Professional Documents
Culture Documents
Memory Test
Memory market and memory complexity
Notation
Faults and failures
MATS+ March Test
Memory fault models
March test algorithms
Inductive fault analysis
Summary
Permanent faults:
Missing/Added Electrical Connection
Broken Component (IC mask defect or
silicon-to-metal connection)
Burnt-out Chip Wire
Corroded connection between chip &
package
Chip logic error (Pentium division bug)
Chip,
Array, &
Board
Functional fault
a Cell stuck
b Driver stuck
c Read/write line stuck
d Chip-select line stuck
e Data line stuck
f Open circuit in data line
g Short circuit between data lines
h Crosstalk between data lines
Fault
SAF Stuck-at fault
TF Transition fault
CF Coupling fault
NPSF Neighborhood Pattern Sensitive fault
1 (rx, …, w x )
2 (r x , …, wx)
SA0
SAF
AF+SAF
ABF
ABF
SCF
SA0
ABF
March 3, 2018 VLSI Test: Bushnell-Agrawal/Lecture 15 44
Multiple Fault Models
Coupling Faults: In real manufacturing, any #
can occur simultaneously
Linkage: A fault influences behavior of another
Example March test that fails:
{ (w0) ; (r0, w1); (w0, w1); (r1)}
Works only when faults not linked
Algorithm Complexity
MATS 4n
MATS+ 5n
MATS++ 6n
MARCH X 6n
MARCH C— 10n
MARCH A 15n
MARCH Y 8n
MARCH B 17n
MATS+:
{ M0: (w0); M1: (r0, w1); M2: (r1, w0) }
MATS+:
{ M0: (w0); M1: (r0, w1); M2: (r1, w0) }
MATS+:
{ M0: (w0); M1: (r0, w1); M2: (r1), w0 }
March 3, 2018 VLSI Test: Bushnell-Agrawal/Lecture 15 61
RAM Tests for Layout-
Related Faults
Inductive Fault Analysis:
1 Generate defect sizes, location, layers
based on fabrication line model
2 Place defects on layout model
3 Extract defective cell schematic &
electrical parameters
4 Evaluate cell testing, using VLASIC
Dekker found these faults:
SAF, SOF, TF, SCF, CFid, DRF
Proposed IFA-9 March test
Delay means wait 100 ms
Algor-
ithm Description
IFA-9 { (w0); (r0, w1); (r1, w0); (r0, w1);
(r1, w0); Delay; (r0, w1); Delay; (r1) }
IFA-13 { (w0); (r0, w1, r1); (r1, w0, r0);
(r0, w1, r1), (r1, w0, r0),
Delay; (r0, w1); Delay; (r1) }
March 3, 2018 VLSI Test: Bushnell-Agrawal/Lecture 15 63
IFA Test Validation
Higher scores show better tests