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Kai Goebel
http://prognostics.nasa.gov
DIAGNOSTICS & PROGNOSTICS
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Prognostics CoE
The Prognostics Center of Excellence (PCoE) at Ames Research Center provides an umbrella for prognostic technology development, specifically addressing technology gaps within the application areas of aeronautics and space exploration. En route to becoming a national asset Expertise in prediction technology and
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Prognostics
4.2 4 3.8
E (measured)
Prediction points
E (from PF)
EOD
EOD pdfs
tEOD
500
1000
1500
2000
2500
3000
3500
time (secs)
Definition: Predict damage progression of a fault based on current and future operational and environmental conditions to estimate the time at which a component no longer fulfils its intended function within desired bounds (Remaining Useful Life)
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Failure threshold
Uncertainty information
Sources of uncertainty Uncertainty characterization
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Prognostics Algorithms
Data Driven Algorithms
Gaussian Process Regression Relevance Vector Machine Neural Networks Polynomial Regression
Kalman Filters
Classical KF Extended KF
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Metrics Example
Establishing a common ground to compare different prognostic efforts Metrics must not only measure accuracy and precision but also the convergence of both properties Data/time requirement of algorithms (prognostic horizon) before they produce consistent predictions is also important
0.95 0.9
Real data
35 30
0.85 0.8
25
RUL
RUL threshold RUL pdfs 0 10 20 30 40 50 60 70
20 15 10
0.6
0 30
35
40
45
50
55
60
65
Time (weeks)
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Uncertainty Management
Model System complexity Insufficient knowledge Usage Load profile Temperature Noise Internal, external Electrical, mechanical, thermal Sensors
Sources of Uncertainty
Uncertainty Management
Training data based extrapolation Probabilistic state space model Online model adaptation Noise modeling Probabilistic regression Hyperparameters to prevent overfitting
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Valve Prognostics
Apply model-based prognostics to pneumatic valves Develop high-fidelity simulation model
Progressive damage models include seal wear (internal and external leaks), spring degradation, and increase in friction.
Investigate performance under different circumstances using prognostic performance metrics for comparison
Impact of using different filters Effects of increased sensor noise Effects of increased process noise and model uncertainty Feasibility of different sensor sets (e.g. continuous position sensor vs. discrete open/closed indicators) Computational Architecture
Source: M. Daigle and K. Goebel, "Model-based Prognostics with Fixed-lag Particle Filters Accepted for publication at PHM09
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Problem Formulation
Prognostics goal
Compute EOL = time point at which component no longer meets specified performance criteria Compute RUL = time remaining until EOL
System model
Output
State
Parameters
Input
Process Noise
Sensor Noise
Define condition that determines if EOL has been reached EOL and RUL defined as
Compute
and/or
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Prognostics Architecture
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System receives inputs, produces outputs
yk Fault Detection Isolation & Identification F yk
uk
System
Damage Estimation
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Case Study
Apply framework to pneumatic valve
Complex mechanical devices used in many domains including aerospace Failures of critical valves can cause significant effects on system function Top
Valve opened by opening bottom port to supply pressure and top Bottom port to atmosphere Pneumatic Port Valve closed by opening bottom port to atmosphere and top port Fluid Flow to supply pressure Return spring ensures valve will close upon loss of supply pressure
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Plug
5 2 12 /
Case Study
Faults
External leaks at ports & internal leaks across piston Friction buildup due to lubrication breakdown, sliding wear, buildup of particulate matter Spring degradation
Defining EOL
Limits defined for open and close times of valves
E.g., main fill valve opens in 20 seconds (26 req.), closes in 15 (20 req.)
Limits placed on valve leakage rates Bottom (pneumatic gas) Pneumatic Port Valve must be able to fully close upon fail-safe Valve is at EOL when any of above conditions Fluid Flow violated (defines CEOL)
Function of amount of damage, parameterized in model
Plug
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Physics-based Modeling
Valve state defined by
Valve position Valve velocity Gas mass above piston Gas mass below piston
Inputs given by
Fluid pressure (left) Fluid pressure (right) Input pressure at top port Input pressure at bottom port
DIAGNOSTICS & PROGNOSTICS
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where,
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Modeling Damage
Increase in friction Based on sliding wear equation Describes how friction coefficient changes as function of friction force, piston velocity, and wear coefficient
Degradation of spring Assume form similar to sliding wear equation Describes how spring constant changes as function of spring force, piston velocity, and wear coefficient
Growth of internal leak Based on sliding wear equation Describes how leak size changes as function of friction force, piston velocity, and wear coefficient
Growth of external leak Based on environmental factors such as corrosion Assume a linear change in absence of known model
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Damage Progression
4 3.5
Friction Coefficient (Ns/m)
6 x 10 Damage Progression of Friction Coefficient
x 10 1.1
10 9
Spring Constant (N/m)
x 10
Damage Progression of Spring Constant x 10 6.94 6.92 6.9 6.88 6.86 6.84 40 41
4
8 7 6 5 4
20
40 60 Time (cycles)
80
100
x 10
-6
1.5
x 10
-7
40 0 20 40 60 Time (cycles)
41 80 100
20
40 60 Time (cycles)
80
100
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Damage Estimation
Wear parameters are unknown, and must be estimated along with system state
Position Velocity Gas mass above piston Gas mass below piston Friction coefficient Spring rate Internal leak area External leak area (top) External leak area (bottom) Friction wear Spring wear Internal leak wear External leak wear (top) External leak wear (bottom)
DIAGNOSTICS & PROGNOSTICS
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Augment system state with unknown parameters and use state observer
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Particle Filters
Employ particle filters for joint state-parameter estimation
Represent probability distributions using set of weighted samples Help manage uncertainty (e.g., sensor noise, process noise, etc.) Similar approaches have been applied successfully to actuators, batteries, and other prognostics applications
w
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PF approximates posterior as
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Prediction
Particle filter computes
General idea
Propagate each particle forward until EOL reached (condition on EOL evaluates to true) Use particle weights for EOL weights
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Prediction
Hypothesized inputs
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Validation of Methodology
Estimate of wear parameter converges after a few cycles, after this, leak area can be tracked well.
EOL predictions all contain true EOL, and get more accurate and precise as EOL is approached.
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- Performance
Plot summarizes performance of internal leak prognosis Over 50% of probability mass concentrated within the bounds at all prediction points except at 20 and 30 cycles
Mean RULs are within the bounds at these points
=0.1, =0.5
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Prediction Performance
- metric for spring damage prediction, where =0.1, =0.4, M={x,f,pt,pb} - metric for spring damage prediction, where =0.1, =0.4, M={open,closed}
Both cases have similar accuracy, but the case with continuous measurements has much better precision, as the metric evaluates to true for all but one point.
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Discussion
Different sensor sets have comparable estimation and prediction accuracy, but some differences are observed Wide differences observed in precision of estimation and prediction Results reveal that some sensors are more useful for certain faults than others
Flow measurement can be dropped with little effect For friction and spring faults, sensor sets with position measurement perform best For leak faults, sensor sets with pressure measurements perform best Helps decide importance of sensors based on which faults are most important
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Motivation
Electronic components have increasingly critical role in onboard, autonomous functions for
Vehicle controls, Communications, Navigation, Radar systems
Future aircraft systems will rely more on electric & electronic components
More electric aircraft Next Generation Air Traffic System (NGATS)
Move toward lead-free electronics and microelectromechanical devices (MEMS) Assumption of new functionality increases number of electronics faults with perhaps unanticipated fault modes Needed
Understanding of behavior of deteriorated components to develop capability to anticipate failures/predict remaining RUL
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Thermal overstress aging of MOSFETs and IGBTs Electrical overstress aging testbed (isothermal) Modeling of MOSFETs Identification of precursors of failure for different IGBT technologies* Prognostics for output capacitor in power supplies+ Effects of lightning events of MOSFETS Effects of ESD events of MOSFETS and IGBTs Effects of radiation on MOSFETS and IGBTs
In collaboration with
* University of Maryland + Vanderbilt University
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In situ state monitoring is supported at varying gate and drain voltage levels.
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Experiment on IGBT
Collector-emitter voltage turn-OFF transient
Collector-Emmiter Voltage (V) Collector-Emmiter and Gate (V)
10 Vce 5 Vg T = ~ 330C Vd = 4v Vg = 10v
Switching Transient peak(V)
11.5 11 10.5 Degradation time (s) 10000 9000 8000 7000 6000 5000 4000 3000 2000 7.5 1000 7 326 326.5 327 327.5 328 328.5 329 temperature (C) 329.5 330 330.5 331
10 9.5 9 8.5 8
4.15
4.2
4.3
8.2 8 7.8 7.6 7.4 4.22 4.222 4.224 4.226 time (s) 4.228 4.23
4.232 x 10
-5
Turn-OFF collector-emitter voltage transient decreased significantly with both increases in temperature and thermal overstress aging time
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Electronics Aging
Offstate ICE 0.6 0.55 0.5 0.5 0.45 0.4 0.4 0.3
IGBT Waveforms ICE
0.7
0.6
VGE
0.2
0.3 0.2
6 5 4
3 2
0.1
33.84 33.86 33.88 33.9 33.92 Time (mins) 33.94 33.96 33.98 34 34.02
0.1
85.44 85.45 85.46 85.47 Time (min) 85.48 85.49
0 86.94
86.96
86.98
87
0 33.82
87.08
87.1
87.12
5.07
5.08
5.09
5.1
5.13
5.14
5.15
5.16
86.88
86.89
86.92
86.93
0 -0.5
x 10
x 10
0.5
-0.5
-1
-1.5
-2
-2.5 0
10
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Time (mins)
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40 50 Time (mins)
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90
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40 50 Time (mins)
60
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x 10
x 10
10
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Electro-Mechanical Actuators
Physical Modeling
EMA
5 metric ton load capacity
Data collection in laboratory
Model Verification
Temperature (K)
306.5
0.5
304
301.5
-0.5
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Mission Statement
299 0
500
1000
1500
2000
2500
3000
3500
-1 4000
Time (s)
Error (K)
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Real-time flight surface loads simulation and data recording Data collection flights performed on C-17 (DFRC) and planned on UH-60 (ARC)
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Demonstration
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Modeling Batteries
Freq. Domain Time Domain
1/C
Increasing Voltage E
IR drop
Eo
m=1/(rctCnf)
-> oo re re +2S2Cnf
Polarization Curve
re +rct
Increasing Current I
Im(Z)
Electrolyte Weakening
IncreasingOhmic ResistanceResistance Ohmic Increasing
Im(Z)
Plate Sulphation
Increasing Charge Transfer Resistance Increasing Charge Transfer Resistance
0 0
0 0
Re(Z)
Re(Z)
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Modeling SOC
Objective: Predict when Li-ion battery voltage will dip below 2.7V indicating endof-discharge (EOD) Approach
Model non-linear electro-chemical phenomena that explain the discharge process Learn model parameters from training data Let the PF framework fine tune the model during the tracking phase Use the tuned model to predict EOD
Eo Eo-E Eo-E
mt sd
voltage
Eo-E
mt: mass transfer sd: self discharge rd: reactant depletion
o
rd
E=E -E -E -E
sd rd
mt
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time
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Modeling SOL
Objective: Predict when Li-ion battery capacity will fade by 30% indicating life (EOL) Approach
Model self-recharge and Coulombic efficiency that explain the aging process Learn model parameters from training data Let the PF framework fine tune the model during a few initial cycles Use the tuned model to predict EOL
discharge
self-recharge
R. Huggins, Advanced Batteries: Materials Science Aspects, 1st ed., Springer, 2008.
voltage
from measurements
from model
time
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Battery Testbed
Cells are cycled through charge and discharge under different load and environmental conditions set by the electronic load and environmental chamber respectively Periodically EIS measurements are taken to monitor the internal condition of the battery DAQ system collects externally observable parameters from the sensors Switching circuitry enables cells to be in the charge, discharge or EIS health monitoring state as dictated by the aging regime
BHM
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Prognostics in Action
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References
A. Saxena, J. Celaya, B. Saha, S. Saha, K. Goebel, Metrics for Offline Evaluation of Prognostic Performance, International Journal of Prognostics and Health Management, 001, 2010 M. Daigle and K. Goebel, Model-based Prognostics under Limited Sensing, Proceeding of IEEE Aerospace conference 2010, 2010 A. Saxena, K. Goebel, Requirements Specification for Prognostics Performance - An Overview, Proceedings of AIAA@Infotech 2010, 2010 B. Saha, K. Goebel, and J. Christophersen, Comparison of Prognostic Algorithms for Estimating Remaining Useful Life of Batteries, Transactions of the Royal UK Institute on Measurement & Control, special issue on Intelligent Fault Diagnosis & Prognosis for Engineering Systems, pp. 293-308, 2009 B. Saha, K. Goebel, S. Poll and J. Christophersen, Prognostics Methods for Battery Health Monitoring Using a Bayesian Framework, IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 2, pp. 291-296, 2009 J. Celaya, N. Patil, S. Saha, P. Wysocki, and K. Goebel, Towards Accelerated Aging Methodologies and Health Management of Power MOSFETs, Proceedings of Annual Conference of the PHM Society 2009, 2009 B. Saha, K. Goebel, Modeling Li-ion Battery Capacity Depletion in a Particle Filtering Framework, Proceedings of Annual Conference of the PHM Society 2009, 2009 K. Goebel, B. Saha, A. Saxena, J. Celaya, and J. Christophersen, Prognostics in Battery Health Management, I&M Magazine, Vol. 11, No. 4, pp. 33-40, 2008 K. Goebel, B. Saha, and A. Saxena, A Comparison of Three Data-driven Techniques for Prognostics, Proceedings of MFPT 2008 2008
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