Engineering Project Summary (50)

http://www.chineseowl.idv.tw














Our working group has
become increasingly intrigued with how to identify defects
in silicon-based solar cells.
Despite the ability of SEM to identify the grain
structure of a solar cell, the area that it scans is relatively
small for the entire solar cell. As constructing I-V curve data
requires time for testing, a wafer must be scanned many
times using SEM to cover the entire area.
However, the conventional procedure to identify defective
cells in a module is laborious and time consuming.
(NOTE: Quantify the problem to be solved) The
inability to identify defects in silicon-based solar cells,
especially unqualified cells, makes it impossible to
calculate the percentage of the defective area immediately.
(cont)
Therefore, we developed an inspection
system to identify defects in silicon-based solar cells, in
particular unqualified cells, by locating them and calculating the
percentage of the defective area immediately. The proposed
system consists of near-infrared (NIR) image sensing electronic
circuits and a data processing control computer in real time.
Solar cell performance was evaluated
using the I-V curve. If the I-V curve represents inadequate
electrical power behavior, the grain structure was then observed
using scanning electron microscopy (SEM) to identify the
problem. Next, before I-V testing for solar cell defects, the
proposed inspection system was implemented to identify the
defective area for the entire solar cell rapidly. Additionally, the
percentage of the defective area in the entire solar cell module
was determined immediately owing to the real time data
processing control computer of the proposed system, making it
feasible to locate unqualified cells without constructing an I-V
curve.
(cont)
According to our results, the
proposed inspection system can locate defects immediately
and determine the detailed reason for defects in the grain
structure by using SEMS.
Importantly, the proposed inspection system for
solar cell defects is highly efficient in terms of identifying
defective areas. (NOTE : Add 2-3 more sentences that
describe more thoroughly how the proposed method
contributes to a particular field or sector)

Our recent project
examined the inability of conventional food processing
methods to inspect the inner quality of fruit.
As concern over food quality has
grown with increased consumption, rapidly inspecting such
quality must satisfy market demand. Fruit market
consumers often purchase their favorite fruits by selecting
them individually based on their subjective experiences.
Although individuals spend considerable
money and time in selecting fruit, whether the fruit is tasty
remains unclear. Moreover, conventional inspection
methods of fruit quality by examining the fruit skin fail to
determine the inner quality of fruit. For instance, weighing
the fruit provides only a quantitative means of comparing
with its proper size. The inability to inspect the inner quality
of fruit makes it impossible to increase agricultural profits.
(cont)
Therefore, we developed a non-invasive
inspection method, capable of examining the inner quality of fruit
efficiently by incorporating use of near infrared absorbance
spectrum. The fruit
quality was evaluated based on measurements of near infrared
absorbance spectrum from the fruit skin and partial least square
regression (PLSR) analysis. (NOTE: Add at least two to three
more sentences in order to more describe the methodology more
completely) Our results indicated that the
proposed non-destructive inspection method can determine the
sugar content of fruit with an accuracy exceeding 85%.
Importantly, the proposed method
can demonstrate the effectiveness of near infrared absorbance
spectrum in accurately predicting the sugar contents of fruit.
(NOTE : Add 2-3 more sentences that describe more thoroughly
how the proposed method contributes to a particular field or sector)
Further details can be found at
http://www.chineseowl.idv.tw