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PHYSICAL VAPOR DEPOSITION (PVD)
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ATMOSPHERIC CHEMICAL
VAPOR DEPOSITION (APCVD)
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ATMOSPHERIC PRESSURE CVD
Simplest CVD process at an atmospheric
pressure of 760 torr.
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ATMOSPHERIC PRESSURE CVD
CHEMICAL REACTION
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ATMOSPHERIC PRESSURE CVD
DEPOSITION RATE
Measure of how fast the film can be grown on the
substrate. Figure shows the concent.
and fluxes in the gas-phase boundary
layer and at the wafer surface.
F1 = hG (CG-CS) ------- (i)
F2 = kSCS ----------------(ii)
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ATMOSPHERIC PRESSURE CVD
The mass transfer coefficient is a diffusion rate constant that relates the
mass transfer rate (n), mass transfer area (A), and concentration
gradient (Δc) as driving force:
hG = n / (A*Δc)
According to the steady state conditions, the two fluxes must be equal
to each other:
CS = CG ( 1 + kS / hG ) -1
v = F/N
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ATMOSPHERIC PRESSURE CVD
ADVANTAGES
- Low equipment cost
- SiCl4 is non-toxic, inexpensive and easy to purify
- High deposition rates
DISADVANTAGES
- SiCl4 requires higher temperature than silane process
- Periodic manual cleaning of injectors are required
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ATMOSPHERIC PRESSURE CVD
VLSI APPLICATIONS
- Used for making thick oxides
- Epitaxial is used to improve the performance of
dynamic random access memory devices and CMOS ICs
as APCVD manufactures good quality epitaxial silicon
layer
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LOW PRESSURE CVD
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LOW PRESSURE CVD
CHEMICAL REACTIONS
We have DG proportional to
1/Ptot
DISADVANTAGES
- Lower deposition rate than APCVD
- Frequent use of toxic and flammable gases such as
ammonia, silane, fluorine, hydrogen fluoride, HCl, etc.
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LOW PRESSURE CVD
VLSI APPLICATIONS
- Gate contacts in MOS and interconnected lines made by LPCVD-
assisted Polysilicon
- Thick oxides are used for isolation between metal interconnects.
- Silicon Nitride is used for encapsulation
- Oxide/Nitrides are used in FLASH memories
- Metals for interconnected lines in CMOS
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PLASMA ENHANCED CHEMICAL
VAPOR DEPOSITION (PECVD)
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PLASMA ENHANCED CVD
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PLASMA ENHANCED CVD
DEPOSITION RATE
PECVD has lower deposition rate than that of APCVD and LPCVD.
ADNAVTAGES
- Lower process temperature
- Films of good dielectric properties
- Good conformal step coverage
DISADVANTAGES
- The highly energetic plasma gases can pose damage to the
substrate
- High cost of equipment and toxic byproduct
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PLASMA ENHANCED CVD
VLSI APPLICATIONS
- PECVD nitride is suitable for passivation layers
- PECVD processed products are used in VLSI-DRAM
memory cells
- PECVD a-Silicon is used in solar cells
- Used for depositing materials like Silicon Oxide, Silicon
Nitride, Carbon, Amorphous Silicon and polysilicon
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MBE
MBE is used to deposit single
crystals.
MBE creates a molecular
beam of material by
evaporating it under ultra-
high vacuum (5 e-11 mbar
pressure) and is focused on
the substrate by effusion cells
RHEED (reflection high
energy electron diffraction) is
used to monitor film growth
Mass spectrometer collects
stoichiometric data
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MBE
CHEMICAL REACTION
To deposit silicon layer, Si2H6 is evaporated in the effusion cells
to give silicon
DEPOSITION RATE
Slow deposition rates require proportionally better vacuum. In
MBE, evaporation is carried out at very low deposition rates. For
good epitaxy, we want rate to be
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MBE
ADVANTAGES
- Well-controlled process
- Grow film with good crystal stucture
- often use multiple sources to grow alloy films
DISADVANTAGES
- Low growth rate
- Sophisticated and expensive equipment
VLSI APPLICATIONS
- Used in high frequency receivers (portable phones)
- Optoelectronics (DVD, Digital Computers)
- For producing superconductors (YBa2Cu3O7-8)
- Used in silicon process technology
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METAL ORGANIC CHEMICAL
VAPOR DEPOSITION (MOCVD)
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Compare of epitaxial methods
Growth method time features limit
MBE 1958 Deposit epilayer at Hard to grow materials
(Molecular Beam 1967 ultrahigh vacuum with high vapor pressure
Epitaxy)
MOCVD 1968 Use metalorganic Some of the sources like
(Metal-Organic compounds as the AsH3 are very toxic.
Chemical Vapor sources
Deposition)
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2. The MOVCD growth system
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Reactor-1
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MOCVD Growth System
Reactor
Gas handle
system
Vacuum and
Exhaust system
Computer
Control
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Gas handling system
The function of gas handling system is mixing of the gas that will
enter the reactor. Timing and composition of the gas entering the
reactor will determine the epilayer structure.
Leak-tight of the gas panel is essential, because the oxygen
contamination will degrade the growing films’ properties.
Accurate control of flow rate, pressure and temperature can ensure
the stable and repeat.
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Exhaust system
Pump and pressure controller
For low pressure growth, we use mechanic pump and pressure
controller to control the growth pressure. The pump should be designed
to handle large gas load.
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3. Metalorganic compound
MOCVD is used for preparing compound semiconductors.
The vapor pressure of the MO source is an important consideration
in MOCVD, since it determines the concentration of source material
in the reactor and the deposition rate. Too low of a vapor pressure
makes it difficult to transport the source into the deposition zone
and to achieve reasonable growth rates. Too high of a vapor
pressure may raise safety concerns if the compound is toxic.
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Vapor pressure of most
common MO compounds
Compound P at 298 K A B Melt point
(torr) (oC)
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Reaction
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6. MOCVD grow GaN and
related materials
TMGa
NH3
1150oC
1050oC
Temperature 550oC
Ga(CH3)3+NH3 GaN+CH4
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Two Step MOCVD Growth procedure
Advantages:
• Highly flexible—> can deposit semiconductors, metals,
dielectrics.
•Used for preparing compound semicondutors
Disadvantages:
•HIGHLY TOXIC! Very expensive source material.
•Environmental disposal costs are high
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