Professional Documents
Culture Documents
Quality
Control
Operations Management
by
R. Dan Reid & Nada R. Sanders
4th Edition Wiley 2010
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Learning Objectives
2.
3.
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Sources of Variation
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Descriptive Statistics
Descriptive Statistics
include:
Skewed
i 1
x
n
i 1
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n 1
Distribution of Data
Normal
distributions
Skewed
distribution
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SPC Methods-Developing
Control Charts
Control Charts (aka process or QC charts) show sample data
plotted on a graph with CL, UCL, and LCL
Control chart for variables are used to monitor characteristics
that can be measured, e.g. length, weight, diameter, time
Control charts for attributes are used to monitor
characteristics that have discrete values and can be counted,
e.g. % defective, # of flaws in a shirt, etc.
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Percentage of values
under normal curve
Control limits
balance
risks like Type I
error
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11
Time 2
Time 3
Observation
1
15.8
16.1
16.0
Observation
2
16.0
16.0
15.9
Observation
3
15.8
15.8
15.9
Observation
4
15.9
15.9
15.8
Sample
means (Xbar)
15.87
5
15.975
15.9
Sample
ranges (R)
0.2
0.3
0.2
, x
k
n
where (k) is the # of sample means and (n)
is the # of observations w/in each sample
x
UCL x x z x
LCL x x z x
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.2
UCL x x z x 15.92 3
16.22
4
.2
LCL x x z x 15.92 3
15.62
4
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2
3
4
5
6
7
8
9
10
11
12
13
14
15
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A2
1.88
1.02
0.73
0.58
0.48
0.42
0.37
0.34
0.31
0.29
0.27
0.25
0.24
20100.22
D3
0.00
0.00
0.00
0.00
0.00
0.08
0.14
0.18
0.22
0.26
0.28
0.31
0.33
0.35
D4
3.27
2.57
2.28
2.11
2.00
1.92
1.86
1.82
1.78
1.74
1.72
1.69
1.67
1.65
15
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17
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Number
of
Defectiv
e Tires
Number of
Tires in
each
Sample
Proportio
n
Defectiv
e
20
.15
20
.10
20
.05
20
.10
20
.05
Total
100
.09
Solution:
CL p
p
# Defectives
9
.09
Total Inspected 100
p(1 p )
(.09)(.91)
0.64
n
20
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P- Control Chart
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10
Total
22
# complaints 22
CL
2.2
# of samples 10
UCLc c z c 2.2 3 2.2 6.65
LCLc c z c 2.2 3 2.2 2.25 0
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C- Control Chart
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Process Capability
Product Specifications
process width
6
Cpk helps to address a possible lack of centering of the process
USL LSL
Cpk min
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3
3
23
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Machin
e
.05
B
C
.1
.2
USLLSL
.4
.3
.4
.4
Solution:
Cp
.6
1.2
Machine A
USL LSL
.4
1.33
6
6(.05)
Machine B
Cp=
Machine C
Cp=
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,
3(.1)
3(.1)
Cpk min
Cpk
.1
.33
.3
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6 Sigma versus 3
Sigma
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Acceptance Sampling
Defined: the third branch of SQC refers to the
process of randomly inspecting a certain
number of items from a lot or batch in order to
decide whether to accept or reject the entire
batch
Different from SPC because acceptance sampling is
performed either before or after the process rather
than during
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Acceptance Sampling
Plans
Goal of Acceptance Sampling plans is to determine the criteria
for acceptance or rejection based on:
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Operating Characteristics
(OC) Curves
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Developing OC Curves
OC curves graphically depict the discriminating power of a sampling plan
Cumulative binomial tables like partial table below are used to obtain probabilities of
accepting a lot given varying levels of lot defectives
Top of the table shows value of p (proportion of defective items in lot), Left hand column
shows values of n (sample size) and x represents the cumulative number of defects found
Table 6-2 Partial Cumulative Binomial Probability Table (see Appendix C for
complete table)
Proportion of Items Defective (p)
.05
.10
.15
.20
.25
.30
.35
.40
.45
.50
.
237
3
.
168
1
.
116
0
.
077
8
.
050
3
.
031
3
.
773
8
.
590
5
.
443
7
.
327
7
Pac
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.
Example: Constructing an OC
Curve
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Where to inspect?
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SQC in Services
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USL LSL
7-3
1.33
6
1.0
6
,
3(1/2)
3(1/2)
Cpk min
Cpk
1.8
1.2
1.5
UCL x X z x 5.0 3
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Chapter 6 Highlights
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Chapter 6 Highlights
cont
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Chapter 6 Highlights
cont
Control charts for variables include x-bar and Rcharts. X-bar charts monitor the mean or average
value of a product characteristic. R-charts monitor
the range or dispersion of the values of a product
characteristic. Control charts for attributes include pcharts and c-charts. P-charts are used to monitor the
proportion of defects in a sample, C-charts are used
to monitor the actual number of defects in a sample.
Process capability is the ability of the production
process to meet or exceed preset specifications. It is
measured by the process capability index C p which is
computed as the ratio of the specification width to
the width of the process variable.
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Chapter 6 Highlights
cont
42
The End
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