EE Times Highlights Case Study of EM Emissions Scans of New Chip Features Used i n Auto-Electronics New EE Times article highlights

very-near-field EM scanning technology. The EMxp ert Scanner, produced by EMSCAN, delivers immediate spatial and spectral electro magnetic emission profiles. The article includes two example case studies includ ed test results and images. Calgary, Alberta, August 23, 2011 -- On August 11, 2011, EE Times posted a new D esign Article on the Automotive Design site that highlights electromagnetic emis sion test results and images for two new chip features. The imaging results, pro vided courtesy of National Semiconductor, used very-near-field EM scanning techn ology to generate the test results. The technology, developed and marketed by EM SCAN allows chip vendors (and other manufacturers of electronic devices) to quan tify and immediately display spatial and spectral electromagnetic emissions prof iles.

The two case studies featured in the article display before and after results fo r each of the two new features. The first study displays both spatial and spectr al results for the Spread Spectrum Clock Generation (SSCG) feature. In the basel ine test, the design team turned the SSCG function Off and then compared results with the SSCG turned On. The highly visual results display the obvious change in electroma netic emissions. The second study compared a second-generation half-duplex SERDES system with the third-generation full-duplex design. The methodology quantified and visually di splayed the sources of emissions and documented compliance with test specificati ons developed by the Society of Automotive Engineers (SAE). The SAE continually issues upgraded specifications for testing and verifying ele ctromagnetic compatibility (EMC) and electromagnetic interference (EMI). EMC and EMI testing proves crucial for carmakers as they continually seek to differenti ate their models with new consumer electronic systems. As a result, engineering design teams value instrumentation that facilitates rapid resolution of a wide v ariety of electromagnetic emissions related issues including filtering, shieldin g, common mode, current distributions, and broadband noise. The EMSCAN EMxpert f or Real-time results provides examples of imaging results and more details about ve ry-near-field EM scanning technology can be found at: http://emscan.com/emxpert/ index.cfm About Us: Since 1989, EMSCAN has continued as the world s leading developer of FAST magnetic v ery-near-field measurement technologies and applications, providing real-time te st solutions to antenna and PCB designers and verification engineers, without th e need for a chamber. The EMxpert, a compact EMC and EMI diagnostic tool, and th e RFxpert, an antenna measurement tool, enable engineers to quickly complete the ir designs. EMSCAN solutions dramatically increase designer productivity and sub stantially reduce time-to-market and project development costs. www.emscan.com O r contact EMSCAN at +1-403-291-0313 or toll free in North America at: +1-877-367 -2261. Contact: Erkan Ickam EMSCAN #1, 1715, 27th Ave. N.E. Calgary, Alberta, Canada, T2E 7E1 403-291-0313 erkan@EMSCAN.com http://www.emscan.com/