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Optical MEMS
Optical MEMS
Electromagnetic Spectrum
Energy of a quantum of electromagnetic radiation:
E = hf = hc/
Electrical
-rays
Visible
720 nm (0.72 m)
U H F VH F
Frequency (Hz)
1024 10-15 10-12
(PHz) 1015
(MHz) 106
10-6
10-3
103
U LF
Ultraviolet
(kHz) 103
() (nm)
10-9
(m)
(mm)
(m)
(km)
(Mm)
Wavelength (m)
EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 4
106
Overview
Mirrors & Mirror Arrays
Beam Steering
Simple Reflection Corner Cube Reflector Grating Blazed Grating Phased Array
Mirrors
Different materials reflect different wavelengths with varying efficiency -- almost anything can be a form of mirror.
Reflectivity: the percentage light reflected from a surface at a given wavelength
ex. elemental comparison at 1 m wavelength
Lenses
Refractive Diffractive
Systems
Web Elements EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 5 EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 6
Mirrors: Reflectance
Mirrors: UV Reflectance
UV
Visible Spectrum
IR
MicroElectroMechanical Systems (MEMS) 7 EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS)
UV
8
Mirrors: IR Reflectance Si
Mirrors: Distortion
Most mirrors are fabricated from surface micromachining Some drawbacks causing distortion in reflected image include:
Deposited layers conform to the topology of lower layers, therefore, embossing the mirror surface. Residual stress in deposited layers or combinations of layers can deform the mirror surface
Solutions include:
Thinner reflective coatings Stiffer mirror structures Avoid topology under mirror by design Use backsides of layers through assembly Use fabrication processes with planarized layers More appropriate combinations of multi-layer materials Different fabrication processing conditions
MicroElectroMechanical Systems (MEMS) 10
10 mm thick Si sample IR
Mirrors: Fabrication
CRONOS -- The Multi-User MEMS Processes, or MUMPs, 1992, www.memsrus.com
15 copies of a 1 cm 1 cm die, $3,200.00
Mirrors: Fabrication
SUMMiT IV & V, Sandia National Laboratory
100 copies of a 6.34 mm 2.82 mm die, $10,000 V provides a 5th planarized layer of poly
mmpoly1_cut Polycrystalline Silicon Oxide (Si02 deposited from TEOS tetra-ethyl-ortho-silicate) Nitride (Si3N4) Crystalline Silicon Max etch hole spacing 38 m Max dimple spacing 75 m sacox2 Global oxide 2 correction for MUMPs-like layout Available CAD Layers & Minimum Width (m): mmpoly3_cut 1 mmpoly3 1 sacox3_cut 2 dimple3_cut 1.5 mmpoly2_cut 1 mmpoly2 1 sacox2_cut 2 sacox2 1 mmpoly1_cut 1 mmpoly1 1 pin_joint_cut 3 sacox1_cut 2 dimple1_cut 1 mmpoly0 1 nitride_cut 1, max 4
Metal (gold) Polycrystalline Silicon (doped with P) Oxide (PSG: Si02 doped with P) Nitride (Si3N4) Crystalline Silicon
poly2
0.5 m metal
0.02 m Cr
dimple1
poly0
anchor2
nitride cut
0.5 m 0.6 m
anchor1
highly doped with P region (100) silicon wafer, n-type (P), 1-2 ohm-cm resistivity 100 mm diameter, 500 - 550 m thickness
EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 11
sacox1 cut
3 m
0. 5 m
<100> silicon wafer, n-type, 2 - 20 ohm-cm resistivity, 6 diameter, 675 m thickness EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 12
2 m
oxide1
Phosphosilicate Glass
0.75 m dimple
0. 5 m 0.5 m sacox2
Cowan, 1998
Gold Poly2
D. Burns, Microelectromechanical Optical Beam Steering Systems, AFIT Dissertation, 1998. 13 14
sin( n ) =
where n is the discrete order, n is the order direction, is the wave length, and a is the period of the grating elements. Incident Light Grating interference orders result when light, reflected off of grating elements, combines constructively in the far field.
n a
n
Reid, 1997
a
EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 15 EE 480/680, Summer 2006, WSU, L. Starman
nth order
16
(n=1)
/2
d=/4
a A pixel
sin( n ) =
The maximum diffracted intensity of the first order is when d = /4.
n a
For same , but different colors, choose a different a such that /a is same. -orBuild one pixel for red and deflect the same pixel less for green and blue.
EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 17 EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 18
Incident Light
sin( n ) =
n a
n = n/2
nth order Reflected Light
a
EE 480/680, Summer 2006, WSU, L. Starman
n
MicroElectroMechanical Systems (MEMS) 19
D. Burns, Microelectromechanical Optical Beam Steering Systems, AFIT Dissertation, 1998. EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 20
n=1
n=2
n=3
D. Burns, Microelectromechanical Optical Beam Steering Systems, AFIT Dissertation, 1998. EE 480/680, Summer 2006, WSU, L. Starman
n=4
MicroElectroMechanical Systems (MEMS) 21 D. Burns, Microelectromechanical Optical Beam Steering Systems, AFIT Dissertation, 1998. EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 22
Overview
Mirrors & Mirror Arrays
Beam Steering
Simple Reflection Corner Cube Reflector Diffractive Gratings Blazed Grating Phased Array
Lenses: Refractive
Lenses
Refractive Diffractive
Systems
23
24
Lenses: Refractive
Reflowed BCB lens for VCSEL de-centered lens beam steering
Lenses: Refractive
UV curable polymer lenses for 2-D scanning
A. Tuantranont et al., "MEMS-Controllable Microlens Array for Beam Steering and Precision Alignment in Optical Interconnect System," Proceedings of the 2000 Solid-State Sensor and Actuator Workshop, pp. 101-104, June 4-8, 2000. EE 480/680, Summer 2006, WSU, L. Starman MicroElectroMechanical Systems (MEMS) 25 EE 480/680, Summer 2006, WSU, L. Starman
S. Kwon et al., Stacked Two Dimensional Micro-Lens Scanner for Micro Confocal Imaging Array, 2002. MicroElectroMechanical Systems (MEMS) 26
Lenses: Refractive
Lenslet arrays with piston micromirrors for aberration correction using phase alteration.
Lenses: Diffractive
Fresnel Lens
Diffraction and constructive interference shape the nearfield light beam exiting the lens. R2 f = m m
where f is the focal length, Rm is the radius of the outer zone, m is the largest integer number of zones in the lens, and is the wavelength of the source. J. Bouchard, MS Thesis, AFIT, 1997 m=1 m=2 m=3
540 m Thick Glass Spacer UV curable epoxy Lenslet Array,Nippon Sheet Glass Company, 250 m diameter. Micromirrors
A. Tuantranont et al., "Packaging of Lenslet Array on Micromirrors," Proceedings of the SPIE `99, vol. 3631, pp. 156-164, 1999.
R3
Overview
Mirrors & Mirror Arrays
Beam Steering
Simple Reflection Corner Cube Reflector Grating Blazed Grating Phased Array
Optical Systems
Surface micromachined VCSEL scanning system
Lenses
Refractive Diffractive
Systems
29
30
Optical Systems
Texas Instruments Digital Micromirror DeviceTM
Optical Systems
3-Chip, Texas Instruments Digital Micromirror DeviceTM
16 m
31
32