.61 2.50 11.40 !3..26 2.14 1.98 1.85 1.72 1.53 1.35 1.14 .936 .71,?
- — —
J 30 2.73 2,61 2.51 2.41 2.2.9 2,15 2.00 1.86 1.73 1.55 1.36 1.1s .946 .723

1
K

L
35

40
1.17

2.77
.?.65

?.,66
2,54

2.5s
I 2.45

.3.44
2.31

2.31’
2.18

2.18
2.03

2.03
1..99

1.89
1.76

1:76
1.57

1.58
1.39

1.39
1.18

1.18
.969 .145

.746
+ .971
— —

L
— — .
5.4 50 2.83 2.71 2.6o 2.5o 2.35 2.22 2,08 1.93 1.80 1.61 1.42 I.ZI 1.00 .774
+
N 75 2.90 2.77 2.66 2.55 2.41 2.27 2.12 1.98 1.84 1.65 1.46 1.Z4 1.03 .ao4

o 100 2.92 2.80 2.69 2.58 2.43 2.29 2.14 2.00 1.86 1.67 1.48 i.26 1.05 .819
—

L
P 150 2.96 Z.84 2.13 2.61 2.47 a.33 7,1! 2.03 1.89 1,70 1.51 1.29 I .07 .841
--t-
Q zoo 2.97 2.85 2.73 2.6.? 2.47 2.33 2,1[ 2.04 1.89 1,70 1.51 1.29 1.07 .845
—
.065 .10 -t.15 .25 .4o i .65 I ,0( 1.50 Z.50 4.00 6.50 ,0.00 I 5.00
— — i
AcceptableC alit, ,fVela lightened inspectio!
A21AOL wdue8 ye knpercent de-a.
[Irst tunpllq plan belcw ●rrow, that is, both sample OIZ.Sas well ao k va2ue. When nample sise equdt er e=ceedo lot ~~
1:::, ,V.V ,tern hth. lot must be inspected.
 TABLE 23-2 “Standard Deviallm Method ~E
Maater Table for Reduced lnmc.ectimfor Plana Breed On Varlabilitv Unkmwm
(Single Sp’c.ifi..tl.n Litnit-F. rm I )
I I “Ac uality Levelo

I SampIe size
Code latter
Sunple
size
.04
I .06S I .10 .15 x.— .40
—.

EEE
Z.50 4,00 6.50 i65i

m
I
-L k
—
k k
—. .—
k k k k

J+~~
l.lz .958 .165 .566 .141

I
1.12 .958 .765 .566 .141
— — _—
D 3 1.12 .958 ,76$ .564 .141

E 3 I,lz .95.9 ,165 ,566 .341

T 4 I 1,45 1.34 1.17 1.01 ..914 ,617 .393

— .— —. — —
G 5 1,65 1.51 1.40 1.Z4 1.07 .874 ,675 ,455
i t
H 7 Zoo 1.$8 i.75 1.62 1.50 1.33 1.15 .955 .755 .536
-i-
1 10 z Z.11 1.9a 1.84 1.7Z 1,58 1.41 1.23 1:01 .828 .611
— .
J 10
I Z.Z4 Z.11 1.9a !.84 1.72
k
1.50 1.41 1.23 1.03 .828 II

-1--
K 15 Z.53 Z.4Z Z.)z Lzo 2.06 1.91 1.79 1.6S 1.47 1.30 1.09 ..986 .664
*
L Zo Z.58 Z.47 z.16 Z.Z4 Z.11 :.96 1.8Z 1.69 1.51 1.11 I.lz .91? .695

T
— — — —
u Zo 2.58 Z.47 Z.36 .LZ4 Z.11 1.96 1.8z 1.69 1.51 1.33 I.lz .917 .695

N 25 z.61 Z.50 2.40 2.Z6 2.14 1.90 1.85 I I,7Z 1.51 1.35 1.14 .936 .712
t-t

d
0 10 2.Z8 .?.!5 2.00 1.86 1.73 1.55 1,36 1.15 .946 .72J
— — — — —- .— —
P 50 Z.Y5 2.ZZ Z.08 1.91 1.80 1.61 1.4Z I.zl 1.00 ,114
*
Q 75 Z.41 2.27 2.IZ 1.98 (.84 1.65 1.46 1.24 1.01 .80$
— —— .— I
All AQLvm3ues ● re in percent defective.
f2rotdunplln,g plmbelowtrrow. that it, both mm-qde nize no well •~ kvalue. Whertaemple oize equal, or exceed. lot
~~;;, e,:,, ,,,m i“ the ,0, lll”,t t., ,mpetted.
 Part n
DOUBLE SPEC337CATZ034 3XM3’I

S8. SAbfPLLNG PLAN FOR DOUBLE the maxfzmIM tiowable percent de fecfivc by
SPECIFICATION ~ ML for the lower limit, mad by M for fhe
upper limft. If one AOL is asci~e 3 to both
This part of the Stan-dard describe. the IiAt. contbi.ed. designate the timum
procedures for use with plain for ● double Ulowable percerd d-f% by ht. Table B -3
specification limit when variability of the i. ● ntered from 3be 30p for marnul flupec-
lot with re.p. ct to the quality cluracteristic tion and from the bottom for tisbtaaed fLl-
i. unknown and the standard deviation method Wpecffon. Samp3fng pfuu for reduced fn-
is used. spect.ien ● re provided io Table B -4.

Bfl.1 use of Sampling Phm.. TCI determine B 10. DRAwU?G OF SAMPLES

whether the lot meets the ●cceptability cri-
I terion with respect
characteristic
to a particular
a“d AQL value(.)
quality
the appli-
Sample# shall
ance with paragraph
be elected
A7.2.
in accord-

cable campli”g plan ●ha31 be used in accord-

anc. with the provisions of Section A, Gen- B11. ;:&-.o;&O T ACCEPTABILITY
eral Description of Sampling Plans, and .
those in this part of the Stamdard.
B 11.1 Acceptability Criterion. The degree
B9. SEIJ2CTI?JG THE SAMPLING PLAN
01 Conformaa Ce or a WlA3ity elaaractcria3fc
A sampling pJa. for each AOZ. value with re. pect to m doubje mpacification limit
.hall. be ● elected from Table B-3 or B-4 m .hafl be judged by the percent of r.onconform-
[C.;J”WS: % P.tiuct. The percentage of manconforrn -
img product i. e.timated by entering Table
B9. 1 Determination of Sample .Stze Code B-5 with the quality index and fhe’.ample
ktter. The .arnple i.. cone letter .hal; .ize.
be selected imm Table A-Z in ● ccordance
with paragraph A7.1.

B9. Z Maater Sampling Table.. The master

satnplmg table. for plum based on variabil-
ity .“kt-mwn for a double specification limit U is the upper specification limit,
when using the standard deviation mctbod L ia the lower sp.cificacion limit,
are Tables B-3 and B-4. Table B-3 i. u.ed X is the sample mea., and
10. normal and tighlened ir.spection amd s is tkm estimate of lot standard deviation.
T=ble B-4 for reduced impectiom
B 11.3 Pere=nt Defective i. the Lat. The
B9. 3 Obtaining Sampling Plan. A sampling aualitv
. . of a lot shall be cx~r.a~terms
da”
.— consists of a .arrml. ..ze and the as- of the lot perc=nt deiecti~c. Ita estimate
soeiated maximum allowable perceni defec- +33 be de.i~ted by p~. PUO Or P. me
tive(s). The sampling plan to be ●pplied i. iadicsten cmifornunce with
inspection shtil be ob-iaed from WSter :::;52ptL upper .Pe.tllctiorl limit, PF
Table B-3 or B-4. w.ilh .e. pee: to fbe lowez .pecifiutio. lima .
-d P for both .Pecifiati.n limit- eom-
B9.3.1 Sample Size. The .unple #ize o is
bimed. The emtimstea p mid p
show” in the mater tablas correape=ding
determined by wIterins + ● ble B- Y . ‘w’ r=.pec be-
tO each sunple size cod. letter.
tively +f.h QL and f)” md the sample ● isc.
B9.3.2 M-.imum Allowable Percent Defec. The eotinute p Zhmfzbe determined by ●dding
*. T h. maximum allowable percem
the corresponding ectinuted percent defec-
defective for #ample estinuLe. of pert.mt tive- pL and p“ found in the tible.
de fe. civ. for the Icxmr. upper, or both .pec.
ificatiori limit. combined, corresponding to B12. ACCEPTABILITY CRITERION AND
the sample .ize mentioned ia paragraph SUMMARY FOR OPERATION OF
f39.3.10 in shown in the COhmm of the mas- SAMPLING PLANS
ter table corresponding to the applicable
AQL value(s). U different AOL, S ● re a.- B 12.1 be AOL value for both Upper and
sign=d to each .pe cification limit, de.ignmfe Lower s’ ecxlncatson Lwm umd.
MI L-STD-414
11 JurIe 1957

B 12.1. I Acceptability Criterion. 4 Carapare tdu, the lot meets the ●ccepubi.fityc riteria;
the ● stimated lot pe.rcatt delective P = PW + otberwimm, the lot doe. not nwet the ace~.
PL with the maximum ● llowable p=rcent abf3ity criteria. U .mither QL or Qv or botb
d. fective M. 11p in ●qual to or less tfun M, are me~tiive, then the 101does not meet the
the lot meets the accepmb{lity criterion: if acceptability criteria.
p is grcatertban Mor ii eifher Qu or QLor
both ● re n.@ive ,then the lot does not meet BIZ.Z.2 SurnmaryfOr Opertiianal Sampffrt&
the ●cceptability criterion. Plan. 3n ca. eg where ● t erenf AOl. walue
~stablished le. the upper and lawer .pec -
B 12.1.2 Summary lor Operation of Samplin# ification limit for ● single quality cfuract=r -
Plan. In cases where a ●m.glc ACfl. value is istic, the following steps sunururi’e the
~lished for the .tmer and lower .pccifi - procedures to be US=CL
cation limit combined for ● .in81e quality
characteristic, the following mtep. ■umma - (1) Deterrninethe ample .izecod=
rize the procedures to be used letter from Table A-2 by twin, the lot size
and fnspectimt level.
(1 ) Delerminc the ample size code
letter [rem Table A-2 by “sing the let .i%e ‘(.?) Select the sampling plan from
● nd the iriap. ction level. Master Table B-3 arB-4. Obtain the.ampfe
.ize . and the maximum allowable percent
(2) Select plan from Master Table defective Mu and M’. corr=apondi.g to the
B-3 or 8-4. Oblain the ample size “ ● nd AOf. va2ues for the upper and lower speci-
the maximum allowable percent defective M. fication limft., respectively.

(3) Select ● t random the sample .af (3) Select .1 random the ..ntple of
“ unit. Imrn the lot: i.sp. ct and r-cord the n unitefr.rn tie lot; ia. pe.t and =ecord the
mea. ur. merit of the quality characteristic meas”remerd of the quality cfur. cterimtic
on each unit O( the amp]=. on each unit in the .mrIple.

(4) Compute the ●mple rnesn X (4) Compute the sample mean X
and c.timltc Of lc.t .tand=rd dcviatic.n s. and estimate . 10I .tamlard deviation s’. ,,
(5) Compute the quality indices (5) Compute the quality ittdice.
QU = (u-X)/. and QL= (X. L)/,. Qff = (u-X)1. and OL = (x- L)/a.

(6) Determine the estimated lot (6) Deterrniae tbe estimsted lot
p.,r.n: d. fecfiv. P = PU + PL from Table percent defective ~ and p~, correspand-
B-5. iag \othe percent defective* shove fhe upper
and below the lower .peciIscaticm limit-.
(7) lf the e.tirnated lot percent de- A2eodetermi”e the combin.d percent delec -
fective p i. equal tc. or 1,.. than the maxim- tive p = pu 4 p~.
um ● llowable ptzcen% defective M, the )ot
meet, the ●cceptability criterion; if p is (7) 11all tbre=of the f.dlowin~ corl-
ur.~t=, th=n M Or if either W or QL - dition.:
bolhar. ne~.tive, then the 101doe. not met
the ●cceptability criterion. (a) ~ i. equal t. 0? 1... thll
% ●
B] 2.2 Different AOL Valueo for Upper and
Lower specification Limit. ~] PL !9 =LNJ81tO 0, h.. t3UII
‘L.
B 12.2.1 Accernability Crit’eria.5 Gmpare (c) p is equal to orlemmthanfbe
th. e.tirnated 101 fJC,C.llt dd ectives pL and larger of ML ● nd btU,
PU with the cm? c.pn.ding rntimum allow.
able p.rcem defective. M are sati. fied, fh= lot meet. the ●cceptabifhy
compare p = F.L + Pu wfth tke%~#~fa?L criteria; ofhe=wi. e the lot does mat meet the
and Mu. If pf, i. ●qual to or Iesn than htL, acceptability criteria. ff either OL or Gff
PO i. =qu*: to or le.. than MII. and P im or both ● re negatiwe, then the lot does not
.@al to or 1.*s than the larger ‘of ML “and tne=t tbe acceptability e=iter ia.

+S.. Etimple B. 3 {or . cmnplete ●xample of ibis proc.dure.

*W Example B.4 lot a cmmpl=te exatnple of thfs procedmre.

42
 Z41L-STD-414
Ii June 1$S7

I 3SXAZ4PLC E-+

i Example of Cdcu3ati0nm

I Double spa Mlutino Ltmtt

I
VariabiNty ?.bbnamn . Stutdard Zkuiaticm M.thod

0.. AQ L Value far both Upper and Lower Specification. Limit Cmmbined

E-de Tbc minimum temperature of operation for a c=rtAtn device 48 speetfied 8.180- F.
The masimwnt.mprst.re h 209” F. A lot of 40 item. i- submitted for imopection.
3nmpection Level 3V. normal in.pect(on, wtth AOL. s 1% im to be ..d. From Tablam
A-2 and B-3 it is neen that s sample of ●i=e 5 is zequird Suppo*e the rne...re.
1’ mcntm obtained ● re 8. fof30w.: 197”, 188”, 1M., 205”, md 201 -; ● nd cmnpliuw.

1’ with the acceptability criterion i. w b. determined.

Line
— Znforrnatian Needed Value Obtained Explanation

1 Sample Sise: n s

2 Sum 01 Measu.. mant.: SX 975

3 Sum of Squared Measurement: XX2 190,435

4 Correction Factor ICF): (2x)z/n 190,125 (975)2/5

5 Corrected Sum of Squarca (SS): XX~C~ 310 190,435-190.125

6 Variance (V): SS/(n- 1\ 77.5 310/4

7 Estimate of Lot St&rd Deviation s: & 8.81 m

s Sample Mean ~: ~1. 195 9?5)5

9 Upper Specification Limit: U 209

10 Lowe r Specification LitnAt: L 180

II QtuIity Index: Qu - (U-X)/s 1.59 (zo9-1951/a.nl

12 C3udity tid=: OL = & L)I. 1.?0 (195-180)/8.81

13 Eat. of L9t Percen5 hf. Ab0V8 U: 2.1 9% .%- Table B-5

%
14 Est. of Lot Percent Z)ef. below L PL .64% See Tablm B-5

15 Tataf E81. Pe.rcm13 hf. & La& p = pu + pL 2.85% 2.19% + .66%

16 Max. Nlowable Percent Da f.: 3.4 3.32% See Table B-3

17 Acceptability Criterion: Compare P . Pu + 2.85% < 3.3.2% See Para.

p~ with M 812.1.2 (7)

‘3& lot meet. the ●cceptability criterion. Ante P s Pu + PL i. 1=. s t~ M.

I ,..
43

—
m&6w14
11 Jone 1957
EXAMPLE B-4

Exampl* of cazcU2Mf0m

DOnbla Spcffiuti.=n Z.imtt

Vari&i3fty Uakm - 5tsadard Deviation Method

Different AQ3. Value. ior Upper and Luwer Specification l.imitc

Example The minimum temparamre of optra3foa for ● certiin dewice i. .pecified ● - 180- F.
The rnu5mumtempQ=a3ure ii 209” F. A lot of 40 items in subrnkted for inmpm=3ion.
f.mp=ctic.n L=v=l Iv, normal imW=CCICQI.--I* ACZL = 1% foI *= upper -d ~~ =
2.5% for tha 10uer specification limit is to be used. From Tables A-Z and 23-3 it
is ●.en that . sample of sise 5 ia required. Suppcme the measurements obtained
are aa follows: 197. , 188. , 184”. 205”, and ZOI. ; and compliuce with the acccpt -
ability criteria i. 10 be determined.

~ Information Needed Vat.. Obtain. d Explanation

1 Sample Size: n 5

z Sum of Mesmmements: ZX 975

3 Sum of Squared Meaour.m.mta: XXZ 190.435

4 Correction Factor (CF): (ZX)2/n 190.125 W75)215

5 Corrected Sum of Squares (SSh lX~CF 310 190.435-190,125

b Variance (V): SS/(n-1) 71.5 31OI4

7 Estimate of Z.ot Stam&rd Deviation s: fi 8.61 m

k Sample Me= X XXln 195 97515

9 Upp=r Specification Limit: w Z09

10 Lower Specification Limit: L ,1s0”

11 CluaIity 3ndex: Q“ . (u-X)/o 1.s9 [209 -195) /6.s1

lZ OAity index: (ZL = (X. fJ/. 1.70 (195 -180) /n.81

13 Est. of z.&4 Percenf DA ● hove U: ~ 2..19% See Table B-5

14 Eat. of f..of Percent Def. belsw k. PL .64% see Table B-S

is Total E.;. P. rcent &f. in Lot,: p . PU ● pL 2.85S 2.19% + .6W

lb Mu. Allowfahlc Pereent Def. •bov~ U: MU See Table B-3

17 Mu. Allowable Percent Def. below & ML 9.00% See T*1. B-3

la Acceptability Criteria: (s) Comp-rc PU 2.19%. 3.3.?% See Para.

Blz. z.z(7 )(a)
@) ;;;p;f pL .bf+ < 9.80% see Psra.
BIZ. Z.2(7)(bj
(c) Compare p Z.esn c 9.80% S.. Para.
Wifh ML BIZ..2.Z(7)IC)

~e lot meet. tbE ●cceptability criteria. ●be 18(s), (b); ad (c)are •ati~fied; i.-.. PU ~
pL<MLsndp<LtL.
44
 TABLE B-3 S1and*rd Devittlon Method
Minter Tsble for Norm81 and Tightened tnapcction for Plms Blsed on Variability Unknown
(Double Specification Limit and F.rm2-Single Specification Limit)

Acceptable ~ t Inorm.1 in! ●ctim

Sample cite .065 .10 .15 .2s .40 I.00 i~ 1.50
.04
code letter ~
M M M M M M ii- M

B 3 7.59
v v
c 4 1.53 5.50 10.9Z 16.45 ZZ.8b 29.45 36.90

D 5 1.31 3.3Z 5.83 9.80 14.39 ZO.19 Zb.56 33.99

; - i +
E 7 0.422 1.o6 Z.14 3.5s 5.35 8.40
‘Zzo I““l 4 ‘0$0
r 10 v v v 0.349 0.716 1.30 Z,17 3.26 4.77 1.Z9 10.54 15.11 ZO.14 Z1. S7
— —.
G 15 0.099 0.186 0.31Z 0.503 0.818 1.31 Z.11 3.0s 4.31 6.56 9.46 13.71 18.94 z5.61

H Zo 0.13s o.2zn 0.165 0.544 0,846 1.Z9 2.o5 Z.95 4.09 6,17 8.9Z 12.99 “12..03 Z4.53

I Z5 0.155 0.250 0.380 0.:51 0.017 1,29 Zoo Z,86 3.97 5.97 13.6311Z.571 17.511 ZL97

J 30 0.119 0.280 0.413 0.581 0.079 I ..?9 1.98 z,03 3.91 5.06
’47I “024
‘2’61 I “s’
K 35 0.110 0,264 0.388 0.5}5 0,847 1.23 1.87 Z,68 3.70 5.57 8.10111.871 16.651 Z2.91

L 40 0.17 9 0.275 0.401 0.566 0.873 1.z6 1.88 z.71 3.72 5.5B s.091 11.85[ 16.61 Iz2.86

M 50 0.16 3 0.Z50 0.36 3 0.503 0.789 1.17 1.71 Z.49 3.45 5.20 7.61 11.Z3 15.87 ZZ.00

N 75 0.14 7 O.zze 0.33 0 0.467 0.7.20 1.07 1.60 2,Z9 3.ZO 4.87 7.15 10.63 15.13 21.11

o I00 0.14 s O.zzo 0.31 7 0.447 0.68 9 I.oz 1.53 2..?0 3,07 4.69 6.91 [0.32 14.75 ZO.66
—
P 150 0.13 4 O.zo 3 0.Z9 3 0.41 3 0.63 8 0.949 1.43 Z.05 z.#9 4.43 6.57 9.86 14.ZO Zo.oz

Q zoo 0. ;3 5 O.zo 4 0..294 0.41 4 0.63 7 0.945 1.4Z Z.04 Z.nl 4.40 6.53 9.81 14. IZ 19.9Z

.06 5 .10 .15 “.25 .40 x I .00 1.50 Z.50 4.00 6.5o 10.00 15.00
—
AcceMabilitv Qualitv Levelt ( ;htem insrmcticml -5
-.

All AQLandtablcvsluet ●re inpercent defective.

a
 ,—

TABLE 23A
Muter Table far Reduced fnvpecclm [m Plan. Bared o Vsrlablllty thkn.awn
(Double SpecU{cation Limit -d Form 2- StttgteS !clfic atim Limit)

Acceptab = ~ 10
ample cite sample -j 7
..?5 .40 zi- 1.00 1.50
:xI* Iettsr 81;0 —
I }.( t.. , -ii- =2 M 3.4
— .— — —
I
B 3 7.59
--

c 3 7.59

D 3 1.59

E 3 7.59 18,06 26.94

t
F 4 v 1.53 S.50 10.9Z 16.45
— — —

I
G s
v
1.33 3.32
!
5.83 9.80 14.39 I 20.19 I Z6.Sb I 33.99

H 7 0.412 1.06 2,14 3.5s 5.15 8.40

A
a
1. 10 0.349 0.716 1.30 Z,17 3.26 4.71 1.Z9
—
J 10 , 0.349 0.716 1.30 “Z.17 3.z6 4.77 7.Z9

K 15 0. ( 2 0.s03 i. fllfl 1.11 Z.11 3.05 4.31 6,56 9.46 I 13.11 I 18.94 ] Z5.bl

L I Zo I 0.228 0.365 0.544 0.846 1.29 “~2.a5 1.95 4.09 6.17

4-4-4-=
— —
M. Zo 0.ZZ8 0.365 0.544 0.946 1.Z9 2.05 2.95 4.09 6.17

N Z5 O<Z50 0.380 0.551 0..977 I,zv ,?.00 2.86 3.97 5.97

o 30 0.280 0.413 0.581 0.879 1.Z9 ,1.9s 2.83 3.91 3.86

0.363 0.503 0.789 1.17 1.11 Z.49 3.45 5.20 -=l=t+t-

0,330 0.467 0.720 I .07 1.6o Z..?9 3,20 4.87 1.15 10.63 1s.13 21.11
_l-1-LK — —
All AQL and t-ble values ●re {a percent defective.
first ounpllng PIU bdow ●rrow, that is, both #unple oize a. well m M value. “When cunplo sise equa2@or exceeds lot
Jy:a, e.e~y item in tha lot mumtb. in#pecled,

I
 —
.—— _ —. _____

TABLE B-5
TSWO for Eotkmtlq th~ &t Pe, CCIIIDefective U#lnS Standard Devl.ilon M#thedl
 .- .

TABLE B-5-Conthed EZ
Thblofor E!tim.tlng the tit Percent D*(ectlve U#lng S;mdard Devlaiion MQ~hod
k!’

1
 -.
.,,

TABLE B-5-Conllm.wd

Table for Eotlmatlag tbo bt Percent Deltctive Usln@ S1-d~?d Deviation Mathod

. ,.-
. .

,.
 J

TABLE B-5-ContlnueU E
Tmblcfor Eotlmatln[tho lmt PcrcerIt D6fecllve Uc@Stmdard Deflation Method
k F

i.

I
 .—. . .—

TABLE B-5-Cadimed

Tatdo for Eattnutlq tho kt Poreant Def*ctlwe UOlag Standard Derlatien ,Mothod

a
“

E
-“
“.
ML-rm-414
11 J5fffa 1957

Pmrt m

C5TZMATZON Or PBOC= AV~E AND ~TER3A FOR

REDUCED A35D TIONTU4CD =PECTION

B13. ESITbfATfON OF PR~ AVBR- and the ~rremmondtnsedmtid 1c4 +rcud

AGE &fOcfiw ~ & p=,-respectively. iw mad
from tfm fable. Tbe ectinuted proceco ● v-
The ●verage percent defectiwa. b-cd crage ~ i* * ~ifhnwfic meaaef fbe fad3-
up. = group of let- submitted for origfnd vtdual e.ttrnmted tot perce.t defective- pu’ c.
inspection. i. cafled the proceo- ● voragc. 6tmitarly. the etiimated procem ● ● =rage
Originaf imspectimi i. the firm im*pecfiOn Of $L it tbe arithmetic mean of the individual
~ -~cb? ety of p~ ●bmttted ● ctfaut9d 30t pareemt &facUwa pL’8.
for ●cceptability a. dfotiaguf.kd from f3M
immpec;ie. of product wbfch ti. been remtb- B 13.L2 Uoubl. SpecW. UtImI Limtc. The
mifted after prior re&cftcm. 3%. pro-.. . ●timated Iof percent defecfive ● c &-
average .fuU be ..timated from flm r..uft. .termIned from Table B-5 for the pfaim ba.ed
of in. peetic.. of samples dr.wmfmrn a .pee- on the standard deviation method. The qtuf -
ified number of precedfq lot. for the pur- It, imdf... Qu d 0= sti ba e-vu-f.
~.= Of d=~=rdaiag ●.v9rity of iacp.cfian Tabfe B-5 i- enzered ●epar.tely wlfh ~ and
d.rin~ the c..r.e of . cmdr.cf in accordance QL d the -unP5e ●iae, d the eor--mpmd-
with ~rag,.ph B14.3. AD, 1- sM1 b- iu- fag ~ and PL us read f mm the t8ble. Th.
cIuded only once in ●stinuffag lb pxocem. eatitrmt.d lot percent defecfive t. p = p .+
.verqe. The ..ti_t. ef Uw prw.. ●wr- PL. The eatimuted proc. ●S a=rage p is se
=K= i. d=. i~t=d by PU -be. eompufed wifh ● rifbm.fic mea. of the individtuf c..tinuted
re. pect to an upper ●pee fficatier. lisnit, by lot ~rcenf defective- p’..
PL w.h=. c,.mpyte,d w+fh rc.pecf to ● lower
.P=c,f,.~t*- I.mtt. md by p when computed D 13.Z.3 S cfal Cam. It the qtulity index
with re. peet to a double .pecfficatio. fimit. OIJ or C3L< a negative ‘numb=.. the. Table
.-. B-5 i. entered bvdimrenardins the negative
B 1~.1 Ahn.rmA R.muft.. l%. r.. ult. of .ip. f-i---- , ‘i. tbi.- a., ‘h. c.. fi&ated
inspection ef product _ufaetured under lc.t percent de fecfive above ftm uppa r limit
. ..”diti... mot” typfcd of ..IuI p.odmeficm or below fbe lo=. Zimit i. obtafned br mzb-
.3u15 be exeluded frmn the ● .tinnted pre- tractiq the PCrcenuge found i m the” table
ce.. avera~e. from 100%.7

B 13.2 (hnputmtion of the Est5nuted %0. .BIL. NORMAL TIGHTENED, AND m-

. estimated procem- ● =r- DUCED IkBP33CTfON
atm
‘~ t. t e ● r thmetic
‘h mean of fhe .atfmafed
l~t percent defective. computed from b Thts S-*rd esti5fah*d campfiag
.amptia~ iit.p. ction *..uft. d the pxecedtms pfam for normal, tightened, and reduced
ten (10) lcIt. .M a. may be othetwf. e decig. iMpactiOn.
nated. b order to e.tirnate tbe lot percent
dal.etive, tba quality Ucea QU tiler QL
shaff be cmn~ted for ● ub lot. Tbom ~e:
C3U = (u-X)/c md QL= (X. L)/a. @em pus.
Sr*pb 3511.2.) B 14.2 -as 31WWetfon D9rtm, tba c0ur9*
Of hmcuon. Mrnuz tirncttan ●haff be

fisbtmnd er ‘r.duc8d LrJsp.cficm 1. ~ mr-

quir9d b •ccor~ wttb pr.sr.~ B 14.3
d n14.4.

B14.3 Tishtaa8d 311spectioa. TI~btarnd h.

●poetfon ●balf b- fmtitmad whn tha c cti -
matid pro- ●a .nragm wmpidmd from tfm

When Form I -Sfngl. Spectff~tfon ~ 1. rm.d for tba acmptabfflty criterion. tbe “octl -
mafe of 101percextl &feetfve pu.or pL 10 mot obta.lmed;fmordertoewtimate the proc.am ● v8r -
~s=. it i* n=c=a~=rr to complete paragrapba B6.2 uuf B6.3 of Form L
7FOraXUnP18. U ~ . -.50-0 = 1.60. us~ ●SMPZO SCM SO,PU = 100% - 30.93% = 69.071b,
P1. 9 ~-n -P* 69.07s + S.sk . 74*.

52

. ..-
 I

XIL-STD414
II 11 June 19S7

preceding ten (101 108. (Ot ..& 04h*r rlwn - b estimated lot percent defective is eqtnt
bar of lat. de. i~ted) 1. =crnrduue with to =ero for a ●pedfied number of conmeeu-
Kr=zr&pb BIXZ i- srestcr than the AQL, tiwe tot, (gee Table B-?).
-d when more than A c=rta~ number T of
them lots have e.timafes Cad6tfon c. PrOdnctiM is ●t a

I
of flx percent de-
fective sxceediq the AQL. The T vdttbs ●teady rata.
● re given in Table B-6 far the procea. .v-
erage computed from 5. 10. Or 15 Iots.e Normal impaction ●hall he r.in.tated if any
NormmI inspection shall he reinstated if the oaac of the following condition. occ. ra undc r
..tinut.d preces. ● ver-ge of lots und=r reduced inspection.
tightened i..prction is cqud to or 1..8 tkmn
the AQL.
Condition D. A lot i. rejected.
Condition E. TM emtimated prc.cem●
B 14.4 Reduced Im.pectiom. Reduced ilI- ● .eragc is greater tham tbe AQL.
.pection may be inmitumd prc.vid. d that ● ll
of the following condition- are ●atiofied: Condition F. Production become.
irreguI~r or delayed.
Condition A. The preceding ten [10)
lot. (or .uch other mmnber cd lm. de. igruted) Condition G. Qther condition. .. .
have been under nornul ia.peclio. and nom ~? ~brrmt that normal inspection .hould
has been rejected. be reinstated.

Condition B. The e ctimated percent B 14.5 Sampling P18m. 1.. Tightened Or Re-
defective for each of theme preceding lot. io duced lmpecthm. Sunplu-ig plan. ior tight-
1=.. U- the appUcable lower limit shown ene d and reduced in.pecticm .re provibd in
in Table B-7; or km =ertak .arnplirIg plan. , Section B, Part. 1 and U.

I:

I ..
 MIfA3TD-414
11 Jwm 1SS7

Cuve] t49mbar
Z.5 10.0 15.0 Of bta

4 4 5
6 :
8 9 1: ‘0 i5

4 4 4 5
1 1 10
9 10 1: 15

4 4 4 5
10
1: 1: 1; 15

4 4 4 5
10
I 1: 1! 1: 15
I .
4 4 5
.: 10
11 1: 1: 1s

4 4 4 5
a a a 10
11 11 11 15

4 4 5
: a a 10
11 11 11 15
,
4 4 4 5
8 8 10
11 11 1: 15

4 4 4 5
a e 8 10
11 11 11 15

4 4 5
8 : 8 10
..
11 11 11 15

4 4 4 4 4 5
L 6 6. 8 io
a 999910 11 1: 1: 15
/
4 44 4 4 4 5
M 6 7 8 8 a 10
9 : 11 11 11 15

4 4 4 5
s 8 8 10
11 11 11 15

4- — 4-- -4 5
“8 a a 10
I 10 I 11 11 11 15

mm ● re m 9mp31a# pluu prwuad la thio Staa&rd far Unse code lctirs dAO1.wshm9.

..-. —-
 unmlTP514
11 Jrmd 19s7

TAB= B-6<0nfif=d sUmdard D8dmnua U8fbd

vdtms of T [or TiKhtaud Impaction

Th. top figure ia ..ch ilock refers t. fbe preced~g 5 10C~. the ~ddfe fi-re ~ ‘e
preceding 10 let. and the boftom fipre to the preceding 15 let-.

Ti@encd ia.pection i. required whom tbe numb. r of lnta wltb e~tfmates of percent
defective ●bove tbm AQL from the precediq 5. 10. Or 15 Lets is srester tbmn th= xiveri wdue
of T in lhe table. ad tbe pro.en~ average from them. 10t@ .=.=.da tba AQf-.

N1 estirnatew of the tot percent defective are c.btained f rem T8ble B-5.

-.
—
—.

TABLE B-7 Slmdtrd DevIa440n M!thod I“

::
Llmlt# 01 &#tim~ttd Lut Percent Defective for Reduced Za.pection

sample tll* Acceptable Ouili!y Level.

code letter .04 .063 1 .10 I .15 I .25 .40 I .65 [ 1.0 [ 1,5 I 2,5 T5-
I
23 * ● * ● * [ZB]** [IO]** [lZ]** ( 9]**
I

.77 5
c ● ● ● ● * ● ● [45]** [II]** [22]** [15]** [IO]** [ 7]0. 15.00 10
& 15

E
●

●
●

●
●

*
*

●
●

[25]**
*

[18]**
[31]**

[14]**
[25]**

[11]..
[18]*.

.00
,10
[13]*O

.00
.88
[ 9]**

.11
z.65
.
0.00
4.40
6.S0

1.38
5.96
.74
9.96
10.00

4.24
10.00
6.06
15.00
&

9.09
15.00
5

5
10

10
15

.es 2.49 4.00 6.50 i & 15

=
? .000 .000 .000 .003 .044 .>06 1.05 tool 5.19 iO.47 5
F ● ● ● ,000 .001 .016 .101 .317 .74 1.80 3.56 6.50 10.00 15,00 10
.002 .029 .123 .369 .81 1.50 2.50 4.00 & I i 4 Is

v .000 .000 .000 .002 .011 .041 .136 .123 .84 1.64 ),s0 6,06 11.51 5
G ,000 .003. .006 .018 .057 .143 .310 ,643 1.14 2,23 3.94 6.50 I0.00 15.00 10
.003 ,010 .02s .062 .151 .315 .6.?6 1.00 1.s0 2.50 4.00 & A L 15

H
.000
.004
.013

.001
.000
.010
.029

.002
.002
.03.3
,0s0

.006
.005
,040
.10!!

.014
.017
.111
.?.1s

,037
.04.s
,2.3s
.396

.083
,121
.445
.65

.185
.266
.78s
too

.36o
.521
1.31
1.50

.653
1,14
2.40
2,50

1.33
Z.24
4.00
,&

Z.49
$
-1- 4.29
6.5o
1

4.59
7.40
10.00
A

7.74
1
12.07
15,00
A

lZ.4>
5

s
10
15

1 .009 ,020 .039 ,071 .146 .214 .509 ..963 1.39 2.48 4.00 6.50 10.00 15.00 10
,03.1 .043 .077 .133 .248 .40 .65 I .00 1.50 2,50 A 1 A & 15

,002 .005 .012 .023 .054 .113 .231 .431 .750 1.47 Z.66 4,81 1.98 lz.69 5
J ,011 .021 .050 .087 .169 .306 .550 .909 1.44 Z.50 4.00 6.50 10.00 15.00 10
.027 .0s2 .089 .146 .2s .40 .65 1.00 1.50 A A ,A h -+- A 15
-.. + 1

●Th=i* mrc no mmpliag plain provided Anth!o Standard for these code Ieltero and AOL vduei.
 .—— ,. —.- -—___—_ ,._

TABLE B-’f-ConUnued Standard DevlaIkIn M,t~d

Limlto of Cctimalcd Lx P~rcetN Delectl}e for Reduced hwpectim

Sunple OIZR Acceptable @di}y Levels Numha r

code letter .04 .065 .10 .1s .25 .40 .65 1,0 ! 1,5 2.5 4.0 6.5 10.0 15.0 of &to

.004 .008 .017 .03.? .069 .137 .210 ,483 .8.?1 1.57 2.19 4,96 8.1s 12.08 5
K .017 .033 .059 ,099 .186 .3Z.9 .577 .940 1.47 2.50 4.00 6.5b 10.00 15,00 10
.012 .058 .091 .15 .25 .40 ..65 1.00 1.50 L h a 1 & 15

.005 .011 .022 .040 .082 .157 .300 .5, ?5 .876 1.64 2.88 5.08 a.z9 13.03 5
L .020 .038 .065 .108 .199 .343 .596 .961 1.49 2.50 4.00 6,50 I 0.00 15.00 10
.035 .ObJ .10 .15 .25 ,40 .65 1.00 1.50 6 A 4 h A Is

.008 .016 .030 .05?. .102 .187 .345 ,507 .959 1.76 3.01 5.21 8.50 13.2s 5
M .025 .045 .075 .120 .215 .36{ .621 .989 1.50 2.50 4.00 6,50 10.00 1S.oo 10
.04 .065 .10 .15 .25 .40 .65 1.00 b 1 A & & & 15

.014 .026 .044 .0?2 .134 .235 .414 .6.91 1.082 1.92 3.24 S.!iz 8.01 13.60 5
N .0)1 .054 .081 .136 .2)6 .389 .65 1.00 1.50 2.50 4.00 6.50 10.00 15.00 10
.04 ,065 .10 .1s .25 .40 A A 1 k A A & & 15

.01s .032 .0s3 .085 .153 .261 .453 .733 1.[49 ,?.01 3.36 5.67 8.98 11.00 5
0 .014 .058 .091 .14J .245 .40 .65 ‘ 1.00 1.50 ,?.50 4.00 6.50 10.00 15.00 10
.04 ,065 .10 .15 .25 b A k , , , , & L 1$

.023 .039 .064 .101 .177 .296 .501 .799 1.Z31 2.13 3.52 5.87 9:22 14.07 5
P .038 .064 .10 .1$ .25 .40 .65 1.00 1.50 2.50 4.00 6.50 Io.oo 1s.00 10
.04 .065 b A 1 A A A b & A a & A 15

.025 .044 .069 .108 .1!38 .312 .525 .830 1,276 2.19 ~.59 5.96 9. N. 14.19 5
Q .04 .065 .10 .15 .25 .40 .65 I .00 1.50 2.50 4.00 6,50 10.00 15.00 10
& A & i A b A & 8 i 1 i 1 A 15

Ml AQL sad t~blo values, ●xe*pt three in the brackets, 8re in percent defectlvo.

VAf3methe flrot figura In dlraetZom o{ ●rrow and corresponding number of Iotm. fa ●ach block tha top (Igure rofcrc to the
prccedlos 5,10ts, the m5dd2* figure to tho preceding 10”lott, snd the bottom figure to the prteedlng 15 loto.
“
Reduced 6nspectlea IIWY ba Sr@itoted when wary ●ttlrmtd lot P rcsnt defcctivc!from the preccdins S, 10, or 1S leto it ~ F
bdow tha flpr* civm tn the tabl*; rcducod inspection for sampling PIMC mmk.d (**) la fho tlblc raquireo that tha ●atlmtiod
lot po?cent dcfoctlvo 10 eqttafto saro for the number of conteeulive lots Indicated In bracketo. la sddltlon, ●ll other cendltlont r?
for roduead Inspection, in Pmt 223of Section B. mutt be ostitfi.d.
s
~g
N1 ●aih’natem of the lot parcent defectIv* are Obtained from Table B-5.

,:
 sample tiaa ‘ Sample tepll leOudity L.cvelo (in ercec
code Imttr Oise .04 .0b5 .Io .15 z
— T
-. .65 I .00 1.50
—
34 3

c 4 .319 ,)53 .374 ,399 .4JZ .47Z .S28

— .
D 5 ,Z94 .108 .Jz) .346 .)73. .408 .45Z .s11

E 7 .24z ,Z53 .Zb6 .Z80 .Z9S .318 .345 ,M31 .4Z5 .489
I
F 10 .214 .2Z4 .23s .248 .Zbl .Zlb .Z98 .5Z4 .359 .403 .4b0
—
G 15 .18?. .I.521 .19s .202 .211 ,Zzz .,215 .248 .262 ,Z84 .309 .344 ,386 .442

H Zo .177 .18J .190 .197 .z06 .z16 .ZZ9 .Z42 .255 .Z17 .302 .3)6 .371 .43Z

I Z5 .114 .180 .181 .193 .203 ,Zlz .Zzs .238 .251 ,27) ,291 .331 .372 .4z6

m J 30 .173 .119 ,185 .192 .201 .Zlo ,22J .236 ..?49 .?70 .Z95 .320 .369. .4Z3
m
K J5 .170 .176 .183 .189 .198 .Z08 .Zzo .ZJZ “,245 .?bb .Z91 .323 .364 .416

L 40 .169 .Ilb .182 .IE.5 .190 .207 ‘.Z19 ,232 .245 .Z66 .290 .3Z3 .363 .416
— —.
M 50 .166 .112 .178 .184 .194 ,ZOJ .Z14 ,ZZ7 .241 ,Zbl .Z84 .317 .156 .408

N 75 ,lb2 .1613 .174 ,181 .189 .199 .Zll .ZZJ .Z35 .Z5S .Z79 .310 .348 .399

0 100 .160 .lb6 .172 .179 .la7 ,197 .208 .Z20 .Z31 .2S3 .Z7b .307 .345 .393
— —
P 150 .1s0 .Ibl ,170 .175 .185 ,191 Z06 .21b .Z30 .Z49 .z71 . 30Z .341 )81

Q 200 .151 .163 .lb8 .175 .183 .191 ;,Z03 .215 ..?Z8 .Z48 .Zb9 30Z .338 .386
L —

The MSD msy b, obtalmdby muh’iplylmg the factor F by the diNereace balwoen the uppr spaclflc~tlcm Ilmil U and lower
spee5fictiian limit L Tha formula lt MSD = F{ U-L). The MSD s+met m I gulda for the magnitud- of the ●oiimatc of let
otaad~rd deviation whtnu81a[ plmc for th* double specification Ilmh came, bm.td en the eatlmat. of 108ctandard davlatlea of
umbown v~riability. The estimua of lot otaadard deviation, if it Ic IF-o Ihm the MSD, helps 10 imure, but doe- not uuar MIee,
Ipt acceptability.
NOTE: Therm Is s corr*opondlng acccptablllty constud In Tikle 6.1 for ●achvdue of F. For reduced lnopectlen. find
tbmaccc~tabil!ty commnt of Table B-Z In Table B-1 and u,e the corresponding vahe of ~.
 Mx~14
11 Juno 10S7

APP@Du B

~efinitkons

, 5!!!!9! Red Definition

m Sample ●ix. for ● .i=~le lot.

x X bsr ~P1. M==. Arithmetic mean Of .mup3m me.surememm i~~m

● .Ixl.qlc lot.

. E.tinute cd lot ctandmrd deviation- Standard deviation of ●un -

ple measurement [mm a ●insle lot. (See &xmpIe* iaSect40n
33.)

u Upp=r ●pecffic~tiOm limit.

L Lower ●pecificalfiOn limit.
k The ●cceptability eon. tant @ven i~ Table. B- 1 and B-2.

t Qu Q ●ub U Quality index for u.. with Table B-5.

I
I QL Q ●ub L Ouality index for u.. with Treble B-5.

% p sub U Sample ● .tirnale of the lot percent defece .. above U from

! Table B- 1..

p s“b L Sampl. estimate of the 101 percent defective below L from

‘L
Table B-S.
I
P Total .ampl. e.timate of the lot percent defective P = PU + P~
I
,, M Maximum ● llowable percent defective for .-pie eatinutea
~iven in Table. B-3 and B-4.

% M sub U Mtimum allowmblc Pcrceat defective ● bove U given i. Table.

B-3 and B-4. (For uoe when differeot AOL valuea for U and
L are specified. ]

ML M sub L Maximum Alowable percexaf dcfecfive below L given in Table-

B-3 and B-4. (For we when differenl AQL vtiuea for U &
L ● re #pacified. )

P p bar Bamp3e ● intimate of the proceem percemf defectivw i.e., the

estinuted procea ● ●ve rage.

p bar sub U Tbe estimated proce. m8varage far u upper specification limit.
%

Pf, p b-r ●ub L The eslimatad procenm sv.rqe for ● 10W* r ●pacification Mmft.

T The maximum number of eattnnted prece. s sveragam wbkb

may ● xceed tb#AQL BlverI in Table B-6. (For u.e in deter-
mining ●pplication O! ti~hteaed inspection. )
1’
F A lactez ua.d in d.te rmim.i~ the ~um Standard Deviation
(hLSD). The F valu=s are given In Table B-8.
i
I > Greater than

< ham than

I .x sum of

Ml
 MZL-STD-414
11 JufM2 19s9

SEC’ITON c

VARIABILITY UNSNOW7J-3LMJGE METBOD

Part 1

sZNG LE SPECIFICATION UT

Cl. SASIPLUJG PLAN FOR SINGLE CZ.2.2 Accep-ility Comstit. The accept-
SPECIP3CATZON LDdIT ability COa.t-t k. correspo~w tithe sun-
I ple mi. e mentioned in paragraph CZ. Z. 1. is
‘This part d the SUmZ. rd describes the indicated in the column of the master t.ble
prO.y@ur=~ fOr. u*e wilh PlaM for s Si=ule corre. poading m the applicable AQL value.
rep..c1ficati0n knit whcri variability O{ cbe Table C-1 i. enmred lrom the 10P lo. nc.r -
lot with rempecl 10 the qtmlily cbarseteri. - rn.1 impection ●md from th. bottom for
tic M u.knowm and the ZWC nmtlmd i. used. tightened inspection. Sampling plans for re-
The -cceptability criteric.ti i# give= in lwo duced inspection a*e provided in Treble C-Z.
equivalent form.. Th. mc arc identified as
Fo,rm 1 d Form Z. C3. WT-BY-L&fT ACCEPTA=ITY PROZ
I CEDURES WffEN FORM 1 IS USED
C1.1 use of SUnpliag Plan.. To deter-
mine whether the. 10C meet, tbe ACCCpt- C3. 1 AccepUbiZity Criterion. The degree
ability criterion wJth respect to a particu. of coaormance of a quazmy characteristic
lar quality characteristic •~d AQL vaZue. with re8pect to ● #ingle specification :imit
the .“pplic~ble ●amplih~ PI- ● hall be treed ●haZl be judged by the quantity (u-X)/R or
in .ccordance with the provisions of Sec- {X- f.)lsi.
tion A, General Demcripciou of Sampling
pl.m.. b the... in thi. part of the Sc.ndard.
:/::1 -i: ‘iw%”%(ilwz
Cl.2 Drawing of Sarnp3e.. AN .armples sbdl depending on whether the specification Iimi!
be draw. m accordance wltb paragr@iA7.2. is = upper or ● lower lirnis. where
I
Cl.3 Determination of Sample Size Code U im the upper specification limit.
Letter. T he sample sme cod e letter •hd~ L is fhe lower specification IimIt.
=ected from Table A-2 in ● ccordance
X is the sample mean, and
with par~raph A7. 1.
~ i. the ●verage range of the #ample.

CZ SELECT3NG THE SAMPLINO PLAN 3n this Standaqd. K ia the average range of

wHEN FORM 1 ls USED ,.bKrmip ranges. 32ach d die subSro.p.
CZ.1 Master Samplin~ Tmblec. The matter consists of 5 mea*u*emenl.. except for tbOa*
●mplmfi tal plans with ●unple ●ke 3, 4, or 7 in which
C* co r DlaM b- ed on varia -
blIity u---n for ~ single ●peef.fieation u** fbe ●kgroup ● im 19 fh sum as i.h

limit wbenuakg & raag. unfkodaro Tables

sanw3e sise. Zm wanpufiq K 338= Ord=r Of
C-1 ●nd C-Z. Tabia C-1 b .u..d for nor- Ihc sample meam=rem=iits u .-de c=u*t b=
mal ● nd ti~htened inspecfi.m uuf Table C-2 rer.-iimd. Smkgrwpa af cnumcrmive nn.. -
for reduced izupoction.
urements must ba formed d the range of
.xh .ubgroup obtalwd. X is the ●weraae of
CZ.Z Obtining the SunptinS P3an. The tbe individnaZ ●bgroup nngea.
.unp3im~ plain ccmsastmO{ . .unple ● X ● -d
● m ● sociated accepIAbUiv C- taut. f The C3. 3 AeceptsbIlltY Crite Finn. compare the
.unplimg plain ia obtain.d from Maater q.mtity (u - m (X- L1
Table C-1 or C-Z. ‘Kwithtbe
●bilitv cor.8cant LOrZf (u-XI/X or (X- “C’%%
L)
equal “to or Creater than k. the lot meats tbe
CZ. Z.1 Sam le Si=e. Tbe sample size a it ●.ccptab13icy c rito rloix u (u-X)/R or
.homa ,n~ 1 e nla’ter table CC4rrm#p0~ tO (X- 2.)1X ia less tbm k or m.’afiva. tbea the
each ●mple .1== e-de Iater. lot deem not met the .c..ptability e ritoricm.

1Se. Appendix C for definitions of afl cymbolo us id b tbe ●ampllng pl~o bac.d on varIablltty
uak90wm- raaga mmbod.
%we f+ample C-1 f.r ● cmIIp3eto ●xunple of tbi. procedure.

al

._ . ..-
I
3A1L-m-414
11 June 1957

CL f3uMM~Y FOR OP3IRATION OF CO. f.CfT-BY-LOT ACCEPTABI w P%

SNAP LANG PLAN WHEN FORM 1 LS CEDU3432S WNEN FOR3A 2 3S USED
USED
c6. 1 AcceptabUity Criteric.n. The degree
Th$ following 8tepm umun.riz. the pro- of conformance of ● qutilty characteristic
cedure. fn be followed: with respeet CC.● ●imgle .pecificstimi limit
.hafl be judged by tbc p.r. mit of notlccm-
(1) Determine the ●ample .i, c cede let- fomnirt~ p.od. ct out. ide the upper er lower
ter from Table A-Z byu. iq the 101.ize and specific aticm limit. The percentage of rmn-
the in. pecti.an level. conforming product i. estimated by emtering
Table C-5 with the quality iadex and the
(2) Obtain plan from Mater Table C-1
#ample ●i*e.
or C-Z by .elecfin~ the sample ●ize n and
the acceptability ccm.taat k.
c6. ?. Computation c.f Quality Index. The
quality izidex Or, . (U- ZC)CIR hall be com -
(3) select *1 random the .;rnpl. of m
“nit. from the lot: in. pect .nd record the puted “if the sp%cificaticm limit i. an IIppcr
meamurernenx of the quality charactari. tic limit U, O= QL = (X- L)c/K if it is a lower
for ●=ch uait of the sample. limit L. Tbe q“amitie., X ● nd R, ● re the
sample mean and ●verage ran~e of tbe samp-
(4) Compute the .;rnple mean X and the le, respectively. The compmatioa of K i.
●vera~e range of the .arnple ~, .md ● l.o ●xplairted in paragraph C3.2. The facbar c
compute the quantity (u- X)IR for am upper is provided in Master Tabl=s C- 3 an& C-4
●pe. ificatiomlirnit V or thequamtity (X- L)/R corresponding to the .unple size code letter.
for . lower specification limit L.
C6.3 fhtimate of Percent Defective in bt.
(5) ff th= quantity(u-X)/R c.r (X. L)/R The quditv of a 1.s1 hall be expre.. ed by
i. equal to or greater thas k, the lot meet. PU. the =.timated percent de fe~tive in the
the ●cceptability criteriow if (u. X)/11 or lot ● bov= the upper specification limit, or
(X- L)llf i. I.*9 than k or negative, then the by PL. the ● .ti-@d p.r. =ntd=fectiv= belo-
lot doe. not meet the ●cceptability criterion. thc lower ●pccificatiort lirnii. The ●.tima~ed
Percent de f=cti~. PU O, PL i. mbt~im=d by
C5. SELECTING THE SAMPLING PLAN .mteri+j Table C-5 with Qu or QL .nd the
WHEN FOR64 2 3S USED ●pp. Opri~t= ●AMPlt ●i*e.
C5.1 Ma#ler Samplinj? Table.. The ma. ter C6.4 Acceptability Criterion. Compare the
●amplmx table. for plana ba. ed o= varisbil - e.timated 1m percent defective PU or pL with
ity unka&n for a single specification litit the m~imutn aZlew.hle perceM defective
when u.iq the rang. method ar= Taidec C- 3 M. U .pU or pL is equml to or le.. Uun M.
● nd C-4 of Part IL Table C-3 is used for the lot meet. the’ ●cceptmbitity criterion, if
nc.n’nal and tightened inspection ●nd Table pu or pL is grekter than M or U QU Or QL
C-4 for reduced inmpectimi. i~ negative. then the lot does not meet the
acceptability criterion.
C5. Z Obtaininz the Sampltng Pllrl. Th ●
sampling ptan con. i.t~ of m .UIWI]e .ize and Cl. SUMMARY OF OPERATTON OF SAM-
an aooo~ik.d maximum a310w&le percent PLING PLAN WHEN FOR3d 2 IS USED
def ●ctive . The ●amplfq ptam ic obtdncd
from Ma.t=r Table C-3 or c-4. Tha fellowinK ,tep~ ●un’unar 3s9 the
ptwedures to be fallowed:

(1) Demwime ihe -ample .ise code lel -

ter from Table A-S ~u~inn the lot dae and
C5. Z.Z Maxd8mtm AIIc.wable Pereent Defec- the iriapecttosi Iov@l.
tive. The madrnwn allowable percemt de-
=ive M for s-pie eotim.tes corres~nd- (Z) Obtmi. plan from t.mater Iable C-3
ing 10 tbe sample ●iz= me~tie tied in or C-4 by .electirg the -ample sk= n. the
paragraph C5.Z.1 i. indicated tn tbe COIUMII factor c, and tbe maximum ●llowable pw. -
Of the rnmms.r tabte correa pending to the ceat defective M.
applicable AfZL value. Table C-3 ii entered
from lb. top f-r ~orrnal iaapectian mad from (3) Select ●t random the sample of n
the botfom for ti~htened in. pecticm. Sun- unit. {ram the 10C inopect and record the
P~ Plaru for reduced inspecticm are pr.a - meamm.mem al the quazity characteristic
vided in Table C-4. on each nut; of the 8sMple.

3See 3cxAmple c-z tar a complete example of thim pru..dur..

62
 MI L-sin-414
11 June 1057 I

(4) timpute the ●unple me-m X 4 the (7) Uthe ● .timaled lot pcrcentdelective
av.ra~c raaSe of the ●ample K. PU or PL i. eqtml to or Ie*. thaa the md-
mum azlowable percent defective M. 3he lot
(5) Comp@= the q.=lity “ index QU =
meets the acceptability criterion; it PU or
(U-X)c/K M the upper speckfieation limit U pL img.eater than M or U Ou or O’i.%=_~
iripecified, or QL = (X- L)CIK i3 the lower -i”.. them the lot doe. W1 meet the ● ccept-
.pccificatirm limit L ia .pecif ied.
●biliw criterion.
161Decermirie
.-, ——— the ● .limaled 10s m.rc.r..
defective PU or pi. from Table C- 5.-

~PLJl c-1

Example of Ca3culati0n*

Single Specification Limit-Form 1

Variability Unknown - Range Method

EXarnple The lower .pecifie.tion limit for electrical r.miataace of ● certtim ●lectricti com-
ponent is 620 ohm.. A lot of 100 item. is submitted for inspection. Inspection
Level IV, normal inspection, tith AOL = .4% i. to be used. From Tablet A-2 ud
C- 1 it i. ..en that a sample of size 10 i. required. Suppose that value. of the’
sample resistances in the order reading from left to right ● re . . follow-:
643. 651, 619, 627. 650, (R, = 658 - 619 = 39)
67o, 673, 641, 538, 650, (Rz = 673 - 638 = 15)
and compliance with the ●ccept ability criterion i. to be determined.

. Line
— 3nf. rrn.ti.. Needed Value Obtained EXP1anatiom

1 Sample Site: n 10

.? Sum 01 Measurements: I X 647o

3 Sample Mean X: XXI. 647 6470/10

4 37 (39+35)/2

5 Speckfieatio. Limit (LOwer~ L 620

6 The qu~tl~ (X- L)/It .7s0 (647-620)/37

7 Accep3AZZity Camsmt: k .811 &- Tabla’ C-1

8 Acceptability Criterion Compmm (X- L)/l! .710< .811 ● &e ParaLc3.3

with k

The lot doe. not meet tbe ●cceptability criterion. .irIce (X- k.)f~ is 1c99 than k.

= U ● .imK1e .PP=r .Pecificati.. limit U im give., then compute tb. quantity (u-Xl/X kn
line 6 ● ad cmmpar= it with k the lot meet. the acceptabUitY criteriom, if (U- rnf~ i-
equal 10 Or greater [ham k.

.-—
MIL-ST13-414
11 June 1957

EXAMPLS c-2

12xample 01 Calculation.

Single Specification Limit-Form Z

Variability U.knowmi - Rang. Method

Ex. mple A lo.ver specification limit for electrical re. i.tan.e of ● certain electrical com-
ponent i. 620 duns. A 10I of 100 item. i. submitl.d for inspection. Zaspection
Level lV. normal in. Dection. wish AQL - .4% i. m be used. From Table. A-2 mad
C- 1 is is seen thal ; sunple of ●izc 10 i. required. Suppo. e lh. v*Iu=. Of the
sample reaiatance. in the order readimg from left m. right are as follows:
643. 651, 619. 627. 6S8. (R, = 658 - 619 = 39)
670. 673. 641. 638, 650. (R2 = 673 - 638 = 35)
●nd compliance with the acceptability criterioo i. 10 be determined.

Line Inlorrnati.n Needed Value Obtained

—
I Sample Size: m 10

z Sum of Measurememtm: IX 6470

3 sample M,.. x: ZXJ. 647 6470110

4 Average Range ~: XRlne. of subgroup. 37 (39.3S)12

5 Factor c 2.405 See Table C-?

6 Sp=. ific*tiO. Limit (~we. ): L 620

7 Q.a2ity Zndex C3L = IX- L)CIX 1.76 (647-620)2.405/37

8 2.54S See Table C-5

‘ct. ‘f bt ‘ercent “f.’ PL
9 Max. Allowable PerceIIt De f.: M 1.14% See Table C-3

10 Acceptability Criterion: Compare pL with M 2.54%> 1.14% See Para. C6.4

The jot doe. mat meet the acceptability criterion. ■ince pL is gr=ate. than M.

-E: U . .ingl. upper specification limit u i. Rive., th=. compute the quaii3y frufax QU ~
fU-X)c/3! in line 7 d obtain the eotimate of lot percent defe.tive PU. -mpr= PU
with M: the let meet. the ●cceptability criterion, U p“ ia ●qu~ io or i’z*. ~hn M.

M
 . .. ——. _.

TABLE C-1 RmIrn Method

Master Ttble far Normat and Tightened Zn$ptctlon for Plans Based an V~riabIllty unknown
(Single Specification Llmlt - rarm I I

ml in pectiml 1
sample t 1se -
K 2.50 15,00
code letter
k Y- T
-
B .587 . 50?, .401 .296 .178
v
c .s’38 .!325 .450 .364 .Z?b .116
— — —
D .565 .498 .431 .)52 ,2?2 .184

E .SZ5 .465 .405 .336 .266 .189

F .65o .519 .307 .424 .~41 ..?5?.

G .684 .610 .516 .452 .360 .216

H .7,?3 .647 .371 .484 .398 .105

1 .730 .654 .577 .490 .403 ,310

— — —
J ,734 .658 .581 .494 .406 .~lj

K .746 .668 .591 .s03 .s15 .321

L .754 .616 .598 .510 .421 .327

— — —
M .1b8 .689 +.610 .!21 .43Z .336

24 .780 .701 ,621 .530 .441 .34s

0’ .791 .111 ,631 ,539 .449 .3SB

— — —
P .807 .7z6 .644 .552 .460 x
--1--
Q 230 1.21 1,21 1,16 1.)2 1,,06 .996 .932 .87o .309 .728 .646 .5s3 .46z .364
I I — — —
.063 .15 .25 ,40 .65 1.00 1.50 2.90 4.00 +6.50 10,0[ 15.00
I .10 I I #2
Accepmble Oualify Levels (tlgl med Impec m)
[ — 4
AU AC2Lv~ueo ●re in gercent defeciivo. i$!
,“:: tir,t &amplln$ plan below ●rrew, that {s, both sample -lie S* well as k value. When sunplt #its equa.loor ●xceed@ let
a ●, 9wory Item 2a tha lot mnmtbn ln#pected.
4s
‘i
 -— .—

TABLE C-2 Raa[e Mtthod

:6
Mantar Table for Reduced Tnnpeclion for Plan~ Based on VariabLllty Unknown
(Siogle SpeciflcalIon Llmi!-Form i}

:ept&l
Sample iiaa Sarnpls J
.15 1.50 2.50 4.00 6,S0 10.00
code latter ●{SC
-i- 7 k k k k k
.
I EEE
B 3 .581 ,502 ,401 .196 .178
*
c 3 .296 .178

D 3 * ,296 ,178
--1--E 1 .296 .178

; 4 .216 .176

G 5 .663 .614 .565 .498 I .43, 1,.3s2 .27?. .184

33 7 .61J .569 .s2s .266 .189

1 10 I .861 .8[[ .75s ,703 .650 .141. .252

—
J 10 .916 ..963 .811 ,7s5 .703 ,650 .579 I ,50? I .424 .341 .2s2

K 15 9 .958 .90J .850 .192 .738 .684 ,610 5J6 ,452 .360 .276

L. 25 1.10 1.0s
T 1.01 .951 .896
—
.B35 .179
—
.723 ,647 .s71 .404 .398 .30$

M 23 1.10 1.05 ;.01 .951 .896 .815 .179 .723 .647 ,s11 .484 .398 .10s

.904
+
N JO 1.10

1.11
1.o6

1,07
1.02

I ,0.?
,959

.964
.
.900
.E43

.E4e
.707

.791
—
.130

.734
—
-u--
.654

,658
.371

.5s1
.490

.494
.40~

.406
.Jlo

.JIJ

P 60 1.16 1.11 1.06 1.00 .94.9 .E85 .826 .768 .6.99 .610 .521 .4J2 . JJ6

Q 8s 1.17 I.IJ 1.08 I.oz ,962 .899 .8J9 .7E0 .701 .621 .5)0 .441 ,34s
— —
I E M
i
 xf~14
11 Jfffw 19s?

Parf 1I

DOUBLE SPECIFKATION Lf3d3T

C8. SAAfPLDfG PLAN POR DOUBLE mmtimum ● llowable ~rcemt defectively ML

SPECIFICATION LtMIT for the lower Iindt. ad by MU for the upper
limit. If ~ AOL i8 88sinmd to bofh limits
This part Of the Sf-rd describes the c.mbiaed. designate tbc -urn aflo.able
procedures for tue with plain [or ● double percemtdelecfiveby M. Table C-3 is entered
cpecificafioa Iimft when variabttify Of the tram fhe cop for aornul inspection and from
let with respect to tbe quality characteristic tbe bottma for tAIhtamd inspection. Sam-
ia u.knc. wm ● nd the range method is umed. plim8 P1W9 Sor
— . . roduce!ttmpaction ● re pr. -
vialed iii Table G-4.
-------1 u.. a{
cA. S-.11..
-. —— ..- .. —”.Plan.. Tc, determine
.—— .—-—
~hethe r the 8.x meet. tbc .C eept.bility c ri- C1O. DRAW7NG OF SAMPLES
te rion *ith rcapeet to a partiastar quality
char.eteristic .~d AQL. vtiue(. ), the .ppli - sample. .fmfl be ● lected in ● ccord -
cabl. ●ampliag F.lao ● U be used in accord- aace with ~raarapb A7. Z.
atxe with the pre. i.imm of Section A, Gen-
eral De.eription d SunplinS PIMa, ● wJ C1l. ;~~OT-~;~O T ACCEPTAB1_
the. e in thi. part of the Staadard.

C9. SE LECITNG THE SAMPLING PLAN Cl 1.1 Acceptability Criterion. The degree
of c.nfo~aracteristi.
A ●unplhg plaa for ● ach AQI. .tiue with re. peel to . doub_fe .~cific. tion limit
.N1 be .clectcd from Table C- 3 or C-4 ● m hall be Judg.d by tbc percent ei wnco. -
10 UOU.. , .. ...- . ... . . . -.. ICr.rni.g producL The per.enta~e of no.-
Cwderming product is estimated by entering
C9. 1 Determination of Sunple Size Code Table C-5 with the quafity imd=x ● nd the
~. Th ● .unple .s. code letter =hfi ‘ample :Ue.
b. ● elected from Table A-Z in accord-ee
with paragra~ A7.1. Cf 1.2 timputatioa of Ouality bdicei. The
qualify inchcea Q {u .Cxl [R and QL=
C9. Z hta-tor SamIIlimX Tabla-. The master (X- L)c/R cbdl be !o&uted. -here
munnlinn tablem [or mlam hmed On variabil -
ity ~fca~wu for a d~ble specification limit u im the upper specification limit,
wbeo uming the range rn.tbod ● re Tablea C-3 L ia the lower .peeificalion limit,
● nd C-4. Tsble C-3 is used for norrnaf and c is ● iacfor provided in Tables C-3 and
tightened im.pectiom and Table C-4 for ra - C-4,
duced Lrup.ccfion. x i. fbe ●mple mean, and
u i- the ●verage range of the sample.
C9. 3 Obtaintng Sampling Plan. A ●sM@in4
plm Comai,ts of ● ●ampfe sise - the sl - b tbh Standard. R is the >verage rmge of
●octatad maximum attowablo percent dafac - tba ●bsroup rauKc& ~cb of tie sti#*0Up9
tiw-e(. ). The cunplin3 plan to be ●pplied in consimt. of 5 meuurement$. ex’c=pt for those
kn#pect&a stmfl be ~btied from Maater pduu dtb ●rnple ●is. 3, 4, or 7 in which
Table c-3 or c-4. case flu ●ubaro.p ●is. h th= ● ame ● e the
s-pfa ● ~e. 3a computing R, the Order Of
C9.3. I Sun 10 Si=e. The ●antple sise m Is fbe .unple meamtrernemm ● s nude mat be
.bownbiitdl,.. .Orr..pmdiag to ratahad. subgroup of co-ecutive meu -
each ●unple ●ice code letfer. urementi mnot be formed and tbe range of
etch ●ubgreup obtahed. K ia the ● -erase
C9. 3.2 Maximum Allowable Percent DeIe c - of the individud ●ubgroup ranges.
five. The maximum-t allowable PC rcrnnt de-
~tive for cunple e.tirnatec of percent Cf 1.3 Percent Defective In the Lint. The
def ● etiv. for the lower, qpsr, or botb ● p.c - qualify of ● lot ●hall be exprew~ed SrImrm-
of the lot ~rc.nt dof=cfi.=. Its •c~~** W~
be dosipawed bY P L, PUO 0? P. The ● gtiwta
PU iadic*eD contmrmca ~tb respect to tbe
UPPG r spockfieatien Mnait. p with resp.ef to
the lower .peckfi.atim lAU. - P fOr
b o t h spaekfieation limlta combined. TIM

67

.
 —

=.cirnatc. p.Laad pU ● baJl be determined by CIZ. Z.1 A.c=ptabitity Critdria. 5 timp8re

entering Table C-5. r.mpacti..l~ ‘iJb Qt. the estimated lot Per.cenc de fcctive~ Pt. ~
● nd Qu ● nd the ●ampl* ● i=.. The =~tim~te P with the corresponding maximum aTiow-
p shall he dew rmined by ●ddin~ the co rres - 8e Ie percent defective M ● nd Mu ● lso
pcmdimg estimated percent defective. PL compar. p . pL + Pu with tk e larcer Of ML
amd PU found iii the table. ● nd Mu. 2f pL ia equal to or 1=6s ~h~ Mb
PU is equal to or lees than b4u. d P is
C12. ACCEPTAB1~ CRZTER20N AND equal to or 1=0s than the larger of btL ~
SUMMARY FOR 0PE2tAlTUN OF Mu. Ihc lot meet8 the *cceplability c ritcri=,
SAMPLING PLANS otheruase.7be lot does not meet the scce Pl -
ability criteria. 33 ● ither QL or OU or both
Cl 2.1 O!ie AQt- value for both Upper ● nd
● re negative, then the lot does not meet the
b-e r + Cit,catmm Limit Cmnbmed. aeceptabitity c riteri&
Cl 2.1.1 Acceptability Criterion. 4 Compare
Cl 2.2.2 “Summary far O~~atic.n -f ~mPliWf
che eetimamd lot percent delectlve P . p“ +
PJan. & ~.ses m.h.re ● cliffere.t AQL value
PL -ilh the maximum ● l10-abl* Prc=nt ~tmblished (or the upper ●nd k.wcr .Pec -
dcfcc:ive M. U p is equal to or less than M.
ificatio” limit fc.r a sim~ie quality character-
$h. lot meets the ●cceptability criterion, if
istic, the fol Jmnimg steps ●m-.mari=e the
P i. e,e*t=, th*n MOr if either QU ‘r ‘Lor procedures to be used:
both .re negative, Ihenthe Jot does not meet
the ●cceptability criterion. (1 I Dcternai~e the sample ai.e &d.
letter from Table A-2 by using the lot ● i=c
C12.1.2 Summary for Operation of Sampliag and inspection Jewel.
Plain In came. where ● .ingle AQL value 1.
=blished forth. um~er and lower s~ecifi - (2) Select the sampJitig plan from
C~t;ori limit cornbin;~ for a ●i=gle quality Master Table C-3 or C-4. Oblain the amp-
.haracleristic. the following steps summa- le size K.. the factor c. -d the m~mum
=i.. lh. procedure. to be used: ● llowabJe percent defective. MU and ML.
. corre. pondi=g to AOL VaIUeS fo, the uPP=r
ll)”Dctcrminc the sample si. ecode ● nd lower Specific atiec. limit., respectively.
letter from T.ble A-2 by using ‘the Jot sic
and the in, pe. tie. level. (3) Select ● t random lhe ●ample of
a utit.from the 10C inspect and record the
(2} Select plan from Maater Table measurement or the quality characteristic
C-3 or C-4. Obtain the sample ttie n. th= on each unil in the .UTIPIC.
factor c, and the maximum mfloumble per-
cent defective M. {4) Ckmpute the ●ample mea. X ● .d
●.er.~e rams-k of tbe ●unpJe R.
13) Select m random, the ●ample of
n unit. from the lot; respect and record tbe (5) Compute the qualiJy imdicec QfJ
mea. urem.. t of the quality characteristic . (u- X)c/R. and OL =(X-L)CfU.
or. ● .ch unit of the sample. (6) Determine the ● .timm~ed lot
percent defective. pU amd pL. corresponding
(4) Compute the sample mean X ● nd
average rmge of tbe ●ample R. to the p.r. em defective. above the upper
and below the lower specificticw limitt.
IS) -mpt tbe quality indite. OU AJSO determine lbe combined percent detec-
. IU. X)c/K arid QL, F= (X. L)C/R. tiV= p - ~ + pL.
(6) Determim the emtimtiad lot (7) 32atl three of the lollowlris cos-
y-fi=nt d= f=ctiv= P * PU + pL frOm T~bl= dbt~ons:
(a) PU is =q-~ tO Or lEM tbu
~u.
(7) 2f the eotinuted lot percent de- (b) P,. ia aqtml co or I=*w th*m
fective pi. equal to erlem. thui the maximum
d20wable percent defective M. fbe 10Jmeets ML-
{c) p is equal toor Jesmtin the
the acceptability criterion, if p ia graatar l.rger of ML and Mu.
lIIM M or U either Ou or QL Or both am
negative, then the lot doe. awt meet tbe ac- ● re ●aticfied. fh lot m.mtm tbe accepfAbi21ty
ceptability trite rion. criteria; otherdse the lot hew not meet the
scc=ptability criteria. If either Oz., or QU or
C#w.~r Different AOL va.luet for Upper a~d both ● re =gative. fba. *h. lot dw* tit UI**C
p8cuLcmU0m LamIL. the acceptability criteria.

4tie ~pk C-3 for . campl,ete ●xample d tbi. proc.dure.

SW *PI= c.4 for . =om**t* exunpZe of Ma PrO=~ur*.

-. -—.. . .
 MIL-STD4M
llJunelDS7

EXAUPIX C-3

Example of Calculations

Double Specification Ltrnit

Variability Unknown - Aver age Rsnge Method

One AQL Value for Both Upper and Lower Specification. Limit Combined

The ●peclficstioni [or elec:riea2 recisfaace -f a certaiu electrical cOrnponeu5 *

65o.o ● 30 ohm.. A lot of 100 item. is ●ibmitt.d for In*petiiar& fmspecfi.. Uwe2
IV, normal intpectiea, wftb AOL . .4% ii to be used. From Tuble. A-2 and C-3 it
is ● eer. that ● samfle of size 10 1. required. Suppose the vafuea of the ●mnp2e
resistance in the order reading frm-n left to ri~ht are ● s follows:
643, 651, 619, 627, 65B. (Rl . 658 - 619. = 39)
67o. 673. 64). 630, 65o. (R2 s 673 - 638 c 35)

and compliance with the acceptability criterion i. m be determined.

*. Znf.armatiom Ne.ded V .lu. Obtti~md Zcxpla.atien

1 Sunpl. Sise: . 10

2 sum of Mea. u,. m.clt.: xx 6470

3 .%mpl. U... X: XXI. 647 6470/10

4 37 (39 + 35)/2

5 .?.405 See Table C-3

6 680

7 fawer Specification Ltmit: L 620

8 Ctudity Index Cfu . (U-X) c/R 2.15 (680 -64Y)z.405/37

9 Ouality Zndex: C3L = IX- L)e/11 1.76 (647-620)2.405/37

10 .35s See Table C-5

~-t. of Lut p--t D=f. ● b- u: w
11 Est. of 3A Percent Def. baleu L pL ..2.54% see Tsble C-5

I 12 Tota2 Est. Parcant Def. h fak P = Pu + PL : 2.89% .s5s + 2.54s

13 Max. A210wable Percent Def.: M 1.14% SOe Table C-S

14 Acceptab12ify Crtterloa: Carnpare p - 2.e98 >1.14s See P*ra.

Pff + PL titb 64 CIZ.1.Z(7)

Tbe lot dtm. nut meet tbe ●cceptabifify crilerlOn. since p = p“ + pL 1~ greater ~ M.

de

—
 xm.-sTD-4l4
11 Jute 1957
I EXAMPLE c+

~ph of Cakuhuom
I
Doub3e Specfficatlom LimI1

I V.riab33ity Unknown - ~we ra~e Range Method

Different AQL Values for Upper and Lwer Specification Limit-

I ZZ.unple The ●pecifi.aticm. f.r electrical reaiscance of ● certain electrical cmnpone~t i-

650.0 ● 30 darns. A J*1 of 100 items im ● ubmitted for inspection Zn.pectimi 3AV.1
IV, rmrmmz impecziou, vifb AQ3. . 2.5$ far the upper and AQL E 1% far tbc lower
specification limit i. Ie be used. From Tablet A-z and C-3 it i. ● ce= that ● .am -
P1. of size 10 is reauired. SuPrmse the values of the sample resistances in the
irder reading fmm left to right “a-re a. follows:
643. 651. 619, 627, 658. (R, = 6S8 - 619 = 39)
670, 673, 641, 638. 650, (Rz = 673 - 638 = 35)
and compliance with the ●cceptability c*iteria i. co be determined.

Intc.rrnation Needed Value Obtained

Sample Six.: n 10

Sum of Me.. urcment.: 1X 647o

3 .%rnplc Mean X: IXf. 647 6470/10

4 Average Z4.nge ~: X3tlno. of .ubgroups 37 (39 + 351/2

5 Factor c 2.405 See Table C-3

6 Wp=r specificatio~ Limit: U 680

7 kwer Specification Limit: L 620

I 8

9
0ua2ity index

OuaIity fndex:
Qu = (u-X)

QL = fX-L).
c/R

/R
Z.15

1.76
(680-647)2.405137

(647-620)2.405137

10 ~s~. Of ~t Perce=: Dcf. =bOv= u: FU .35% See Table C-5

11 ~.t. ‘=f kt p=c.mt D=f. belOw fA PL 2.s4% See Table C-5

lZ Tad Ems. Per.emt Del. in tit: p = PU + PL 2.89% .3s% + 2.54%

I
13 MAX. A130wab1= Percent Def. ● bove U: Mu 1.42s S.. Table C- 3

14 - A330wabla Percent Def. below 3A M’ 3.23% See Table C-3

I 15 Acceptability Criteria: (a) CDmpmre PU .3s% <7.42% See Pars.

with Mu clz.z.z(7)(d
(b) Compare PL 2.54s . 3.Z3U See Para.
with ML C12.Z. Z(7)lb)
(c) ~t~p~ue p 2.898 <7.42s See Pars.
CIZ.Z.Z(7)(C)

The 10t rtmetm ttm ●cceptability criter&, slats 15(-). (b) and (cJ ● re satisfied; i.e.. PU <
MfJ. pL<M~uldp <Mu.

. . ,______
 ———— . .. —_. —

Rtrme Mcihc.d
TABLE C-3
Mamer Tbbl. fer Nermal .nd Tlthtencd fnsmctionf.r Plan. B.nedmv..i.hlltt.. lIA.,w.
(Double Speclficatlon ~lmlt ●ndf;r Form Z-Single ~peciflc”~fion Limit; ‘“””’---”

4cceptable C mlity Levels (normal in#pectlon]

Sumplc *IS* Ssmple
.04 .06S .10 m- .25 .40 .65 1.00 1.50 Z.50 4.00 1 ZE-1 10.00 1s.00
cede Icller *11* fa:to?
MMM T M M MM M M M M M
B 3— G .7.59 lfI.86 Z6.94 31.6q 40,47
~vv
c 4 z.a34 t.sl 5.50 10.91 \b.45 ‘ 22.S6 29.43 3b,90

D 5 2.474 1.42 ‘3.44 5.93 9.90 14.47 ZO.Z7 26.S9 33.95

E 7 2.8)0
B v
.28 .89 I .9q 3.46 5.JZ 8.47 12,]s 11,s4 2).s0 30.66

r 10 2.405 .ZJ .58 1.14 Z.05 3.Z3 4.77 7.42 10.79 I 5.4q 21.06 2?.90
—
G 15 LJ79 .061
iiir!t .136 .2s3
I
.430 .786 1.]0 Z.lo 3.11 4.44 6.76 9.76 14.09
TI
19.36’ 2%92

34 2s Z.358 .125 .214 ,>36 .5o6 .827 1.27 (.95 Z,8Z 3.96 5.98 8.65 12. s9 17.40 23,79
4
w
1 30 2.353
It
.147 .240 .366 .53? .856 1.z9 1.q6 ,?.81 3.q2 5.88 s. 50 12.36 17.19 23.41

J 35 2.349 .lbS .261 .391 .564 .883 1.31 1.98 2.82 3.90 5.85 8,42 12,24 17.03 z3. zi
-tt-
m 4b 2.346 .)60 .232 .375 .539 .842 1.Z5 1,B8 2.69 3.73 5.61 0.11 11,04 16.55 22.38

L 50 2.342 .169 .Zbl .)81 .s42 .818 1.25 1,60 Z.b3 3.64 S.47 7.91 12.57 16.20
+- ?.2.26
—
M 60 2.339 .13S .244 .356 .504 .1.51 1.16 1.74 2.41 3.44 5,17 1.s4 11.10 I $.64 ,?1.63
++-
N 85 2.335 .1561.Z4Z I .350 .493 .755 I.lz 1.61 2.37 3.30 4.q7 1.17 10,73 15.11 21.0$

0’ 115 2.333 .133 .230 .313 .468 .718 1.06 1.58 Z.zs 3.14 4.76 6,99 10.37 t4.14 20.31
—
P 113 2.111 .z3q .210 .303 .4Z7 .65S .972 1.46 1.0s 2.93 4.47 6.60 9.89 14.i5 19.88
-t-t I
0. 230 z,j30 .43Z .661 .q76 1.471 2.0.5 lz.q2 4.461 6.511 9.!34 I4.1O 19.02
—
.23 .40 .65 1$.00
— -!Asl.& 4OOI6JOI1OJO
parcant dafactlve.
,ceeptable (3 dlty Levelo (N:htemd Inspection)
-L
 Ran[a Method ~
TABLE C-4 -!5
Maamr Table #or Redueed Zmpecticmfor Plan, Baoedon VSrlabillty Umkmwn ~$
(Doubl* Speclficalion kltand Form ?-Single SptcUicttion LlmII]

Acmptablo OuaZ{t IAVCI1

Smnpl* 81SC Samp10
I .065 .10 .15I ..?5 I ,40 I .65 I 1.50 2.$0 in- 10.00
cede letter ● IX* L
MM M[hI’l MIM M MM M -ii-
I *
1.910 1.99 18.06 26.94 33.69 40.47
1, 1.?10 7.59 18.86 26.94 33.69 40.47

1.910 7.59 18.86 Z6.94 33.69 40.47

1.910 1!59 1.s.86 26.94 3J069 40.47

2.234 1.53 10.92 16.’5 2Z.8b 29,45 36,90

i -
G 5 Z.474 1.42 3.44 !.93 9.90 14.47 20.Z7 G- 33.95

: H 7 2..530 , Z8 1.99 3.46 5.3Z 8.47 If?.Js 17.S4 Z3.SO. JO.66

I 10 2.4o5 .58 l,i’ 2.05 1.23 4.77 7.42 10.79 15.49 z1.06 21.90
—
J 10” Z.405 .21 .58 1.14 Z.05 ).Z3 4.77 7,42 10.79 G G Z7.90

4 K

L“ZS
15 z. 379

Z,MB .214
v
.253

.336
.430

.506
I.1!
.786

.S27
I,JO

l.z7
Z.10

1.95
3.11

Z.8Z
4.44

3.96
6.76

S.9.3
9.16

8.65
14.09

IZ. S9
19,30

17.48
Z5.9Z

Z3.T9

M 25 2.358 ,214 .136 .506 .827 1.21 1.95 2.82 3.96 5.98 8.65 IZ.S9 17.48 Z3,79

N I 30 Z.353 .240 .366 .537 ,S56 1,29 1.96 2.81 3.92 5.88 8.50 12.36 17.19 2>,42
-1-- z.349
$
Z.339
.261

.144
,391

.356
.564

.504
.883

.75.1
1.33

1.16
1.98

1.74
2,82

2.47
3.90
—
3.44
5.85

S.17
8.42

7.54
la.z4

11.10
17.03

15.64
Z3,ZI

21.63

Q 05 Z.J3S .242 .350 .493 ;755 l.l Z 1.67 2.37 3.30 4.97 1.Z7 10.13 15.17 21.05
I
ML bad table waluec tra in pcrcmt d. f.ctlve.
%deZ3rdt #ampNnszdmb.kw’.rrtmr,
$ II that,,, betb ccmple,l.ea~
&
weNa* MvsJu*. ‘ WI..SamPle S1S. OqU~C or ,xc.,do 10,
 ... .. —.— — —-. —

TABLE C-5
Tabh for EcUmatInI lha Lot Percent Defective USIIIg Rans* Methedl

L-... . ..-

I
 TABLE C-5-ConUINed
Ttbh for E#timatln# tba Let Percent Defective Ualng Rune Method

. ,. “

.“ .- ...
. ,.. . .
., ,.” ,..
.. .“ . .

. . ,.” .“
;,. . .
.. t.. ,-
.. .“ ,,*
.. ,,. ,,.
I.. ,.. ,.”

,- ,.a ml
9..,= ,-
*“ ,.. ,,.
. 6.. 0,”

. . . . ,-

. . . .. . ..

4.. .“ ,,.

. . .,” ,..

.. . “
. . ...
“ ,.- **
.“ ,.9 .s
4.. ,.. .*
i . t.” ..”

a * ..
).. ,.* ..
i ,A ,a ,,.
l.. ,.” ,..
,.. ,.0 ,,..
1.. ,.” ,,.

. ,.94 *..

. .
*..I
,,. ,.n *.S
“ ,. .
. ,.= D..
s.. ,.” .
,. ,- !..
,.” A. 9-
,s ,.. -
,. m “

1
I
 .

TABLE C-5-ConUnursl
Tabh for Estimating tbo Let Par.ml t3ef@c11veUcla: Ilmte Method

I
 — ‘-- —-

TABLE C-5-Continued
:!
Table fer Eotlmatlng the l-al Percrn! Defective Uolnc Range Method

I
 _—

TABLE C-5-Contlaued
..
T*Mo for Estimatlq ttm Lot Percm! Defective U#inS Raa[t Method
.\.
.

. . ..
 ESTIMATION OF PROCUS AV~GfZ AND CRfTERfA f=OR
R=UCED AN(3 T1Gf4TENE0 3NSPECTION

C 13. fig~MATION OF PROCESS AVER- corresponding e.limated lot prcent dcf. c-

Uve p or p . rempecfivel~, is red from
the ta~)e. Tk ..tirnated proce.. .ver.~e
Tbe .verag. percent defective, based % i~ the -it f-=*ic M-= Of the individu~
~POa ● group of lot. .ubmttted for c.ri~iii.l -.titn.ted lot percent d. fectiva. pu’s. Sim -
In. pectmn. i. called [be prc.ce. a ● verase. itarly. tbe estimti.d proces8 ●.=r8ge PL
OrigiM1 im. pectiert imthe fir.t inspection of i. fbe srifhmetic mean of the individual esti-
. particular quantity Of product .ubmitted mated lot perceot defective. pL’..
le. ●cceptability . . diati~uiah.d from the
ia. pe. tion of praducl which hambeen re. ub - C13..?.2 Dc.uble Spccificatioa Umit. The
rnisted after prior rejection. The pr.acc.. e.timateii lot pe,=.nl de fcct, ve shall be de-
● vera~e shall be e.timated from the remdtm termi~ed {mm Table C-5 fc.r the Plan. baaed
of im. peetion of ●mple. drawn from . .pec - cm the rmt~. method. The quality iridice.
Uied numb. t of pr. ceditq lot. for the pur - OU and OL shall be computed. Table C-5
PO.. of delerminiag .everity of imapection is cmter.d #.parately with Cfu ad QL ● nd
durimg the .our. e cd ● co=t?.ct in aecordaace the .ampfe .izc, and the c.rrespohdi:g Pu
with paragraph C14.3. Ay lot .bdl be in- -d PL ● re read from the table. The ● sti-
citided md, ante (m rt.dnutfri~ chm proc... m.ted lot percem defective i. P . PU + P .
avera~c. The e.timate of thepmcc.. aver- Tb. e.lirnated proce.. ● verage p i. ct+●
age i. de. igriated by p“ wbem cwnpuc.d with ● rithmetic mea. of the i.divid.af ..tinuted
rempect tc. ● n upper .pecific.tion limit, by 10I percemt defective. p,..
(JL -b.. ..mP.ted rnth respect to a lower
.p. cifi..tic.n limit, and by p when computed C13. Z.3 Special C.. e. If the quality iade.
with respect to ● double .pecifi..t ion Ilmft. Ou or 01. i. . aegativ. amber, lhen Table
. C-5 i. entered bydi. regarding the negative
C13.1 Abnormal R.. uft.. Th. ra.ult. of .iar.. Howcwer , ii. thi. c-.. the ..timat=d
ic!. pectitin of product rnamuf. cmred under lot perce.m defective above the uppar limit
ccanditions aot typica3 of u.tmf production or below the lower limit i. obthic.ed by .ub -
hall b. excluded from the emtimaled pro- Cr.cting fh~ percentage lc.und in the table
ctm. ● verage. from 100%.

Cl 3.2 Compufatio. of tbe EsUnmted Pro- C14. NORMAL TIGHTENED, AND RE-
Ce.. Average. Th e estmuted pracemm ● vmr - “DUCED IkSPECTION
.;. 18 the a%hrnetic mean of 4(I. e-hated
lot percent d. fecti.=m computed from tbe Tbia Standard esmblisbed ●u’nplfng
●ampliag i.. pectioa re. ufto of the precedlmg P(U far normal, tightened. and reduced
ten ( 10) lot. er ● . may be otberwi. e de. ig - IEmpectk.n.
matad. & order to eatim.t. the lot p.rcem
C14. 1 At Start of fa. pectiom. Normal in-
defective, the qua3ity hdie.. Q“ andlcw OL
spection .hd3 be used ● t the start of ias Pee-
9ball be Coin ● d for aach lot. Tb... ua: U& uateoc otb.rwise dacignated.
Ou = (u-X)C r X and Ot, = (X- L)c/IL (See
parwraph Cl 1.2. ) C14. Z ZturirIg 3aspection. Qurimgfhe courm
6 of iwrnctiim, normal &xctio. sbdl be
C13.7..1 S&l* Specific& 3An& Tbe UDd vba. imspoctian Coaiitimms are ●uch
emilmuea lot percent d ● 1eetlva ●bQ b. d.- (&85 tibteaed or reduced iMmcc?ion io not
Iarmin.d from Tabl. C-S forth #_ ti.d r.4dTd Lm ● ccordume -itb” paragrmpfu
on the r~c tuetbod. T& qdity M-x Ou C14.3 d C14.4.
● bd k uood for tbae~e ti u-r •~.
tb8 cu. d . tir
Ific.tlmiMrnft er Q~ ler Cl 4.3 Tisbtened fxukmcfion. Tishw..d ia-
●p.cuictiom ulmlL T&l* c-s b tirti 9D0ct10m 91M31 be ttmtituted wbem tbe estj J
dfb C)uor QL ● nd (h* ●rnfla ●ti=. d ~* &t&f procemi ●verage computed from td
 prec.di.# t.. ( 10) lots (or ●uch other aem- the ● stimat.d lot percent defective i- ~
ber of lot. de.i~nat.dl in ● ccmrdaoee .ith to sero for b ●vclfied ~r of towau-
para~raph Cl 3-Z is greater than th= AQL, tiv. 10CC(see Table C-?).
sod when mere than ● cc.rlaln ~r T of
theme hats have emtimatea O! the percem COmdItkl c. Production i- ●t ●
delecctve .xecedisg the AQL. Tba T-values ●teady rata.
●r.give. ln Table c-6 for tbeprocem ●wer,r
age compted from 5, 10 or 15 101*.8 r40r- Normal Iaspectlen ● hall be reinstated M ‘my
mal in. p.ctioa hall be reiiut.ted i[ the one of the following cooditiea. eccvra ti.r
e.tinuted proces. ● verane of Iota her reduced ia.~ctiOU.
Cightea.d im.pecxic.n is ●qtd to or le.. tkn
Cmditbm D. A M k rejected.
the AQ t..
condition E. Tbe ● ettmatad procema
Cl 4.4 Reduced ln9PccUon. Iled=ced in- ●va age 1. greater tbao tite ML
●pecti.a rrmy b. uutitutad providd that all
of the following conditions ● rc catiafied: tkmditi.. F. Prehcttom become,
1. irregular or delayed.
Conditioa A. The preceding ten {10)
lot8 (or .uch other number of Iota deaigrmted) Camdittc.aG. Dtber condition. w
have bee. under norm81 inspection and non. may warrant Umt normal impaetio. . bauld
ha. be.m rejected. b. r.ltwtated.

thmdicioa B. The ecttnu:ed pereemt Cl 4.5 S- Pling PIUIO for Tfuhta.d or Re -

defective for each d theme preceding Ietm i- dimed LompeCroon. Sam #w P~ i or tight-
le.. than tbe applicable lower limit #bow. ened -d reduced in@p@ctioa ● re provided in
in Table C-7; or for certain ●ampiius plar.a. Sectio. C, Partm 1 aad U.

... ,... .. .. .. .. .. .

Qa
MIL-sTD-414
11 Jme 19s7

TABLE C-6 Range Me3b0d

VA.e. of T for Ti~ht.ned k.spcction

Sample #ix. Acceptable DIM Sy Lewd ‘ectke] Number

T?.
code letter .04 .065 .10 .15 .25 .4( .6s 1.0 6.5 10.0 15.0 of Wm
44
B . . . . ● . . . :
8 : 1:

T -L
2 4 5
c ● . . ● ● . ● 3 4 : :8 10
5 6 9 10 11 15

23 3 4 .4 4 5
D ● . . ● . . 44 5 1 7 8 10
56 7 F10 10 11 15

z z 3 4 4 4 4 5
E . ● . . > 4 5 :7 ‘7 7 8 10
4 s 7 89 10 10 11 15
-
z 3 3 44 5

d-
44
F . . . 4 4 5 2 67 78 : 10
5 5 6 8 99 10 11 11 15
—
4 4,4 4 4 5
6 : 10
G 1: ! ; : ! : 9 1;
-t--t 11 1: 1s
,-
3 “3’ -3 3 4 4 44 4 44 4 4 4 5
H 5 b 6 6 77 7 7 n 8 8 10
: ; 7 7 e s 99 10 10 1: 11 11 11 15
—

$
3 3 3 4 4 ,4 44 4 44 4 4 4 5
.1 5 b 6 6 6 7 7 7 -8 8 8 10
7 : 7 8 8 9 :9 10 10 1: 11 11 11 15

4 4 4 4 4 4 4 4 4 5
J ; : 6 6 6 7 : 7 78 : : 8 10
7 7 0 8 9 : +9 10 10 10, 11 11 11 11 15
—
4 4 4 4 4 4 4 4 44 4 4 4 5

$
K : 6 6 6 7 80 8 8 8 10
7 8 8 8 : ; 10 1: 1: 11 11 11 11 11 15
— — —
4 4 4 4 4 4 4 4 4 44 4 4 4 5
L 6 6 6 6 7 7 7 7 7 a 8 a a 10
a a 9 9 9 9 10 JO 10 11 1: 11 11 11 15
— — —
4 4 4 4 4 4 4 4 44 4 4 4 5
M 6 6 7 7 7 : e 88 8 8 8 10
a 9 9 : ;1 0 10 10 11 11 11 11 11 11 15
— —
4 4 4 4 4 4 4 4 4 4 4 4
N 7 7 7 7 7 7 ; a a 8 : 8 a 8
9 9 91 01 0, 10 10 11 L1 11 11 11 11 11
— — —
4 4 4 .4 4 4 4 4 4 44 5
0 7 8 80 10
9 Ii 1:1 :1 :1 : 1! 11 ,? 11 11 15
— — *
uid MLvm3umm.

----
 MlL%Tn414
11 Juna 10S7

TABLE C-6-CooUfoJad R.-g. Method

zIT
Vale. d T for Ti@t-.d Lmspcuoa

‘=%!7
Q-lx
.10
44
77
10

4
7
10
z m
A. ce
.15

10

:
10
ble Ouatit
..?5

10
w
4
788

laa
11
.40
“4

11

44

11
5A ,.1s [ill
.6s
4

11

11
1.0
44
f5a
11

:
11
1.5

11

:
11
II

!1
+
44
a8

4
a
11

:
11
4
a
11
I
4
a
11
I
45

1:
1

10
15

The S-D
.- fiiwm in each block refers to the precedim 5 lot., the middle li~rc to the
preceding 10 lots and lhc bottom figure to the pre&ding I S-lot..

Tightened inspection i. required when the number of lots with ● .timatem of percent
defective above th= AOL from the precedin~ 5, 10. or 15 lots i. ~rester fhan the given vtiue
of T in the table, and the pr-.e=m averaae from these lat. exceeds the AQL.

Aff estimates of the lot percem defective are obtained from Table C-5.

al
 TABLE C-7 RWISQMethod
Llmit# of htimxcd Lot Percent Defective (or f2educcdfn,pectk

Ssrnple *ize Acceptable Oudity Levels Number

code letter ,04 .065 .10 .1$ .25 .40 ! .b5 I ,0 1.5 .?.5 4.0 6.5 10.0 15,0 or z.ato

B ● ● o * ● ● ● ● ● [42]*. [28]** [18]** [121.. [ 9]**

.17 s
c ● ● 4 ● ● ● ● [45]** (31)** [221.. [15j** [[O]** ( 7]** I S.oo 10
& Is

0.00 .74 6.06 s

D ● ● ● * ● ● [)1]** [25].* [18].* [II]** [ 9]** 4.40 9.96 15.00 10
6.50 10.00 , 15

.00 0.00 .19 3.s2 8.45 5

E ● ● ● ● [JO]** [23]** [17/.. [13].. [IO}** .35 1.84 5.74 10,00 J5.OO Jo
1.84 4.00 b. 50 b A Is

.000 .000 ,00 .061 .s3 .?.04 4.92 9.66 5

r ● a * [191** [141** [II]** .008 .104 .40 1.37. 3.01’ 6.06 10.00 I 5.00 10
.158 .50 1.14 ,2.30 4.00 6.50 & i 15

.000 .000 .000 .006 .040 .148 .5)6 1.41 3.27 6.30 11.01 5
G [12]** [loI** [ 8)** .002 .015 ..060 .19z .449 .90 1.94 3.63 6.50 to.oo 15.00 10
.0.?0 .014 .199 .466 .90 1.50 2.s0 4.00 A & 1 15

.000 .000 .002 .004 .014 .04Z .112 .Z48, .498 1,12 2.20 4.27 1.40 12.13 5
H .003 .009 .020 .047. .101 .209 .422 .755 1.26 2.)4 4.00 ..50 10.00 I 5.00 10
.011 .025 .052 .096 .199 .174 .65 1,00 1.50 2.s0 , , A & 15

.001 .002 .004 .010 .028 .069 .16.2 .326 .600 1.27 2.42 4.52 7.68 12.43 5
I .006 .015 .032 .061 .110 ..?52 .478 ..522 1.34 2.42 4.00 6.50 I 0.00 15.00 10
.017 ,037 .067 .118 .230 ,40 .65 I ,00 1.50 2.s0 L a A A 15

.001 .004 .007 .017 ,042 .094 .202 .Jsb .691 1.39 2.S7 4.11 7.91 12.65 5
1 .010 ,021 .042 .075 .151 .281 .51b .861 1.39 ?..47 4.00 6,50 10,00 15.00 10
.0.?2 ,044 .079 .131 .24B .40 .65 I ,00 1.50 2.s0 b A i A 15

●Th-rc ~rc no tunpllng plmo provided In this Standard for the-e code Iettera and A(3L vduos.
 .

TABLE C-’I-C.mthtued RUIIO Method

Llmltc of ZZctlm~tedLX Pereent Defective for Reduced fmpectimi

,04 ,06S ,10 T 2.5

.002 ,00s .012 .0Z4
y
1.40
.013 ,021 .049 .087 2.50 4:00
.0Z6
TF ,010 .088 .144 & i

.004 .010 .020 .036 .076 .140 .Z88 ,509 .857 1.6,? 2.86 5.01 8.11 11.o~ 5
L .010 .016 .062 .1OZ .190 .332 .581 .94.? 1.47 2.s0 4.00 6.50 10.00 19.00 10
.033 .0s9 .09? .1s .Z5 .40 .65 1.00 1.s0 & k’ A k b 15

.007 .014 .07.6 .046 .09Z .174 ,326 .562 .92i 1,7Z 2.99 5.2Z 8.48 13. z7 5
5.5 .023 .041 ,069 ,112 .z06 .35Z .6o4 .968 1.50 Z,50 4.00 6.5o 10,00 15.00 10
.036 .064 .10 .15 .Z5 .40 .65 1.09 b A b tt-t-1 bd 15

.Olz .Ozz .0)8 .064 .Izz .z16 ,389 .648 l.o4l 1,87 3.19
N .Ozfl .051 .0 z .1Z9 .2Z6 .378 .636 1.00 1.50 2<50 4.00
#.04Z .065 .1) .15 .25 .40 .65 i A A A
—
,015 /.oz9 .0 .078 .144 .246 .434 .109 1.119 1.90 1.32
.013 .056 It .08 .139. .Z)a .391 ,65 1.00 1.50 Z.so 4.00
.04 .06s .10 .15 .25 .4044A b 1 & AA

P
.093
.146
.1s”
333 .?.08
Z.50
&
3.46
4.00
1
5.BO
6.5o
l&A
9.15
10.00
14.OZ 5
15.00 10
15

1s

,103 Z.15 3.54 5.90 9.Z7 14.15 5

Q 1 .149 2,50 4.00 6.50 10.00 1S.00 10
& A A 11 Is
El&E!! k

AQ Ipt tholI In the bracketm, ● re h percent clef, :tke,

N]

Wm. tht (Irml flsu?o In diractlon O( arrow aad corree~adin~ number of Iotn. in e~eh bl~ck tho top (Inure
prccodkng 3 Iota, the mlddlo Npre ‘to tho preceding 10 Iott, and the bottom figure to the precedlal 15 lots.
T# ref. r# to the

Reduc~d Impaction may bo Inotltuted when every emtlmmed lot percent defectlv~ from the preceding 5, 10, or 15 IotmIc -
bdew the figure @iven la the labl~ raduced impectlea (or sunpllng plum marked I*.) in tbe table requires that the e8tImated
:!
lot percent defecllve la equa2to -ero, for the number of comecutive Io!* iadlcsted !n br~cket~. in tddltlam. dt other condltiom
for r-ducad lnapection, In Part 221et Sactlom C, mumtbe ● attmii*d. !,g
g$
~1 ●btlnmtem of tbe lot percent defective ● re obtained from T.ble C-5.

1
 ,

TABLE C-8
Vducs Of f for h{dmum Average Range (hfARl

$ample #lz* Slrnple :ceptable Ouallty Le !It (in perct de/cctive)

CO* Ienor 91s* .04 .065 2.50 4.00 6.50 I 10.00 115,00
B 3 ’77 .811 .865 .907 .958 1,028
+
c 4 .756 .78.9 .816 .891 .96S 1.0s6 I 1.180
—
D 5 --t-% .764 !801 .857 .923 1.011 I 1.118 I 1.26j
+
E 1 .804 .846 .910 I .985
695 727 765
I I
r 10 .529 ,64z .677 .730 .19)

G 15 .444 .460 ,477 .49J

442!3
.517 ,542 .572 .6OZ ,637 .68.9 .748
-t-
n 15 .4[6 .412 .447 .463 .486 ,509 .537 .567 .6OO .649 I .707 .785 I .879 I 1.004
I 30 .411 .426 .442 .457 ,480 .503 .531 .56o .593 .642 I .699

1 35 .408 .4?.3 .438 .454 ,416 .49? .527 .556 .588 .6)7 j .694
*
% K 40 .402 .417 .4JZ .441 .469 .4’?2 .519 .548 ,580 .628 I .684

L 50 .396 .411 .426 .441 ,463 .486 .503 .542 ,573 .621 .676 ,752 .843 .96)

M 60 .190 .405 .419 .434 ,455 .478 .505 .533 .564 .608 .666 ,740 .830 .949
it- + I
N 85 .J8Z .398 .412 .427 .525 .555 .6OZ I .656 .129 I .618 I ,934
44’I 470I 497
0’ 115 .318 .)92 .406 .421 .442 ,464 .490 .517 .540 .594 .64S .720 I ,s08 ] ,923
—
P 175 .371 .384 .399 ,411 .434 .455 .481 .300 .5)8 .504
-1- .637 .708 I .194 I .908

a 230 .369 .384 .197 .41z .43.? ,454 .480 .507 .516
+
i--l--
The MAR may ba obtdaod by multlplyin~ the factor f by the difference between the upper .pecificati.an limit u .nd lew. r
speciflcallon Ilmif L. The formuh 1- MAR . lIU-L). The htAR serveB as a guide for the magnitude Of the average rang, of
Iha ounpla when uaia# plant for the double opecUicatian Ilmit .ca#e, based on the average range of the munpla of .mbm.wn
varlabUity. Tha werap ruge of the .smple, tl It.ls Ieoo than the 5dAR, helpc to inoure, bd doe- not [utrantee, lot accept.
abiflty.

NOT&: There h t eorreopoadkg occepfablllty constant In Table C. I for eqch .aZue of f. For reduced hirpection, find
tht ●ccepttbillty comtant of T-ble C-Z in T~ble C- I md u-e the corre~pmtding value or f.
 f

mL-SlW414
.11 June 19s7

APPENDIX C

mMlmitfO.s

Read Definition.
SY@.?!
m sample ●ike far ● single lot.

x X bar %rnple mean. Arithmetic meam of ●mple mea.. r.m.rm

from . .ingle lat.

R Range. The difference betweer. the Iarge. t and ●rnalle.t

mea.ur. mests in . .. bgroup. & this Smitdard, the #ubg.o.p
site <s 5 except for them= plan. in which m . 3. 4: er 7. in
which ea.. the ●ubgroup i. the same a. ths .ampl. size.
Range e: the fir. t subgroup.

Range d the ●econd subgroup.

R bar Aver.~e ruag.. The arifhn-.etic mean of the rug. values of

the subgroups ef tbc sample measurcm.nta [ram ● single lat.

u Upper spec Uication limit.

L faumx apecificstien limit.

I k The acc.pcability conctanr given in Tables C- 1 nc.d C-Z

c A factor u.ed in determinizi~the quality index when using the

range method. The c values ● re given is Table.. C-3 and C-4.

Qu O ●ub U Ouafiry fmdex for “.= wijh Table C-5.

QL Q ●.b L Ouafiry fndex for use with Table C-5.

Pu p .ub U Sample estimate of the let percent defective above U from

I Table C-5.

p ●ub f. Sample ●.tixnale cd the lot percent defective below L from

‘L
Table C-5.
I
P Totti SUTIple estimate of the 101percenl defective p = Pu + PL.

I M M&imum ● llowable percent defective for sample ● mtimam.

given in Tablmm C-3 and C-4.

M,ub. U Mtitun allowable percent d. fecfive above U gi.em in Tables

%
C-> scuf C-4. (For use wbem differenf AOL valuca for U and
L ● re specified.)

ML ~uxn mflowmble pert..t de f.cti.. blew f. Siv.m in Tabfe.

C-3 and C-4. fF~r u.e -ha. different AQL value. for U ad
f. ● re cp=dfied.)

P p bar S-pi. ..tinut. @f the p.ece.. p.rc.m defective. i.e.. Cbe

estinmt=d prc.ee.. average.

$U p bar #ub V The estimumd proce.. ..era~e for UI upper ●pecUication lf-mit.

FL p bar suh L The ● stimated pro . . . . ● verage for a lower .pecific.tion limit.

T The m- um number of emtin’tated proces. a.er4ea w~cb

may exceed the AOL given in Table C-6. (For use in deffr-
_ WW+fiCafiL= U fi~ht=aod Ampeefloa)

8s

.—.
 MIL-STD-414
11 Jffffa 10s?

SECTfON D

vARIABIIJ’I-s KNOWN

Part 1

SINGLE SPEC1fICATION LIMIT

01. SAMPLfNG PLAN FOR SINGLE Dz.2.2 AcceptabilityCom.tant. Th= ●=c=Pt-

sPEC1 nCATfON LfhffT ●bility comstaut k. corrcapOd@f to the SUTI-
ple is. mentioned in paracraph DV..2. I, im
This part of the Stand~rd de.tribes tbe i-dicated in the column of the maater tabl*
prOc=<u, =* fer u*= with plan- fOr ● ●in81= corre. p.amding to the ●pplicable AOf.. vafue.
.peciftcac ion limit whe. variability of the Table D-1 i- .ntered from the t.pf. r normal
lot with rcapecl to the quality chbracteri. tic i.. peetion ● nd from tbe bottom for tightened
i. known. Tbc acceptability criterion i. im.pection. Sampling plan. for reduced ic.-
givcm in two equivalent form.. The.. are apectioo ● re provided in Table D-Z.
identified am Form 1 ● nd Form 2.
D3. WT-BY-~T ACCEPTAEfl-~ PRO-
D1. 1 U.c of Samplinu Plan.. To determine CEDURES WNEN FORM 1 IS fJSEf#
whether the lot meets the ●cceptability
criterion with respect to ● particular qtmtity D3. 1 Acceptability Criterion. The dear-
chsracteristi. and ACIL value, the applicable of conformance of a quality characseri. tic
.ampling plan shall be umed in accordance with re. pect to a •in~le specification limit
with the prcwi. iom of Sectic. n A. General hall be judged by lb. quantity {u-X)/_ or
Description of S.mpling Plan.. ● nd lhose in (x- L.)/..
thi. psrt of the Standard.
D3.2 timputation. The folio witas qu~tifY
D1.2 Drawing of Sag. “All -ample. ●hail ● ball be compute& (u-X)1. or (X- I.)l. . de-
be dramt i. ●ccarrJa.ce with para#rmph A7.2. pendins on whether the .p..fficatiom limit
I i. u upper Or ● 10wer limit, where
D1.3 Determination of Sample Size Cod.
Letter. T he m-pie 91ZC code,letter .hdf U i- the upper specification Mntlt,
~.cted from Table A-2 tn 8ce.rdmce .L is the low-r ●pecKicatioa llmit.
with paragraph A7.1. X i. the sample mean. ● nd
e is the bnown variability.
D2. SELECTING THE SAMPLING PLAN
wHEN FORM 1 IS USED btlltv Criterion. timpar. the
qmantity - L)I. with tba ●ccept-
DZ.1 Master Sampliq Table-. The rzm. t.r ●bifity coaatant L M (U-X)1. or (X- L)le i.
●amplms fabJe. Ior planm ba. =d on v8ria - .quf ’te ox sroater tb- b. tfmbg=-e~ ~
bttlcy ~ k? ● ●imsle qeetfkattc$m ltmlt ●cc*pfabfflfy crtsertcud If (U-w. or ~- L)/.
● re Tables D-1 and D-z. Tablo D-1 i- omd Is 18** tbn k or Decative. tin tbe lot dOa*
(m -rmsl Ind tightened tnapectiom and mt mat tbo 8cc*pfAbtltty c rlterioa.
T&l. D-z for rod.ced icupectioa.
D4. SUMMARY PUR OPERATION’ OF
DZ. Z Obtdmimr8ampffnR PtM. Tbo Qu81- 8mAuNGm..Az4wmz N?onu 12s
pli8* ph. C.nmmtm 01 ● ,unpl* i.a,wd M ●
s~moclated ●cceptability conmtant. Tbe
samplimg plan ia ebtahed from k.te r
Table D-I ● nd D-Z.

DLL, ~pfe Sise. The ..niph she m i. [1) Determine [be sample sise coda let-
●howa in t e mamter table correspoadhs fo ter from Table A-Z by u-lr.I Ibc lot ●iM ad
each ●ampl. ●he code leffer & AOL. tba tipecftoa lee:.

lS.a Appcadis D for d= finicia=u al all ●pnbals used in tba sunptiQz PIUU bned oavar~U~
Z~-~PIe D. I fo, ● COmpfete .sunpf’e Of tti prO=eda.e.

67
 mL-snb414
11 June 1957

(21 Obtain PI*. from Master Table 33-I ●Pecificalion limit. The p.rc.mtag. ef nom-
or D-Z by sel=ctitag the ●ample .i%e rI ●nd c.nferming product i’ ● .;imamd b~ ●nfcr-
the .Cceptabitity Coti.ta-t k. Tablt D-5 with the quality index.

(3) Seleti at random ~ha .unple ef ❑ D6. Z Computation of Oualilv lade-. The
units from the lot: inspect ● nd record the quality ic.de= QtI . [U-X) VI. .h.lf be corn.
tn. amur. merit of the quality characteristic puted if the 8pe; ification limit im u. upper
Ior each unit of the ●ample. limit U, or C3L = fX-L) v/. if il is s lower
limit L. The quzc.litie.. ~ and . . ● re the
[4) Cornput. the .unpl. me.. X, ●nd ..mplc mean and known variability. respec-
●lso compute the quantity (u-X)/e for an tively. The laclor v i. provided in Tables
D-3 and D-4 corre. pc.ading to the .unpfe
u per specification limit U or the quamtity
{f- L)/. for ● lower .peciiicatiaa limit L size.

(5) lf the quatitity (U-X)/. O. (x- L)/a D6.3 Estimnte of Pert.nt Defective in Lot.
The quality of ● lot ●hall be exprem. ed by
i. equal to or greater lhas k, the lC.I meet.
the acceptability criterion; U (u-X)1. or Pu. the estimated percent delective in the
lot ● bove the upper .pecificstmn limit, or
(X- L)/W is Icaa :han k c.r eesative, them the
by P the ●stimated percetit defective below
101do=. not meal the acc.ptabillty criserbn.
ih. l-”
owcr specific alior. limit. The citimated
percent de~ective PU or pL i. obtaizted by
D5. SELECTING THE SAMPL3NG PLAN cmte. img Table D-5 with OU or Cfti
WHEN FORM 2 3S USED
D6.4 Acceptability Criterion. Compare the”
D5. I Master Samplirm T. bles. The ma.t.r estimated 101 p=rcent defective p~ or pL
m.rnpling tables for plans ba. ed on vari. - with th. maximum ●llowable percent de fcc -
bilily knc.un (~r ● .ingle specification Iirnil ti. e M. lf pu or pL i’ equal to or le.. than
● rc Table. D-3 ●nd D-4 of Part IL Table M, the lot meet. the acceptability criteriotx
D-3 is used {or normal .ad tightened in- if PU or PL is ~reater than M or U QU or
spection and Table D-4 for reduced inspec-
tion. ‘L ~S negative. ~h=n th= 10t do= C@ IIWCt
cn. acceptability crxterior..
D5. Z Obtainin~ the Samplinff Plan. The .137. SUMMARY FOR OPERATION OF
sampl.ug plan .onsi. ts c.{ ● ample .iz. ●nd SAMPLZNG PLAN WNEN FOffhf 2 IS
an ●ssociated maximum ●llowable perccnl USED
defective. The .amplimg plan is obtained
from Master Table O-3 or D-4. The following steps summarice the Pro-
cedures tO be followed:
D5. Z.1 Sample Sise. The .ampl. .i=e ~ i.
.hown in the rnasler table .x. rreaportdine to (1) Dele. rninethe .m’nple size code 141-
each s~mple .i=e code letter, cer from TabIe A-Z by ..ing the lot .ise and
the in. pecliem level.
D5.2. Z Maximum Allnr.. able P.rcecIt De-
fe<tive. The rnaxirnum ● llowable ~ereent (2) Obtaia plmr. from Mater Table D-3
i~ve M for 9UTIP1. ●.timalc. corr.. - or D-4 by ●electing lhe ●unple ●i=e U. fbe
poadkmg b tbe sample ●i.e meatlomed i. fbctor ., ●nd the mulmum df.wable per-
r-wr~pb D5.z. 1 I* irtdicated in the Colwn. cent defeefiwe M.
of the mseter table corrempoadiag to the
~PP1ic~hle AOL value. Tabl. D. 1 is acte, ed (3) S4ect st ramdom tbe .unple of n
from tbe t.pfar .armaf inopecfioh and frc.m umits from the 10G irs. pect and record the
tbc bottom let tight.md tip.cuon. Sun- nma.ur.nmnt 01 the qualhty charutari9tic
plirig plans for reduced Iamfmctima.are pro- on each umit of tbe ●empl..
vided io Table D-4.
(4) Compute tbe sample me- X.
DE. ~T-BY-WT ACCEPTABILITY PRO-
CEDURES WNEN FORM Z IS USED 3 [5) Compute the quality index f2u .
( U- X}v/- U ● . upper t cificatimn limit U
Db. 1 Acceptability Criterion. The de~ree = (FL)v/. If ● ,-*
of con>ormae.ce c.f ● quality eha~aeterimtic ;F%%%$; %ai% i, .peeified.,
with respect m ● .iagi. .pecifi. atio~ limit
.hdl be judpd by the prc=a of ~~con- 16) Determine the ●mtimsted lot prcasd
formimg producl nutside tbe upper Or lm.er defective PU or pL fram Table D-5.

‘S=. EXamPI. D-2 far . complete exunple of thl. precedure.

88

I -——
 MUA7D-414
11 Juoa 1SS7

(7) U the emthrmtcd lot percent de f.c -

UW* pU or pL im eqtml W or Ie*a ttmo tbe u ‘u h ‘rnesattve,
QL “ “ ““”=’
thea the ‘- let M “ ad
deem ‘f ‘4Z
maximum atlowable percent defective M, the =ccopMbUitY criterion.
the lot meata thm ●ccaptabiii.~ cricerla~

EXAMPLE D-1

&Ample of Ca3ctiiiam

SiaCle Spec51ictii0a L%iit- Form 1

VariabiIlfy t(cw-n

Example The ●pecif ied minimum yield point for certain ●t4el c~-ttags is 50,000 psi. A lot
of 500 item. im wubmicted for inspection. lo bpection Level IV. normal Ia.poction.
with AOL . 1.5S i. to be u..d. The variability . i. knowm te be 3000 p-i. From
Table. A-Z and D-1 it i- seen that ● mample of ●kc iO io re.autred. SUPW9C fhe
yield point. of the ●unple specimen, ● re:

6Z,500; 60,500; 68,00(h 59.000; 65.500;

6z.000; 61 ,000; 69.000; S6.000; 64.500;
and rompliame with the acce?tabilitv criterion i- to be determined.

Lint Information Ne.ded Value Obtained Expluulion

—
1 Sample Sise: n io
I 2 Known V.riabitity: . 3.000

3 Sum af Mes..rcmcnt.: IX 630,000

4 Sample Mm. X: ZXln 63.000 6J,000110

5 Speeificatioo Llmlc (Luwer): L 58,000

I b The Quantity: (X- L)le 1.67 (63,000-5.5.000)/3000

I 7 Acceptability CoLI. taat: k 1.70 See T-ble D- I

I .. 8 Acceptability Criter- Compare (X- L)/. 1.67 c 1.70 see Para. D>.3
with k

The lot does mot meet the =eceptabi3ity critmriom, dnce (X-L)!. is le.. th= ~
I NOTE: If ● ●ksie upper specUiCatiOn ltrrdt u i. SWen. tbeh compute tbe quaatlfy (U-X)1. tm
— lb- b d compu~ it with k the 10C meet. the .cceptabiiify crit=rio. if ( u-X)k i.
I equal to or greater tbui k.

I
I
I

89
 54flL-sl’13-414
11 Jumd 1957
E~LE D-2

fkampfe of Cafcuhtfonm

Single Specification L4mit - Form 2

VariabUity Known

Example The specified mimimum yield poiuf f-r certain .teel casting. . . .in S8.000 psi. A lot
or 500 item. is submitted ror inspection. inspection Level Iv, normal lnspectlon,
with AQL = 1.5% is to be u.ed. The variability e is known to be 3000 psi. From
Table, A-2 and D-1 it is . ..cI that ● sample of ●ize 10 i. required. .SuPpa. e the
yield points of the sample mpecimen. are:
62.500; 60.500: 68,000; 59.000; 65,500:
62,000; 61 ,000; 69,000; 58.000; 64,500;
and compliance with the ●cceptability criterion is m be determined.

Line biforr?mtirm Needed Value Obtaimed Explanation

—
I sample size: n 10

2 Know. Variability: c 3.000

3 sun-l of Mr.a.urerncIll’: xx 6>0.000

4 sample Me- X: TXln 63.000 630,000/10

5 Factor, v 1.054

b sp=cific aliOn ~mi, ltiwe r): f- S8.000

(63.000-58.000)1 .054
7 Ouality fnder: OL : (X- L)v/o !.76
3,000
8 3.927. Se. Table D-5
‘m’” ‘f “ ‘Crcent ‘“1 ‘L
9 Max. A1l.awabl, Percem Def.: M 3.63% See Table D-3

10 Acceptability Critcrian: Compare pL 3.92% a 3.63% S=. Par.. D6.4

with M

The lot d~es not rn. e$ the ●ccepf.abifity criterion, since PL is great=r than M.

~E ff . sin 1. upper .pecific.tion Iii-nit ff i. given. the. compute the qu~lity index Qu =
F-
(U. XIV . m lme 7 and ebtain the sstimale -f $he perceml
with W. the 1.s rn. et. the ●cceptability criterion
defective PU. compare PU
if pu i. ●qual 10.0. 1.*S than M-

90

I ------- . . ..- .-
 TABLE D-1
Matter Table for Normal and Tlghtenad Inspection for Planr Baoed on Varlablllty Known
(Single Specification Lkmlt-Form 1)

ccepttble Ouallty Level? (norma2 Inopaction]

Sample 91*c
.04 .06S .10 [ .1s I .25 .40 ,65
code letter [ I
n k n k a k [nklnklnkl ak

c
— —
D

F F .
— — 1 1 , ,
G’ 3 2.58 3 49 4 2.39 4 2.30 4 2,14 5 2.05 5 1,25

H 4 2.63 4 2.5s
++” S 2.46.
I
5,.,4 I 62.2,
I
I 6Z.0*
I
I ?.‘“ 1,95

1 5 .?,69 6 2.59 6 2.49 I 6 2.37 I ? 2.25 I 8 2.13 I 8 1.96

J“ 6 2,12 6 2.58 -1 2.s0 1 2.3s 8 2.26 9 2,13 10 1.99

x 1 2.7? 7 2.63 8 2.54 ‘? 2.4s 9 2.29 10 2.16 11 “2,01

5., 8 2.7? 8 1.64 9 2.54 10 2.45 II 2.31 12 2.la 13 2.03

1 t

M 10 2.81 11 2.12 11 2.59 12 2.49 13 2.35 14 2.21 26 2.o7

I I
N 14 2.88 15 2,77 16 2.65 I 1? 2.S4 I 19 Z.41 I 21 2.21 I 23 2.12

o 19 2.92 20 .?.80 22 2.69 2)- 2.57 25 Z.4J 27 2.29 30 2.14

I I I
27 2.96 10 2..94 31 2.72 34 2.62 31 2,41 40 2.33 44 2,11

37 2.97 42 2,71 45 2.62 49 2.48 %4 2,34 59 2.18

,’ ~
.65 i ,00
‘E 1=r- .063 .10 .15 .29
Acceptable Oua21ty Levalo (tightened lnopectlon)
~o
 . ---

TABLE D-1-Conl[nud
=s
Maoler Table [or Normal and Ti~htenid Znopectionfor PlarJI Based On Variablllty l(nown
(Single Speclflc.tlon Limit-Form II ?1
;.
Acceptable I 31ty Level# (normal Inmpeetim) d
z
Sample ●Ic* ~~
I .00 1.50 Z.50 4<00 6.5o 10.00 15.00
code Ietlar I I I *
n k nk n kink n k]ak
.—
B
l== 1 1 3

v v v Vlvlvlvl
c I 2 1.36 z 1.25 z 1.09

D 2 1,42 ,? 1.33 3 1.17

I E 3 1.s6 J 1.44 4 1.28 4 ,.,, I , .9,9 I , .,.28 I , .,,, I

I 4 1.53 5“ 1.$9 5 1.20 6 .991
I
7 .197 8 .S84

--+-H%- 6 1.62 7 1.45 8 1.28 9 1.01 11 .877 12 .649

H 7 1.s0 B 1.68 9 1.49 10 1.31 12 1.11 14 .906 lb .685

1 9 1.83 10 1.10 11 1.51 13 1.34 Is 1.13 I 17 ,924 I ..20 .706

—
f l-- II 1.S6 12 1.72 13 1.53 Is 1.35 lZI 1.15 [ 21 ,942 I 24 .719
I
“1

K 12 1.88 14 1.75 IS 1.56 I 18 1.38 20 1.11 24 .964 27 .737

14 [.09 Is 1.75 10 1.57 20 1.38

Ill
L,

M 17 1.93 39 3.79 22 1.61 25 J,42

N 25 1.97 28 1.84 32 1.65 t 36 1.46

31 2.00 36 1.86 42 1.67 48 1,48

——
o

P 49 2.03 54 1.89 61 1.69 70 1.51

=-b-t=-,
55

82
I.Z~

1.29
] 64

95
1.05

1.07
], 75

Ill
.8I9

.841
I

t--- I I
Q 65 2.04 ?1 1.89 El 1.70 I 93 1.51 109 1.29 t 127 1.07 147 .045 I
, ,I
1.50 2,50 4.00 6.50 I 10.00 15.00 I
Acceptable O !ty Lavelo (tightened Incpeclhm)
I I

AI AQL VdUS* ●?E In Bercent dafectlve.

’
I!fi::v,r, item in
k
at cunplkag plm baZow●rrow, that ln, both aunple site *8 well amk value,
nzuat be kmpected.
idol When S~ptO site equa20or ●xctads tot
 .

TABLE D-2
Msomr ~nbte for Reduced Zn8pectionfmr Plant Baiedon Variability bon
(Sinlle SpecUicaIlon Limit- Form 1)
1
ble Quality Levelo—
Sample aico .065 .10 .15 I .25 .40 .b5
.04
coda Inttmr
8 k m k n k n knk n knk
}

25

r Z 1.3b
—
G z ,.581, z 1.42 I

34 z 1.94 z 1.01 3 1.b9 3 1.S.6

J’
I

I
1 3

3
2.19

2.19
RF1 1

3
2.07

2.07
I 3

3
1.91

1.91
-=-H-i
II

K 132.’ 914 39 4 Y..3O 4 2.14 s 2.05 5 l.aa b 1.7a

II
L 4 2.ss 5 2.46 5 2.34 6 2.23 b 2.0%
a M 4 2.55 5 2.46
r 5 2.34 ‘k 2.23 b 2.08
=-l-=-i
N 6 2.59 b 2.49 6 2.37 7 2.25 8 2.13

0 6 2.58 7 2.50 7 Z.J8 a 2.26 9 Z.13 10 [.99 I II 1.86 I

P 11 2.12 11 2.59 la 2.49 13 2.35 14 2.21

Q 15 2.77 16 2.65 17 2.s4 19 z.41 21 2.21

I I *

4*
 :. .

TABLE D-2-ConUnued
:s
Masltr Table {m Reduced kicpectbn f.? I?lan. Breed On Variability IGI.Wm
(Sin@Speciflcatlon Limit -F.atm 1) :8
..—
Acecptable C2uaIityLevelt
‘Smple Siso
1.00 I 1.50 2.50 “ 4.0 6.5
code letter
n k n k m k n k n k n k 1
! ! I
B

D,

F a 1.2s 1 2 1.09 I 2 .936 I 3 .755 I J .573

G a 1.33 1 1.17 3 1.01 3 .8.35 4 .641

53 9 1.44 4 1.28 4 1.11 5 .919 5 .1?.8

=--l
6 ,515
z .1
4 t.5j 5 1.39 5 1.20 6 .991 1 .797 0 .584 I

J 41.53 I 5,1.39 I 51.ZO 6 .991 1 .797 8 ,584

K b 1.62 7 1.45 8 1.28 9 1.01 11 .877 !2 .649

II
L a 1.60 9 1.49 10 1.31 11 1.11 14 .906 16 ,685

M S 1.60 9 1.49 10 1.31 12 1.11 14 .906 16 ,685

N 10 1.70 11 1.51 13 1.34 15 1.13 17 .9?.4 20 .706

I I
o 12 1.?2 13 1.53 \s 1.35 18 1.15 21 .942 2.4 .719

P 19 1.79 22 1.61 25 1.42 29 1.21 33 .995 18 .770

Q 28 1.84 32 1.65 36 1.46 42 1.24 49 1.03 56 .803

E I I
 kUL-sm-414
llJums 106?

Psrt n

DOUBLE SP3ZC3SXATZON Lfb4ZT

DE. sAM’PU?JG PLAN FOR DO CfBCE the lover Itrnlt. M4 by MU for tb= UPWr
sPECIF3CAT10N _ limit. u one AOZ. i- ●ssigned to bath l~ltc
combined. demipte tbe maximum A31.wable
This part Of the Standard describma the p-rcerd defective by M. Table D. 3 is entered
procedures f.r use with pftis for ● double from the zop for uornuz tipeczton and from
Specific-tiom limit when variabttlty of the tbe bosom for ttghtened imopectdon. Sam-
lot =ith reopact to the qtmfky c~rscteristic pli.s plans for redoced imcpeczion sre prO-
i. known. vided in Table D-4.

DE. 1 U.* Of SUnplimc Plan,. TO determine D1O. DRAWING OF SWLES

w%the r the lot meets the ●cceptability cri -
I le.-ion with ?=*PCCX co ● XrtiCtIISr qu~i~ Samples #ball be selected In accord-
characleri~ tic and AOL v’azuels). the appli- ● nce with parasraph A7. Z.
cable ●ampliag plan shall bc u.ed in accord-
I ance with the prwimic.nm cd .$ection A, Gea -
eral DeacriptiOm of SkrqdiW Plmns, md D1l. #.&-T-Y~O T ACC~PTABIIXl%’
those in this part of the Standard.

D9. SELECTWG THE fMkfPLfNG PLAN D! 1.1 Accepi.bility criterion. Tbe degree
et conformance al ● qutiltY c r.cleri~ tic
A sampling plan for esch AQI. .ake with respect to a do~le sF&c Ification limit
.h.11 be selected from Tab)e D-3 or D-4 ● .ihll be judged .by tbe perce~ al ~con-
[0110-s: farmiog product. The ~TCeIIUSS Of Wa-
.IJaforzniq product La estimated by enterkg
D9. i Determination Of S=mple Sise Code Table D-5 wAzh Z& quality M-x.
Letter. T he ●ample ● ma cade letter .bfi
-- b~.cte.d [ram Treble A-Z in mecordamce D 11.2 Computation of Quality lndice ■ . The
I
...” with paragraph A7. 1. qua3ity iadices Q . (U-xwi e and OL=
(X- L)v/c. ●ball be ~omputed, where
D9. Z Master SamPlinE Table.. The maater
SUnpl-es ier w bs. ed on wuiabi3- U is the upper specification limit,
ity known for ● double cpecific-tti Itit ● r= L i- the 10wer ●peeificmion limit,
T=ble- D-3 and D-4. Table D-3 11 u~ed for “ is a facsor providsd in Table* D- 3 ~d D-4.
.O rmal amd tightened izupection ud Tmblc X is tk .unple mean. and
. D-4 for reduced inspect.ion. . ia zbe ksowm wariabifizy.

D9. > Obtaining .sunpli.g P1_ A ●unpliag

plaa Celia, mt, 01 ● ●mple ● 2*, d M ● s80-
..: .dated maximum aflowsble ~rc=m defec-
tively). The ●uf@ins PI- ti be ●pp3Aed Jo
inspection shall be ebtahed from 3dmcter
Table D-3 or D-4.

D9.3. 1 Sun 1. Si.e. The ●unple ●i.e m i-

#how. =~ t e master ZAb3e. eorrecpondlag to
each ●unple ●txe code letter -d AOL.

~Iv* for.unpte .8Unut.* .of

percent
dafeectwe th4 Imr.
for nppe?. 0rb04b cp*c-
tfication limits co~ta.d. eerr*mpOndbs fa
tb. sample ●ize memfiomed in parasrmpb
D9.3. 1. i. #ho_ in the cdunm of the W18mter
table eorreaponding co tba applicable AQ3.
wdte(s]. K dKferemtAQLos
m aa~isad w
●xb speckficatlon Umlt. demtsuua th8 --
tmmm tile-able percent defective by ULIOZ

es
 nlL-s’nk414
11 JuIIe 1957

athrwi. t, tbe 10I doe. rat meet tb. ●ce.pl -

ability .rit. ria. Zf either OL O* O“ or both
Pi +b *= s-Am .Uew*Ie ‘P~z~ti
delceuve M. 25 p u equaf to or lea- 3baa U
ar. ae*.U.e, UMrI the 10; &e.
●ccep3abUtty criteria.
03%rpe.t the

the Id meeb the ●ccep3abUIty crUeri~ ff

p ic ‘re=ter tbm M or if Of) or Of. or both : D12.Z. Z summaryc.f operation ef s-
.,* Itapfive. Umn the lot &es ml meet the Plan. Za em=. wtmre ● diflereot AOL
acceptabffity criteriam ~ctabliched f., the “p-r -d lower t~c.
Aficatiom limit for a •in~le qtmii17 character -
D12.1. Z Suna~ryef OP erati.n of Sunplia imtic, tbe ;dfow- .tcp. . urnnmrime tbe
Plan. la caoe. where a .ingle AOLvtiue ~ prmcedurem fn be u.ed:
~bliohed for tbe upper and lower ●pacifi-
cation limit cornbim.d (or a ●fwle quality (1) Determlae the ●unple ●k. code
characterimtlc. the tolZowinS steps 8umma. letter from Table A-Z by uefa, the 105.&e
ri. e th.. procedtwe. to be u.ed: d in.peetio. level.

(1) Determine the sunple ●ise code {Z] Select tbe san-tpliag plan front
letter from Table A-2 by u.ing the lot .ize Mate. Table D-3 or D-4. Obtaio tb. amp-
and the in. pectioa level. le .ise tI .ad the I.cter ., eorre.podirq
to the lar~erof lb. two AQLva3ue.. dal. o
(Z) Select plan fr.am Mater Table the maximum .U.Ywable percerit delecgive.
D-3 or D-4. Obtti tbe .unpla si.e n. the ●nd M corresponding to the AOL
factor ., and the rruximurn allowable per- va
‘Y ue. for 1# e apper and lower specificatiea
ced defective M. limit., respectively.

(3) .%], ct ● l ra=dem the .am~le of 13) Select at random the ●mple of
n unit. from the lot; in. pect and record the n unit. from tbe 10C irIap. ct ●md record the
m... ttmeatat of tbe quality characcerimtic mcaauremcm of the quality characteristic
on ●.cb unit of the sample. on each unit in the .arrtple.

(4) COmpute the .unple mean X. (4) compute tie .8mpIe mean x.
(s) compute the quality indicem Qu (5) Compute the q~ty indiee. QU
.. = (U-x)vl. ad QL . (X. L)v/.. = (U- fov/. and CZL = (X- L)v/&,.

(6) Determine the ●.tinmxed lot (6) Determine the ●.tImued @t

percent defective p . pu + pL from TabIe p.rceat de fectl.es p“ mud pL, correspond -
D-5. ins to tha pa rc.af d. f.ctivec tie tb. upper
and b.lmw the lower .pecific.tkm limit..
(7) M tbe e. f.inuted lot percent de- Afmo d.te rmine th. combined percent de f.c -
fective p i. ●qual to er le.. than the maxi. tive p = p“ + p~ .
mum allowable p.rceas defective M. tbe lot
me. t. tbe acceptability criterion: if p is (7) u all three of tbe fallowing cc,n-
sreater than M or if Qu or OL o, both ● xe diuolta :
=S~~V~. tfI*n *- let doa - not meet ~e
mccapc-bility criterion. l.) ~u i’ equaf to or 1... tbma
%.
DIz. z Dlff8remt AOL Values for Upper and
&w.r .Sp.eUi.aUOO LiInlL (b) pL i. mquaf 1. or lR.8 ffun
Mu
D1 2-2; 1 Aceap4abflUy Crit9ria. 5 COirtfu*e
the ●stdnuted 1ot pmrc~t defeetivem m.. h (CJ p b equaf ts Or Ie*#fzlamthe
PU dth the cerro@omd4ng ~ -a..- larger of ML and Mu,
=bI= Perta=t de f==ttvew M d Mfj alao
=Omi=r. P . Pfi + PU wittt k larger d ML u. satiaficd, th. lot umato the ~C~tdiii~
mmdMu. lf pL sequmt taarle*attmm ML. P criterk other+se. the lot does MC meet the
ic 9qtmf to or Ie*m tbul Mu. ad p i. q A
to or lam than the larger of ML aad Mu, “’=~
or both am “’’”’A’*
aesativ~ tbeo ‘*’
* lot%::%
the lot meat. tbe ●ecepbility criterk m..t tbe acc.ptiifiiy criterb

—--- . .
 .

bn~14
11*2ES7

EXAMP= D-S

fsxanlpze of Cdcufat,ioms

DOEbh sp4c3d&az10a ZAm2t

varhbmfy XmOwm

Dm. AC3L Vahie for Seth Upper @ &w.r SpeeUiea320a 2AMA1 Combined

E.mtple The ●peclfie.d maximum ad mitdmnun yield 3,0311u[m cemd. steel rutimzN are
67.000 p. i and 58,000 psi, rucpceUvel y. A lot of 500 items is ●tbmitted for impec -
tloa. 3nop.ct30n &val ZV. aornd insPct3aa, W3UI AQL = 1.5% 1- to be ..4. T&
variability c is &o-n to be 3,000 psi. Frati ?abka A-2 ●nd D-> it i. seem fzut a
.unpl. of ●i.e 10 i. required. SuPpu. e the yi.ld point. of the ●ample specimens
● re:

6z, SOO; 60,500; 68.000; s9,000; 65.500;

6z.000; 61 ,000; 69.000: 58.000; 64.500;
●nd compliance with the ●cceptability criteriom is to b, determined.

Lb.
— lnIornutio. Needed V. I.e Obtaim.d Explanation,

1 Sample Size: n 10

?. Know. Variability: o 3,000

3 Sum of Meaaurem6ats: ZX 630,000

4 Sample Mean X: sXln 63, o0O 630,000/10

I 5 Factor, v 1.054 See Table D-3

6 Upper Specification Untie: U 67,000

7 Zmwer Specific=cion Limiti L 56,OOO

8 QuaIity Index: Qu = fU-X)V/. 1.41 (67,000-61,000)1.054/3,000

9 Quality Lufex: Z3L . (~- Z.).1. l.?b (63,000-58.000)1.054/3.000

10 Est. of Lot Percen: Def. Above U: pu 7.93% See Table D-5

..:
11 12tc. of &t PerccnI D*I. Below IA P& 1.92% See Table D-5

J2 TelaJ ~*t. P=r=e=t D-f- ~ ~~ P -

Pu + P~ 11.85% 7.93% + 3.92%

13 Max. A310w~ble Percent D.[.: M 3.63S Seo T*1c D-3

14 AcceotablI1tv C.ite rioa: cmn~r=

. .n .
pu + “pL with M 11.85% > 3.63% See Para. D13.4

The 3ot doe ● not met the ●ccepzcbiflty criterion. da.. p = pu + PL io sreater than ~

97

------ .. . -—
um=slv-414
11 Jnne 19S7

EXAMPLK D-4

Exampte of Cafcutatimu

ml= sp0dfka3A9n ZAmtt

V.rkatduty KaOwt!

Difiere.t AQL. Vti.ss for Upp.r & lmwer SpeeUicDtinm ZAmlt.

The .pecified maximum and minintum yield p0&39 for cer3mim oteel ca.tl~o ● re
67.000 psi -d 58,000 psi. reapectivdy. A lot d S00 item, is submitted for inspee-
UO.. znspctko. *CI IV, uarnuf knspctinn with ML = 1%. for the uPP8r aad
AOZ. . 2.5% for the lower tipecificuiom lkmit im m. be u..d. The vari.bilicy . is
kcuaw. m be 3.000 pi. Frern Table. A-Z ●d D.> it i. .... that ● .unple cd ais.
11 c~rre. poridir..g to the s.rnple .ise code letter, 1, ●nd the AQL value Of 2.S% i.
required. S.ppc.. e the yield Pc.itis d the ●mple specimen- ● re:

6Z.500; 60.500: 64.000; 59,000; 65.500:

6Z.000; 61.000; 60.631; 68.000; 62.000; 63,000
and cmnplisnce with the ●cceptability criteria 1. to be determined.

Lime Information Needed Value Obtained Expl-ation

—
I Sample Size-: n 11
~ Kn~wn Variability: o 3,000

3 Sum .f Me... rernen:.: Ix 67.9,131

4 .%rnple Mean X: XXIC. 61,64.9 678.131/11

5, Factc. r: v 1.049 See Table D-3

6 UPPe r Specific atiort Lirnic u 67,000

7 faw. r Speci[ieatiea Limit: L 58,000

8 Quslity Index au = (u-X)v/. 1.07 (67,000-61,648)1.049/3,000

9 Ou-lity htdex: QL = (X- L)*/a 1.28 (61.648 -SB.000)l.0491J. oOO

10 3.07% See Table D-5

=.~ ‘f ‘t ‘“’cent Def” -’e u: Pu
11 E.1. of bt Percent Def. Selow b pL 10.01% See T-ble D-5

17. T.atal Cat. Percent Del. h bt: p = pu +

Pz. 13.10% 3.07% + 10.03%

11 Mu. Allowabi. Pe r..mt Del. Abo.e U: 2.59% Se. Tabl. D-3

%
14 - A31.wable Pe rcest De[. B=lmu k s.60% See Table D-3
‘L
15 Acceptabilit~ Criteriw (al Compare PLI 3.07s ~ 2.59s see Par*.
with Mu - DIZ..Z. Z(7)(a)
(b] Compare PI. 10.05% > 5.60% see Para.
with ML 1312.Z, Z(7)lb)
(c) Cemoare 0 13.10% >5.609 s.. P.**.
with “ML D12. Z. Z17)(C)

The 10: dins. not meet the mccep~bUity crIterl.. .tnce 15(a), (b) - (c) ● re Dot ●*-
fied; i.e.. pu ●64U. pL > Mb ●nd p wM~

08

,:
-. -.. .—
 ..— —,. ..—. .—.

TABLE D-fl;
Matter Table for Normti ●nd Tightened Ioapectlon ~or Plain Bamadon Known Vtriabllity
(Doubla 5pec{flcatlon Llmlt and Form Z-Single Specification Llmlt]

ImpI* -I*E
ode letter
—.

I r

1
a
J

P
,.
Q

I J!LJ__
l!
IJ
AU AQ L id tabl~ who ● m In pmcaat defective.
1 ● firm sunpllq plan balow arrow. that Id, bath mmpsa 01*4 as well as M valua. When ●ample ●Is* equdo or ●xe*sd* lot
I:la., @v*r, ‘Mm ,. tba 10, rnu,tb. SrIlpocied.

I
 ... ,.

TABLE D-3-Con(lnued
MmIar Tcble for Normal and TI$ht~ned hmpectlon for Plma Baaed on Known VarlabIllty
(Doubl. Specllic8tl.m Umit -nd 5’orm Z-Single Speci[icztlm Limit)

Acceptable Quality Level# [normal In#pectio,

mpl* 01:
1.00 “ 1.s0 2.50 4.00 6,50 10.00 I 13,00
oda ldtt 1
m M v m Mv n he v n M v n M v n 64 v m M v

B
v v v v v v ~
c 1 .?.13 1.414 ?. 3.90 1.414
T ?. 6.11 1.414 6 9.27 1.414 3 {1.14 1.ZZ5 3 Z4.2Z 1.225 4 33.67 1.15s

D t Z.23 1.414 2 3 1.56 1.225 3 10.79 1..?Z5 3 15.60 1.ZZ5 4 22.91 1.IJ5 4 31.01 1.155

E 3 2.76 1.U5 1 4 6.99 1.155 4 9.97 1.155 5 15,21 1.118 5 Zo.ao 1,118 6 28.64 1.095

r 4 2.s8 1.155 4 5 6.05 1.110 5 B.9Z l.lia 6 13,s9 1,095 7 19.46 1.080’ f5 2b.b4 1.0b9
*
G b 2.s7 1.093 6 1.77 1.095 7 5,83 1.080 B 8.62 1.069 9 12.88 1.061 11 I 7.88 1.049 12 24.88 I .04s

54 1 2.’bZ 1.000 s }.b@ 1.069 9 5.68 1.061 10 8.43 1.054 12 12.35 1.04s 14 17.36 1,038 16 23.96 1.033

1 9 2.s9 1.061 10 ),63 1.054 II 5,60 1.049 13 e.13 1.041 15 12.04 1.03s 17 17.03 1,031 20 23,43 1,026

J I 2.51 1.049 Iz 3.61 1.045 13 5.50 1.041 15 8,13 1.035 la I l,n8 1.029 21 16.71 1.025 24 23,13 1.022

K z 2.49 1.045 14 3.43 1.038 1$ 5.34 1.035 18 1.72 1,029 20 11.57 1.o26 Z4 16.23 1.022 21 u;i) 1.019

L 4 2.51 1.038 1! 1.54 1.03s 18 5,29 1.0,?9 Zo 7.80 l.OZb z] 11.5b 1.023 Z1 16.z7 1.019 31 Z2,51 1,011
— —
M 1 2.3s 1.031 19 3.2$ 1,027 z?. 4.98 1.024 25 7.34 1.021 39 10.93 1.018 3~ 1S.61 1.016 30 21.77 1.013

N s 2.19 1.02! 2a 3.0! 1.OIE 32 4.68 1.016 36 6.9S 1.014 42 I,).40 1.012 49 14.81 1.010 56 20,90 1.009

o 3 2.12 1.o16 31 2.9~ 1.014 42 4.s5 1,012 48 6.75 1.011 5s 10.17 1.Ooq 64 14.s8 1<008 ?5 20.48 1.001

P 9 7..00 1.010 54 2,s2 I.ooq 61 4.35 1.008 70 6,48 I .007 82 9.76 1,006 95 14.09 1.00s [11 19.90 1.00s

Q 5 2.00 1.008 11 ‘1.82 1.007 81 4.34 1.006 93 6.46 1.00s 109 9.73 1.003 I Z7 14.02 I ,004 I 47 19.84 1.003

1.50 2.50 4.00 6.50 10.00 15.00

I I I I I I
Accepluble Qu4Zlty Zmvela (tichtened 10spQcll.onl

A33ML hd tabla vaheo ●rt 18 percmt defective.

,~c::it sampling plan bet.- .rrc$w, that f., both .unp,e ct.. . . well .S M WIZ.. When *ample ●IS6 Cqualc or •xceod~ lot
v-ry item In the 101muot bs hmpecled.
 . .. ——. —

TABLE D-4
Matter Table for Reduced Znopectlonfar Plan@ Based on Known Varhbllliy
fDmhlo Specillcmion Limit and Form 2–Single Specllicatl.m Limit)

Acceptable (lualhy Levels

mph Dim
.04 I .065 [ .10 I .1s I .25 I .40 I .&<
ode letter

2(

1!

AU AOL Ad Iabh VdUCi i?o in PO?CQ84dafactlvc.

I US* flrol mmPlkIs Plan hlOW ●rrow, that I*, both mnv.le slsa ●s well ●s M vahie. When mmplo tlse ●quala o? azewdc lot
{DISC, ●T*?F Itim k~ha lot mutt ba inspected,
k
 .-. . .

TABLE D-4-Continued
.Mmter Tsb2e for Redue.d Zn*p.ctl.n lor PlarM Bated on Known Vsrisbllity
(Doub18 Specillcmtion Umit and Form Z-Single Specl{~cItiOn Umit]

ACCI
Ssmplo BI*9 1.06 1.50 2,50
cod- lqtt@r
n M v a M v n M “ II

B
~.

1
D

12
v v T t
k 1 3.90 1.414 1 6.11 1.414 2 9.27 1.414 J 17.74 1.Z?.5 3 1.Z25 i 4 IJ.67 1.225

G 2 3.00 1.414 3 7.5b 1.225 3 10.79 1.2z5 ) 15.bO 1.ZZ3 4 lZ.91 1.155 4 )l.O1 1.155

1
3

4
3.85

1.87
1.ZZ5

1.15s
4

5
6.99

6.05
1.1s5

1.118
4

5
9.97

8.92
1.155

1.118
5

6
15.Z1

11.89
F
1.118

1.095
5

?
ZO.80 ).11.3

19.46 1.080
6

8
28.64

zi.b4
1.095

1.069

J 4 3.81 1.155 $ 6.05 1.118 5 .9.92 1.116b 13..59 1,095 7 I 19.46 1.080 8 t4.64 1.0$9

K b 5.77 1.095 1 5.0) 1.080 8 8.62 1.069 9 12.88 1.061 11 17.88 1.049 1z 24.08 1.045

L,

M
a

8
l.be

3.68
1.0699

1.0699
5.68

5.b8
1.061

1.061
10

10
8.43

8.43
1.054

1.05i
Iz

IZ
IZ.35

12.35
T
1.045 14

1,045 14
17.lb

17.36

17,05
1.o38

1.038
16

16
z3.96

Z3.96
1.033

1.033

N 10 3.63 1.05 4 11 5.6o 1.04 9 13 8.13 1.041 15 12.04 1,035 17 1.031 Zo 23.43 1.026

0 1z L61 1.04 s 13 5.58 1.04 1 15 8.13 1.035 “18 11..58 1,029 z! 16.71 1.0,?$ Z4 23.13
+ 1.022

P 19 3.26 1.02 7 22 4.98 1.02 4 7.5 7.34 I.oz 1 .?9 10.93 1,018 31 1S.61 1.016 M 21.77 1,013

0 28 3.05 1.01 8 32 4.68 1.01 6 36 6.95 1.014 4Z 10.40 I.olz 49 14.81 I.O1O 56 ?.0.90 1.009
— i i
. —— –-— ——-
—— __
.

TABLE D-5
TabIc for CotlmstInS the lat Percentage Defective for Plans Bared on tiowa Varllbilityl

1
 Part Ill

ESTIMATION OF PROCESS AVDLAOE A34D CRfTER3A ~31

REDuCED AND TIGNTENW 1NSPECTION

D 13. ~:S#fATfON OF PROCESS AVER- !. with Q or QL 4 the corr. spondin~ .mti-

muted Y et perce,att defective Pu 0. P L. ?*-
spectively, is read from #he ~bIe. The
Th. ● ve rage percent defecti*e. baoed e.tinuted proces. ●verage pu i. the arith-
UPOn A 8r0.P 0[ 10U ●tbmitmd for or~imal metic m-u. of the Itidi.idual e.timated lot
in. pecticm, i. called Sbc proceaa average. percent defective. Pu’ ●. Sinaihrly. the e.ti -
OrlgirIal inspection is the fir-t Inope.tion Of nuted procems average p is the arithmetic
● prticular quantity 01 product .ubmitted me- of tbeiadividdemt~atcd lot percemt
[or .eceptahslity ● . di.tfngui.hed from the de fect%ve. PL’..
in. pectian of product which ba. b=cm re. ub -
rnirted after prior rajectimm. Th. procea. D13. Z.Z Double Specification lAmit. Tbe
●.eragc shall be ..tinuted frc. rn tbe re. ult. e.cim.ced lot percent dciectzve ●hall be .de-
of i.. pe. tion of wampl. mdrawn from . ●pee- termim.d from Table D-5 for the pluI. bm. ed
ifi.d murnber of preceding lot. for the pur- on variability b.swa. The quality Indic.s
pose of decermis.img severity cd inspection 0 and QL shall b. computed. Table D-5 i-
during lhe tour. e of ● contract in accordance enY ered separately with QU and OL ad- the
with paragraph D14. J. Any Iot. .htil be in- carre.pomding pu snd pLare read frOm the
cluded OUZY once io e.timatitig tbe proce. a fable. The e.timtied ict percemt defective
average. The estimate of the prec... ● ver - is p = pU + pL. The e.tirnat.d pro . . . . a.er -
●t?. is designated by $u what computed with ●ge p i. th= ●rithmetic rn.a.mof the individual
r.. pect to ● n upper ●pecific.tion limit, by =atimsced lot percent defective. p’..
PL wb=n cOmp~t=d rnth r=~p=ct tO ● 10w=r
specification Iirnit, and by p when cmnput=d D13. Z.3 Special Case. U the quazity index
with re. pect W. a dc.uble .pecificaciOm Iimit. 0,, or Q, ,s a nt~atm.e number. them Table
DY5 i..~~ter=d by-di. regarding the negative
si~n. However. io thi. case the e.timated iot
D13.1 Abtmrrr,a) Remult,. Th. re. ult. 0[
P. TC.nt defective ●bove the upper limit or
irmpectior. of product manufactured umdcr below the Jow.r limit i* obtained by ●ubtract -
1, conditions not typical cd tmual production.
~~~~ Per==at=ge found in the table from
shall be excluded from the estitrmted pre -
cemm’ average.
AL TXGZiTENED, AND RE-
D1 3.2 Ccmputatiem d the Esf.inuted prc-
ce. a Avers e. Th ● e.tmuted proce.. aver-
‘“ %%%dWPECITC)N
●ge M the ●r~thrnetic mean of tbe estimated This S$azidard e.tabli. ha. wampling
10t pe rcem def ●ctive computed from the pl*rsh for normal, tightened, and reduced
.unpling itt*pecti.ma re.. tit. of the preceding i-peetioa.
tea (10) low or S* may be .alhenvi. e d.miS -
❑ated. In order to estimate the lot percerat D14. 1 At Start of Inspection. Normal in-
dsf.cti.e, the quality kdicem Ou &\.ar QL .pectiom SW b. wed ● t the ●tart of inapec.
●lmfl be computed for each lot. Theme ● re: UOa IU13C.*Secberwim de#$gm4ted.
(3u . (U-X)WI. and QL = (X- LWIO. (S8.
paragraph D] I. Z.) D14.Z OuriaS fn.xctiou During the co.r ● e
of In9puctia, -rmal uumction shall be
used when taapeecio. cmaditioo. ● re much
D13.?.. I SiI@. Sp.cifieatlon Z.lml% 6 The tbt t6sht.nod O. redncad iaapection is not
estimated 1ot percent dof ecu-e ●bal-1 b de- rqufred fn accordance with prmS.aphs
Cennined frarn Table D. 5 ter the plum hawed D14.3 and D14.4.
O. bnowa varbbi3ity. Tbe q-am3ityiadex Q“
hall be us.d far tbe ea.. of aocJppr .pec - D1 4.3 Tight=imd 31Wpecttoa. Tiuhtermd tn-
iiic.tiom limit c,r QLlor the c.. e of a 10X. Spectltl. .W1 be in. ututed wb. n the emti -
●pecifi..ticm limit. Table D-5 ii entered naat.d proce. m ●verage computed from’<he
6Wbem Form ~_~l.s~di=utia d.tmit ti a-cd (0? Czu ue*ptabi3~ty crltariO=, ~h= a~ti-
rnste Of lot defective pzz or pL i. ❑ m ebtaiaed,
percent 10 order to emtinmte the procems
●veraga, it ia aecea.~y to eornpiete paragraphs D6. Z d D6. S af hrm 2.
‘ra, .m~e. ifQ . -.50and O = 1.60,thenpu = 100IL - 30.854% = 69. J46%. pL = %4g%
~ P “ 69.146% + &S . 74.6z6&.

..-— ----
 MUAID-414
11 Jftfld 10s7
!’
prece4iag [e. (1OJ Iot# (.r much other smm- Iesm than the ●pplicable loumr limit cbown
ber of lma demig=atedl in ●ccordmce with i- Table D-7.
paragraph D1 3.2 i. greaur thaa the AQL.
and when more thao ● certAn number T Of Caufitiom c. Pr0dmct50n is ● t ●
these 10ta ‘have ●stimmen of the percent ●tcD4y rak.
deiective exceeding ctaeADL. Tb* T-value. Nonnsf impecthm *baff be retostate4 U my
are SiWeaI in Table D-b when tbe pr.acua one of tbe foIlowing eondftiom occurm tiad~r
average is computed from 5, 10. or 15 lots. 8 redueed tic wctlon:
Normal inspection still be reimtmted if the
.stinnted pro . . . . ..erage of Iota under Condition D. A Iot-ic rejected.
tightemed iiwpectio. i, equaf tc.c.,lem. than
the AQ L. fkradiiinm E. The estiunkd plwJce~-
. ..erage i. ~re.ter tbn the AQL.
D14.4 Reduced fnsp=ctior.. Reduce4 b- Comditiom F. P.oductiom be=om.a
cpectien may be instituted provided that all irregular or delay=d.
of the following cOndiliOn. ● re ■atisf ied:
COtisti.n G. Dthe r ccmditiom u
Condition A. The preceding tea (10) may wtarrwt that normti inspection should
lc.ts (or such other mmnberoflots designated) be reinstated.
have be.- under r.c.rrnsl i.. pecti.m -d no.e
has been rejected. D1 4.5 Sarnplin~ Plans for Tightened or Re-
duced k,C.~=CtLOIl. S~PIIDS Pl~S fOr *lghl -
Condition B. The e.linuted percent e~ed and reduced inspection ● re provided in
defective for ●ach of these preceding lots is Section D, Parts I and 11

I
10s

..
I

TABLE D-U

v.iu. mof T for Ti+t.oed k+spsctbon

—
i.e Nu13160r

7F
Sample size Acceptable OustIty tavels (in percent deft!, —
code letter .J-t .065 .10 .15 .25 .40 .65 1.0 1.5 2.5 ●-o ,.5 10.0 15.0 of bm
—

B . . . ● ● . . ● ● ● ● ● ● *

D
●

●
.

●
●

●
●

.
.

2
.

3
●

3
4
b

3
3
5
6

3
3
5
6

:
3
5
7

4
6
a

4
:
7

4
b
9

4
—
4
7
9

4
7
9

4
w
E . ● . ● 4 4 5 6 : 6 7 7
5 6 7 7 8 9 9 10

3 3 3 4 4 4 4 4
F . . . 6 6 6 7
: : : 8 8 8 ; 9

3 3 3 3 4 4 4 4 4 4 4 445
G 4 4 5 5 : 6 6 ‘1 7 7 7 7 88 10
b 6 7 7 7 8 8 ,9 9 10 la 10 11 11 15
—
3 3 3 3 4 4 4 4 4 4 4 445
H 5 5 b 6 6 2 7 7 7 7 7 8 88 10
b 7 7 8 a 9 9 9 10 10 10 11 -++-
II 11 15
—
3 4 4 4 4 4 4 4 4 4 4 4 445
1 5 6 b 6
b 6 7 7 7 7 7 7 8 88 10
7 a 8 8 9 99 9 I.101 10110 11 11 11 15

u
!
4 4 4 444444 4
J : b b b : 77 8
8 a 181819119101 :1:1: 11
—
4 4 445
K : b a en 10
8 8 9 9 9 9 10 10 10 10 II 11 11 11 1s
—
4 4 4 4 4 4 4 4 44 4 445

-l-J--
L b 6 6 7 7 7 7 7 ; 88 8 88 10
a q 99 9 9 10 10 10 10 11 11 11 11 11 15
I I I —
44d t 4 4 4 4 4 4 4 4 4 44=
7 8 a
1: 9 1: 1: 1: 1: 1: 1! l.: 11
—
4 445

+E
a 88 10
II 11 11 Is

4 44’5
8 8 8 10’
11 .11 11 15
—
.There are no .antplimg plMM provided in this Standard fer these code letters 8nd AOL.a3nOS.

I&

—
 hfnATD-414
11 June 1951

TABLE D4-CmtJmd v ●riab.bMc7 ~

VAM., of T for Tl@umd f519~Cti00

Sample ●L. Accepmkle Ouatlty Lavelo (in PC rcemt ttefe

code letter .04 .065 .10 .15 .25 .40 .b5 I .0 1.5 2.5 4.0

4 4 .4 4 4 4 4 4 4 4 4
P 7 7 1 7
10 10 10 10 If< 1: i! 17 1: J: 1:

4 4 4“ 4 4 4 4 .4 4 .4 4 4445
Q 1 7 8 s 8 s 8 888 10
10 10 lJ 11 11 11 11 1: 1: 1; 1: 11 11 11 15

I The top rigure in cacb block refer. to tbe precedi~ 5 lot., the rniddlc figure m the
preceding 10 lot. ●nd the bottom figure to the precedi~~ 15 lots.

Tightemed i.. pectiom i. rquir.d wbem the aurnber af lotm with .stirn.tea of percent
defective ●bove the AQL from the preceding 5, 10, or 15 Iotm i. greater thaa the Eiven value
Of T iu tbe t.ble, and the proceos ●verage from th.. e lat. e=c=ed. th= AOL.

N] estinutea of the lot p.rcemt de fectiws ● re Obtaimed from Table D-5.

107
 TABLE D.7 V. fIablllI~ Known ~~
Llmlto o{ Estimated Lot PerceIII D. f.c!Ivr ior Reduced Inspection *r

Sample size Acceptable C1. &litv Levels

*
code letter .04 .065 ,10 ,15 ,,?5 ,40 .b5 1.0 15.0
—

● * . ● ● . ● . . *
35
J
.011 .021 1.714 5
c ● * * ● ● ● ● .109 .2, ?2 14.z91 10
,209 .558 ! I 5.00 Is

.003 .011 .027 .369 .769 1.645 4.386

D ● * ● ● ● ● .050 .109 .222 I,Z48 Z.354 4.496 8.049
.144 .290 .558 2.145 3.850 6.50 10.00 I 5.00 1$
I I
.001 .002 .045 .086 ,16b .631 1.225 z.q37 5.154 9.419 5
E ● * ● * .009 .021 .197 .)57 .62Z 1.64J 2.9z4 5.69? 9.330 15.00
.029 .064 .384 .669 1.124 2.50 4.00 6.50 I 0,00 A

.005 .010 .021 .09n .178 .311 .046 1.560 1.3Z5 6.114 10.436 5
~ ● 4 * .025 ,052 .100 .309 1.880 3.250 5.958
I J- .5Z8 .874 9.806 15.00- 10
.056 .110 .204 .5.22 .867 1.194 2.50 4.00 6.50 10.00 b 1$

.001 .001 007 .013 .0Z6 .078 .147 .Jz Z .53J 1.1)6 t.166 4.o45 1.093 11.470 5
G .004 .008 027 .049 .093 .Z17. .385 .718 I,IJ9 Z.141 3.698 6.342 10.00 15.00 10
: .010 .01.9 055 .090 .167 .347 .6OZ .00 1.50 2.50 4.00 6.50 J A IS

53”
.002
.009
.004
.017
l-l .-1-
013
041
.02.?
.0b7
,057
.147
.103
.252
,ZZ3
.418
.375
,773
.677
1.Z70
1.326
z.Z17
Z.40J
3.8JI
4,453
6.5o
7.s02
10.00
12.054
I 5.00
5
10
.018 .033 071 .114 .227 .382 .65 ,.00 1.s0 2.50
% 4.00 A A & Is

.004 .011 018 .030 .070 .142 .252 .451 .718 1.461 Z,643 4.719 1,786 12.427 5
1.346 J.94z 6.5o
I .014
.025
.011
.051
0s1
082
.081
.129
,164
.244
—
.298
.40
—
.508
.65
.847
,.00
.
1.50
Z.J59
2.50 4.00 A
10.00
i
-L
15.00
~ [’015

.006 .011 OZJ .038 .08Z .15.9 .298 .316 .85J 1.562 2.758 4.909 8.05s 12,693 5
J .016 .011 0s8 .092 ,177 .J13 .549, .892 1.J94 2.412 3.987 b.50 10.00 15.00 10’
.030 .051 090 .140 .2s .40 .b5 1.00 1.50 2.50 4.00 A a A 15
— —
.008 .014 ,028 .051 ,09 I .171 .3!7 .540 .910 1.641 2.89! 5.009 8.205 12.848 5
2( .021
.033
.036
.056
,064
,09b
+
.10’9
.1S
.18B
.25
.JZ6
.40
.564
.b5
.908
1.00
1.4z7
1.50
2.449
2.50
TF
,4.00
1
A
1
6.50
A
1
10.00
A
15.00
A
10
1$

I ●There ● re no aampllng plant provided in lhh Standard far lhe. e :ode letter, and AQL va5ue#.
4
 _—— .

TABLE D-7-Conllnued V~rIabIllty Knows

Llmlto of thtimited Lat Percent Defective lor Reduced fnnpectim
., .-. . .
we u“alftv La C19 Numb-r
“X .40 2.5 4.0 6.S 10.0 1 .0 of I/As
—
.107 .191 .348 .501 .934 1.732 z.96Q 5.131 8.3Z8 13,017 5
,203 .344 .586 .934 1.440 Z.406 4.00 b.io ko.oo I+5.03 10
.Z5 .40 .65 I ,00 1.50 2.50 b A h 1115
—
.120
.Z14
.211
.557
.383
.608
.6zl
T
.959
---1- I,o1O
1.415
1.821
2.50
3.093
4.00
5.310
6.50
8.516
10.00
13-238
I S.00
5
10
.Z5 .40 .65 I .00
I 1.50 ha, A A 15

N
.017 .030 .049 .080 .146
.03Z ,054 ,086 .134 .232
.Z51
.38Z
.435
.635
.705
.994
-1_
1.113
1.50
1,959
T
2.50
3.Z7Z
4,00
5.546
6,5o
8.0z2
10.00
13.588
15.00 -
s
3u-
.04 .06S .10 .15 ?.25 .40 .b5 1.00 i A A * A 1 15
-1- —
.(41 .277. 13.801 5
.241 .392. I 5.00 10
.2s .40 & 15

.1s0 .299 14.034 5

5 .249 .41Z‘ I S,oo 10
.25 b & 14
*
.191 .316 14.173 5
,.
1
.25

*
h
.40
b

All A(3L ●nd tsble vduec ~r; In percent defective.

m 15.00
A
10
15

bUmethe flrot fl#ure In dlrectlon of arrow and correepondin~ number of 10M. In each block the top (Igura reform to the
precedlm[ 5 lott. the middle figure to the preceding IO lots. and Ihe bottom figure 10 the preceding 15 lots.

Rw!uc813 impectkon may b- tnalituled when every emtlmaled lot percent defective from the preceding 5, 10, or 15 lot- in
bdow the flsure glvon In the table. fn addition, III c.ther conditiom for reduced impection, In Part 323of Sectloa D, must bc
dtiltfled.

AN entknmteoof the lot percent defective ● re Obtained lrom ‘Table D-5.

=H

II
baL-sTD-414
11 June 1957

APPENDIX D

Defhiflmu

Sz@!s!! Read Def intt.io.s

n Sunple site for + ●ingle lot.

x X bar S-pie rnemn. Arithmetic mean of ● unple rneawaremento from

8 tingle lot.

. Sigma fbowa variability. The predetermined variability of the quaf -

ify cbaract.ristic which vill be u.ed rntb the .ariabifify bow.
●cceptabfltfy plus.

u Upper specification Iimtit.

1. Lawmr ■pectficatian limit.

k The .ceeptabi3ity constant givem in Table. D. 1 and D-z.

v A factor tw.d in determining the quality indices when ua ing

the bnowLI variability acceptability plan, The v vafues., ● re
giv== in T~b10. D-3 -d D-4.
Q“ Q ,ub U Quality Index for use with Table D-5.

QL O .ub L C3uality Index for use with Table D-5.

m p sub U Sample estinute 0[ the Iot percent defective ●bove U front

.Table D-5.

p ●ub 1. Sample escinute of the lot percent @ef.ctive below L fr.am

PL Table D-5.

P Total ●unple emfirnsfe .af tbe 101percent defective p = p“ + PL.

M“ Maxdmum dfowable percent defective lor sample eatimatea

given in T@bles D-3 and D-4.

Mu M ●.b u Maxfmum allowable percent defective ●bove U ~ivem h Table.

D-3 and D-4. IForuce when different AQf- v81uec for W and
L ● re spactfjed. )

‘L M ●ub L Maximum ●llow.blcpercent defective below 1. @em ia Table.

D-3 and D-4. (For usawhen different Mf- value. for U =d
L ●re ●~edfted. )

P p bar Sunpfe ewtdnnte Of the procemw merceut defective, i. e., the

amfimated procema average.

P“ p bar ●ub U Tbe ●mfimuod pw..s. .Verq. [*. -n upper Spectficstlom unlit.

p bo ●ub L The estimated process average for a lower ●pecf3icatlon Umit.

‘L
T Tbe maximum number of emttnuted pr.xeoa ●verage- which
may exceed tbe AQL given in Table D-6. {For u.e indetnr -
=1- applic~t~a Of ti8bt=n=d i=~p=ctiOa. )
< Less than L.eom than.

> Greater tbM Greater than.

I SLunof

110

.—.—— .- ---- ----

I I

-.
,FOM d.m# thb lhn,

lFOM k-, Ih” It”. )

n
DEPARTMENT OF THE NAVY

111111 No PGE?AOe
wscE!EEAmv
1S UAILEO

UNITED
1947MC
STATU

OFFKIAL ●krJNE5
●ENALTV FOm ●RIv ATC USC E.100 BUSINE:SNOR~,P;~M,M,fi[&,
rlnsl CLAW
POSfAGE WILL BE PAID BY THE DEPARTMENT OF THE NAVY

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StandardizationlDocumen tatiop Divieion (Code 524
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I

,.

DDa??”1426
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