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Physics of X-Rays

and

Instrument Parameters

1 Bruker Confidential 31/10/2018


Introduction

 Physics of X-rays:

What are they?


Origin?
Properties?

 Instrument Parameters:
 tube
 filter
 (sample: see Appendix)
 collimator + collimator mask
 crystal
 detector

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Introduction

 1  tube: “Kramer”
I () =KiZ -1
 min 
Sample
“Duane and Hunt”

Filters
Collimators
h.c
E=

Tube d,   filter
Crystals
 sample
 collimator
Z, i, E  crystal
 Detectors
n = 2d sin “Bragg”
 detector

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Physics of X-rays: What are they?

Energy-range (keV) Wavelength Type of radiation


-7
< 10 cm to km Radio - waves
<10
-3
m to cm Micro - waves
<10
-2
m to mm Infrared
0,0017 - 0,0033 37 – 75 nm Visible light
0,0033 - 0,1 12,5 – 37 nm Ultraviolet light
0,1-100 0,0125 – 12,5 nm X-rays
100 - 5000 0,0002 – 0,0125 nm Gamma radiation

1nm = 10Å = 10-9m = 10-6mm

XRF analysis covers the following energy- respective wavelength range:


E = 0.11 - 60 keV  = 11.3 - 0.02 nm
or
Elemental range from Berylium (Be) to Uranium (U)

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Physics of X-rays: Origin

X-rays originate from the energy loss associated with the interaction of
high energy electrons with atoms

Continuous radiation
(white radiation or Bremsstrahlung)

Characteristic radiation
(photoelectric effect)

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Physics of X-rays: Origin

h.c 12,4
 min = =
V V

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Physics of X-rays: Origin

characteristic radiation photoelectric interaction

M K-Quant EK = EK-EL


L
K EK = EK-EM

L-Quant EL = EL-EM


EM = EM-EN
High Energy Photon

K-Quant

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Physics of X-rays: Origin
Derivation of the X-ray lines from shell transfers

Niels Bohr

Bohr‘s atom model

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Physics of X-rays: Origin

X-ray emission lines = electron transitions


K H

2    K-lines

L Li, ....., F

      L-lines

M Na, ....., Cl

M-lines

N K, ....., Br

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Physics of X-rays: Origin

CONTINUUM, COHERENT (RAYLEIGH) AND INCOHERENT (COMPTON) SCATTERING

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Physics of X-rays: Origin

FLUORESCENT YIELD
Concurrent process:
Emission of
Auger-Electrons

Np(useful )
FluorescentYield (w ) =
Np(total)

wk(B)  0-
wk(Fe)  0.
wk(Te)  0.86
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Physics of X-rays: Properties

All these effects occur at the same time!


I = Io. exp -  . r . x
 Photo-electric effect
=0 r, 
 Absorption (by composite

I0 (0) I ()
material)
 Scattering: coherent
incoherent
 Diffraction
 >0

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Physics of X-rays: Properties

sample

Rayleigh scattering (elastic)


Compton scattering (inelastic)
Y
0 c

- collimator slit
- analyser crystal
- detector

c-0 = 0.0243 (1 -cos ) in Å

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Physics of X-rays: Properties

Diffraction:
 coherent scatter from the different crystalline phases in the material
 reinforcement of the scattered waves takes place

PHASE ANTI-PHASE

 Bragg’s Law has to be fulfilled: n = 2d sin

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Instrument Parameters: the tube

 Design: End-Window (or Side-Window)

 Anode material

 Window material

   1 
 Excitation kV, mA I ( ) = KiZ  - 1  2 
  min    
 Cooling

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Instrument Parameters: the tube

Tube head cooling


Water-inlet for cooling the anode

Ring-shaped cathode

Electron beam

thin Beryllium window 75m or 125m

X-ray beam
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Instrument Parameters: the tube

   1 
I ( ) = KiZ  - 1  2 
  min    
INFLUENCE OF THE ANODE MATERIAL

min.

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Instrument Parameters: the tube

   1 
I ( ) = KiZ  - 1  2 
INFLUENCE OF THE CURRENT   min    

Imax

min.

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Instrument Parameters: the tube

   1 
I ( ) = KiZ  - 1  2 
  min    
INFLUENCE OF THE KILOVOLTAGE

Imax

min.

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Instrument Parameters: the filters

ADVANTAGES:
 Exclude tube lines

 Improve the peak to background ratio

 Suppression of spectral impurities from the tube spectrum

 Different types (Cu, Al,...) and varying thickness (10- 800 m) of filters
are available to select the optimum settings

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Instrument Parameters: the filters

Cu filter 200m to exclude the Rhodium tube lines

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Instrument Parameters: the filters

Use of an Al 100m film to improve the Peak-to-Background ratio

Sr KA1
LiF220
0,15 degree collimator Ip/Ib = 80 kcps/2,2 kcps = 36
50kV/50mA
3 Ib
Black: 100m Al filter LLD = *
Red: No filter s t

Ip/Ib = 36 kcps/0,8 kcps= 45


Sr KB1/3

Ip/Ib = 32,0 kcps/2,6 kcps = 12,3

Ip/ Ib = 14,7 kcps/1,09 kcps = 13,5 Rb KA1


Ip/Ib = 5,30 kcps/1,45 kcps = 3,60
Ip/Ib = 2,50 kcps/0,55 kcps = 4,55

<30.73 Y : 0.181 to 86.32 40.926>


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Instrument Parameters: Sensitivity

The sensitivity in combination with the resolution can


depend on 2 parameters:
 the collimator or soller slit
 reflection efficiency of the crystal

The sensitivity can often be increased at the expense of


the resolution (separation between the peaks) and vice versa

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Instrument Parameters: the
collimators

 The collimator is mostly preceded by a collimator mask

 The mask hides the sample cup radiation comes mainly from
the sample

 Different mask sizes (8, 18, 23, 28 and 34mm):


 different sample sizes
 improve cup masking

 Collimator:
 diverges secondary X-ray beam
 finer improves resolution but less intensity
 different sizes: 0.12, 0.23, 0.46, 1 and 2 degree (°)

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Instrument Parameters: the
collimators

IN

0,46 degree

0.23 degree

OUT

1 degree 2 degree

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Instrument Parameters: the
collimators
Improving the resolution by means of a collimator

0.46 degree collimator


0.15 degree collimator Cr KB1

Cr KB1
Mn KA1

Mn KA1

<61.21 Y : 0 to 362.5 kcps KCps 63.931>


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Instrument Parameters: the Crystals

POLYCHROMATIC MONOCHROMATIC

' AC '
= sin 
d
' AC' = d sin 
' ACB' = 2d sin 
' ACB' = n Amplification

n = 2d sin  n = 1, 2, 3, ...... (Reflection order)

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Instrument Parameters: the Crystals

Crystal Material Application for Elements 2d–value [nm]

LiF(420) Lithiumfluoride from Co KB 0.1801


LiF(220) Lithiumfluoride from V 0.2848
LiF(200) Lithiumfluoride from K 0.4028
Ge Germanium P, S, Cl 0.653
InSb Indiumantimonide Si 0.7481
PET Pentaerythrit Al - Ti 0.874
AdP Ammonium dihydrogen Mg 1.0648
phosphate
TlAP Thalliumhydrogenphtalate F, Na 2.5760
OVO-55 Multilayer (W/Si) (C) O - Si 5.5
OVO-160 Multilayer (Ni/C) B, C, N 16
OVO-N Multilayer (Ni/BN) N 11
OVO-C Multilayer (V/C) C 12
OVO-B Multilayer (Mo/B4C) B (Be) 20

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Instrument Parameters: the Crystals

Improving the resolution by means of a crystal

LiF200 Cr KB1
240

230 LiF220
220

210

200

190

180

170

160

150

140
Lin (KCps)

130

120
Cr KB1
110

100

90
Mn K1
80

70

60

50

40
Mn K1
30

20

10

6. 04 6. 03 6. 02 6. 01 6. 00 5. 99 5. 98 5. 97 5. 96 5. 95 5. 94 5. 93 5. 92 5. 91 5. 90 5. 89 5. 88 5. 87 5. 86 5. 85 5. 84 5. 83 5. 823

E - Scale
Immediate Measurement - File: LiF200_0,46C.ssd - - 2Th.0: 61.200 - 2Th.1: 63.868 - WL.0: 2.050 - WL.1: 2.130 - Step Size: 0.046 - Time.: 0.600 - Crystal: LiF200 - Collimator: 0.46 degr. - Filter: none - Mask: 34 mm - kV: 50 - mA: 81
Operations: Import
Immediate Measurement - File: LiF220_0,46C.ssd - - 2Th.0: 89.400 - 2Th.1: 98.692 - WL.0: 2.003 - WL.1: 2.161 - Step Size: 0.046 - Time.: 0.200 - Crystal: LiF220 - Collimator: 0.46 degr. - Filter: none - Mask: 34 mm - kV: 50 - mA: 81
29 Bruker Confidential
Operations: Import 31/10/2018
Instrument Parameters: the detectors

 Detectors convert X - ray photons into measurable voltage pulses


 A range of detectors is required to cover the
wavelength range 0.012nm - 12nm (100 - 0.1 keV):

 Gas proportional detectors: 0.08nm - 12nm (15 - 0.1 keV)

 Scintillation detector: 0.012nm - 0.15nm (100 - 8 keV)

 Output pulse and energy incoming X-ray photon are proportional


Identification

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Instrument Parameters:
the sealed proportional counter

Ar + 10% CH4 HV: + 1400 V - 2000 V


+ Anode wire +

Ar KA+ DE Ar++e-
e- e- e-

X-rays Pulse

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Instrument Parameters:
the scintillation counter

Photo multiplier

NaI - crystal

X-ray quant

Photo cathode

High voltage

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Instrument Parameters: the detectors
Some characteristics

 The Pulse Height Analysis or


Distribution (PHA/PHD)
Zn-K peak
 The Full Width at Half
00% E = 8.6 keV
Maximum (FWHM)
 The Resolution (R):
gas proportional: 15%
scintillation: 51%

FWHM: 49 %

Lower Higher Discrimination Window


Limit Limit

Y : 0 to 31.33 kcps
<10 200>

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Instrument Parameters: the detectors
PHA = Pulse Height Analysis

Evaluation of the energy-distribution is very important


as several “non-analytical” signals may enter the detector:
 electronic noise
 escape peak
 higher order peaks
 crystal fluorescence

The next slides will show some examples based on Flow


Counter signals (Scintillation counter signals are generally
spoken straightforward apart from eventual Iodium crystal
fluorescence from the NaI crystal)

34 Bruker Confidential 31/10/2018


Instrument Parameters: the detectors
PHA = Pulse Height Analysis

Mn-KA Escape Peak in Stainless Steel


Mn-KA
= 100% E Mn-KA = 5.9 keV
E Ar-KA = 2.96 keV
E Escape Mn-KA= (5.9 -2.96) keV = 2.94 keV

Electronic noise

Mn-KA
Escape Peak = 49%

<0 Y : 0 to 4.085 KCps 300>

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Instrument Parameters: the detectors
PHA = Pulse Height Analysis

Mg-KA in Cement
Mg-KA
= 100% E Mg-KA = 1.3 keV
E Ca-KA = 3,7 keV
E Ca-KA Escape peak = 0.7 keV
E Si-KA/B = 1.7/1.8 keV
E W-M = 1.8 keV

3 rd order Ca-KA
Si-K and W-M from OVO-55
= 285%
Electronic Noise = 135%
3 rd order Ca-KA
Escape peak = 55%

<0 Y : 0 to 1.308 KCps 340>

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Instrument Parameters: the detectors
PHA = Pulse Height Analysis

P-KA in Limestone with Ge crystal


80
P-KA
= 100% E P-KA = 2.0 keV
E Ge-LA = 1.2 keV

Ge X-tal fluorescence
= 60%

<10 Y : 0 to 0.087 KCps 300>

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Instrument Parameters: the detectors
PHA = Pulse Height Analysis
P-KA in Limestone with OVO-55 crystal

2nd order Ca-KA


= 185%
E P-KA = 2.0 keV
E Ca-KA = 3,7 keV EXERCISE!
E Ca-KA Escape peak = 0.7 keV
E Si-KA/B = 1.7/1.8 keV
E W-M = 1.8 keV

Electronic Noise
Si-K and W-M from OVO-55
= 90%

2nd order Ca –KA


Escape peak = 35%
P-KA
= 100%

<10 Y : 0 to 1.275 KCps 300>

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Summary

 A lot of physics take place before we come to a final result: the better
you understand them, the better you will understand and control the
XRF technique
 Instrument parameters can be used to improve your final results
 It is important to understand both physics and the application of the
instrument parameters in order to set up good calibrations which give
you precise and accurate results

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Appendix: The Sample
Introduction

 A bad sample preparation can lead to a large error in XRF-analysis


 Specify your analytical goals before beginning a specimen preparation
method as several effects may and do take place:
 penetration of X-rays (information depth, shadow effect)
 grain- or particle size effect
 crystallographic- or mineral effect
 inter-element effect

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Appendix: The Sample
Penetration- and Information Depth

Penetration Depth

Information or Critical Depth

SURFACE TREATMENT !

high energy photons

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Appendix: The Sample
Grain- or particle size effect

SiO2 analysed layer


Al2O3

ISi= f (NpSiO2)Volume
Analysed layer = homogeneous distribution
IAl = f (NpAl2O3)Volume

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Appendix: The Sample
Crystallographic- or mineralogical effect

loose powders pressed powders


SiO2
analysed layer
AlxSiyOz

ISi= f ((NpSiO2)+(NpAlAlxSiyOz ))Volume


SSiO2(kcps/%)<>SAlxSiyOz
IAl = f (NpAlxSiyOz)Volume

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Appendix: The Sample
Inter-element effect

Tube ENHANCEMENT ABSORPTION Detector

Normal Ni x-ray

Alpha NiFe

Gamma NiFe,Cr

Cr

Fe

Ni
Stainless Steel

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Appendix: The Sample
Inter-element effect

 (cm2/g) Stainless Steel

Ni-K Fe-K Cr-K

Ni K-absorption Fe K-absorption Cr K-absorption


edge edge edge

Ni-K Fe-K Cr-K

 (Å)
1.4 1.5 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5

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Appendix: The Sample
Inter-element effect

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