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EE141-Fall 2010 Digital Integrated Circuits

Lecture 2 Integrated Circuit Basics: Manufacturing and Cost


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Administrative Stuff
Discussions start this Friday Labs start next week Homework #1 is due this Thursday
Everyone should have an EECS instructional account Use cory, quasar, pulsar

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HSPICE Syntax
Simple CMOS inverter .include '/home/ff/ee141/MODELS/gpdk090_mos.sp TT_s1v * netlist Vdd vdd 0 1.2 VIN in 0 PULSE 0 1.2 200ps 100ps 100ps 2ns 4ns M0 out in vdd vdd gpdk090_pmos1V L=100e-9 W=120e-9 M1 out in gnd gnd gpdk090_nmos1V L=100e-9 W=120e-9 R1 in gnd 10K R2 out vdd 100K * extra control information .options post=2 nomod * analysis .op .TRAN .01ns 3ns .DC VIN 0 1.2 .001 .END
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Last Lecture
Last lecture
Introduction, Moores law, future of ICs

Todays lecture
Introduce basics of integrated circuit manufacturing and cost

Reading: Ch 2.1, 2.2

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CMOS Manufacturing Process

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The MOS Transistor


Polysilicon Aluminum

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The Manufacturing Process


For a complete walk-through of the process (64 steps), check the Book web-page

http://bwrc.eecs.berkeley.edu/IcBook

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Photo-Lithographic Process
optical mask oxidation

photoresist removal (ashing)

photoresist coating stepper exposure

Typical operations in a single photolithographic cycle (from [Fullman]). photoresist development process step acid etch spin, rinse, dry

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Patterning of SiO2
Chemical or plasma etch Si-substrate (a) Silicon base material Photoresist SiO 2 Si-substrate (b) After oxidation and deposition of negative photoresist Si-substrate UV-light Patterned optical mask Exposed resist Si-substrate (c) Stepper exposure Si-substrate (f) Final result after removal of resist (e) After etching Hardened resist SiO 2 Si-substrate

(d) After development and etching of resist, chemical or plasma etch of SiO 2 Hardened resist SiO 2

SiO 2

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Advanced Metallization

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A Modern CMOS Process


gate-oxide TiSi2 AlCu SiO2 Tungsten
poly
p-well n-well

SiO2 p+

n+

p-epi p+

Dual-Well Shallow-Trench-Isolated CMOS Process DualShallow- Trench11

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Transistor Layout
Cross-Sectional View
poly
p-well

SiO2

SiO2
n+

poly

Layout View

p-well

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Cost

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Cost of Integrated Circuits


NRE (non-recurrent engineering) costs - fixed
Independent of volume (i.e., number of units made/sold) Examples: design time and effort, mask generation, equipment, etc.

Recurrent costs - variable


proportional to volume Examples: silicon processing, packaging, test Most of these proportional to chip area
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NRE Cost is Increasing

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Total Cost
Cost per IC
cost per IC = variable cost per IC + fixed cost volume

Variable cost
variable cost = cost of die + cost of die test + cost of packaging final test yield

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Die Cost
Wafer Single die
cost of wafer dies per wafer * die yield

cost of die =

From: http://www.amd.com
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Wafer size
AMD Athlon

8 (200mm) 90nm CMOS


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12 (300mm) 90nm CMOS


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12 (300mm) 65nm CMOS


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From: http://www.sandpile.org

Yield
Y= No. of good chips per wafer 100% Total number of chips per wafer Wafer cost Die cost = Dies per wafer Die yield

Dies per wafer =

(wafer diameter/2 )2 wafer diameter die area 2 die area

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Defects
Yield = 1/4 Yield = 19/24

defects per unit area die area die yield = 1 + , where is approximately 3
die cost
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( die/wafer die area

1
-1

)( yield

die area

-3

die area 4
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Cost per Transistor


cost:
-per-transistor per-

1 0.1 0.01 0.001 0.0001 0.00001 0.000001 0.0000001 1982 1985

Fabrication cost per transistor

1988

1991

1994

1997

2000

2003

2006

2009

2012

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Next Lecture
CMOS transistors as switches How to build an inverter Design metrics

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