Professional Documents
Culture Documents
Symbol ! on equipment signifies that the manual contains information to prevent injury or equipment damage. Refer to page vi and to other manuals in set.
IEC417
Copyright GenRad, Inc. 1999. All rights reserved under copyright laws of the United States and other countries. The technical data included herein, excluding computer software documentation, is subject to the LIMITED RIGHTS as set forth in FAR 52.227-15 (JUN 1987) and DFARS 252.227-7015 (JUN 1995). All technical data and computer software documentation contained herein is proprietary and confidential to GenRad, Inc. or its licensor. All computer software documentation contained herein is Commercial Computer Software Documentation, proprietary to GenRad, Inc. or its licensor and furnished under limited license only. For solicitations issued by the United States, its agencies or instrumentalities (the Government) on or after December 1, 1995 and the Department of Defense (DoD) on or after September 29, 1995, the only rights provided in the Commercial Computer Software Documentation shall be those specified in a license customarily provided to the public by GenRad, Inc. in accordance with FAR 12.212 (a) and (b) (OCT 1995) or DFARS 227.7202-3 (a) (JUN 1995). For solicitations issued before December 1, 1995 by the Government (other than DoD) use, duplication or disclosure of the documentation shall be subject to the RESTRICTED RIGHTS as set forth in subparagraph (c) (1) and (2) of the commercial computer software restricted rights clause at FAR 52.227-19 (JUN 1987). For solicitations issued before September 29, 1995 by DoD: RESTRICTED RIGHTS LEGEND The use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c) (1) (ii) of the Rights in Technical Data and Computer Software clause at DFARS 252.227-7013 (OCT 1988).
Product names listed are trademarks of their respective manufacturers. Company names listed are trademarks or trade names of their respective companies.
The material in this manual is for informational purposes only and is subject to change, without notice. GenRad assumes no responsibility for any error or for consequential damages that may result from the use or misinterpretation of any of the procedures in this publication.
ii
GenRad
We at GenRad strive to achieve the highest possible customer satisfaction through innovative products and services, and continuous improvement of our product quality and support. To help us achieve our goal, we ask that you:
z z
Please fill out and return the Reader Comments card, located at the back of this manual, if you have any suggestions for structure or content improvements. Please document any product problems or enhancement requests on the GenRad System Performance Report forms, supplied with the equipment documentation, and return them to the GenRad Customer Care Center (CCC). The contact addresses are in the Preface of this manual.
Thank you for choosing GenRad as your integrated diagnostic solutions provider.
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Issue . . . . . . . . . . . . Original
Title . . . . . . . . . . . . . . . . . . . . . Original 11 through 115 . . . . . . . . . Original 21 through 220 . . . . . . . . . Original 31 through 336 . . . . . . . . . Original 41 through 410 . . . . . . . . . Original A1 through A3 . . . . . . . . . . Original Index1 through Index5 . . . Original
WARNINGS
z
Do not remove covers. Potentially lethal voltages are present inside the system. Observe all WARNING markings on the equipment and WARNING notices in the manual. If servicing is necessary, it should be performed only by a qualified person familiar with the electrical shock hazards present inside the system. Grounding circuit continuity is vital for safe operation of the equipment. Never operate equipment with grounding conductor disconnected. Safeguard your hands and fingers while handling any fixture or other accessory. Be sure it is securely supported if you reach under it. If it is heavy, you must have another person help to move it. The symbol ! on equipment signifies that the manual contains information to prevent injury or equipment damage. Observe and heed all WARNING notices in the manuals and the equipment. WARNINGS call attention to personnel safety information. Replace any fuse only with the same type and ratings as labeled on the equipment and/or listed in the manual.
IEC417
z z z
MISES EN GARDE
z
Ne pas enlever les couvercles. Les niveaux de tension se trouvant dans le systme sont extrmement dangereux. Respectez toutes les consignes de scurit figurant sur lquipement et les MISES EN GARDE donnes dan ce manuel. Seule une personne qualife, connaisant les risques de dcharge lectrique du systme, est autorise effecteur les oprations de nettoyage ou de rparation du systme. Le circuit doit tre mis la terre sans discontinuation pour garantir un fonctionnement sans danger de lquipement. Ne jamais faire fonctionner lquipement pendant que le raccord la terre est dconnect. Protgezvous les mains et les doigts pendant le maniement de tout dispositif de serrage ou autre accessoire. Assurezvous que ceuxci soient bien solidement fixs en place, avant de vous pencher sous eux. Si laccessoire en question est trop lourd, faitesvous aider pour le dplacer. Le symbole ! figurant sur lquipement signifie que le manuel contient des informations permettant dempcher les accidents ou lendommagement de lquipement. Respectez toutes les consignes de MISES EN GARDE donnes dans le manuel et figurant sur lquipement. Les MISES EN GARDE attirent lattention sur la ncessit de se protger. Ne remplacez les fusibles quavec des fusibles du mme type et de la mme valuer que ceux mentionns sur lquipement et figurant dans le manuel.
IEC417
z z
WARNHINWEISE
z
Abdeckungen nicht entfernen. Potentiell lebensgefhrliche Spannungsbedingungen innerhalb des Systems vorhanden. Alle auf der Einrichtung befindlichen WARNMARKIERUNGEN und im Handbuch enthaltenen WARNHINWEISE beachten. Wartungsarbeiten dem qualifizierten Personal berlassen, das mit den innerhalb des Systems vorhandenen Gefahren eines elektrischen Schlags vertraut ist. Die Erdung des Schaltungsdurchgangs ist eine Grundvoraussetzung fr den sicheren Betrieb der Einrichtung. Einrichtung niemals ohne Erdleiter betreiben. Hnde und Finger bei der Handhabung einer Spannvorrichtung oder eines anderen Zubehrteils schtzen. Sich vor der Plazierung der Hnde unterhalb der Einrichtung vergewissern, da die Einrichtung ber ausreichenden Halt verfgt. Falls die Einrichtung schwer ist, sich von einer anderen Person beim Tragen helfen lassen. Das auf der Einrichtung befindliche Symbol ! bedeutet, da das Handbuch Informationen zur Verhinderung von Krperverletzungen oder Sachschden enthlt. Alle in den Handbchern enthaltenen und auf der Einrichtung befindlichen WARNHINWEISE beachten und befolgen. WARNHINWEISE sollen auf Informationen zur persnlichen Sicherheit aufmerksam machen. Sicherungen nur durch Sicherungen des gleichen Typs und der gleichen Nennleistung ersetzen. Auf der Einrichtung befindliche Etiketten und im Handbuch enthaltene Informationen zu Rate ziehen.
IEC417
z z
vi
AVISOS
z
No remova as tampas. H voltagens potencialmente fatais presentes na parte interna do sistema. Observe todas as marcaes de AVISOS no equipamento e discries de AVISOS no manual. Se for necessrio fazer manuteno, esta deve ser feita somente por uma pessoa qualificada familiarizada com os perigos de choques eltricos presentes na parte interna do sistema. A continuidade do circuito de aterramento vital para a operao segura do equipamento. Nunca opere o equipamento com o cabo de aterramento desligado. Proteja as suas mos e dedos ao operar qualquer dispositivo ou outro acessrio. Certifiquese que ele esteja suportado com segurana se voc tiver que alcanar algo debaixo dele. Se for pesado, voc deve ter a ajuda de uma outra pessoa para movlo. O simbolo ! no equipamento significa que o manual contm informaes para prevenir ferimentos ou danos ao equipamento. Observe e preste ateno a todos os AVISOS nos manuais e no equipamento. Os AVISOS chamam a ateno a informaes sobre a segurana pessoal. Substitua qualquer fusivel somente com um do mesmo tipo e da mesma capacidade nominal como marcado no equipamento e listado no manual.
IEC417
z z
ADVERTENCIAS
z
No quitar las tapas. En el interno del sistema hay voltajes potencialmente mortales. Obsrvense todos los rtulos de ADVERTENCIA presentes en el equipo, as como la descripcin de las notas de ADVERTENCIA presentadas en el manual. De ser necesario, el servicio de mantenimiento deber ser efectuado nicamente por personal calificado que est familiarizado con los peligros de choque elctrico presentes en el sistema. La continuidad del circuito de puesta a tierra es de vital importancia para el functionamiento seguro del equipo. Nunca se debe usar el equipo con el conductor de puesta a tierra desconectado. Protjanse las manos y los dedos toda vez que sea necesario manipular un dispositivo u accesorio. Cerciorarse de que el mismo est firmemente sujetado antes de proceder a trabajar debajo de l. Si el aparato u accesorio fuera pesado, pedir la ayuda de otra persona para moverlo. El simbolo ! que aparece en el equipo significa que el manual contiene informaciones para evitar lesiones personales o daos al equipo. Obsrvense y prstese atencin a toda las notas de ADVERTENCIA presentes en los manuales y en el equipo. Las ADVERTENCIAS sirven para llamar la atencin sobre informaciones de seguridad para el personal. Reemplazar los fusibles nicamente con otros del mismo tipo y capacidad, segn lo indique el rtulo en el equipo y la descripcin en el manual.
IEC417
z z
vii
CAUTIONS
z
Observe and heed all CAUTION notices in the manuals and on the equipment. CAUTIONS call attention to information about safeguarding equipment from damage.
viii
Contents
Preface
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Audience . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . About this Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Related GenRad Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Document Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GenRad Customer Care Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xiii xiii xiv xv xvi xvii
Overview
GR228X System Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Basic System Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . System Activities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . In-Circuit Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Functional Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . System Test Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Board Continuity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Analog Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Digital Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Hybrid Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing Boundary Scan Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Test Fixtures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . In-Circuit Test Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Functional Test Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2 1-3 1-4 1-4 1-6 1-7 1-8 1-11 1-11 1-12 1-13 1-14 1-15 1-15 1-15
ix
Contents
Generating a Plot . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Test Execution Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Standard Test Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PinPoint Guided Probe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TEST XPRESS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Panel Test, Split Fixturing, and Serial Numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Test Analysis Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Real Time Data Collection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Data Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Off-line Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ATG Xpress . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TRACS III . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GRXpert . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Migrating from One Test System to Another . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3-27 3-27 3-27 3-29 3-29 3-31 3-31 3-31 3-34 3-35 3-35 3-35 3-35 3-36
Index
xi
Preface
Overview
This manual introduces you to the GR228X Test Systems by providing you with a brief description of the: z GR228X Test System architecture. z Standard and optional hardware available for each GR228X Test System. z Software that is available to help you develop test programs, and which manual in the GR228X Documentation Set provides detailed information. z Windows NT-based system environment.
Audience
This manual will benefit: z Network Manager or Administrator z System Manager or Administrator z Test Engineer z Field Service Personnel z Site Manager z Test Programmer z Operator
xiii
For information about The general GR228X Systems architecture, testing strategies, devices tested, and test fixtures The standard and optional hardware that is available on your GR228X System and some basic information about power supplies The test development process and the software tools available for the GR228X Systems The Windows NT system environment, test editors, user interfaces, and how to get help Where to find information about a task in the documentation set; where to find 3rd Party (nonGenRad) documentation information
xiv
Preface
xv
Document Conventions
The following document conventions are used throughout the documentation set. Convention Bold monospace text Bold text Courier text Italic monospace text Italic text P/N or PN [text, text] {text, text} CAUTION Example Indicates command text that you enter commands, keys, buttons, prompts, menu options, icons, and literals within text command, syntax, or error message replace the term with a valid entry manual title, chapter title, or section title part number field within the brackets is optional select one or more choices within the braces potential harm to the system or equipment as a result of this action the beginning of an example
End Example the end of an example NOTE NEXT specialized information that may benefit you informational options that direct you to the next chapter or step potential harm to you as a result of this action
WARNING
xvi
Preface
Fax
Email Mail
xvii
Overview
The GR228X Test Systems, hereafter referred to as the GR228X systems, are a family of PC-controlled combinational test systems. The systems are designed to perform rapid electrical testing of printed circuit boards with high diagnostic accuracy. The GR228X systems run on a Windows NT-based software platform and are configurable to meet the hardware and software requirements of the target application. Your GR228X systems primary purpose is to execute in-circuit tests on electrically-isolated components of a unitundertest (UUT). Such components include analog IC, digital IC, hybrid IC, and memory components. NOTE The GR2281A and GR2287A Test Systems do not have digital test vector capabilities, but can detect opens on digital components using the TEST XPRESS software.
A GR228X system is particularly effective at detecting manufacturing faults, such as: z Shorts and opens within components or on board etches z Missing, wrong, damaged, or improperly inserted components z Out of tolerance and faulty components z Incorrectly programmed components and faulty memory devices z Functional faults on complete circuits This chapter provides an introduction to all Windows NT-based GR228X Test Systems, which include any VMS-based GR228X Test Systems that have been retrofitted with a Windows NT-based PC.
1-1
CDROM DRIVE
MOUSE
KEYBOARD
MODEM
DISKETTE DRIVE
42601.3
Figure 11
System Components
Tape Drive
Modem Processor
1-2
Overview
Description The source and measure instruments perform a variety of device tests. For example, by forcing a known voltage from the dc source and measuring the current, the software computes the value of dc resistance under test using Ohms Law (R=E/I). Provides an interface between the test instruments and the variety of boards that undergo tests. Fixtures, which are uniquely fabricated for each board design to be tested, are mounted to the test systems receiver. Through the fixture, the test system establishes electrical connections between the test instruments and individual components on the UUT.
The GR2281A and GR2287A Test Systems do not contain a digital subsystem.
ANALOG SUBSYSTEM PERSONAL COMPUTER MXI-TO-GENRAD (MTG) INTERFACE DIGITAL SUBSYSTEM RECEIVER UNIT UNDER TEST
Figure 12
1-3
System Activities
Figure 13 identifies activities that are needed to use the system effectively. The activities are grouped under four major functions.
System Management
Set Up System
Production Testing
Prepare Site Install Hardware Load Software Create User Accounts Set up System Set up Network
Use Window NT Operating System Customize Environment Choose an Editor Identify Test Program Development Process Build, Test, and Debug Test Fixture Develop Test Program Debug Test Program Release Test Program for Production Testing
Perform UUT Testing Routine Maintenance Collect and Analyze Test Data Run Verification Programs
Perform Preventative Maintenance Calibrate Instruments If Test System fails, Run Diagnostic Self Tests Remove and Replace Defective System Parts
31953.1
Figure 13
Testing Methods
There are two testing methods available for the GR228X systems; in-circuit and functional. Both methods can produce tests that identify a high percentage of all possible defects. Depending on the assembly stage, either the in-circuit or the functional testing method is easier to implement and provides the most useful information. In-circuit tests are usually performed at earlier and intermediate stages of assembly when it is most important to identify and correct component faults. While the in-circuit test does not provide direct information about how well a board functions, experience shows that most boards that pass an in-circuit test can also pass a thorough functional test. Therefore, even though the in-circuit test does not determine whether the whole board works correctly, it can indicate whether a board should continue through assembly or whether it has faults that need repair. Once it is established that all components are correctly inserted and are operational, boardlevel functional tests or quality control tests can be useful for verifying a boards overall performance. Functional tests are usually performed in the later stages of assembly when access is only available at the board edge.
1-4
Overview
A dedicated functional test system is often used for functional testing. Alternatively, you can move many of the functional tests to the GR228X Test System which has many of the necessary hybrid test capabilities built-in. The ICA systems contain instruments for testing groups of analog components, groups of ICs using the systems parallel Driver/Sensors, and groups of hybrid components using the AWG, DMM, and ACM in addition to the other instruments. Functional testing may require the addition of optional power supplies. The Hybrid Test Library (HTL) enables you to develop a library of functional tests that can be automatically generated. Functional testing enables you to collect additional test statistics using the systems data logging feature. In-circuit testing individually checks the performance of each component on the board with little or no operator probing. Occasionally a fault such as an open connection needs to be localized further. The GR228X systems offer a scratchprobing technique that can discriminate between a poor test probe contact, a bent IC pin that was not inserted correctly, or a broken track. Performing a combination of in-circuit and functional tests provides the most thorough fault coverage. The GR228X software and hardware are optimized for in-circuit component testing, therefore, the test development process focuses on in-circuit testing. GR228X systems can also perform clusters of functional tests using the same test fixture. By grouping the UUT into functional clusters, you can simplify test development and improve the diagnostic accuracy of failing cluster tests. Table 12 identifies and contrasts the major characteristics of functional and in-circuit testing. Table 12 Functional and In-Circuit Test Characteristics Characteristic What is tested How is it tested Functional (Board-Edge) Test Component inputs and outputs. Power is applied to the board. In-Circuit Test Component connections, values, and functions. Component-by-component; power is applied to UUT for digital and hybrid tests. Bed-of-nails fixture for each board design. Automatic Test Generator (ATG) writes the test using test libraries. The hybrid library can generate functional tests.
Board edge connector that may accept many boards. Can use an optional circuit simulator as a diagnostic aid to predict outputs and fault coverage. Test development requires a simulator library, and a programmer to write part of the test. It requires a longer test development cycle. Must contain complete transfer function or truth table for each digital device. Provided by guided operator probing; fault identification depends on adequate simulation. Excellent fault coverage, although both the test development and debug time are lengthy. Also, manufacturing faults may not be detected.
Contains analog, digital, and hybrid model tests, written for a variety of circuit environments. Probing is not required to obtain good fault identification. Excellent fault coverage with fast test development and debug time.
Fault coverage
1-5
In Circuit Testing
In-circuit testing methods are used to check for manufacturing faults. Manufacturing faults are defects in individual components and inter-connections on the board. To test components individually, connections from the test system to all functioning component pins is required. This is accomplished using a test fixture that mates with each of the boards circuit nodes and test methods that can effectively isolate a single component from the parts surrounding it. An in-circuit component test is often performed as the first or second test after a board has been assembled and soldered. It may be preceded by a separate bare board test to check for opens and shorts in the conductive tracks before parts are inserted. In-circuit tests generally fall into four test categories: z Connectivity tests that check for shorts and open connections on the board. z Analog tests that measure component values. z Digital tests that check the operation of digital integrated circuits. z Hybrid tests that check components that are a combination of analog and digital components. The System contains test hardware appropriate for each kind of test, but it must be connected to each part on the board individually before you can perform a test. Since components are tested individually, the system can usually localize a fault immediately and issue a report telling the operator or technician which part needs repair. Interactive faults that can cause the board to malfunction are generally overlooked, but such faults are rare on a welldesigned board. The in-circuit tests are generated by the Automatic Test Generation (ATG) software. Programmers who need to modify tests created by ATG or who need to write tests of their own should thoroughly understand these techniques and the criteria ATG uses in selecting various test methods. The most troublesome aspect of the in-circuit test is the assumption that you can test each component as if it were the only part on the board. Fairly complex test strategies are often required to analyze the components circuit environment and to isolate the component from the surrounding circuits. Since these test strategies involve only individual components and their immediate circuit connections, you can assemble libraries of standard test procedures and adapt them to the limited range of environments in which the components are found. Given an appropriately coded description of the circuit, the system software can write the entire board test by drawing tests for individual components from test libraries. VLSI devices are tested in a way that is, in principle, no more complex than the method used for simple components. The system does not need to know the entire truth table or transfer function of a digital device, since it does not analyze how signals move through the circuit. Instead, it only requires that the library contain a set of typical input and output patterns for each device that is used to test the device. For a simpler digital IC, these patterns are usually based on the devices truth tables, but for a larger device, they may consist of no more than a carefully chosen sample of the possible inputs and outputs. Bused ICs present a special class of challenges. Before full tests are performed on bused devices, all the devices on the bus are tristated, that is, put in a low current state to verify that the bus is free. If the bus test fails, the BUSBUST diagnostic technique can automatically identify the IC(s) causing the bus failure. Once the bus test passes, you can individually test the performance of each IC on the bus. All other devices on the bus are disabled or disconnected from the bus and the IC is tested as if it were the only device on the board. For an in-depth explanation of in-circuit testing strategies, refer to the GR228X Test Program Generation Manual.
1-6
Overview
Functional Testing
Functional circuit testing is often used to identify any faults that went undetected by in-circuit testing. A functional test is most important to the end user of a circuit board because it certifies that the board meets its performance specifications. To connect the unitundertest (UUT) to the test instruments, you must construct a fixture that mates easily with the board and provides reliable electrical connections. Usually, you only need to test the boards inputs and outputs, and the fixture needs to provide little more than the boards normal interface connectors. Therefore, the test fixture can be relatively simple and inexpensive to construct, which is especially attractive for lowvolume testing. Using a functional tester, it is often possible to test a variety of busoriented boards from an edge connector in a single fixture. With power applied to the board, a functional test checks that the board, or chosen sections of the board, produces the desired output response when various input stimuli are applied. Functional testing can also check that further stages of assembly have not damaged the board. When a board fails a functional test, the test cannot always identify the cause of the fault immediately since there can be any number of paths from the inputs to the outputs along which the fault might lie. As boards become more complex, the possible signal paths become much longer, and the simple information that a particular board output has failed becomes less useful in identifying the cause of the failure. After a board fails a functional test, a technician usually has to trace the fault from the output back to its origin. Since ATG does not generate functional test programs, you must write a test in the systems test language. The test you develop needs to apply an appropriate stimulus, a waveform or a bit pattern, at the boards inputs and measure the outputs to determine if the board or a group of components, such as a filter section, are functioning properly. When a sophisticated functional test is required, or if diagnostic information can be gained from the functional test, some proficiency in manual programming in the test language may be required. For functional testing, you can use software to adapt the output of simulator models to the GR228X test language to form digital models of function units. You can then use the PinPoint Guided Probe for testing a function unit. The guided probe provides an important capability for diagnosing functional faults. Refer to the PinPoint Guided Probe Users Guide for more information. The PinPoint Guided Probe is ideally suited for tracking digital functions. Using a probe connected to a signal tracer or logic analyzer, is not as efficient as using PinPoint Guided Probe. If the PinPoint Guided Probe capability is to aid in locating the fault, it must have a software model of the boards circuits available so that it can compute the possible signal paths and guide the operator to probable sources of the error. However, when you perform a functional test in conjunction with an in-circuit test, the in-circuit test is often sufficient to identify component faults that cause functional failures. To model a circuit, the simulator must be able to predict the state of each pin as a signal propagates from the inputs to the outputs. A complete truth table for each digital device on the board must be available so that for each input pattern that appears at an ICs inputs, it can find the resulting outputs and advance to the next devices. This has important consequences for functional testing of boards containing VLSI devices. For SSI and most MSI devices you can record the truth tables without difficulty; however, for some VLSI devices such as microprocessors, the truth tables comprise from 10,000 to several million test vectors. For these devices you must find other less thorough methods for simulation. In general, adequate software modeling of boards containing VLSI devices is a formidable and expensive task. For an explanation of functional testing strategies, refer to the GR228X Test Program Generation Manual.
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AWG
DMM ARITH [1] ACM ICA ACZ AFTM DCS MUX DCM RM [1] SVS SHORTS, OPENS, AND CONTACT [1] I488 (BUS OPT) TEST PINOPENS [1] LGC [2] UPS [3] [3] SCAN PEX UUT STM PIO
DSM
PVS/HCS [3] PS
NOTE: [1] Not actual instruments, they are software drivers [2] LGC may include standard digital test nails and/or special nails [3] Power supplies for UNIX PC Retrofitted Systems
31936.0
Figure 14
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Overview
Table 13 System Test Device Functions Acronym ACM Device Name Digital AC Voltmeter/Ammeter Function Measures a signals positive peak, negative peak, RMS, or dc offset (Voltages up to 200 V and currents up to 160 mA for signals between 1 Hz and 40 kHz.). Measures impedance or admittance by applying the ac source voltage and measuring the result. The AFTM option contains these analog instruments: DC Voltmeter, AC Voltmeter, AC Source, TTL Sync Signal Output, Frequency/Time-Interval Meter. ARITH Arithmetic Test Module Tests arithmetic quantities not directly measured by an instrument, such as the gain of a transistor. This utility device is considered a system device because the action required when it fails is the same as other instrument statements. Sources voltage or current waveforms. Programmed waveforms can be sine, square, and triangle. You can also define arbitrary waveforms. Uses a differential voltmeter and an ammeter to measure dc voltage. The DCM module on an ICA-configured system has a wider range than on a non-ICA configured system. Serves as voltage source (DCV) or current source (DCI). The DCS module on an ICA-configured system has a wider range than on a non-ICA configured system. Trigger command available for ICA systems only. Measures voltage and current. Permits immediate or triggered voltage and current sequence measurements which are then stored in the DMMs memory. Extends test system memory by supplying state data to the Driver/Sensors through the digital instrument bus. Permits up to nine external devices that conform to IEEE Standard 4881978. These external devices can be attached to the system, then operated remotely by test language statements. Digitally controls the D/S subsystem for standard digital testing.
ACZ AFTM
AWG
DCM
DC Measure
DCS
DC Source
DMM
Digital Multimeter
DSM
LGC
Logic Driver/Sensors
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Table 13 System Test Device Functions Acronym MUX Device Name Instrument Multiplexer Function Relay matrices used to connect selected instruments to any of four (A, B, C, D) or eight (A, B, C, D, E, F, G, H) output channels. Connects Driver/Sensor or analog BUS lines to a larger number of pins. This software driver tests for open pins on selected components and connectors. It uses various tester instruments depending on your tester configuration and selected PINOPEN options. Reads driver outputs and monitors TTL inputs. This utility device consists of program controlled driver circuits that activate relays, TTL circuits, LED indicators, and sensor circuits. Power supply option used on the Windows NT-based GR228X Systems to power the UUT. Uses an ohmmeter to measure resistance. Uses relay matrices to connect the MUX channels to designated UUT nails. Connects the DCS and DCM to perform analog continuity tests. The DCS and DCM go through the MUX and SCAN, to connect source and measure units to the UUT. This utility device contains circuits and components of known values that check how the various system test devices operate. Power supply options used on the Windows NT-PC Retrofitted GR228X Systems to power the UUT. Printed circuit board that you are testing.
PEX PINOPEN
PIO
Parallel I/O
PS
Programmable Supply
Resistance Measure Analog Pin Scanner Shorts Opens Continuity SelfTest Module
Selectable Voltage Supply; Universal Power Supply; High Current Supplies Unit Under Test
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Overview
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ATG can also determine if a test system has an 8wire mode, and, when appropriate, writes accurate 8wire resistor tests for low value components. Each in-circuit analog test that ATG generates: z Defines relevant measurement parameters, such as resistance, capacitance, or gain, and selects a stimulus current or voltage for measuring it. z Determines how the device can be isolated from its circuit environment so that interactions from other components do not affect the measurement. z Connects the appropriate circuit nodes to the testers measurement instruments so that it can issue relay commands. In some cases, both analog and digital test strategies are used to accomplish these ends. Fortunately, most testing problems are solved by the ATG software, using programmed circuit analysis and libraries of test procedures for circuit components to develop tests for the board.
Digital component testing requires a method of testing the device and a method of isolating it from the surrounding devices or from adjacent buses. The device test requires a set of known logic states applied to the devices inputs, and a set of expected output states that the device should produce. These input and output bit patterns, called test vectors, usually reflect the truth table associated with the device. To allow the device to function, power and ground are applied to the device during the test. Digital component testing is actually several tests that are performed in this order: z Nonbused IC tests are performed before full tests on the bused devices. z Bus connections are tested by attempting to free the bus from all the devices connected to it. A digital circuit component test usually requires a large number of simultaneous input and output test vectors. Accordingly, the test hardware for digital testing consists of a relatively large number of Driver/Sensor circuits. Test programs are written as if a separate Driver/Sensor were available at each test probe. The actual number of Driver/Sensors is, however, much smaller than the number of available probes. The system software arranges connections from the Driver/Sensors through a relaybased multiplexing system, so you can connect all probes to the Driver/Sensors. This means that a program cannot actually use all of the test probes at once; but test programs rarely need to use more than 250 probes at any one time. Each Driver/Sensor contains builtin, programmable pullup and pulldown resistors that connect to the logic high and low drive voltages. These resistors are commonly used to simplify the sensing of openemitter and opencollector outputs. In bus testing, the pulldown resistors are first used to pull the bus lines low. If the pulldown resistors can bring the bus lines to a low voltage level, you can assume that the bus is in a high impedance state, at least in the high voltage range. The programmable pullup resistors are connected to the logic high voltage, and the bus lines are checked for logic highs. These two tests verify that no device is driving the bus at the low logic level.
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Overview
The output of each driver normally functions as a programmable voltage source, generating highs and lows at voltages the test program determines. To test opencollector, openemitter, and tristate devices, the Driver/Sensor can switch in a pair of pullup and pulldown resistors. A sensor is simply a voltage comparator that returns a logic 1 for all voltages above a certain programmed threshold, and a logic 0 for voltages below a second programmed threshold. Values falling between the two thresholds fail tests for both high and low. A digital test is conducted by applying as many input combinations to the devices inputs as the circuit connections allow. Inputs tied high or low cannot be tested and inputs tied together cannot be tested separately. Using the truth table or an appropriate set of test vectors, the test system checks the outputs for the expected high and low states. Within certain limits, you can specify the devices current and voltage parameters, as well as signal delays, in the test. In-circuit digital tests generally, however, are meant to verify the devices logical functions rather than its electrical parameters.
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A hybrid test is generated from a hybrid model. The hybrid model can contain both unpowered and powered sections that define how the hybrid device is tested. Unpowered section tests are performed on the passive section of a component or group of components. The unpowered hybrid test is inserted in the test program after the analog in-circuit tests and before the power up routine. Powered section tests are performed on the key operating parameters of a device or group of devices. The powered hybrid test is inserted in the test program after the power up routine and before the digital tests. These tests can contain a digital burst. When both unpowered and powered tests are within the same model, ATG splits the test and places the sections in the appropriate place within the program. For examples of these advanced test techniques, refer to the GR228X Advanced Applications.
Some circuit board assemblies contain boundary scan components. These components offer testing advantages by exercising the components internal circuitry to overcome probing limitations. In addition, you can further test the board by exercising boundary scan components to perform self-tests. To improve UUT fault coverage and diagnostics, GenRad combines traditional in-circuit test techniques with boundary scan test techniques. GenRad offers two optional software products that perform in-circuit testing of boundary scan components: z BasicSCAN is very effective for testing UUTs that contain a few boundary scan components with full access. z Scan Pathfinder is very effective for testing UUTs that contain many boundary scan components with limited access. For further information, refer to Meeting the Challenge of Boundary Scan. This GenRad handbook provides an informal introduction to Boundary Scan. You can obtain this handbook from your sales representative.
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Overview
Test Fixtures
A test fixture is a custom built interface that provides reliable electrical paths to the UUT from the systems analog source and measure instruments, digital driver/sensor circuits, and UUT power supplies. There are many test fixture types. The most common are: z In-circuit (bed-of-nails) z Functional (edge)
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GenRads GR228X Test Systems are a family of Windows NT-based PCcontrolled, combinational test systems. Providing a variety of GR228X systems enables you to choose the configuration that best suits your board testing needs. This section describes the hardware that comprises the Windows NT-based GR228X Test System.
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Table 21 GR228X System Configurations Pin Board (Type) Combo I Combo II ASM
Mux Ratio 2:16 2:8 2:8 2:16 2:16 2:8 2:8 2:16 2:16 2:8 2:8 2:16 2:8 2:8 2:8 2:8
Data Rate 5 MHz 5 MHz Not Applicable 5 MHz 5 MHz 5 MHz 10 MHz 5 MHz 5 MHz 5 MHz 5 MHz 5 MHz 5 MHz Not Applicable 5 MHz 10 MHz
11 30 15 15 15 30 30 30 30 30 30 30 9 30
1408 3840 1920 1920 1920 3840 3840 3840 3840 7680 7680 3840 1152 3840
GR2285e
GR2287L GR2287A
System allows 11 pin boards if the AFTM is not installed. 1408 if 11 pin boards are present Analog Scanner Modules Windows NT PC Retrofitted system e-Series system or i-Series system Xtended Performance High Density Card 1. You must have a minimum of two HDC1s. Optionally, you can populate the GR2287L with up to 28 Combo II pin boards. High Density Card 2. You can only populate the GR2287LX with HDC2 pin boards.
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42947.0
Figure 21
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If an AFTM is not used in these systems, they can accommodate 11 pin boards and has 1408 available nails.
Optional Hardware
The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2280 and GR2281 systems can contain up to 10 pin boards, 11 if AFTM is not present. The standard system comes with 2 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 7 PS in alliance rack) 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Repair ticket printer or line printer Fixed Voltage (Fixed) (set of 3 ) +5V @ 6A +15V @ 1.0A or +5V @ 6A +12V @ 1.3A
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31830.1
Figure 22
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Data rates are used to describe digital test vector speeds. Since the GR2281A and GR2287A Production Test Systems do not have a digital subsystem, data rates are not available. ASM refers to Analog Scanner Modules
Optional Hardware
The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2281A systems can contain up to 11 pin boards. The standard system comes with 4 pin boards. GR2287A systems can contain up to 30 pin boards. The standard system comes with 4 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 5 PS in alliance rack) 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V) z Additional vacuum port (2281A only) z Bar Code Scanner z IEEE interface z Custom Function Board (CFB) with Frequency Time Interval Instrument (FTI) z Repair ticket printer or line printer Fixed Voltage (Fixed) (set of 3 ) +5V @ 6A +15V @ 1.0A or +5V @ 6A +12V @ 1.3A
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33006.0
Figure 23
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Standard Hardware
The standard test system hardware configurations include: Hardware Pin board type Pin board (max) Driver/Sensors per board Available nails (max) Mux Ratio Data Rate Analog testing and measurement Digital testing and measurement Clock/Sync/Trigger board High Speed Controller NOTE GR2283 Combo I 15 16 1920 2:16 5 MHz YES YES YES YES GR2284 Combo II 15 32 1920 2:8 5 MHz YES YES YES YES GR2286 Combo I 30 16 3840 2:16 5 MHz YES YES YES YES GR2287 Combo II 30 32 3840 2:8 5 MHz YES YES YES YES GR2287L HDC1 or Combo II 30 32 7680 2:16 5 MHz YES YES YES YES GR2287LX HDC2 30 64 7680 2:8 5 MHz YES YES YES YES
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Optional Hardware
The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from the 2 pin board minimum configuration. GR2283 and GR2284 systems can contain up to 15 pin boards. In addition, there are 7 accessory slots available which can contain optional hardware modules such as DSM boards and the AFTM board. GR2286 and GR2287 systems can contain up to 30 boards including more pin boards and the optional DSM and/or the AFTM. Accessory slots are not available for these systems. The GR2287L must have a minimum of two High Density Cards (HDC1). Optionally, you can populate the GR2287L with up to 28 Combo II boards. The GR2287LX can only be configured with HDC2 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 2 cages of 7 PS) 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Repair ticket printer, line printer z AFTM Fixed Voltage (Fixed) (set of 3 ) +5V @ 6A +15V @ 1.0A or +5V @ 6A +12V @ 1.3A
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DVR/STROBESTROBE 3 STEP TRIGGERTEST VACUUM CONTROL 1 UUT FIXTURE AUTO MODE RAISE ENABL L AUTO SINGLE MODE SYS SNR/STROBE 2 CLOCK DIG4 STROBE INSTR AUTO N OFF O ON R DUAL PROBE LOWER
42905.0
Figure 24
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2-11
Optional Hardware
The hardware options that may be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2283, GR2284, and GR2285 systems can contain up to 15 pin boards. The standard system comes with 2 pin boards. GR2286, GR2287, and GR2289 systems can contain up to 30 pin boards. The standard system comes with 5 pin boards. z UUT power supplies in any combination of these voltages: Programmable Voltage (PS) (up to 14 PS in two alliance racks) 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A Fixed Voltage (Fixed) (set of 3 for ICA systems only) +5V @ 6A +15V @ .75A
z High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA). z IEEE-488 Interface Controller and Instrument Multiplexer z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Deep Serial Memory Module (DSM) z Analog Functional Test Module (AFTM) z Additional Relay Driver Board z Bar Code Scanner z Footswitch
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42874.0
Figure 25
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Optional Hardware
The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2283 and GR2284 systems can contain up to 15 pin boards. The standard system comes with 2 pin boards. z UUT power supplies. The Programmable Voltage (PS) supplies are: 0 - 7V @ 15A 0 - 20V @ 8A 0 - 60V @ 2.5A z IEEE-488 Interface Controller and Instrument Multiplexer z Deep Serial Memory Module (DSM) z Analog Functional Test Module (AFTM) z Additional Instrument Multiplexer Board z Additional Relay Driver Board z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Bar Code Scanner z Footswitch z Repair ticket printer z Line printer z Load box (for operational verification)
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Figure 26
Figure 27
31854.0
31853.0
2-15
32500.1
Figure 28
The GR2282 is the only 4-wire system, the other systems are 8-wire.
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Optional Hardware
The hardware options that can be added to the standard system configurations include: z Increasing the number of pin boards from minimum configurations GR2282 systems can contain up to 30 pin boards. The standard system contains 5 pin boards. GR2286 and GR2287 systems can contain up to 30 pin boards. The standard system contains 5 pin boards. GR2288 systems can contain up to 9 pin boards. The standard system contains 2 pin boards. z UUT power supplies Universal Power Supply (UPS) 10V 20V 40V 50V z Load box (for UPS/SVS current verification tests on GR2288) z Additional Instrument Multiplexer Boards z Additional DC Voltage and Current Source Boards z Additional Relay Driver Board z Bar Code Scanner z IEEE interface z Line printer z Analog Instrument Option (AIO) z Analog Functional Test Module (AFTM) z Deep Serial Memory (DSM) z Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency Time Interval Instrument (FTI) modules z Expansion bay (GR2286 and GR2287) z Footswitch Programmable Voltage Supply (PVS) 0 - 5.5V @ 50A 0 - 7V @ 35A 0 - 30V @ 8A Selectable Voltage Supply (SVS) 7 - 20 - 20 20 - 20 - 20
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Fixed Power Supply (Fixed) YES YES YES YES YES YES YES YES YES YES YES YES YES YES
Programmable Power Supply (PS) YES YES YES NO YES YES YES YES NO YES NO YES YES YES NO YES
eSeries ICA systems permit the use of a User (Fixed) power supply. Non-ICA GR2286e and GR2287 eSeries systems can only use PS power supplies. Windows NT PC Retrofit systems cannot contain Programmable power supplies (PS).
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Each Windows NT-based GR228X UUT power supply complement is configured at GenRad according to the test systems needs. Often, the configuration is based on existing GR227X and GR228X systems at your facility, so that you can easily move test sets and associated fixtures to the other GR228X systems.
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The GR228X Test System family is designed primarily to execute incircuit tests on electrically isolated components of a unitundertest (UUT). Such components include analog, digital, and hybrid ICs. The GR228X Test System can z Detect manufacturing faults, such as wrong , missing, damaged, and incorrectly inserted components, and damaged etches. z Detect connectivity faults on bare boards. z Run functional tests on complete circuits on the systems that contain the instruments needed to perform the test. The GR228X test program preparation and Run-Time System (RTS) software comprise the GR228X software, which is an application layered on Windows NT. The GR228X monitor and Software Control area form the interface to the GR228X UNIX software which enables you to develop test programs, manipulate files, and test boards. You can simultaneously perform more than one task by running multiple GR228X sessions from different directories. For example, you can run two program preparation sessions at the same time. NOTE The Automatic Test Generator (ATG) features that provide testing for digital components are not available on the GR2281A and GR2287A Test Systems.
This chapter briefly describes the test development process and the numerous software tools that assist you in developing tests for isolating faults on the UUT. The tools are grouped into these categories: z Test Preparation z Test Generation z Test Debug z Test Execution z Test Analysis z Off-line Programming This chapter also describes migrating from one test system to another.
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Manual Used
CB/Test Documentation
GR228X Test Program Generation Manual GR228X Test Program Debug Manual
Release to Production
Figure 31
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CB/Test
CB/Test is part of the GR228X software running on Windows NT. It converts a GenCAD (general CAD output) file into a printed circuit board (PCB) database. The GenCAD file contains the major physical attributes of the board, such as the component shapes and position, pin X-Y locations, electrical net list, component types and electrical attributes, pad and via styles, board outline, and placement side of the device. It is created from a raw CAD data file using an input processor. There are a number of input processors available for different types of CAD systems. When the PCB database is created, you can: z View and interrogate the database using an interactive graphics editor z Compare the database against a system-level parts library verify if part attributes in the database are correct z Add missing parts to the parts library z Change pin names in the PCB database z Select the type of nodes to use in your circuit description file z View the board placed over the receiver shelf so that you can manually edit the probe placements
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3-4
Figure 32
The Digital Test Generation (DTG) software uses entries from Digital Test Library (DTL) files to produce tests for digital components on a given UUT. The Digital Test Library contains individual component models written in the Digital Test Source Language (DTSL). The Digital Test Generator (DTG) uses the circuit description file and DTL models to identify and extract a generalized device test that is tailored to the specific digital device circuit configuration. The specific digital device model provides DTG with routines to: z Test the device in most wiring configurations z Inhibit and disable the device while testing other components z Test any bused outputs, functional blocks, and banks Refer to the GR228X Test Library Programming Manual for more detailed information.
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Figure 33
Refer to the GR228X Test Library Programming Manual for more detailed information.
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Figure 34
Refer to the GR228X Test Library Programming Manual for more detailed information.
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Figure 35
Refer to the GR228X Test Program Generation Manual for detailed information.
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Model Generation
The model generation tools enable you to develop models for devices on the UUT that do not have models available in the device libraries. The available model generation tools include: z Hybrid Model Editor z BasicSCAN (Bscan) z Xpress Model z Onboard Programming Tools
Figure 36
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BasicSCAN
BasicSCAN is a separately licensed software product that is designed to solve the test generation problem for both Application-Specific ICs (ASICs) and complex commercial boundary scan components. You access BasicSCAN from the Start menu or by clicking its icon from the GR228X Program Launcher. BasicSCAN eliminates the need to develop test vectors for BasicSCAN components and has these benefits: z Simplifies the program preparation and debug processes. z Improves open pin fault coverage. z Reduces test development time. z Simplifies test complexity and reduces the number of test vectors. Figure 37 shows the BasicSCAN main window.
Figure 37
Once BasicSCAN knows the boundary scan capabilities of a component, it can automatically generate a Digital Test Source (.DTS) model that can be used by the test generation software. All BasicSCAN generated models use the same test structure. They are capable of generating disable and inhibit sections that describe how to prevent the device from interfering with other UUT component tests, and can also handle various component wiring configurations. When selected, BasicSCAN can also generate a test to run a components builtin self test.
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The BasicSCAN test checks: z Components instruction register capture value. An incorrect capture value can indicate a faulty or wrong component. z Correct length of the Instruction Register and Boundary Scan Register. z IDCODE and USERCODE expect values are correct. z Opens between the system Driver/Sensor nails and the components input/output cells. This type of failure can indicate a misinserted or poorly attached component. z Component pins can either capture or drive both a logic 0 and a logic 1. This detects any stuckat failures at the components input/output buffers. For more information about BasicSCAN, refer to the BasicSCAN Boundary Scan Users Guide.
Xpress Model
Xpress Model is an interactive graphical tool that you can use to create a model for a digital device that is not in the Digital Test Library. Xpress Model is often used to create models for custom digital components that do not support boundary scan components, such as programmable array logic devices (PALs). You access Xpress Model from the Start menu or by clicking its icon from the GR228X Program Launcher. Xpress Model is designed to facilitate data entry by providing a window that contains data entry fields. Figure 38 shows the Xpress Model main window. There are several 3rd-party software products that you can use to create DTL models. FS-ATG and AccuGEN are two products that can automatically generate models for PALs. For more detailed information on generating digital models, refer to the Xpress Model Users Guide.
Figure 38
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To obtain ISP vendor tools, you can contact your vendor sales representative or access the vendor home page at the specified URL. NOTE Vendor tool names may change. There may be a vendor charge associated with these tools.
Deep Serial Memory (DSM) is specifically designed for onboard programming test applications. DSM reduces testing and programming preparation time, and required disk space. Programming Flash devices requires DSM. ISP devices can be programmed with or without DSM.
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When you use DSM, data is loaded into memory once, independently of the driver/sensor memory, and is separated from the test preparation process. If the data changes from device to device but the device configuration remains the same, the test preparation process does not need to be rerun. The data representation is more compact than what is used in the programming language, which reduces the required disk space. However, the bursts that result when you use DSM are very large. If the configuration changes when you use DSM, the preparation process must begin again. The Onboard Programming Solutions tools implement onboard programming of Flash and ISP devices using a graphical interface. Flash memory devices are nonvolatile storage devices that allow memory writes and reads while the devices are assembled on the board. The Flash tool, which is shown in Figure 39, simplifies programming your Flash devices.
Figure 39
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Insystem programmable (ISP) devices are logic devices that can be electronically erased and reprogrammed after they are installed on a board. Because programming these devices requires that power be applied to the board, the board should be checked for shorts and other defects that could cause damage when power is applied. The ISP tool shown in Figure 310, in conjunction with a vendor tool, simplifies the process of programming ISP devices.
Figure 310
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Figure 311
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Figure 312
ATG may not be able to generate tests for certain component types or device configurations not contained in the library. There may also be configurations in which ATG detects a potential for component damage or excessive error if an attempt is made to test a particular component. In these circumstances, ATG will not generate a test. You can however develop a test for that component using the test language. For detailed information about the test language refer to the GR228X Test Language Reference Manual.
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Preprocessor
The preprocessor is a general purpose interpreter program that converts flagged statements in a file to GR228X test programming statements that the translator understands. The preprocessor simplifies complex programming sequences, eliminating the need for creating tests for specific components. The preprocessor contains three interpreter programs (.IEE) files: system, update, and user. For more information on using the Preprocessor, refer to the GR228X Test Program Generation Manual.
Scan Pathfinder
The Scan Pathfinder software is a separately licensed option that can generate boundary scan test programs for UUT scan chains that are IEEE 1149.11990 boundary scan compliant. This option comes integrated with the GR228X software You access Scan Pathfinder from the Start menu or by clicking its icon from the GR228X Program Launcher. Figure 313 shows the Scan Pathfinder main window.
Figure 313
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The Scan Pathfinder software: z Performs fullaccess opens testing of individual ICs as well as more complex interaction and interconnect testing of limitedaccess, mixed boundary scan boards. z Verifies the syntax and structure of Boundary Scan Description Language (BSDL) models. It also verifies the IDCODE, USERCODE, and RUNBIST instructions. z Integrates the boundary scan test generator with the Automatic Test Generator (ATG), and provides a separate boundary scan diagnostic generator that communicates with the RunTime System (RTS) software. z Contains a graphical user interface that you use to select boundary scan tests and options. z Generates boundary scan reports that provide details about the UUT boundary scan configuration, generated tests, fault coverage, and nodes where access is not required. z Contains automatic adaptive pattern test generation to resolve ambiguous short faults and to produce accurate pinlevel diagnostics. z Contains a boundary scan debug mode to help identify test problems. z Contains a boundary scan library with BSDL models for a number of commercially available Boundary Scan parts. Scan Pathfinder generates boundary scan test programs that can detect these UUT interconnect faults: z Test Access Port (TAP) pin stuckat failures. z Faulty scan paths through the UUTs Instruction, Bypass, or Boundary Scan Registers. z Incorrect IDCODE or USERCODE values in Boundary Scan parts. z Opens at nailed UUT Boundary Scan pins. z Boundary Scan parts that fail their built-in self-test. z Shorts between nailed conventional nodes and unnailed Boundary Scan nodes. z Shorts and opens between unnailed Boundary Scan nodes. For more information regarding modeling and testing of boundary scan components, refer to the GR228X Scan Pathfinder Users Guide.
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Nail Assignment
The nail assignment tool automatically assigns all test nails and produces fixture wiring reports. It supports SHORT_WIRE nail assignment, which is used to build shortwire fixtures. It also supports new fixture development as well as modifications to an existing fixture resulting from an ECO. The NAIL_ASSIGNMENT monitor page produces the report files used to build a fixture. Use NAIL_ASSIGNMENT to: z Obtain an accurate fixture wiring list. z Obtain a cross-reference of the assigned nail, node name, and nail interconnection. This data is useful during fixture debug and test program debug. z Modify diagnostic files to improve the failure report data. z Modify a test set to reflect changes as the result of an ECO. NAIL_ASSIGNMENT also offers panel test and Opens Xpress capabilities. For more detailed information, refer to the GR228X Test Program Generation Manual.
Translator
The Translator uses a source test program (.tpg) file as its input and produces an object file (.obc ) file as its output. The .OBC file is a compact binary file that the tester uses to test UUTs. The Translator: z Locates and reports program format and syntax errors. z Creates an error list (.lis) file. z Checks the language structure, syntax, and nail multiplexing for conflicts as the statements are translated. z Reports error messages which include the statement where the error was recognized. A caret is inserted under the point of error recognition. The location and type of error are also listed below the statement. NOTE Each .tpg must be translated for the target tester on which it will run. Therefore, if you have more that one GR228X Test System, you must have an .obc file for each test system that will run the test program.
For more detailed information, refer to the GR228X Test Program Generation Manual.
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Program Xplorer
The Program Xplorer is a graphical debugging tool for analog tests within the GR228X test program. Before using the Program Xplorer, you should: z Run ATG and nail assignment z Build and debug the test fixture z Obtain one or more UUTs that you can use for debugging the test program and fixture The Program Xplorer display, shown in Figure 314, provides a window environment that enables you to: z Modify GR228X instrument statements z Determine which nodes surround the Device Under Test (DUT) z Plot measurement readings z View graphical views of mux connections The Program Xplorer relies on information stored in the .idd and the .wor files, both of which are created from the .ckt file. For detailed information on debugging with Program Xplorer, refer to the GR228X Test Program Debug Manual.
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Figure 314
Program Xplorer
Autodebug
Autodebug is a debugging tool that uses the Run-Time System (RTS) to debug your test program without programmer interaction. Autodebug performs the actions that you would interactively perform using RTSs Debug mode. Autodebug assumes that the test program, not the UUT or fixture, is the cause for a test that does not pass. You can edit the Autodebug command file (.ADC) to control which debug changes are performed. When you debug a test program using Autodebug, it recognizes the type of test and applies a sequence of debug commands that attempt to pass the test. The tasks Autodebug can perform on analog tests include: z Changing the values of analog test parameters z Swapping source and measure z Adding a small delay to adjust the guard set z Modifying instrument parameters For digital tests that fail or have unknown output states, Autodebug can: z Initiate the learning of output states z Insert faults using the Digital Fault Insertion (DFI) feature Most of the debug actions that Autodebug initiates require data contained in the in-circuit diagnostic data file (.idd). Although an Autodebug session can be performed without an .idd, useful results generally occur only when an .idd file is supplied. For detailed information on debugging analog tests with Autodebug, refer to the GR228X Test Program Debug Manual.
3-21
Figure 315
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The PLOT system subroutine and the debug PLOT command only display the values at the time the plot was made.
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The test information for each component will vary depending on the test technique used. For detailed information on using ALLFAULT, refer to the GR228X Test Program Debug Manual.
3-24
3-25
Figure 316
Plot Window
The plot window has a menu bar that permits you to perform activities such as saving and printing a waveform, altering the view of a waveform, and obtaining online help. You can operate on the entire display, for example, using features such as scrolling and resizing. You can select an individual waveform within a plot by changing its attributes (color, dot size and shape, line thickness) or hide it from view. You can customize the plot window to include multiple waveforms. You can select an individual waveform and alter its attributes to distinguish it from other waveforms. To focus on particular data, you can change the view by zooming and scrolling the plot. You can update the display, while keeping portions and removing other portions. The plots provide you the capability to manipulate the display to help you interpret the data.
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Generating a Plot
You can generate a plot during test program debug using either a system subroutine call from within the test program or by stepping through the test program and running the PLOT debug command. The two methods are interchangeable and yield the same display. The result is a graph of an array in a window. Both methods permit you to select the amount of data, the plot window to which it is displayed, and whether to retain previously generated plots in a selected window.
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BUSTEST
The BUSBUST test technique is used to detect and diagnose device defects on bus nodes. The BUSBUST Diagnostic Routine can isolate a BUS node defect to the device output pin that is causing the GO/NOGO test to fail. A test program can contain many BUSTEST sections which include two tests that are performed in this order. z The GO/NOGO test verifies that the bus nodes can be disabled by placing all the device outputs connected to the bus nodes in a highZ state. The bus nodes are pulled high and then pulled low to verify that all the devices can be disabled from the bus. If the GO/NOGO test: Passes, the devices can be BURST tested later in the program. Fails, the devices are marked as UNTESTABLE. z Measure the device output driver currents using a force high and force low test for each device output connected to the bus. The forces must be properly written to allow accurate diagnosis, should the GO/NOGO test fail.
SoftProbe
SoftProbe is a diagnostic technique that can identify multiple open or stuck input and output pins on a wide variety of digital ICs using normal incircuit test vectors. SoftProbe test procedures use Digital Fault Insertion to verify the fault coverage and build a knowledge database. The most accurate diagnostic messages are the result of high fault coverage of the test vectors. SoftProbe detects open pins by first recording the failing component signature, then successively rerunning the component test while simulating open input failures. After each run of the test, the new failing output signature is compared to the original signature. If a difference exists between the two signatures, the pin is not open. If there is no difference between the two signatures, the pin is open. While the diagnostic data is being collected, it is constantly compared to the digital component knowledge database to eliminate false diagnostics.
ScratchProbe
ScratchProbe is a diagnostic technique used after all the digital ICs are individually tested. This second level digital diagnostic tests each IC that failed. This technique uses a hand-held probe to assist in determining whether a fault is caused by a bad IC, open connecting circuitry, or a bad nail. Scratchprobe can be invoked by the user, the diagnostics, or the test program. To verify connectivity between a suspect IC pin and a system driver, you lightly scratch the probe continuously along the length of the side of the IC. If continuity is found, the IC is bad. If no continuity is found, you can choose to probe other pins on the node. When you select the full monitor option, continuity is tested between the suspect device and the suspect nail on the node. If continuity to some of the devices on the node is discovered, an open track exists. If no continuity is found, the nail contact is bad or the IC pin is bent.
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TEST XPRESS
TEST XPRESS is a suite of tests that identify open circuits (such as solder opens) and/or improperly oriented components. These options are separately licensed: z Junction Xpress z Opens Xpress z Cap Xpress z Orient Xpress NOTE TEST XPRESS is not available for GR2288 test systems.
The TEST XPRESS options require these elements: z Test Instruments You need a stable ac source and flexible sensitive sampling ac voltmeter which is supplied by systems containing an ICA module, an AFTM module, or ATM, AMM, and APM modules. The ACZ device used by systems with a measure cage is not sensitive enough to use with the TEST XPRESS options. z A path connecting the DUT to the test instruments The TEST XPRESS options used for establishing the path depend on the option selected. Option Junction Xpress How connected Applies an AC voltage with DC bias to pins on IC that have a diode path to ground. Does not require special fixturing hardware. Places an opens probe above the DUT to capacitively couple pins on the DUT to the sampling voltmeter. Requires a special overclamp fixture.
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z Access to the pins of the DUT The UUT in-circuit test fixture provides the required access to the pins of the DUT. You will need to create a Device Probe Information (.dpi) file along with the .ckt file when generating the Device Probe Report (.dpr) for the fixture vendor. For detailed information on using the TEST XPRESS options, refer to the TEST XPRESS Users Guide.
Junction Xpress
This option is a licensed feature that generates tests that identify open pins on ICs. No special fixture wiring is required to use Junction Xpress. Junction Xpress testing is recommended for testing: z Ceramic or shielded device packages, or devices with heat sinks. z Devices that have a high pin count. z Marginal solder joints. z Devices that do not have device models available. z Devices that would add considerable cost because they require special fixture hardware.
Opens Xpress
This is a licensed option that generates tests that identify opens on connectors, sockets, and ICs. To use Opens Xpress, special hardware must be added to the test fixture. Opens Xpress testing is recommended for testing: z Nonsemiconductor devices. z Analog and mixedsignal devices. z Whether the fixture is properly contacting the UUT.
Cap Xpress
This option generates tests that identify misoriented polarized capacitors. Cap Xpress uses the Opens Xpress modified test fixture.
Orient Xpress
This option generates tests that identify misoriented integrated circuits (ICs) that contain multiple asymmetric power and ground pins. Orient Xpress uses the Opens Xpress modified test fixture.
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Panel Test
The Panel Test software enables you to test a homogeneous panel of boards. Testing boards while still on the panel decreases the handling and throughput time. The Panel Test software supports: z Prepending and/or appending a user-specified prefix or suffix to each board in the panel. z Passing and failing data collection. z Fixture reports that encompass all boards on the panel.
Split Fixturing
Split fixturing combines two smaller, identical, independent board test fixtures with a standard test fixturing casing. Using a split fixture enables you to increase board test throughput. The split fixture operates by alternating between the right-hand and left-hand side of the fixture when testing. This approach eliminates waiting for one test to complete before you setup and test another UUT. You can alternate between the right and left sides for testing the UUTs.
Serial Numbering
In typical testing, serial numbers are used with some form of data collection. You can use serial numbering to electronically collect data and print the serial number on the repair ticket.
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Table 31 provides you with a brief description of the data logging options that are selected from the DIAGNOSE monitor page as shown in Figure 317. Each option produces a .log file with a varying degree of information. Table 31 Logging Options Logging Option Standard Description Collects data for all components on the UUT. The amount of test data collected for the components determined by the Logging options. The Standard Logging combination of +PASSES option and LOG page PLOTS generation is commonly used as a debug tool and is sometimes used as acceptance criteria for Analog tests. The ALLFAULT command on the lowerlevel DIAGNOSE monitor page can also be used to characterize test program measurements and produce fault coverage reports. Refer to the GR228X Test Program Debug Manual. Selective Data (SEL) Real-Time Data Collection (RTDC) Enables you to select the components you want logged and the amount of data logged. Selective logging requires a Selective Options file (.sel) as input. Provides the most comprehensive data collection control. You can select sampling intervals. RTDC is commonly used in a realtime network environment as it allows for transfer of Log data at the end of each test run. RTDC requires a Data Collection Options file (.dco) as input.
Figure 317
DIAGNOSE Page
After you have run the test program many times and have collected data on the components tested in the program, you are ready to analyze the collected component data. The collected component data is placed into a formatted ASCII file with a .log extension during testing. The data that is stored in the .log file is not sorted or statistically processed.
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Summary Reports
Summary reports are formatted ASCII files with a specific number of statistical entries. You use summary reports as input for further processing. The three summary report types generated by the .log report generator are: Report Type Statistics Description Contains boardlevel data for analyzing the current data or summary file. It includes the: z Time period for which the report was generated z Number of failing, passing, and total boards tested z Total testing, waiting, and elapsed times z Average passing, failing, and actual board test times z Throughput per hour z Total faults and faults per failing board, if failure data was collected Contains current failure data on a component level in addition to boardlevel statistics. The information includes the total number of failures and faults per failing board for each failing component. Also, you can generate a failure trend analysis in this mode if you specify the .LOG and .SUM files to be used in the comparison in the LOG = fields. Both current and summary failure data are reported, and any significant difference in failure rates for a component are flagged to bring attention to it. Component plots generate a distribution of test measurements over a range on the componentlevel in addition to total number of failures and boardlevel statistics. The range is determined by the component test limits and measured values for all logged current data. No trend analysis is performed in this mode.
Failure Data
Component Plots
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Data Display
Data Display (datad) extracts process performance statistics from the test system log file. It identifies trends or deficiencies in particular components by analyzing the failures that occur when you test a board. Collected data can also be graphed and plotted using the Data Display graphical software. You access data display from the Start menu or by clicking its icon from the GR228X Program Launcher. Analyzing test results with Data Display requires you to import the files you want to analyze, then choose the type of report you want to generate. Data Display offers these features: z Custom report generation z Multiline color charts z 3D bar charts z Run Chart z Userannotated charts z Hard copy reports Use Data Display to generate these reports and charts: z Tester Yield Report z Test Times Report z Passing Board Volume Report z Parts Overview Chart z Top Failing Parts Chart z Top Failing Components Chart z Measured Values Chart For detailed information about Data Display, refer to the GR228X Production Test Users Guide.
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ATG Xpress
ATG Xpress is a separately licensed option that enables you to develop a test program off-line on a PC. For more information, refer to the ATG Xpress Users Guide.
TRACS III
TRACS III is a process information system designed to give you a clear and comprehensive picture of your manufacturing operation. TRACS III links all of your test processes together which enables you to determine what is actually occurring in your manufacturing processes. You can obtain reports on a wide range of data, such as defects and yields. For more information, refer to the TRACS III documentation.
GRXpert
GRXpert is a software translation tool that converts HP3065/3070 or Schlumberger Technologies Series 30 incircuit test programs to GenRad GR227X/228X language. The program is designed to facilitate the smooth transfer of previously debugged HP3065/3070 or Schlumberger Technologies (Factron/Fairchild) Series 30 test programs to GenRads GR227X/228X platforms. GRXpert translates HP incircuit test program files (TESTPLAN), wirelist files (WIRELIST), digital executables (all digital ASCII source files under the BOARD digital directory) and their associated circuit description files (.BCF) to GenRad GR227X/228X circuit descriptions (.CKT) and test program (.TPG) files. GRXpert also translates Schlumberger Technologies incircuit test program files (.BA), CHIPS digital test routines (.SR), and their associated circuit description files (.FX) to GenRad GR227X/228X Circuit Descriptions (.CKT) and Test Program (.TPG) files. For more information, refer to the GRXpert Users Guide.
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2280 Y Y Y
2281 Y Y Y
2281A 2282 Y Y Y Y Y
2283 Y Y Y
2284 Y Y Y
2285 Y Y Y
2286 Y Y Y Y Y Y N N
228 8 Y Y N Y Y N N N N N N N
228 9 Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y
Y Y Y Y Y Y N N
Y Y Y Y Y
Y Y N N
Y Y Y
Y Y Y N N
Y Y Y Y Y Y Y
Y Y Y Y Y Y Y Y
Y Y
Y Y Y Y Y Y Y
Y Y Y Y Y
Y Y N N
Y Y Y Y
Y Y N N
Y Y N N
N N
Y Y Y Y
Y N N
Y Y Y
Y Y Y
Y N N
Y N N
Y Y Y
Y Y Y
N N N
N N
N N
Y Y
Y Y
N N
N N
Y Y
Y Y
N N
Y Y
N Y
N
Y
Y
N
N
Y
Y
N
Y
N
Limited due to converter wiring and target test system pin count limitations. Limited due to target test system pin count limitations. System tests analog components exclusively, it does not support digital component testing. Requires a fixture converter that has 1-to-1 nail mapping. There is also a constraint on the number of source test program nails (1 -1152). Not supported because there is a greater multiplexing ratio. Requires any SET TIMING statements be rewritten as SET CLOCK statements. Tests must have 5MHz capability.
For a detailed explanation on migrating a test set from one system to another, refer to the GR228X Migration Users Guide.
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This chapter provides a brief description of the Windows NT-based GR228X system environment tools which include: z Editing Tools z User Interfaces z Help Tools For more information on the Windows NT-based GR228X system environment, refer to the GR228X System Administration Users Guide, or the non-GenRad documentation that shipped with the test system.
Editors
The GR228X software is shipped with these text editors: z Programmers File Editor (PFE) z emacs z vim In addition, Window NT provides text editors such as Edit, Notepad, and WordPad. Refer to the Windows NT online help for more information about these editors. You can also install third-party text editors such as MicroSoft Word or EDT.
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PFE Editor
The Programmers File Editor (PFE) is a 32bit, largecapacity text file editor. Its capacity is limited only by the total amount of memory available on your system. There are no editorimposed limits on the number of files that you can edit simultaneously, nor on the number of edit windows that you can have open. There is no limit on the size of file that can be handled, and no limit the number of lines that a file may contain. PFE adheres strictly to the Windows MDI conventions. Some of the feature of PFE enable you to: z Invoke most commands and facilities from menus z Navigate with a mouse or with keyboard shortcuts z Cut and paste from the clipboard z Reconfigure the use of keys z Run DOS commands, such as compilers, and to capture their output into windows for inspection z Define sets of templates that you can insert into the file youre editing. z Group templates into distinct files and load them for use automatically. The documentation describing how to use PFE is available via online help topics. Click the Help menu for the available help options.
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emacs
emacs is a powerful text editor that is distributed through the Free Software Foundation, which develops GNU software. emacs contains many powerful features and it has been tailored to work well under the Windows environment. When you run emacs, a separate emacs window is created, complete with menus that permit you to enter emacs commands with the mouse. GenRad recommends that you become familiar with emacs and use it as your default editor because it is fast, powerful, works well in a Windows environment, and is available on a number of different operating systems. Refer to the GR228X Test Program Generation Manual for more information that can assist you in learning the emacs editor. In addition, refer to the online help for emacs.
vim
vim is a displayoriented text editor that is available for WindowsNT. Expert vim users can make editing changes very quickly; however, beginners find vim difficult and hard to use. A brief list of common vim editing commands can be found in Appendix E. Also, more information about vim command line options, refer to the online help. There are two modes in vim: z Insert mode Insert mode enables you to add text to your file by typing at the keyboard. z Command mode Command mode enables you to enter vim commands using the keyboard. You are placed in command mode when you first enter vim. Refer to the GR228X Test Program Generation Manual for more information. In addition, refer to the online help for vim.
4-3
You can use TestFlo for developing test programs for new PCBs as well as performing an ECO. You cannot use TestFlo to migrate to another GR228X Test System. Refer to the GR228X Test Program Generation Manual for a detailed explanation of the TestFlo Program Preparation Manager interface.
Figure 41
4-4
GR228X Monitor
The GR228X monitor user interface helps you to develop and debug test programs, perform production testing, and collect test results data. When using the monitor pages, you control every detail of the test development process. This amount of control is often desired by experienced users of GR228X Test Systems. You require complete control of the test system environment when performing ECOs or migrating to another GR228X Test System. NOTE If you have a GR2280, GR2281, GR228X e-Series, GR228X i-Series,or a Windows NT PC Retrofitted Test System, the default user interface is the GR228X monitor.
The test development process for generating an accurate and complete test set is the same no matter which interface you choose. During the test development process, you will use several monitor pages. Figure 42 shows the DIAGNOSE Monitor page which is the default when you access the GR228X monitor page. The monitor utility pages are described in the GR228X System Administration Users Guide. Most of the monitor pages are described with their corresponding function in the GR228X Test Program Generation Manual. Some monitor page descriptions are presented in the GR228X Documentation as they are used during the test development process.
Figure 42
4-5
Online Help
There are a variety of online help options available to you within the GR228X Test System Environment. The GR228X Test Systems contain these on-line help tools: z GR228X monitor page help z Online help topics z Online manuals
In screenediting mode, you can toggle the display of monitor option help for the selected option by clicking PF4 from the VT100 keypad. When option help is enabled, the option help changes when you move from one field to another.
4-6
Figure 43 shows the help topics window for the GR228X online help. This window has three tabs: z Contents z Index z Find
Figure 43
4-7
Contents Tab
Figure 43 shows the help topics window with the Contents tab selected. This tab displays help topics organized by category. Doubleclicking a book icon shows the help topics for that category. Doubleclicking a document icon displays the help text for that topic. You can doubleclick an open book icon to close it. Figure 44 shows the organization within a typical category.
Figure 44
4-8
Index Tab
Figure 45 shows the help topics window with the Index tab selected. This tab displays the help index. To find a topic you want, type its name in the search edit box. Or, you can scroll through the list of index entries. Click the entry you want, and then click Display to display the help text for the selected entry. Alternatively, you can doubleclick the entry to display its help text.
Figure 45
Find Tab
Selecting the Find tab enables you to search for specific words or phrases used in the help topics, instead of searching by category or index entry. Before using Find for the first time, you must create a database of the words used in all of the help topics. You have three choices for creating the database: z Minimize database size (recommended) z Maximize search capabilities z Custom search capabilities Be sure that you have sufficient disk space available for creating this database.
4-9
Online Manuals
The GR228X software manuals are supplied in electronic format and are available from the GenRad 228X menu. With manuals in electronic format, you can navigate quickly through the documentation and locate specific information. The online manuals can be viewed using the Adobe Acrobat Reader 4.0. You can use Acrobat to view, navigate, and print documents, which are stored in Adobe Portable Document Format (PDF). Acrobat Reader 4.0 and the online manuals are provided and installed on your system, if you choose to install them, during the GR228X installation procedure. The online manuals are available from the Start menu, in the GenRad 228X menu. The Acrobat Reader allows you to perform full-text searches over the entire set of GR228X online manuals using the Search command. A master index of the GR228X online manuals is provided for this purpose. Also, Search provides a number of ways to limit or expand your search. For more information about using the Acrobat Reader, refer to Acrobats Reader Guide, which is accessible by click Help > Reader Guide.
4-10
Use the tables in this chapter to quickly locate detailed information that will help you to understand and perform GR228X Test System tasks. Use the Table of Contents or Index of the document referenced to find the chapter or page where the task starts, or refer to the Master Index.
Hardware Documentation
If you want information on ... System site requirements System and peripheral installation procedures Preparation and wiring of a test fixture System configuration and functional description, preventive maintenance, system verification program, and automatic calibration Servicing information, diagnostic procedures, removal and replacement, and calibration System diagrams and related part lists Refer to your systems ... Site Preparation Guide Installation Manual Test Fixture Manual Maintenance Manual
A-1
Software Documentation
If you want information about... The process of preparing and developing a test set Debugging test programs Performing production tests How to write library routines How to create a new test program or modify an existing test program, and GR228X language commands Device library models that currently exist Advanced applications and test methods Managing the system and its user accounts, file transfers, backup, software installation, system error messages, and system startup/shutdown How to test panels of boards, how to use serial numbers, and how to use a split fixture Converting test program files, device libraries, and test fixtures from one type of system to another system Developing test programs for use with the guided probe which execute an arbitrary number of functional block tests (bursts) on functionally or topologically partitioned PCBs AFTM hardware and software DSM hardware and software How to use Scan Pathfinder software Testing for open pins without power or vectors Using Xpress Model to develop DTS models using regular and pseudorandom pattern techniques Hardware and software features for GR2285 and GR2289 10MHz systems Software to generate digital test source (DTS) models that comply with the IEEE 1149.1 1990 standard How to use the Import CAD Data subflow within the TestFlo user interface. The various data importers that create a GenCAD file from CAD file(s). Refer to the... GR228X Test Program Generation Manual GR228X Test Program Debug Manual GR228X Production Test Users Guide GR228X Test Library Programming Reference Manual GR228X Test Language Reference Manual
GR228X Device Library Reference Manual GR228X Advanced Applications Programming Guide GR228X System Administration Users Guide
GR228X Panel Test, Serial Numbering, and Split Fixturing Manual GR228X Migration Users Guide
GR228X Analog Functional Test Module (AFTM) Users Guide GR228X Deep Serial Memory (DSM) Users Guide GR228X Scan Pathfinder Users Guide TEST XPRESS Users Guide Xpress Model Users Guide
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If you want information about... GR228X test system architecture, standard and optional hardware, and features of the test program developement software. The Multi-Protocol Instrument module, which provides functional test capabilities for a GR228X test sytem. The installation, setup, and use of the Frequency/Time Interval Instrument as well as the test language system subroutines that support it. The installation, setup, and use of the Vehicle Control Interface module as well as the test language system subroutines that support it
Frequency/Time Interval Instrument Users Guide Vehicle Control Interface Users Guide
Okidata Microline 320/321 Printer Setup Guide Seiko DPU5300 Line Thermal Printer Users Guide SmartUPS 600 Battery Backup/Uninterruptable Power Supply Owners Manual PowerChute Plus for Windows NT Manual
A-3
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