Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials July 8-12, 1991 Tokyo, Japan

A COMPARISION BEXWEEN THE ATMOSPHERIC CORRECTION FACTORS USED BY IEC AND ANSI APPLIED TO TESTS PERFORMED ON POST INSULATORS

CEPEL

Mello, D. R. and Souza, S.D.C C e n t e r f o r Electrical Energy Research Rio d e J a n e i r o - B r a z i l

Abstract The IEC had revised its Standard nwrber 60.1 - High Voltage Testing Techniques - and published it in 1989. One of the innovations is t h e use of t h e new approach of a d s p h e r i c c o r r e c t i o n f a c t o r s described by P i g h i and Feser. The ANSI had also revised its Standard C 29.1 - T e s t Methods f o r Electrical Power I n s u l a t o r s and continued t o use t h e atmospheric c o r r e c t i o n f a c t o r s described on the same Standard f r a n 1982. This r e p o r t s m r i z e s a comparision of the r e s u l t s of d i e l e c t r i c tests ( l i g h t n i n g impulse, switching iupulse and power frequency tests). performed on 2 meters p o s t i n s u l a t o r s , c o r r e c t e d t o standardized a d s p h e r i c c o n d i t i o n s according t o IEC with t h e same r e s u l t s c o r r e c t e d according ANSI. The l a r g e range of hlrmidities had permited t o make a good comparision between the two Standards, p r i n c i p a l l y a t high values of absolute humidities ( 15 g/m').
1) Introduction

(,, U)

c a l c u l a t e d as t h e medium value of 5 d i s r u p t i v e

voltage a p p l i c a t i o n s ( t h e t i m e i n t e r v a l between each a p p l i c a t i o n w s 1 minute). a 2 . 3 ) Ambient conditions durinq t h e tests The range of t h e atmospheric conditions, noted during t h e tests m d e a t t h e t h r e e l a b r a t o r i e s involved, can be seen i n f i g u r e 2. The a l t i t u d e of the t h r e e laboratories is: CEPEL COPEL IEE/USP
+ +

sea l e v e l 905 m 760 m

2.4) Colnparision between t h e c o r r e c t i o n f a c t o r s The methodology used to c o r r e c t t h e test r e s u l t s is:

- t o IEC: - t o ANSI:
Where :

um um

uAm/(%

x KJ

= UAm/(%/IQ

Since 1982, s e v e r a l s t u d i e s have been m d e 11,2,3,41 i n order to improve t h e atmospheric c o r r e c t i o n f a c t o r s used i n d i e l e c t r i c tests, f i n i s h i n g with t h e n publication of an article by P i g i n i and Feser 151 i 1987, used as reference f o r t h e r e v i s i o n of IEC Standard n r . 60.1 161, published in 1989. The ANSI Standard n r . C.29.1 171, employed i n tests f o r n i n s u l a t o r s , although had s u f f e r e d a r e v i s i o n i 1988, u t i l i z e its o n w atmospheric correction f a c t o r s , d i f f e r e n t s , i n c l u s i v e l y , from the f a c t o r s used by t h e ANSI/IEEE Standard n r . 4 181, published i n 1978. This Standard is t h e ANSI reference f o r d i e l e c t r i c tests and it employs the same f a c t o r s of IEC 60.1 published i n 1973. The o b j e c t i v e of t h i s work is t o compare t h e r e s u l t s from d i e l e c t r i c tests, perfonned on post i n s u l a t o r s , c o r r e c t e d f o r the reference atmospheric conditions by t h e two Standards c i t e d a b v e . 2) Experimental Details

- Um

value

of

u50% or

UD

under

reference

atmospheric conditions,

uATM

value

of

U50%

or

UD

under

atmospheric

conditions measured during t h e test.

\
with

( 6 )m t o IEC

and

%=6
273
t

t o ANSI

(F)2 7 3 + T ) x (
kPa, measure3 during to

To

P + barometric pressure, i n t h e test P +

standardized barometric pressure (101,3 kPa

IEC and 100,86 kPa t o ANSI)

T + temperature, i n "C, 2.1) Object under t e s t The tests were m d e on station post glass i n s u l a t o r s , 230 kV and B I L equal t o 900 kV, as can be seen i n f i g u r e 1. 2.2) Test method There were m d e l i g h t n i n g impulse tests f o r t h e determination of t h e value of U50% using up and down
TO+

measured during t h e test

standardized t e m p r a t u r e (2OoC t o IEC and 25 OC t o ANSI)

the

m + expoent obtained in function of

G, described i n IEC 60.1

parameter

$+ ( k ) w t o
with

IEC

and

= k t o ANSI

test methcd with 40 voltage a p p l i c a t i o n s , f o r b t h p o l a r i t i e s , and power frequency tests f o r the determination of t h e d i s r u p t i v e discharge voltage

existing k + obtained by curves in Standard used m + e x p e n t obtained i n function of parameter G, described i n IEC 60.1.

the the

359

3) T e s t R e s u l t s The r e s u l t s obtained were p l o t t e d as Um versus the

5) Reference

r a t i o between t h e a b s o l u t e humidity and r e l a t i v e a i r d e n s i t y (Hms/RAD) f o r Um obtained by IEC ( f i g u r e s 3 t o 5) and by ANSI ( f i g u r e s 6 t o 8 ) . The table 1 p r e s e n t s the following i n f o m a t i o n s obtained w i t h t h e a p p l i c a t i o n of l i n e a r regression t o values of Um:

111 - A. P i g h i : Atnuspheric c o r r e c t i o n factors f o r l i g h t n i n g impulses and switching impulses Cigr6 33.03 - paper no. 50 - 1982;
12) - A. P i g i n i and a l l : Influence of air d e n s i t y and h u n i d i t y on the breakdown voltage of a i r gaps - Cigrg 33.03 - paper no. 29 - 1983; 131 - E. Busse a d K. Feser: Influence of humidity upon the breadown voltage of a p o s i t i v e rod-plane gap and t h e c o r r e c t i o n f a c t o r to be applied - Cigr6 33.03 - paper no. 14 - 1984;
41

U,,

value of Um when Hms/wy)

= 11 g/m3;

- the i n c l i n a t i o n of the s t r a i g h t
f i g u r e s 3 t o 8; the percentual d i s p e r s i o n of considering U
the

lines

showed of

in
Um

A . P i g i n i and a l l : Influence of

values

a i r d e n s i t y on the impulse s t r e n g t h of e x t e r n a l i n s u l a t i o n IEEE/PAS - vol. io4 - no. 10 - ~ 9 8 5 ;

K.

as the reference value.

51

The values presented i n table 1 had showed that the r e l a t i o n ANSI/IM: of the values of U, is lower than 2% f o r l i g h t n i n g implse tests and upper 5% f o r power frequency tests. Considering 3% as t h e nnximum acceptable value f o r this r e l a t i o n , it can be s a i d that the both c o r r e c t i o n methods are similar f o r impulse tests b u t not f o r power frequency tests. As t h e i n c l i n a t i o n , the d i f f e r e n c e observed is not s i g n i f i c a t i v e , q u a l i t a t i v e l y . For t h e percentual a d i s p e r s i o n , t h e r e w s a reduction of its value when the ANSI c o r r e c t i o n method w s employed. a 4) conclusion The test r e s u l t s i n d i c a t e d that the use of ANSI c o r r e c t i o n f a c t o r s had a better p e r f o m c e than the use of IEC ones. Such conclusion needs mre tests in order t o o b t a i n a confirmation of the above affirmative.

Feser and A. Pigini: Influence of atmDspheric conditions on t h e d i e l e c t r i c s t r e n g t h of e x t e r n a l i n s u l a t i o n - E:lectra no. 112 - pp 83 - 95, 05/1987;

161 - IEC 60.1 e 60.2 - High Voltage Test Techniques - Revision - 1989; 171
181

ANSI C 29.1

- Test methods power i n s u l a t o r s 1988;

for

electrical
for High

ANSI/IEEE 4 - Standard Voltage Testing - 1978.

Techniques

Li;h$inq 1256

Imp.(-) 1272 0,7160 1,0325

Power Frequency
634

1
I

667

1
I
I

(%I

6,9746

I
I

0,3769 5,6725 1,4331

I
I

1,6240 11,672 19,2953

3 60

Figure 2

- Atnospheric Conditions

Figure 1
I

- Object under test

1

I
Hrai i BX
Hral

> clnX
A A A

I-

1270 n

I 2m a &

I
a

11

1176

A A A A A A A

1 "

6.0

76 .

10.0

12.6

1. 60

1075}

'Habe /'DRA
1

I Q/rra
(-)

,owl
Figure 3

10 W i ' [ # K I

13

1 6

Figure 4

(dm35
(+)

- Test results - LI

- Using IEC

- Test results - LI

- Using

IEC

726 r

1 t m

n
A

iA f
io78
I
I I

i I
I

O f 2

mi
Figure 5

io
k5a
/'

I
18

t3

1 8

1 5 bb/M;fl

1 3

1 6

(ditl3)

m. c

Q/ils9

>

Figure 6

- Test results - Powzc frequency using IM:

- Test results - I;I: (+) - Using ANSI

- 361 -

ILV

II

t
I

i
1 "

Figure 7

- Test results - LL

(-)

- Using ANSI

Figure 8

- Test

results - F a e r fresuency

using ANSI

D a C y Ramalho de Me110 W L - centra de Pesquisas de Energia El6trica E AV. Hum Ilha da Cidade Universitkia 20001 Rio de Janeiro RJ - Brazil