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To interface and associated verification requirements for the control of the electromagnetic interference (emission and susceptibility) characteristics of electronic, electrical, and electromechanical equipment and subsystems designed or procured for use by activities and agencies of the Department of Defense. Such equipment and subsystems may be used independently or as an integral part of other subsystems or systems.
UK Defence Standardization
TEST METHODS
for Transient
Transient Category
External Transient
Internal Transient
A.
1. 2. 3.
B.
1. 2. . .
OTHER SOURCE
HEMP=High-altitude EM Pulse
NATURE
NATURE
IMPULSE EXCITATION
*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation
*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation
*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation
*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation
*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation
CS115-CS116 TEST
CS115-CS116 TEST
CS115-CS116 TEST
CS115-CS116 TEST
CS115-CS116 TEST
generator
CS115-CS116 TEST
generator
generator
GENERATOR
GENERATOR
Bandwidths.
For susceptibility measurements, the entire frequency range for each applicable test shall be scanned frequency scan rates and frequency step sizes of signal sources shall not exceed the values listed in Table III. The rates and step sizes are specified in terms of a multiplier of the tuned frequency (fo) of the signal source.
These bandwidths are specified at the 6 dB down points for the overall selectivity curve of the receivers.
If a controlled video bandwidth is available on the measurement receiver, it shall be set to its greatest value. Larger receiver bandwidths may be used; however, they may result in higher measured emission levels. NO BANDWIDTH CORRECTION FACTORS SHALL BE APPLIED TO TEST DATA DUE TO THE USE OF LARGER BANDWIDTHS.
Analog scans refer to signal sources which are continuously tuned. Stepped scans refer to signal sources which are sequentially tuned to discrete frequencies.
LISN schematic.
LISN impedance.
RS103-2. Multiple test antenna locations for frequency > 200 MHz.
Frequency Step
As specified in Standard (Fig.RS101-1) 30 Hz to 100 kHz nil 3 Sec Step Frequency Size 30 Hz to 100 3 Hz Hz 100 Hz to 10 1kHz Hz 1kHz to 100 100 kHz Hz
Frequency 10 kHz to 100 kHz 100 kHz to 1MHz 1MHz to 5 MHz 5 MHz to 30 MHz 30 MHz to 100 MHz 100 MHz to 200 MHz 200 MHz to 400 MHz 400 MHz to 1 GHz 1 GHz to 3 GHz
Antenna
10 kHz
20 kHz 100 kHz 300 kHz 1 MHz
Biconilog
2 MHz
4 MHz 5 MHz Double Ridged Waveguide Horn
Subrange 10 kHz 150 kHz 150 kHz 30 MHz 30 MHz 200 MHz 200 MHz 1 GHz 1GHz 7 GHz
100 kHz
1 MHz
40 kHz
400 kHz
Log Periodic
Double Ridged Waveguide Horn