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NPN Transistor
C B E
PNP Transistor
C B E
S. Kal, IIT-Kharagpur
Current flow in an npn transistor biased to operate in the active mode. [ Reverse current components due to thermally generated minority carriers are not shown ] For active operation of the transistor, the E-B junction is forward biased and the C-B junction is reverse biased
S. Kal, IIT-Kharagpur
BJT Operation
Electrons are injected into the base from emitter and holes are injected into the emitter from the base Since ND ( emitter) >> NA ( Base ), nE >> pB thus, IE = Ine + Ipb = Ine ( 1 + Ipb/Ine) $ InE @ Ine >> Ipb
The electrons injected into the base diffuse towards the collector Since the physical base width is very small ( only a few micron), only a very few electrons are lost by recombination with holes ( majority carriers) in the base Most of them reach the C-B junction where they are instantaneously swept out or collected by the strong electric field in the depletion layer of C-B junction
S. Kal, IIT-Kharagpur
BJT Operation
The fraction ( E ) of injected electrons which are finally collected by the collector is called common base current gain. E is usually just less than 1 Since the C-B junction is reverse biased, the minority carriers from either side of the junction cross it easily. Since VCB >> VT , this component of collector current is equal to the reverse saturation current ( ICBO ) of the C-B junction @ IC = EIE + ICBO, As Ine } IE , IC = E IE + ICBO
Hence ICBO = IC for IE = 0, i.e. ICBO is the current in the collector base loop when the emitter is open ( IE = 0 ) Few electrons which are unable to reach the C-B junction recombine with holes - the majority carriers in the base. It accounts for a small base current (IB) that is supplied from the base contact to restore the charge neutrality which was hampered by the recombination.
S. Kal, IIT-Kharagpur
@ IC = F IB + ICEO
where, ICEO } FICBO is the current in the collector-emitter loop if the base is open ( IB = 0 ) Also, E = F / ( 1+ F ) If E = 0.995, F = 199
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BJT Characteristics
In saturation
In Saturation
Early voltage
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S. Kal, IIT-Kharagpur
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VCE =VCC IC RC @ (VCE = RC ( IC This linear or analog relationship between (IC and (IB holds true for some particular ranges of IC and VCE. We bias the transistor in such a way that the most appropriate values of IB, IC, VCE are maintained. The particular set of values (d.c.) of IB, IC, and VCE represents a particular point in the output characteristics of the transistor, called the operating point or quiscent point.
S. Kal, IIT-Kharagpur
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Too large an input signal causes both positive and negative clipping
S. Kal, IIT-Kharagpur
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Q-point is located too close to saturation and the output voltage shows positive clipping
Q-point is located too close to cut-off and the output voltage shows negative clipping
S. Kal, IIT-Kharagpur
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(IC = S1 . (ICBO + S2 (VBE + S3 (F S1 , S2 and S3 are called stability factors w.r.t. ICBO, VBE, and F respectively. The design of a good biasing circuit aims at reducing the values of S1 , S2 and S3. A large value of RE will generate more negative feed back thus making the biasing more stable (reducing S1 ,S2, S3 ).
(a)
(b)
S. Kal, IIT-Kharagpur
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&
Applying K.V.L to the B-E loop of Fig.(b): VB = IB RB + VBE + ( IC + IB ) RE , since the drop across RE is IERE = ( IC + IB ) RE VB VBE RE IC IB = ~~~ (3) RB + RE
S. Kal, IIT-Kharagpur
It gives,
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VB VBE RE IC Substituting (3) in (4) IC = F + (1+F) ICBO RB + RE Rearranging terms, we can express IC as a function of ICBO, VBE and F as : VB VBE RB + RE IC = F + ( 1 + F ) ICBO RB + ( 1 + F) RE RB + ( 1 + F) RE ~~( 5) RE + RB Thus we get S1 = xIC /xICBO = . (1+F) VBE const. RB + (1+F) RE F const.
S. Kal, IIT-Kharagpur
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Beta-Stability
Transistors are made by a batch manufacturing process in which hundreds of transistor chips are processed simultaneously. Due to lack of uniformity, all the transistors of the same type fabricated in the same process may not have identical parameters. Particularly, there may be a wide variation of F from transistor to transistor of the same type. Thus F is temperature dependent as well as process dependent. If the transistor is to be replaced by another of the same type in a circuit ( in case of a failure ), IC and VCE may change substantially because of the difference in F. But the presence of RE stabilizes IC w.r.t. wide F variation. The corresponding stability factor, S3, for a large change of F is given by S3 = (IC2 IC1)/(F2 - F1) ~~~ (8)
where IC1 and IC2 are collector currents for the old and new transistors of F1 and F2 respectively.
S. Kal, IIT-Kharagpur
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