MX Signal Debug

Wang Ze

Contents
DAC Test - Overview - Debug Flow

ADC Test - Overview - Debug Steps

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Main Building Blocks of Analog Modules

Clock (external signal) Trigger Sequencer memory (external signal)

Sequencer

Timing generator

Relay multiplexer Filter Att or Amp

Waveform memory

DAC (AWG) or ADC (WD)

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SmarTest Main Tool Bar

Analog Tab -> Signal Analyzer

Signal Analyzer Start Button

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Passing Waveform into Signal Analyzer

In order to debug a waveform captured from the hardware, retrieve the waveform from the hardware and pass it into the Signal Analyzer by using an API such as PUT_DEBUG API or the Data Display API.
An example:

ARRAY_D waveform1, waveform2; waveform1 = Analog.DGT("dgt1").getWaveform(); waveform2 = Analog.DGT("dgt2").getWaveform(); PUT_DEBUG("dgt1", "first", waveform1); PUT_DEBUG("dgt2", "second", waveform2);
Pin name label name Source name
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Flag Control
Testsuit Flag Testflow Variables

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The Waveform Navigator Tool (WNT) will list each waveform as shown in the following screen.
Pin name label name Source name

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DAC Test Overview

Digital Subsystem
Devices Power Supply Vref Digital Pins Digital Waveform DAC Device Power Supply

Analog Subsystem
DUT Digitizer Analog Waveform Multiplexer ADC

1
Waveform Memory

Vector Memory Trigger/Sync.

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DAC Test Debug

Case 1: No signal captured in SMT; Case 2: Signal captured, out of limit.

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Case 1: No signal captured in SMT

1. 2. Power check under connected state;
Digital Subsystem Analog Subsystem
Device Power Supply Devices Power Supply

Infinite loop of pattern to capture waveform of DAC at the point of the output of LB using oscillograph; (trace, relay) Hardware monitor used to check the relay switch states of analog module; *** Trigger captured by Oscillograph to check the level change; software trigger can be tried: trigger:AnalogDGT(Ain).trigger(); TestMethod problem cause data source overflow

Vref Digital Waveform

DUT

2
Analog Waveform DAC Multiplexer

Digitizer

Digital Pins

ADC

3.

Vector Memory

Waveform Memory

Trigger/Sync.

4.

5.

***
*** Step by step debug needed
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Relays Switches Display

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Step by step debug in TestMethod

Step4:Debug Debugger Icons in TestMethod Step1:set Testsuit Flag Step3:Execute Testitem Step2 Execution Point
Breakpoints Instant Console View

click the debugon

Variables/ Expression Views

variable=dgtz_waveform

Breakpoints/Problems Views

type=void Quick Viewer/Console /Debug Views

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Case 2: Signal captured, out of limit

1. 2. 3. 4. 5. Power voltage adjustment;
Digital Subsystem Analog Subsystem
Device Power Supply Devices Power Supply

Vil and Vih of data input pins; Initial discard of DGT adjustment, wait time added in the pattern;* V-Range and filter of DGT adjustment; Waveform check in signal analyzer;
For dynamic test, check the noise floor and harmonics; For Static test, check the integrality of the waveform.

Vref Digital Waveform

DUT

2
Analog Waveform DAC Multiplexer

Digitizer

Digital Pins

ADC

Vector Memory

Waveform Memory

Trigger/Sync.

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Analog Setup Tool (Hardware Settings)

Setup Page selector Pin/Core selectors Global functions

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Signal Spectrum Components

Fundamental Harmonic Noise Spur

Bin Number
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ADC Test Overview

Analog Subsystem
Power Supply Device Power Supplies Reference Voltage DUT Waveform Generator DAC Multiplexer Analog Waveform ADC Vector Capture Memory Digital Data Digital Capture Pins

Digital Subsystem

Waveform Memory

Digital Pins Conversion Clock Trigger

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ADC Test Debug

Case 1: No signal captured in SMT; Case 2: Signal captured, out of limit.

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Case 1: No signal captured in SMT

1. 2. 3. Power check under connected state;
Power Supply

Digital Subsystem Analog Subsystem

Device Power Supplies Reference Voltage

Waveform check in Analog setup; Trigger captured by Oscillograph to check the level change; software trigger can be try: trigger:AnalogAWG(Ain).trigger(); Infinite repeat of sequence to capture waveform of ADC at the point of input of LB using oscillograph; (trace, relay) *** Hardware monitor used to check the relay switch states of analog module; *** TestMethod problem cause data source overflow

DUT
Waveform Generator DAC Multiplexer Analog Waveform Digital Data ADC Digital Capture Pins

Waveform Memory

Vector Capture Memory

4.

Digital Pins Conversion Clock Trigger

5.

6.

***

*** Step by step debug needed

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Viewing the Contents of a Waveform Label

Click here

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Set RPTI/LoopI of the sequence to generate the waveform for capture by oscillograph

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Case 2: Signal captured, out of limit

1. 2. 3. 4. 5. Power voltageadjustment; VOL and VOH adjustment of digital capture; Initial discard of digital capture adjustment; AWG Voltage parameter adjustment;
Conversion Clock

Digital Subsystem
Power Supply

Analog Subsystem

Device Power Supplies Reference Voltage

DUT
Waveform Generator DAC Multiplexer Analog Waveform Digital Data ADC Digital Capture Pins

Waveform Memory

Vector Capture Memory

Digital Pins

Waveform check in signal analyzer;

For dynamic test, check the noise floor and harmonics; For Static test, check the integrality of the waveform.

Trigger

*** Step by step debug needed

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Hardware Settings for the WGA

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Please collect the data using EventDatalog and the waveform in the Signal Analyzer for analysis if Mixed signal issue happens!

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Q&A

Thank you!

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