Time Domain Analysis Using

Vector Network Analyzers

Presented by
Dr. Martin I. Grace
Anritsu Company
Time Domain Analysis Using VNA
Vector Network Analyzers (VNAs) are very powerful and
flexible measuring instruments.
Their basic capability is to measure in the frequency
domain the S-parameters of an RF or microwave device and
display the result.
This presentation will describe how the frequency domain
S-parameters data can be transformed into a time domain
display.
This provides valuable data for the design engineer to
develop a design and for the production engineer to
substantiate the performance of the device or system.
Time Domain Analysis Using VNA
The Fourier transform has been used in many technologies
and in microwave measurements, provides a method for
transforming VNA frequency domain data, into the time
domain display.
Specifically, a variation of inverse FFT (Chirp Z Transform)
is used to transform from the frequency domain to the
time domain. This permits the user to zoom in on a
specific time (distance) range of interest for the data
display.
This presentation addresses the properties of the transform
process and shows how the various processing options are
used to obtain optimum results for a given application. It
will not address the algorithmic details of the FFT.
Time Domain Analysis using VNA
The Time Domain capabilities for VNA have found to
be useful in the following types of measurement:
Rise time determination
Antenna measurements
Fault Isolation and identification
Filter tuning
Signal Integrity measurements
Cable measurements
Time Domain Analysis Using VNA
Dielectric constant measurements
Precise positioning and distance measurements
RCS measurements
Target detection, classification and tracking
Obstacle avoidance
Ground penetration Radar
Mining
Topics covered
Time Domain Theory
Time Domain Low Pass and Band Pass
processing
The effects of Windowing, Gating and Masking
The limitations of VNA Time Domain
Aliasing, resolution, rise time and side lobe
suppression
VNA Time Domain applications
Fourier Transformations
dt e H h
t j
) ( ) t (
}

e
e =
Each LTI network can either be represented in the time domain by its impulse
response h(t) or in the frequency domain by its transfer function H(e). The relation
between the two forms of representation is given by the Fourier Transform(FT) as
follows:
Using the Fourier transform, the impulse response is transformed from the time
domain to the frequency domain. Data measured in the frequency domain by
the network analyzer can be transformed to the time domain using Inverse
Fourier Transform (IFT).
dt e h H
t j
) t ( ) (
}

e
e =
Time Domain Analysis
VNA measures error corrected frequency domain S-
parameters (Reflection coefficient S11(e) and
Transmission coefficient S21(e))
The discrete Chirp-z Fourier transform is then used to
convert complex frequency domain data S(e) to time
domain data s(t)
s11(t) = F
-1
{S11(e)}
s21(t) = F
-1
{S21(e)}
The VNA calculates both the Impulse h(t) and Step
response u(t) for the reflection function s11(t) and Impulse
h(t) for the transmission coefficient s21(t)
Time Domain Analysis and its relation to
Time Domain Reflectometry (TDR)
Beatty Standard
Er: Reflected wave amplitude
Ei: Incident wave amplitude
o ) 25 (
o ) 25 (
i
r
Z Z
Z Z
E
E
+

= = I
Time Domain Analysis Using VNA
S12 REVERSE TRANSMISSION
PORT 1 PORT 2
S11 FORWARD
REFLECTION
S22 REVERSE
REFLECTION
S21 FORWARD TRANSMISSION
DUT
Coaxial 50 ohm
Coaxial 50 ohm
Coaxial Low Impedance (25 ohm)
) ( 11 S ) ( in e = e I
] in 1 [
] in 1 [
Zin
) (
) (
) (
e
e
e
I
I +
=
] Zin [ Zin ) (
1
) t ( e

=
Frequency Response of Beatty Standard
Coaxial 50 ohm
Coaxial 50 ohm
Coaxial Low Impedance (25 ohm)
Processing Alternatives
The Time Domain option offers a number of processing
alternatives to the user. It is important that the user be
aware of the feature set available as selection can have
a significant effect on the end result.
These tools include:
Processing Method Low Pass or Band Pass.
Response Step or Impulse for Low Pass mode and
Impulse or Phasor Impulse for Band Pass mode
Window Shape Rectangular, Nominal, Low Side
lobe, Min Side lobe
Gating Frequency with Time Gate
Time Domain Processing
Low Pass Processing
This processing method is useful in determining the
characteristics of a discontinuity or component. It has twice the
spatial resolution of the band pass mode.
The DC value must be approximated by extrapolation and
harmonic calibration required.
Band Pass Processing
This processing is ideal for measurements where the DC term is
not available and only discontinuity location is required.
Low Pass Processing
The DC term is determined by extrapolation
The time domain low-pass processing simulates the traditional
TDR measurement and supports both the step and impulse
response.
It is assumed that the frequency response is hermitian (in that
the negative frequency response is the conjugate of the
positive frequency response).
Low Pass Processing
Thus the Time Domain response is real and not
complex
The shape of the real part of the step and impulse
response in the Time Domain will show the nature
of the complex discontinuity
Harmonic frequency VNA measurement is required
F
L
F
H
-F
H
-F
L
Total Frequency Spectrum for Low Pass Processing
Total Bandwidth = 2F
H
DC
freq -freq
Low Pass Processing
VNA data set = n*FL
Where: n=0,1,2,.N,
N=F
H
/F
L
,
# of data points = N+1
frequency step AF=F
L
n=0 term calculated by
extrapolation
Calculated negative
frequency terms
Low Pass Processing
Component Step Response Impulse Response
I = 1, Open
I = 1, Short
Resistor, r > Z
o
Resistor, r < Z
o
Inductor
Capacitor
S11
(t)
Low Pass Response for known components showing real display
Band Pass Processing
VNA linear frequency calibration
Band limited data
Scalar information only (Location), does not
give impedance
Band Pass mode does not include the DC term,
thus only Impulse response is available
Frequency Spectra Band Pass Processing
F
L
F
H
0
Freq.
Frequency step: F(n) = F
L
+n(F
H
-F
L
)/N,
Where: n=0,1,2,3..N
Number of data points = (N+1)
Freq. step = (F
H
-F
L
)/N
Bandwidth = (F
H
F
L
)
Time Domain Displays
Step Response u(t)
Impulse Response h(t)
Phasor Impulse response for Dispersive Media
Low Pass Step and Impulse response
for the Beatty Standard
Time Domain Processing
Phasor Impulse Response
Normal Band Pass display and the Phasor
Impulse display of waveguide
Impedance level for a height change in a waveguide
Measurement Range
A property of the transform process is the Alias Free Range. The transform is a circular
function and repeats itself periodically outside of its inherent time range that is t =
1/(Frequency Step Size). The frequency step size is proportional to the frequency span
and inversely proportional to the number of data points.
Inherent time range: t = (N-1)/(Frequency Span)
For example with a 40 GHz. frequency span and 1,001 data points, the Alias Free
Range is: 1000/40 GHz = 25 nanoseconds, This is large for most applications and the
range is usually greatly reduced for display. However, if the user wanted to locate a
fault in a 100 meter cable, the range is inadequate. For such applications the step size
must be reduced either by decreasing the frequency span or increasing the number of
points.
The Time Domain Response Showing The Discrete Data
15 10 5 0 5 10 15
0
0.5
1
Sampled data of a continuous response
frequency
V
N
A

D
i
s
p
l
a
y
1.3
0
y
i
15 15 x
i
The frequency sampling can be visualized as data points measured evenly over
the frequency range.
Alias Signals
20 0 20 40 60 80 100 120
40
20
0
Alias Signals
Distance
V
N
A

D
i
s
p
l
a
y
Images of the original function and aliases which occur at repetitive time
intervals of 1/(frequency step size).
Alias Responses
S
11(f)
for a short ckt, at the end of an
airline
S
11(t)
for the short at end of airline
Alias Response
Windowing of Measured Data
These abrupt amplitude changes give rise to side
lobe levels that can obscure adjacent discontinuities
The measured frequency domain data is measured
over a finite frequency range where there are
abrupt amplitude discontinuities
When the amplitude of the measured data is
multiplied by a window function, the side lobe
levels are reduced at the expense of the main lobe
width.
Application of Windows
S
11(f)
Of a Open Ckt. at end of trans, Line
Frequency domain data after application of
A two term Hamming Window
Application of Windows
S
11(t)
= F
-1
[S
11(f)
] no Hamming window
applied to data
S
11(t)
= F
-1
[S
11(f)
] Two term Hamming
window applied to data
Effect of The Window
Window Type Main Lobe Width Main Lobe Width Side lobe Level (dB) Rise Time
Low Pass Band Pass (10% to 90%)
Rectangular 0.5/BW 1/BW -13 .5 / (Freq span)
Nominal 1/BW 2/BW -42 1 /
Low side lobe 1.5/BW 3/BW -70 1.5 /
Min side lobe 2/BW 4/BW -90 2 /
Band Pass impulse width is twice that of low-pass impulse width. The band pass impulse side
lobe levels are the same as low-pass impulse side lobe levels.
Low Pass and Band Pass resolution of main lobe and side band levels for
various windows
Low Pass time domain window effects
Low Pass time domain window effects
Main lobe width vs advanced window parameters
Response Resolution
The principal property of interest in time domain processing for
most microwave applications is spatial resolution of the
response; or the ability to resolve one location from another.
Response resolution is a function of the type of processing (low
pass or band pass), the frequency band of the measured data,
the type of measurement (reflection or transmission), the
physical properties if the media (permittivity and permeability)
and the window function used in the transform.
Discontinuity Resolution
In practice, the main lobe time width limitation is
inversely related to data collection bandwidth in the
frequency domain
The (-6 dB) Band Pass impulse width is twice that
of the Low-Pass impulse width. The band pass
impulse side lobe levels are at the same as low-
pass impulse side lobe levels.
The (-6 dB) of the Impulse and the (10 to 90 %)
step rise time points are inversely proportional to
the span of measured frequency.
Resolution in BP mode
TWO MISMATCHES SEPARATED
By 2 mm (AIR)
1) 40 GHz 3.75 mm
2) 50 GHz 3.0 mm
3) 60 GHz 2.5 mm
SPAN RESOLUTION
Resolution in Low Pass Mode
Low pass time domain plot of two
discontinuities 4.8mm apart located
at marker 3. VNA has an upper
bandwidth limitation of 26.5 GHz
Same device measured with 60 GHz
bandwidth. Second discontinuity
now visible at marker 6. Note
difference in return loss values.
Gating Frequency Gated by Time
Gating provides the ability to selectively remove or include
responses in time. The remaining time domain responses can
then be transformed back to the frequency domain with the
effect of the gated-out responses being removed. This process
is known as FREQUENCY GATED BY TIME
This generally improves the quality of the response, in that the
gated frequency response more closely resembles the device
response if it were measured with no other reflections. However,
previous reflections do have some effect even after the
measurement has been time-gated.
Gating Frequency Gated by Time
The Gating process involves selection of a gate shape. This is
similar to the Window function selection.
From examination of time domain displays, it is apparent that
there are side lobes associated with a specific reflection that
extend over the time range. All of which are necessary to obtain
a good representation of that reflection in the frequency
domain.
Gating Frequency Gated by Time
The gating process eliminates some of these data points that
may introduce errors or ripple in the frequency domain
response. As in Windowing, the solution is to provide a selection
of Gate functions so the user can obtain the best tradeoff of
resolution versus ripple.
Time Gate
RED-Impulse Response for Beatty Standard, BLK-time gate
BLUE- Second discontinuity
0 20 40 60 80
40
20
0
Time Domain Gate
Distance
V
N
A

D
i
s
p
l
a
y
15
50
y
i
z
i
w
i
82 10 x
i
Ti me Gate
Gating Frequency Gated by Time
The application of a Gate and the Frequency Gated by Time
display of the initial discontinuity of the Beatty Standard
Frequency Gated by Time
Rise Time Measurements using Time Domain Transmission
The VNA is capable of measuring the rise time and propagation
delay of wide band devices such as coaxial cables, switches, and
amplifiers used in optoelectronic systems.
The use of sampling oscilloscopes in conjunction with fast rise
pulse generators is a common technique for measuring rise time
and delay. However, the VNA bandwidths and low level
sensitivities have surpassed those of the scopes, allowing the
VNA to be an excellent means of performing the rise time and
propagation delay measurements of these high speed devices.
Rise Time Measurements using Time Domain Transmission
These measurements require the use of Time Domain
Transmission, that is an S21 Step response. The VNA can perform
these measurements with equivalent rise times less than 9
picoseconds (110 GHz system). The processing options; low pass,
band pass, and the gating feature also apply to S21 Time Domain
response.
Rise Time Measurements using Time Domain Transmission
These measurements require the use of Time Domain
Transmission, that is an S21 Step response. The effective rise
time for a VNA is:
t
(VNA)
=1/(F
H
F
L
)
where FH is the maximum measurement frequency and FL is
the lowest measurement frequency. A 110 GHz VNA such as
the Anritsu Vector Star has an effective rise time (the time
between the 10% and the 90% magnitude points) of
approximately 8.25 Pico-seconds measured using a through
line.
Rise Time Measurements using Time Domain Transmission
Corrected Step response of the through line for the 110 GHz VNA
Rise Time Measurements using Time Domain Transmission
t
DUT
t
MEAS
( )
2
t
VNA
( )
2

The 40 Gb/s driver amplifier replaces the through line and

the transmission step response of the amplifier is
measured using the 110 GHz. VNA.
The rise time, the time between the 10% and the 90%
magnitude points, is measured to be approximately 12
Pico-sec. The rise time of the amplifier is calculated using
equation below:
Rise Time Measurements using Time Domain Transmission
Inverted rise time and propagation display response of the 40 Gb/s amplifier.
Rise Time Measurements using Time Domain Transmission
The S21 Time Domain response is the composite measurement
of the VNA rise time and the Amplifier rise time. The 180
phase shift in the amplifier S21 response is displayed as an
inverted step in Time Domain mode. The calculated rise time
for the amplifier is 8.7 Pico-sec.
The propagation delay of the amplifier is measured at the 50%
Point of the step response.
sec. - Pico 7 . 8 24 . 8 12
2 2
) Amp (
= = t
t
delay
30
Pico-Sec.
Thank you
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