Deflectometry based android application for non-

destructive testing of different optical components

A
presentation for IDEAS-2017
 Content

Origin of the proposal: Problem domain

Probable Solution: Theory

Initial Progress

Results

Expected Outcomes

References
 Origin of the proposal: Problem domain
Camera lense testing
Mirror
Surface profiling
The existing non-destructive techniques (e.g. digital holography, interferometry, optical
coherence tomography, wavelength scanning interferometry, etc.) require large number of
components, have complex alignment, high cost and are extreme susceptible towards
environmental perturbations.

Company: OpTest Test Bench

Market price: 5-7 lakhs
In aeronautical engineering, many components can be treated like beam- or plate-like
structures, for instance wings or fan blades. In laminated composite structures, different
damage processes exist, such as matrix cracking, delamination, and fibre breakage. These
affect the structural performance of the components by reducing their stiffness and can
lead to premature failure.

Hence, an alternative simple, low-cost, handy and accurate device is required to

measure the surface characteristics and perform non-destructive testing outside
laboratory condition. Hence, a handy android application based mobile device using
deflectometric principle is proposed.
The mirrors (aspheric, X-ray and free-form) can correct the aberrations and improve the
imaging quality of the optical system.
Moreover, using such a mirror can reduce the number of optical elements in an optical
system and further reduce the weight and the size of the system. Because of its fine
characteristics, the aspheric mirror is widely used in the modern optical design. Thus,
accuracy of the aspheric mirror fabrication should be improved.
Expected Outcomes

 Creation of a single android phone based low-cost and handy deflectometric setup for various
metrological measurements. This employs the front camera of the mobile phone and the structured
screen of the same phone. The initial arrangement is shown in Fig. 5
 Development of advanced phase retrieval algorithm for evaluation of desired phase information with
minimal error.
 Derive analogy between phase and metrological parameters (e.g. surface curvature, aberration,
distance, profile, etc.).
 Develop an android application that can perform the entire process automatically.

Fig. 5. Experimental arrangement of the proposed setup.

Probable Solution: Theory
 The basic principle of deflectometry resides in
measuring the extent of deflection in the
reflected beam induced due to its interaction
with the specular object surface.

Phase measuring deflectometry (PMD) is a

quantitative implementation of deflectometric
principle [1]. An LCD monitor or structured
projection pattern is used as a source of
sinusoidal grating projection. A calibrated camera
is used to observe the light source via the object
surface. This basic principle is shown in Fig. 1

The recorded fringe pattern can be described

by:

Fig. 1. Basic principle of phase measuring deflectometry.

The surface information resides on the phase term of recorded interferogram. This can be retrieved
using different phase extraction algorithms, e.g. phase shifting, Fourier transform, wavelet transform,
windowed Fourier transform, synchronous demodulation, etc.

 Overall technique can provide the a resolution in the nanometer range [2].
Initial Progress
J. Dhanotia, A. Chatterjee, V. Bhatia and S. Prakash, “A simple low-cost latent fingerprint sensor
using Deflectometry and WFT analysis,” Optics and Laser Technology (Accepted).
 Fringe (grid) pattern in x and y direction with
equal spacing period ‘p’ in Matlab simulation
environment is simulated and converted to image
(‘.JPEG’) format.
 This structured light from LCD screen of a
mobile phone (ASUS Zenfone Max; Android v5
Lollipop operating system with 1.0GHz MSM8916
Qualcomm quad core processor, 2GB RAM, 13MP
primary camera with auto focus) is used as a
source.
The resulting sinusoidal fringe pattern is
projected onto a specular object on which a
fingerprint is implanted.
 Depending on the local slope variation induced
because of the presence of ridges and valleys in
the fingerprint, the reflected pattern is distorted.
Fig. 2. Experimental arrangement of latent The distorted fringe pattern is then captured
fingerprint detection. using back camera of a second mobile phone of
the same model.
 Results

(a) (b) (c)

Fig. 3. (a) Fingerprint, (b) Fingerprint Fringe, and (c) Wrapped phase map.

(a) (b)

Fig. 4. (a) Side view, and (b) rotated top view of reconstructed 3D phase map of fingerprint
obtained using WFT.
Comparison with existing commercial products

Company Name Model Number Price in USD

(considering
$1=64.15 INR)
Axsun Technologies SSOCT-1310 30,800
Inc., Billerica, (Swept source OCT)
Massachusetts
HATCO, USA SRT-6210 1300
(Surface Profiler)
Zygo Corporation Wavelength tuning 12,000-50,000
interferometer
Anton Paar India Pvt. 153028/90241013/C 50,500
Ltd. H (Video Microscope)
Anton Paar India Pvt. 145500/90241013/FR 20,650
Ltd.
Proposed Strategy Deflectometry The cost of your own
cell phone
 References
I. Häusler G 2001 Method and apparatus for determination of the shape or of the imaging properties of
reflective or transparent objects (translated from German) German patent DE 19944354
II. Wagner C and Hausler G 2003 Information theoretical optimization for optical range sensors Applied
Optics 42 5418-5426
III. Häusler G, Richter C, Leitz K H and Knauer M C 2008 Microdeflectometry—a novel tool to acquire three-
dimensional microtopography with nanometer height resolution Optics Letters 33 396-398
IV. Guo C, Hu X L A and Zou J 2016 Improved phase-measuring deflectometry for aspheric surfaces test
Applied Optics 55 2059-2064
V. Wedowskin R D, Atkinson G A, Smith M L and Smith L N 2012 Dynamic deflectometry: A novel approach
for the on-line reconstruction of specular freeform surfaces Optics and Lasers in Engineering 50 1765-
1778
VI. Devivier C, Pierron F and Wisnom M R 2012 Damage detection in composite materials using
deflectometry, a full-field slope measurement technique Composites: Part A: Applied Science and
Manufacturing 43 1650-1666
VII. Petitjean B P, McLaughlin D K and Morris P J 2006 An Experimental Investigation of Density Gradient
Fluctuations in High-Speed Jets Using Optical Deflectometry 12th AIAA/CEAS Aeroacoustics Conference
(27th AIAA Aeroacoustics Conference) Cambridge, Massachusetts
VIII. Jacques L, Gonzalez A, Foumouo E and Antoine P Refractive index map reconstruction in optical
deflectometry using total-variation regularization Wavelets and Sparsity XIV, SPIE Optical Engineering
and Applications, Proc. of SPIE 8138 813807-1 doi: 10.1117/12.892729
IX. Dhanotia J, Bhatia V and Prakash S 2017 Collimation testing using deflectometry in conjunction with
windowed Fourier transform analysis Applied Optics 56 2346-2352
X. Kemao Q 2007 Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles,
applications and implementations Optics and Lasers in Engineering 45 304-317