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How much closely spaced objects human eye

can separate ?
?????
0.2mm spacing
Optical microscope
Particles are photons
Resolving power = FORMULA?

Currently, Finest optical microscope give upto 1000x magnification


Optical microscopes are limited in their power by the properties of light. To surpass
such primitive limits, scientists in the 1930s began working with electron
microscopes.
HISTORY

In 1937: Manfred Von Ardenne


invented first SEM
In 1942: Zworykin et al. developed
first SEM for bulk samples
In 1965: Cambridge Scientific
Instruments made first commercial SEM

First SEM designed by Ardenne 1937

Today's extremely high magnification image of about 1000000x available


Most versatile instrument of material Scientist
SCANNING ELECTRON
MICROSCOPE
Probe is classical
electron
Resolution power
WHAT IS SEM?
Microscope uses focused electron beam to
examine surface of a sample
To study morphology i.e. shape and size of
particles of sample.
To see topography i.e. surface texture of specimen.
To analyzes elements and compositions in a
sample.

Benefit over TEM: Easy sample preparation


Members of SEM
Up to down components of SEM
Gun source by two methods:
Thermionic and field emission
IISER Clean room facility is FE-SEM
Collimated column
Consist of series of aperatures and condensed lenses.
Detector
SE(Secondary electrons)- low energy
BE(Backscattered electrons)- high energy
SB(both secondary and backscattered)- intermediate energy
Sample holder
Electronic circuitry
to produce image from signal.
PHENOMENA TAKE PLACE
WHEN ELECTRON HITS
SOURCE OF ELECTRONS
Two processes:
Thermonic emission
(traditional method)
Field emission
(modern method)
Has better resolution
and brightness but need
high vacuum 100m 100nm

Huge number of electrons per unit time per unit area (high current
density) is required with smallest electron beam spot.
COLLIMATED COLUMN
Condensed
lens(electromagnetic lens)
A coil of wire through which current flows
to produce a magnetic field that converges
the beam into the hole in the centre.

Objective Aperature
To control intensity of electrons that finally
reached sample. It narrow the electrons on
sample to have sharp spot.

Scan coils
Finally beam synced to the CRT to produce
image

By changing magnetic field strength, focal length of lens changes.


DETECTORS
Backscattered
electron detector

Secondary electron
detector
GLIMPSE OF ACHIEVEMENT OF
SEM MICROGRAPH

Pollen grains

AFM Centilever
THANK YOU FOR YOUR
ATTENTION

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